CN205317865U - Thermistor dynamic characteristic measuring device - Google Patents
Thermistor dynamic characteristic measuring device Download PDFInfo
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- CN205317865U CN205317865U CN201520945381.0U CN201520945381U CN205317865U CN 205317865 U CN205317865 U CN 205317865U CN 201520945381 U CN201520945381 U CN 201520945381U CN 205317865 U CN205317865 U CN 205317865U
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- critesistor
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Abstract
The utility model discloses a thermistor dynamic characteristic measuring device, including laser instrument, optical collimator, light beam homogenizing beam expander, absorbing screen, fast response photoelectric detector, the thermistor that awaits measuring, photovoltaic amplifier, light guide amplifier and data collection station, the laser pulse that the laser instrument sent forms even facula after optical collimator collimation, light beam homogenizing beam expander homogenization, treat that measuring thermistor lies in in the even facula, even facula is partly to be absorbed by thermistor, and on the absorbing screen was shone to another part, most absorbate screen absorbed, and very the fraction scattering is to the surrounding environment in, and photoelectric detector's output is connected with the photovoltaic amplifier and is used for real -time supervision laser pulse shape, and the dynamic response who is used for measuring thermistor is connected to thermistor's both ends and light guide amplifier. The utility model discloses can be fast, accurate measurement thermistor's thermal time constant.
Description
Technical field
This utility model relates to a kind of measurement apparatus, is specifically related to a kind of critesistor dynamic characteristic measuring device.
Background technology
Filament critesistor is mainly used in the field that temperature is accurately quickly measured, and especially in atmospheric turbulance measurement, its minimum temperature resolution is up to 0.002 DEG C, and the highest response frequency is up to hundred more than Hz. Its dynamic characteristic is mainly by 3dB response frequency f3dBCharacterize with thermal time constant τ, the relation of the two asRepresent, wherein, f3dBFor the 3dB response frequency of critesistor, τ is the thermal time constant of critesistor, for critesistor under step Temperature Excitation, from initial temperature T0Reach step temperature TeThe time used by 63.2%.
For ordinary temp sensor, the measurement of its dynamic characteristic generally adopts electrical heating, temperature chamber or wind-tunnel to produce the saltus step of a temperature, its shortcoming is that the step Temperature jump edge produced is relatively slow, experimental expenses is higher, uncertainty of measurement is bigger, it is only applicable to the slower Dynamic Characteristics of Temperature Transducers of response speed measure, for the critesistor that thermal time constant is the even sub-millisecond magnitude of millisecond, its dynamic characteristic measuring does not still have equipment or the device of maturation at present.
Utility model content
The purpose of this utility model is in that the shortcoming overcoming above-mentioned prior art, it is provided that a kind of critesistor dynamic characteristic measuring device, this device can quickly, accurately measure the thermal time constant of critesistor.
For reaching above-mentioned purpose, critesistor dynamic characteristic measuring device critesistor dynamic characteristic measuring device described in the utility model, it is characterized in that, including laser instrument, optical fiber collimator, beam homogenization beam expander, absorbing screen, data acquisition unit and for the laser of absorbing screen surface scattering being converted to the photodetector of voltage signal;
The laser pulse that laser instrument sends forms uniform light spots after optical fiber collimator collimation, beam homogenization beam expander homogenizing, critesistor to be measured is positioned at described uniform light spots, a described uniform light spots part is absorbed by critesistor, another part is irradiated on absorbing screen and is absorbed by absorbing screen, and the two ends of critesistor and the outfan of photodetector are all connected with the input of data acquisition unit.
Also including photoconduction amplifier, the two ends of critesistor are connected with the input of photoconduction amplifier, and the outfan of photoconduction amplifier is connected with the input of data acquisition unit.
The outfan of photodetector is connected with the input of data acquisition unit by photovoltaic amplifier.
Described data acquisition unit is double-channel data collector.
Described absorbing screen is graphite absorbing screen.
Described photoconduction amplifier includes the first resistance, second resistance, instrument amplifier, first potentiometer, second potentiometer and power supply, one end of first resistance and one end of the second resistance are all connected with positive supply, pin 3 on instrument amplifier is connected with the other end of the first resistance and one end of the first potentiometer, pin 2 on instrument amplifier is connected with one end of the other end of the second resistance and critesistor to be measured, the other end of the first potentiometer and the other end ground connection of critesistor to be measured, pin 7 and pin 4 on instrument amplifier connect positive supply and negative supply respectively, pin 5 ground connection on instrument amplifier, pin 1 on instrument amplifier is connected with the pin 8 on instrument amplifier through the second potentiometer, pin 6 on instrument amplifier is connected with the input of data acquisition unit.
Described photovoltaic amplifier includes the 3rd resistance, the 4th resistance and operational amplifier, the negative pole of photodetector is connected with positive supply, the in-phase input end of operational amplifier is connected with one end of the positive pole of photodetector and the 3rd resistance, the other end ground connection of the 3rd resistance, the inverting input of operational amplifier is connected with the outfan of operational amplifier through the 4th resistance, positive supply input and the negative supply input of operational amplifier are connected with positive supply and negative supply respectively, and the outfan of operational amplifier is connected with the input of data acquisition unit.
This utility model has the advantages that
Critesistor dynamic characteristic measuring device described in the utility model is in measurement process, by being radiated the side of photoconductive resistance after the laser pulse collimation sent by laser instrument and homogenizing, photoconductive resistance is made to reach thermal balance after heating up, then utilize the lower of laser pulse to jump along the temperature-fall period caused to measure the thermal time constant of critesistor, there is higher certainty of measurement. The speed simultaneously measured. The time width adjustable extent of laser instrument constant power output laser pulse is bigger, operating cost is relatively low, the power of laser pulse can reach multikilowatt simultaneously, hopping edge can reach tens Microsecond grades, therefore the thermal time constant certainty of measurement of critesistor is higher, and speed is fast, it is possible to be millisecond or the dynamic characteristic measuring of sub-millisecond critesistor suitable in thermal time constant.
Accompanying drawing explanation
Fig. 1 is structural representation of the present utility model;
Fig. 2 is the structural representation of filament critesistor 4 sensor in embodiment one for atmospheric temperature fluctuation measurement;
Fig. 3 is the circuit diagram of photoconduction amplifier 8 in this utility model;
Fig. 4 is the circuit diagram of photovoltaic amplifier 9 in this utility model;
Fig. 5 be in this utility model diameter be 20 μm, length be the oscillogram that the thermal time constant of 2cm tungsten filament is measured;
Fig. 6 be in this utility model diameter be 10 μm, length be the oscillogram that the thermal time constant of 2cm tungsten filament is measured;
Fig. 7 be in this utility model diameter be 8 μm, length be the oscillogram that the thermal time constant of 2cm tungsten filament is measured.
Wherein, 1 be laser instrument, 2 be optical fiber collimator, 3 be beam homogenization beam expander, 4 be critesistor, 5 be hot spot, 6 be absorbing screen, 7 be photodetector, 8 be photoconduction amplifier, 9 be photovoltaic amplifier, 10 for data acquisition unit.
Detailed description of the invention
Below in conjunction with accompanying drawing, this utility model is described in further detail:
With reference to Fig. 1, critesistor dynamic characteristic measuring device described in the utility model includes laser instrument 1, optical fiber collimator 2, beam homogenization beam expander 3, absorbing screen 6, data acquisition unit 10 and for the laser of absorbing screen 6 surface scattering is converted to the photodetector 7 of voltage signal; The laser pulse that laser instrument 1 sends collimates through optical fiber collimator 2, form uniform light spots 5 after beam homogenization beam expander 3 homogenizing, critesistor 4 to be measured is positioned at described uniform light spots 5, described uniform light spots 5 part is absorbed by critesistor 4, another part is irradiated on absorbing screen 6 and is absorbed by absorbing screen 6, and the two ends of critesistor 4 and the outfan of photodetector 7 are all connected with the input of data acquisition unit 10.
It should be noted that this utility model also includes photoconduction amplifier 8, the two ends of critesistor 4 are connected with the input of photoconduction amplifier 8, and the outfan of photoconduction amplifier 8 is connected with the input of data acquisition unit 10, the outfan of photodetector 7 is connected by the input of photovoltaic amplifier 9 with data acquisition unit 10, data acquisition unit 10 is double-channel data collector, absorbing screen 6 is graphite absorbing screen, photoconduction amplifier 8 includes the first resistance, second resistance, instrument amplifier, first potentiometer, second potentiometer and power supply, one end of first resistance and one end of the second resistance are all connected with positive supply, pin 3 on instrument amplifier is connected with the other end of the first resistance and one end of the first potentiometer, pin 2 on instrument amplifier is connected with one end of the other end of the second resistance and critesistor 4 to be measured, the other end of the first potentiometer and the other end ground connection of critesistor 4 to be measured, pin 7 and pin 4 on instrument amplifier connect positive supply and negative supply respectively, pin 5 ground connection on instrument amplifier, pin 1 on instrument amplifier is connected with the pin 8 on instrument amplifier through the second potentiometer, pin 6 on instrument amplifier is connected with the input of data acquisition unit 10, photovoltaic amplifier 9 includes the 3rd resistance, the 4th resistance and operational amplifier, the negative pole of photodetector 7 is connected with positive supply, the in-phase input end of operational amplifier is connected with the positive pole of photodetector 7 and one end of the 3rd resistance, the other end ground connection of the 3rd resistance, the inverting input of operational amplifier is connected with the outfan of operational amplifier through the 4th resistance, positive supply input and the negative supply input of operational amplifier are connected with positive supply and negative supply respectively, and the outfan of operational amplifier is connected with the input of data acquisition unit 10.
Specific works process of the present utility model is:
Laser instrument 1 produces rectangular laser pulse, described rectangular laser pulse is input in beam homogenization beam expander 3 after optical fiber collimator 2 collimation is for directional light, and after described beam homogenization beam expander 3, form uniform light spots 5, a portion uniform light spots 5 is received by the side of critesistor 4 to be measured, a part in another part is absorbed by absorbing screen 6, remainder light scattering is in surrounding space, photodetector 7 receives the laser that absorbing screen 6 absorbs, then the first voltage signal is converted to through photovoltaic amplifier 9, and described first voltage signal is forwarded in a passage of data acquisition unit 10, simultaneously critesistor 4 receives uniform light spots 5 temperature and changes, and then make the resistance value of critesistor 4 change, the resistance change of critesistor 4 is converted to the second voltage signal of paraphase by photoconduction amplifier 8, and by the second voltage signal input of described paraphase to another passage of data acquisition unit 10, the rectangular laser pulse that data acquisition unit 10 sends according to described first voltage signal monitoring laser instrument 1,Data acquisition unit 10 measures the dynamic response of critesistor 4 to be measured according to the second voltage signal of described paraphase.
Embodiment one
In atmospheric optics field, filament thermistor (temperature) sensor for atmospheric temperature fluctuation measurement is mainly made up of superfine cylindric platinum filament or tungsten filament, general diameter is micron or tens micron dimensions, the platinum filament of tested filament respectively diameter 20 microns and the diameter respectively tungsten filament of 10 microns and 8 microns, length is 2 centimetres, as shown in Figure 2. The described filament thermistor (temperature) sensor for atmospheric temperature fluctuation measurement includes the filament for temperature sensing, supports copper wire, electric crossover board. Having two deposited copper films on electric crossover board, be respectively arranged with a pad in the upper end of deposited copper film for welding support copper wire, the lower end applying copper film is respectively arranged with two pads, is used for welding output lead. In measurement process, only filament being placed in uniform light spots 5, side receives laser irradiation, remainder is outside hot spot 5, circuit board is connected with photoconduction amplifier 8 by wire, and temperature signal has been carried out paraphase amplification by photoconduction amplifier 8, for measuring the variations in temperature of filament.
Laser instrument 1 adopts the optical fiber laser of output up to 2kW, output wavelength 1.07 μm, exports parallel rectangular laser pulse by optical fiber collimator 2, and front and back are along less than 50 μ s, and pulsewidth 100ms is adjustable.
Beam homogenization beam expander 3, adopts square microlens array MLA, is of a size of 10mm × 10mm × 1.2mm, laser beam is homogenized and expands, and forms a length of side at distance 1m place and is about the square uniform light spots 5 of 3cm.
As it is shown on figure 3, photoconduction amplifier 8 is made up of Wheatstone bridge and instrument amplifier, wherein regulates PR1 potentiometer and make two input terminal voltage VA=VB, now output voltage VO 2=0V of instrument amplifier, it was shown that electric bridge is in poised state. After going out light, along with critesistor 4 is by laser irradiation, its temperature is gradually increasing, critesistor 4 resistance raises, then bridge balance is broken, instrument amplifier anti-phase input terminal voltage VA is more than in-phase input end voltage VB, and the difference VB-VA of two input terminal voltages is amplified by instrument amplifier, VO2 export. Note: the voltage of VO2 linearly changes with the temperature of critesistor 4 here, and in opposite direction.
Photovoltaic amplifier 9 is as shown in Figure 4, adopted by photodetector 7 and receive the scattering light from graphite screen, optical signal is become current signal, 3rd resistance R4 produces voltage, by the follower that operational amplifier is constituted, the voltage signal VO1 that output is proportional with PIN received optical power, is used for monitoring in real time the change of laser pulse.
Data acquisition unit 10 adopts the four-way digital oscilloscope that Li Ke company produces, and uses channel C 1 therein to gather and shows real time laser monitoring waveform, and channel C 2 is for gathering and show the variations in temperature waveform of filament. Wherein, channel C 1 rectangular pulse rising edge represents the process of Laser output, and the trailing edge of respective channel C2 represents the process that filament Stimulated Light irradiation temperature rises; Channel C 1 rectangular pulse trailing edge represents that laser pulse stops the process of light, and the rising edge of respective channel C2 represents the process that filament temperature declines. Due to laser pulse turn off process faster, and laboratory room temperature is highly stable, it is easy to measure, therefore adopt laser pulse to continue about 100ms, after filament temperature stabilization, turn off the lower of laser generation and jump along as excitation, the rising edge of respective channel C2, measure the time required for the 63.2% of its amplitude of variation, the thermal time constant τ of tested filament critesistor 4 can be obtained, and then calculate its 3dB response frequency f3dB.Fig. 5～Fig. 7 gives the waveform that three kinds of filament critesistor 4 are measured at laboratory (wind speed is 0m/s).
Claims (6)
1. a critesistor dynamic characteristic measuring device, it is characterized in that, including laser instrument (1), optical fiber collimator (2), beam homogenization beam expander (3), absorbing screen (6), data acquisition unit (10) and for the laser of absorbing screen (6) surface scattering being converted to the photodetector (7) of voltage signal;
The laser pulse that laser instrument (1) sends forms uniform light spots (5) after optical fiber collimator (2) collimation, beam homogenization beam expander (3) homogenizing, critesistor (4) to be measured is positioned at described uniform light spots (5), described uniform light spots (5) part is absorbed by critesistor (4), another part is irradiated on absorbing screen (6) and is absorbed by absorbing screen (6), and the two ends of critesistor (4) and the outfan of photodetector (7) are all connected with the input of data acquisition unit (10).
2. critesistor dynamic characteristic measuring device according to claim 1, it is characterized in that, also include photoconduction amplifier (8), the two ends of critesistor (4) are connected with the input of photoconduction amplifier (8), and the outfan of photoconduction amplifier (8) is connected with the input of data acquisition unit (10).
3. critesistor dynamic characteristic measuring device according to claim 1, it is characterised in that the outfan of photodetector (7) is connected by the input of photovoltaic amplifier (9) with data acquisition unit (10).
4. critesistor dynamic characteristic measuring device according to claim 1, it is characterised in that described data acquisition unit (10) is double-channel data collector.
5. critesistor dynamic characteristic measuring device according to claim 1, it is characterised in that described absorbing screen (6) is graphite absorbing screen.
6. critesistor dynamic characteristic measuring device according to claim 2, it is characterized in that, described photoconduction amplifier (8) includes the first resistance, second resistance, instrument amplifier, first potentiometer, second potentiometer and power supply, one end of first resistance and one end of the second resistance are all connected with positive supply, pin 3 on instrument amplifier is connected with the other end of the first resistance and one end of the first potentiometer, pin 2 on instrument amplifier is connected with one end of the other end of the second resistance and critesistor (4) to be measured, the other end of the first potentiometer and the other end ground connection of critesistor (4) to be measured, pin 7 and pin 4 on instrument amplifier connect positive supply and negative supply respectively, pin 5 ground connection on instrument amplifier, pin 1 on instrument amplifier is connected with the pin 8 on instrument amplifier through the second potentiometer, pin 6 on instrument amplifier is connected with the input of data acquisition unit (10).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520945381.0U CN205317865U (en) | 2015-11-24 | 2015-11-24 | Thermistor dynamic characteristic measuring device |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520945381.0U CN205317865U (en) | 2015-11-24 | 2015-11-24 | Thermistor dynamic characteristic measuring device |
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| CN205317865U true CN205317865U (en) | 2016-06-15 |
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| CN201520945381.0U Expired - Fee Related CN205317865U (en) | 2015-11-24 | 2015-11-24 | Thermistor dynamic characteristic measuring device |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105319469A (en) * | 2015-11-24 | 2016-02-10 | 中国人民解放军63655部队 | Device and method for measuring dynamic characteristics of thermistor |
| CN109839541A (en) * | 2017-11-27 | 2019-06-04 | 上海交通大学 | For measuring the measuring device of thermosensitive resistance type detector time constant characteristic |
-
2015
- 2015-11-24 CN CN201520945381.0U patent/CN205317865U/en not_active Expired - Fee Related
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105319469A (en) * | 2015-11-24 | 2016-02-10 | 中国人民解放军63655部队 | Device and method for measuring dynamic characteristics of thermistor |
| CN105319469B (en) * | 2015-11-24 | 2018-03-16 | 中国人民解放军63655部队 | A kind of thermistor dynamic characteristic measuring device and method |
| CN109839541A (en) * | 2017-11-27 | 2019-06-04 | 上海交通大学 | For measuring the measuring device of thermosensitive resistance type detector time constant characteristic |
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| Date | Code | Title | Description |
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| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20160615 Termination date: 20161124 |