CN205123711U - Analog -to -digital conversion chip volume production test circuit - Google Patents
Analog -to -digital conversion chip volume production test circuit Download PDFInfo
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- CN205123711U CN205123711U CN201520900765.0U CN201520900765U CN205123711U CN 205123711 U CN205123711 U CN 205123711U CN 201520900765 U CN201520900765 U CN 201520900765U CN 205123711 U CN205123711 U CN 205123711U
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Abstract
The utility model relates to a chip testing technical field especially relates to an analog -to -digital conversion chip volume production test circuit. The utility model discloses an in the embodiment, analog -to -digital conversion chip volume production test circuit includes automatic test equipment and multichannel digital analog conversion circuit, the digital analog conversion circuit will the data signal of automatic test equipment output converts into to export to behind the analog signal and is surveyed the analog -to -digital conversion chip, the automatic test equipment test whether the output of analog -to -digital conversion chip correctly can accomplish the test. The utility model discloses an in the embodiment, each way digital analog conversion circuit only occupies automatic test equipment's three passageway, the three passageway that each way digital analog conversion circuit occupy is different, and automatic test equipment can connect multichannel digital analog conversion circuit simultaneously under the unchangeable condition of original port number promptly, and each way digital analog conversion circuit corresponds one and is surveyed the analog -to -digital conversion chip, but makes while testing's chip number increase, has reduced test cost.
Description
Technical field
The utility model relates to chip testing technology field, particularly relates to a kind of modulus conversion chip volume production test circuit.
Background technology
Generally, inside the manufacturing process of all electronic devices and components (comprising integrated chip, discrete component etc.), there are the needs of eliminating the false and retaining the true, this needs is actually a process tested, and namely goes the true and false of testing each electronic devices and components by automatic test equipment.When testing electronic devices and components, testing cost is more low better.
At present, the method reducing chip testing cost has two kinds: one to be the quantity (being called for short with surveying number) increasing the chip that can simultaneously test, and two is the testing times of reducing each chip, namely in same time, the core number of test is more, and production cost is lower.The quantity of the chip that can simultaneously test is determined by the port number of automatic test equipment and power supply number.At present, when batch testing modulus conversion chip, mainly contain two kinds of methods: a kind of is directly powered to tested modulus conversion chip by the accurate power supply of automatic test equipment, automatic test equipment directly exports an analog signal to tested modulus conversion chip, then surveys the output of tested modulus conversion chip; Another kind is on automatic test equipment, join the digital-to-analogue conversion board that a piece is tested modulus conversion chip specially, automatic test equipment exports a digital signal to described digital-to-analogue conversion board, described digital-to-analogue conversion board will export triangular wave or sinusoidal wave to tested modulus conversion chip after described Digital Signal Processing, then is tested the output of tested modulus conversion chip by automatic test equipment.
The shortcoming of the first method of testing is: (1) due to the accurate power supply of automatic test equipment few, be generally 8, powering to chip under test also needs to take the accurate power supply of automatic test equipment, can limit the quantity of the chip that can simultaneously test like this; (2) this method of testing is subject to external interference; (3) testing time is long.
The shortcoming of the second method of testing is: the board that (1) joins one piece of test modulus conversion chip specially on automatic test equipment can take the more channel resource of automatic test equipment, causes the chip-count that can simultaneously test to be restricted; (2) testing time is long.
Utility model content
The purpose of this utility model is to provide a kind of modulus conversion chip volume production test circuit, and being intended to solve in prior art directly to be powered to modulus conversion chip by the accurate power supply of automatic test equipment or to be tested modulus conversion chip by configurable number mode convertion board causes the problem that the chip-count that can simultaneously test is restricted, the testing time is long, cost is high.
The utility model is achieved in that the utility model provides a kind of modulus conversion chip volume production test circuit, is connected, it is characterized in that with multiple tested modulus conversion chip, and described modulus conversion chip volume production test circuit comprises:
Test lead is connected with the output of described multiple tested modulus conversion chip, detects the automatic test equipment whether described multiple tested modulus conversion chip output is correct;
Multi-channel digital and analogue change-over circuit, three expanding channels that three inputs of each way analog conversion circuit are corresponding with described automatic test equipment respectively, the output of each way analog conversion circuit connects with the input of corresponding described tested modulus conversion chip, and described D/A converting circuit exports described tested modulus conversion chip to after the digital signal that described automatic test equipment exports is converted to analog signal.
Further, each way analog conversion circuit described includes D/A conversion unit and amplifying unit;
Three expanding channels that three inputs of described D/A conversion unit are corresponding with described automatic test equipment respectively, amplifying unit described in the output termination of described D/A conversion unit, the output of described amplifying unit is connected with corresponding described tested modulus conversion chip.
Further, described D/A conversion unit comprises:
Analog-digital chip U1, filter capacitor C1 and filter capacitor C2;
The data input pin SDI of described analog-digital chip U1, clock pin SCLK and chip select pin CS is respectively three inputs of described D/A conversion unit, the digital lower margin DGND ground connection of described analog-digital chip U1, the supply pin VCC of described analog-digital chip U1, the reference voltage pin VREF of described analog-digital chip U1, the first end of described filter capacitor C1 and the first end of described filter capacitor C2 are connected to+5V power supply altogether, the simulation lower margin AGND of described analog-digital chip U1, second end of described filter capacitor C1 and second end of described filter capacitor C2 are connected to ground altogether, the voltage output pin VOUT of described analog-digital chip U1 connects described amplifying unit.
Further, described amplifying unit comprises:
Operational amplifier U2, filter capacitor C3 and filter capacitor C4;
The input pin IN+ of described operational amplifier U2 meets the voltage output pin VOUT of described analog-digital chip U1, the negative supply pin V-of described operational amplifier U2 and the first end of described filter capacitor C3 are connected to-15V power supply altogether, the second end ground connection of described filter capacitor C3, the positive supply pin V+ of described operational amplifier U2 and the first end of described filter capacitor C4 are connected to+15V power supply altogether, the second end ground connection of described filter capacitor C4, the Voltage Feedback pin VOS of described operational amplifier U2 and the output pin OUT of described operational amplifier U2 is connected to described tested modulus conversion chip altogether.
In embodiment of the present utility model, described modulus conversion chip volume production test circuit comprises automatic test equipment and multi-channel digital and analogue change-over circuit, described D/A converting circuit exports tested modulus conversion chip to after the digital signal that described automatic test equipment exports is converted to analog signal, and whether the output that described modulus conversion chip tested by described automatic test equipment correctly can complete test.In embodiment of the present utility model, each way analog conversion circuit only takies three passages of described automatic test equipment, three passages that each way analog conversion circuit takies are different, namely automatic test equipment can connect multi-channel digital and analogue change-over circuit when original port number is constant simultaneously, the corresponding tested modulus conversion chip of each way analog conversion circuit, the chip-count that can simultaneously test is increased, reduces testing cost.
Accompanying drawing explanation
Fig. 1 is the module map of the modulus conversion chip volume production test circuit that the utility model embodiment provides;
Fig. 2 is the circuit diagram of the modulus conversion chip volume production test circuit that the utility model embodiment provides.
Embodiment
In order to make the purpose of this utility model, technical scheme and advantage clearly understand, below in conjunction with drawings and Examples, the utility model is further elaborated.Should be appreciated that specific embodiment described herein only in order to explain the utility model, and be not used in restriction the utility model.
Fig. 1 shows the module map of the modulus conversion chip volume production test circuit that the utility model embodiment provides.For convenience of explanation, illustrate only the part relevant to the utility model embodiment.
A kind of modulus conversion chip volume production test circuit, is connected with multiple tested modulus conversion chip 1, comprises:
Whether correct test lead is connected with the output of multiple tested modulus conversion chip 1, detect multiple tested modulus conversion chip 1 and export automatic test equipment 2;
Multi-channel digital and analogue change-over circuit 3, three expanding channels that three inputs of each way analog conversion circuit 3 are corresponding with automatic test equipment 2 respectively, the output of each way analog conversion circuit 3 connects with the input of corresponding tested modulus conversion chip 1, and D/A converting circuit 3 exports tested modulus conversion chip to after the digital signal that automatic test equipment 2 exports is converted to analog signal.
As an embodiment of the present utility model, tested modulus conversion chip 1 can be successive approximation analog-digital chip.
Fig. 2 shows the circuit diagram of the modulus conversion chip volume production test circuit that the utility model embodiment provides.For convenience of explanation, illustrate only the part relevant to the utility model embodiment.
As shown in Figure 2, each way analog conversion circuit 3 includes D/A conversion unit 31 and amplifying unit 32;
Three passages that three inputs of digital-to-analogue conversion 31 are corresponding with automatic test equipment 2 respectively, the output termination amplifying unit 32 of D/A conversion unit 31, the output of amplifying unit 32 connects with corresponding tested modulus conversion chip 1.
As an embodiment of the present utility model, D/A conversion unit 31 comprises:
Analog-digital chip U1, filter capacitor C1 and filter capacitor C2;
Data input pin SDI, the clock pin SCLK of analog-digital chip U1 and chip select pin CS are respectively three inputs of D/A conversion unit, the digital lower margin DGND ground connection of analog-digital chip U1, the supply pin VCC of analog-digital chip U1, the reference voltage pin VREF of analog-digital chip U1, the first end of filter capacitor C1 and the first end of filter capacitor C2 are connected to+5V power supply altogether, the simulation lower margin AGND of analog-digital chip U1, second end of filter capacitor C1 and second end of filter capacitor C2 are connected to ground altogether, and the voltage output pin VOUT of analog-digital chip U1 connects amplifying unit.
As an embodiment of the present utility model, amplifying unit 32 comprises:
Operational amplifier U2, filter capacitor C3 and filter capacitor C4;
The input pin IN+ of operational amplifier U2 meets the voltage output pin VOUT of analog-digital chip U1, the negative supply pin V-of operational amplifier U2 and the first end of filter capacitor C3 are connected to-15V power supply altogether, the second end ground connection of filter capacitor C3, the positive supply pin V+ of operational amplifier U2 and the first end of filter capacitor C4 are connected to+15V power supply altogether, the second end ground connection of filter capacitor C4, the Voltage Feedback pin VOS of operational amplifier U2 and the output pin OUT of operational amplifier U2 is connected to tested modulus conversion chip altogether.
As an embodiment of the present utility model, the model of analog-digital chip U1 is DACA8830, also can be other models.
As an embodiment of the present utility model, the model of operational amplifier U2 is OP177, also can be other models.
Below in conjunction with concrete operation principle, embodiment of the present utility model is described further:
When testing modulus conversion chip, general test philosophy is: export an analog signal to tested modulus conversion chip by automatic test equipment, tested modulus conversion chip exports after described analog signal is converted to digital signal, got the output valve of tested modulus conversion chip again by automatic test equipment, see whether it just indeed reaches the object of eliminating the false and retaining the true.
In embodiment of the present utility model, when testing tested modulus conversion chip 1, automatic test equipment 2 exports a digital signal to D/A converting circuit 3, described digital signal is converted to analog signal output to amplifying unit 32 by the D/A conversion unit 31 in D/A converting circuit 3, amplifying unit 32 exports tested modulus conversion chip 1 to after amplifying described analog signal, the output valve of tested modulus conversion chip 1 got by automatic test equipment 2, whether correctly detect, the true and false of tested modulus conversion chip 1 can be measured.
In embodiment of the present utility model, described modulus conversion chip volume production test circuit comprises automatic test equipment and multi-channel digital and analogue change-over circuit, described D/A converting circuit exports tested modulus conversion chip to after the digital signal that described automatic test equipment exports is converted to analog signal, and whether the output that described modulus conversion chip tested by described automatic test equipment correctly can complete test.In embodiment of the present utility model, each way analog conversion circuit only takies three passages of described automatic test equipment, three passages that each way analog conversion circuit takies are different, namely automatic test equipment can connect multi-channel digital and analogue change-over circuit when original port number is constant simultaneously, the corresponding tested modulus conversion chip of each way analog conversion circuit, the chip-count that can simultaneously test is increased, reduces testing cost.
The foregoing is only preferred embodiment of the present utility model; not in order to limit the utility model; all do within spirit of the present utility model and principle any amendment, equivalent to replace and improvement etc., all should be included within protection range of the present utility model.
Claims (4)
1. a modulus conversion chip volume production test circuit, is connected with multiple tested modulus conversion chip, it is characterized in that, described modulus conversion chip volume production test circuit comprises:
Test lead is connected with the output of described multiple tested modulus conversion chip, detects the automatic test equipment whether described multiple tested modulus conversion chip output is correct;
Multi-channel digital and analogue change-over circuit, three expanding channels that three inputs of each way analog conversion circuit are corresponding with described automatic test equipment respectively, the output of each way analog conversion circuit connects with the input of corresponding described tested modulus conversion chip, and described D/A converting circuit exports described tested modulus conversion chip to after the digital signal that described automatic test equipment exports is converted to analog signal.
2. modulus conversion chip volume production test circuit as claimed in claim 1, it is characterized in that, each way analog conversion circuit described includes D/A conversion unit and amplifying unit;
Three expanding channels that three inputs of described D/A conversion unit are corresponding with described automatic test equipment respectively, amplifying unit described in the output termination of described D/A conversion unit, the output of described amplifying unit is connected with corresponding described tested modulus conversion chip.
3. modulus conversion chip volume production test circuit as claimed in claim 2, it is characterized in that, described D/A conversion unit comprises:
Analog-digital chip U1, filter capacitor C1 and filter capacitor C2;
The data input pin SDI of described analog-digital chip U1, clock pin SCLK and chip select pin CS is respectively three inputs of described D/A conversion unit, the digital lower margin DGND ground connection of described analog-digital chip U1, the supply pin VCC of described analog-digital chip U1, the reference voltage pin VREF of described analog-digital chip U1, the first end of described filter capacitor C1 and the first end of described filter capacitor C2 are connected to+5V power supply altogether, the simulation lower margin AGND of described analog-digital chip U1, second end of described filter capacitor C1 and second end of described filter capacitor C2 are connected to ground altogether, the voltage output pin VOUT of described analog-digital chip U1 connects described amplifying unit.
4. modulus conversion chip volume production test circuit as claimed in claim 3, it is characterized in that, described amplifying unit comprises:
Operational amplifier U2, filter capacitor C3 and filter capacitor C4;
The input pin IN+ of described operational amplifier U2 meets the voltage output pin VOUT of described analog-digital chip U1, the negative supply pin V-of described operational amplifier U2 and the first end of described filter capacitor C3 are connected to-15V power supply altogether, the second end ground connection of described filter capacitor C3, the positive supply pin V+ of described operational amplifier U2 and the first end of described filter capacitor C4 are connected to+15V power supply altogether, the second end ground connection of described filter capacitor C4, the Voltage Feedback pin VOS of described operational amplifier U2 and the output pin OUT of described operational amplifier U2 is connected to described tested modulus conversion chip altogether.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201520900765.0U CN205123711U (en) | 2015-11-12 | 2015-11-12 | Analog -to -digital conversion chip volume production test circuit |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201520900765.0U CN205123711U (en) | 2015-11-12 | 2015-11-12 | Analog -to -digital conversion chip volume production test circuit |
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| CN205123711U true CN205123711U (en) | 2016-03-30 |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106603074A (en) * | 2016-11-03 | 2017-04-26 | 武汉新芯集成电路制造有限公司 | DAC circuit parallel testing system and parallel testing method |
| CN106990350A (en) * | 2016-11-29 | 2017-07-28 | 珠海市微半导体有限公司 | Inside carries the volume production test module and method of analog-to-digital conversion interface chip |
| CN109765477A (en) * | 2018-12-20 | 2019-05-17 | 西安现代控制技术研究所 | Test equipment for accelerometer signal collection plate |
| CN111398781A (en) * | 2020-03-25 | 2020-07-10 | 合肥悦芯半导体科技有限公司 | Analog chip test circuit and system |
| CN112311393A (en) * | 2019-12-18 | 2021-02-02 | 成都华微电子科技有限公司 | J750-based high-voltage high-precision analog-to-digital converter testing device and method |
-
2015
- 2015-11-12 CN CN201520900765.0U patent/CN205123711U/en active Active
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106603074A (en) * | 2016-11-03 | 2017-04-26 | 武汉新芯集成电路制造有限公司 | DAC circuit parallel testing system and parallel testing method |
| CN106990350A (en) * | 2016-11-29 | 2017-07-28 | 珠海市微半导体有限公司 | Inside carries the volume production test module and method of analog-to-digital conversion interface chip |
| CN109765477A (en) * | 2018-12-20 | 2019-05-17 | 西安现代控制技术研究所 | Test equipment for accelerometer signal collection plate |
| CN109765477B (en) * | 2018-12-20 | 2021-07-02 | 西安现代控制技术研究所 | Test equipment for accelerometer signal acquisition board |
| CN112311393A (en) * | 2019-12-18 | 2021-02-02 | 成都华微电子科技有限公司 | J750-based high-voltage high-precision analog-to-digital converter testing device and method |
| CN112311393B (en) * | 2019-12-18 | 2023-09-29 | 成都华微电子科技股份有限公司 | Testing device and method for high-voltage high-precision analog-to-digital converter based on J750 |
| CN111398781A (en) * | 2020-03-25 | 2020-07-10 | 合肥悦芯半导体科技有限公司 | Analog chip test circuit and system |
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Address after: 518051 Shenzhen Nanshan District, Guangdong Province, Guangdong Province, Yuehai Street High-tech Zone Community Science and Technology South Road 18 Shenzhen Bay Science and Technology Eco-Park 12 Skirt Building 732 Patentee after: Shenzhen Bojuxing Microelectronics Technology Co., Ltd. Address before: 518000 4th Floor, Building D, New Material Port, No. 2 Changyuan, Zhongxin Road, Nanshan District, Shenzhen City, Guangdong Province Patentee before: Shenzhen Bojuxing Industrial Development Co., Ltd. |