CN205102776U - Measurement system is interfered to heterodyne convenient to adjust splitting ratio - Google Patents
Measurement system is interfered to heterodyne convenient to adjust splitting ratio Download PDFInfo
- Publication number
- CN205102776U CN205102776U CN201520902729.8U CN201520902729U CN205102776U CN 205102776 U CN205102776 U CN 205102776U CN 201520902729 U CN201520902729 U CN 201520902729U CN 205102776 U CN205102776 U CN 205102776U
- Authority
- CN
- China
- Prior art keywords
- light
- acousto
- measurement
- frequency shifters
- wave plate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Landscapes
- Instruments For Measurement Of Length By Optical Means (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
The utility model discloses a measurement system is interfered to heterodyne convenient to adjust splitting ratio, including laser instrument, polarization splitting prism and photoelectric detector, the front end of laser instrument is provided with the reputation frequency shifter, measures light, one -level diffraction light as the reference light through the zero level light conduct that the reputation frequency shifter produced, measurement light shines on the measured object through polarization splitting prism, 14 wave plates in proper order, shines on convex lens after polarization splitting prism's reflection through 14 wave plates of measurement light transmission that reflect again, the reference light shines on convex lens through reflection, 12 wave plates of speculum in proper order. The utility model discloses a measurement system is interfered to the heterodyne, utilizes zero level light sum one -level diffraction light that the reputation frequency shifter produced respectively as measuring the light sum reference light, need not to set up the beam splitting arrangement, can conveniently change the splitting ratio through adjusting reputation frequency shifter drive circuit, and it is close with the light intensity of measuring light to make the reference light, acquires better interference effect, has improved measurement accuracy, and the optics spare of adoption is less, and beneficial effect is showing.
Description
Technical field
The utility model relates to laser interferometry field, is specifically related to a kind of acousto-optic frequency shifters that adopts to regulate the heterodyne interferometry system of the splitting ratio of reference light and measurement light.
Background technology
Laser interferometry, owing to having noncontact, high-precision advantage, is widely used in engineering reality, especially in fields such as displacement, velocity survey and vibration surveys.Process of heterodyning is a kind of method of interferometry, and it makes reference light produce certain difference on the frequency with measurement light thus introduce carrier wave, and the measured signal of interference is transmitted, by photoelectric detector by this carrier wave exactly.This method can completely cut off the DC level drift caused due to external environmental interference.In difference interference, the general Amici prism that adopts is as beam splitting arrangement, the laser sent by laser instrument is divided into reference light and measures light, due to reference light and measurement Guang Bugong road, have decay in various degree, especially the measurement light returned after measured object reflection, by deep fades, for ensureing good interference effect, needs to regulate the splitting ratio of reference light and measurement light, the light intensity of the reference light that detector is received and measurement light is close, to obtain good interference effect.The adjustment of splitting ratio is generally realized by the element directly adjusted in light path.For high-precision heterodyne interferometry system, in measuring process, measurement difficulty is added to the adjustment of light path element, and be difficult to the stability of guarantee system, affect measuring accuracy.
Existing Chinese patent literature CN201020134455 discloses a kind of heterodyne laser interferometer light path, this method adopts polarizing beam splitter to carry out light splitting to the laser that laser instrument sends, be divided into reference light and measure light, adopt acousto-optic frequency shifters to modulate reference light, modulated reference light and the measurement light that reflects through measured object again through another polarizing beam splitter close bundle interfere laggard enter photodetector.This method needs rotary laser or laser emitting end element to change the polarization direction of linearly polarized light when regulating splitting ratio, thus utilizes the characteristic of polarizing beam splitter to change splitting ratio, and adjustment process is more complicated.And in light path, employ more optical element, cause the efficiency of light energy utilization low, light channel structure takes up space comparatively large, and stability of layout is poor.
Summary of the invention
The utility model, in order to overcome the shortcoming of above-mentioned technical matters, provides a kind of heterodyne interferometry system being convenient to regulate splitting ratio.
The heterodyne interferometry system being convenient to adjustment splitting ratio of the present utility model, comprise laser instrument, polarization splitting prism and photodetector, laser instrument is used for sending linearly polarized light, and photodetector is used for light signal to be converted into electric signal, and the front end of photodetector is provided with convex lens; Its special feature is: the front end of laser instrument is provided with the acousto-optic frequency shifters of its linearly polarized light sent being carried out to acousto-optic interaction, acousto-optic frequency shifters is connected with acousto-optic frequency shifters driving circuit, linearly polarized light is after acousto-optic frequency shifters effect, the zero order light produced is as measurement light, the first-order diffraction light produced is as reference light, acousto-optic frequency shifters driving circuit is by controlling the parameter of the sound wave of acousto-optic frequency shifters generation, and the zero order light produce polarized light and the splitting ratio of first-order diffraction light control;
Laser instrument, acousto-optic frequency shifters and polarization splitting prism are located along the same line, quarter wave plate is provided with between polarization splitting prism and measured object, measuring light irradiates on measured object through polarization splitting prism, quarter wave plate successively, and the measurement light transmission quarter wave plate through measured object reflection irradiates on convex lens after the reflection of polarization splitting prism again; The front end of photodetector is provided with catoptron, is provided with 1/2 wave plate between catoptron and photodetector, and reference light irradiates on convex lens successively after the rotation of the reflection of catoptron, 1/2 wave plate; Measurement light and reference light are converged at photodetector surfaces and interfere by convex lens, and the light signal interfered is converted into electric signal by photodetector, to realize the measurement of measured object characteristic.
The heterodyne interferometry system being convenient to adjustment splitting ratio of the present utility model, the angle between the direction of the axial plane of described 1/2 wave plate and the polarization direction of reference light is 45 °, to realize the rotation to reference light 90 °; Polarization splitting prism is in order to greatest extent and measures the orientation of light transmission, direction and the angle measured between polarisation of light direction of the axial plane of quarter wave plate are 45 °, to make the measurement light reflected through measured object again through 90 ° of rotations can occur after quarter wave plate, there are 90 ° of measurement light rotated and can not pass through polarization splitting prism, and reflexed on convex lens by it.
The heterodyne interferometry system being convenient to adjustment splitting ratio of the present utility model, the characteristic of the measured object of measurement comprises displacement, speed and vibration information.
The heterodyne interferometry system being convenient to adjustment splitting ratio of the present utility model, described polarization splitting prism is formed by a pair right-angle prism gummed, on the inclined-plane of a right-angle prism, degree has metal dielectric-coating, and metal dielectric-coating is optionally through P polarized component and the S polarized component of incident light; The optical surface of right-angle prism is coated with broadband anti-reflection film, to improve the transmissivity of respective wavelength.
The heterodyne interferometry system being convenient to adjustment splitting ratio of the present utility model, described acousto-optic frequency shifters is Bragg diffraction acousto-optic modulator.
The beneficial effects of the utility model are: heterodyne interferometry system of the present utility model, by the acousto-optic interaction of acousto-optic frequency shifters to the linearly polarized light that laser instrument sends, utilize the zero order light and first-order diffraction light that produce respectively as measurement light and reference light, no longer need other beam splitting arrangement light splitting, less optical element is adopted in light path, improve transmitance and the efficiency of light energy utilization of laser, be conducive to the interference of measuring light and reference light, make the measurement of measured object more accurate.Splitting ratio can be regulated by acousto-optic frequency shifters external drive circuit, the light intensity of the reference light that photoelectric detector is arrived and measurement light is close, to produce good interference effect, avoid in measuring process the problem needing to regulate light path element simultaneously, have more practicality.Make simultaneously whole system have less, gentlier, just more stable structure, use convenient.
Accompanying drawing explanation
Fig. 1 is the structural representation of heterodyne interferometry system of the present utility model.
In figure: 1 laser instrument, 2 acousto-optic frequency shifters, 3 catoptrons, 41/2 wave plate, 51/4 wave plate, 6 measured objects, 7 acousto-optic frequency shifters driving circuits, 8 convex lens, 9 photodetectors, 10 polarization splitting prisms.
Embodiment
Below in conjunction with accompanying drawing and embodiment, the utility model is described in further detail.
As shown in Figure 1, give the structural representation of heterodyne interferometry system of the present utility model, it comprises laser instrument 1, acousto-optic frequency shifters 2, acousto-optic frequency shifters driving circuit 7, polarization splitting prism 10, quarter wave plate 5, catoptron 3,1/2 wave plate 4, convex lens 8, photodetector 9; Laser instrument 1 is for generation of linearly polarized light, laser instrument 1, acousto-optic frequency shifters 2, polarization splitting prism 10, quarter wave plate 5 are located along the same line, after linearly polarized light irradiates in acousto-optic frequency shifters 2, zero order light and first-order diffraction light is produced after the acousto-optic interaction of acousto-optic frequency shifters 2, zero order light is as measurement light, and first-order diffraction light is as reference light.Acousto-optic frequency shifters driving circuit 7 can control the sound wave that acousto-optic frequency shifters 2 produces, the splitting ratio of the zero order light produced to regulate linearly polarized light and first-order diffraction light, to obtain the good interference effect measuring light and reference light.
As measuring the zero order light of light successively through after polarization splitting prism 10 and quarter wave plate 5, irradiate on measured object 6, polarization splitting prism 10 is according to fixing through the form measuring light to greatest extent, to make the direction of vibration of measurement light consistent with the direction of vibration of polarization splitting prism transmitting P-type polarisation component, to ensure more Transmission light.Direction and the direction of vibration angle at 45 ° measuring light of quarter wave plate 5 axial plane, after measuring light transmission quarter wave plate 5, become circularly polarized light from linearly polarized light, circularly polarized light irradiates on measured object 6,, again there are 90 ° of rotations through after quarter wave plate 5 in rotation direction reversion after measured object 6 reflects.There are 90 ° of measurement illumination rotated to penetrate after on polarization splitting prism 10, can not through polarization splitting prism 10, but almost be reflexed on convex lens 8 completely.
Catoptron 3 is positioned at the top of convex lens 8, and 1/2 wave plate 4 is between convex lens 8 and catoptron 3, and catoptron 3 reflects as the first-order diffraction light with reference to light, and the reference light after reflection irradiates on convex lens 8 through after 1/2 wave plate 4.The form that 1/2 wave plate 4 is 45 ° of angles according to the direction of its axial plane and the polarization direction of reference light is arranged, and like this, reference light, through 90 ° of rotations can occur after 1/2 wave plate 4, with the consistance kept with measure light polarization direction, meets the condition producing and interfere.
Through polarization splitting prism 10 occur measurement light, all irradiate on convex lens 8 through the reference light of 1/2 wave plate 4, convex lens 8 are by the surface measuring light, reference light converges at photodetector 9, interfere at the measurement light of photodetector 9 surfaces converge and reference light, the diffraction efficiency of acousto-optic frequency shifters 2 can be controlled by acousto-optic frequency shifters driving circuit, and then change reference light and the splitting ratio measuring light, the light intensity of the reference light that photodetector 9 is received and measurement light is close, to produce good interference effect.Kinetic characteristic (as displacement, speed, vibration etc.) due to measured object 6 can affect the frequency of the measurement light irradiated on convex lens 8, and then the interference effect of impact and reference light, finally can affect the electric signal that photodetector transforms, by to the collection of electric signal and measurement, realize the measurement to measured object 6 characteristic.
Polarization splitting prism 10 is formed by a pair right-angle prism gummed, and on the inclined-plane of a right-angle prism, degree has metal dielectric-coating, and metal dielectric-coating is optionally through P polarized component and the S polarized component of incident light; The optical surface of right-angle prism is coated with broadband anti-reflection film, to improve the transmissivity of respective wavelength.Acousto-optic frequency shifters 2 is Bragg diffraction acousto-optic modulator.
Claims (5)
1. be convenient to the heterodyne interferometry system regulating splitting ratio for one kind, comprise laser instrument (1), polarization splitting prism (10) and photodetector (9), laser instrument is used for sending linearly polarized light, photodetector is used for light signal to be converted into electric signal, and the front end of photodetector is provided with convex lens; It is characterized in that: the front end of laser instrument is provided with the acousto-optic frequency shifters (2) of its linearly polarized light sent being carried out to acousto-optic interaction, acousto-optic frequency shifters is connected with acousto-optic frequency shifters driving circuit, linearly polarized light is after acousto-optic frequency shifters effect, the zero order light produced is as measurement light, the first-order diffraction light produced is as reference light, acousto-optic frequency shifters driving circuit is by controlling the parameter of the sound wave of acousto-optic frequency shifters generation, and the zero order light produce polarized light and the splitting ratio of first-order diffraction light control;
Laser instrument, acousto-optic frequency shifters and polarization splitting prism are located along the same line, quarter wave plate (5) is provided with between polarization splitting prism and measured object (6), measuring light irradiates on measured object through polarization splitting prism, quarter wave plate successively, and the measurement light transmission quarter wave plate through measured object reflection irradiates again on convex lens (8) after the reflection of polarization splitting prism; The front end of photodetector is provided with catoptron (3), is provided with 1/2 wave plate (4) between catoptron and photodetector, and reference light irradiates on convex lens successively after the rotation of the reflection of catoptron, 1/2 wave plate; Measurement light and reference light are converged at photodetector surfaces and interfere by convex lens, and the light signal interfered is converted into electric signal by photodetector, to realize the measurement of measured object characteristic.
2. the heterodyne interferometry system being convenient to adjustment splitting ratio according to claim 1, is characterized in that: the angle between the direction of the axial plane of described 1/2 wave plate (4) and the polarization direction of reference light is 45 °, to realize the rotation to reference light 90 °; Polarization splitting prism (10) is in order to greatest extent and measures the orientation of light transmission, direction and the angle measured between polarisation of light direction of the axial plane of quarter wave plate are 45 °, to make the measurement light reflected through measured object (6) again through 90 ° of rotations can occur after quarter wave plate, there are 90 ° of measurement light rotated and can not pass through polarization splitting prism, and reflexed on convex lens (8) by it.
3. the heterodyne interferometry system being convenient to adjustment splitting ratio according to claim 1 and 2, is characterized in that: the characteristic of the measured object of measurement comprises displacement, speed and vibration information.
4. the heterodyne interferometry system being convenient to adjustment splitting ratio according to claim 1 and 2, it is characterized in that: described polarization splitting prism (10) is formed by a pair right-angle prism gummed, on the inclined-plane of a right-angle prism, degree has metal dielectric-coating, and metal dielectric-coating is optionally through P polarized component and the S polarized component of incident light; The optical surface of right-angle prism is coated with broadband anti-reflection film, to improve the transmissivity of respective wavelength.
5. the heterodyne interferometry system being convenient to adjustment splitting ratio according to claim 1 and 2, is characterized in that: described acousto-optic frequency shifters (2) is Bragg diffraction acousto-optic modulator; Acousto-optic frequency shifters driving circuit changes reference light and the splitting ratio measuring light by the diffraction efficiency controlling acousto-optic frequency shifters, and the light intensity of the reference light that photodetector (9) is received and measurement light is close, to produce good interference effect.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520902729.8U CN205102776U (en) | 2015-11-13 | 2015-11-13 | Measurement system is interfered to heterodyne convenient to adjust splitting ratio |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520902729.8U CN205102776U (en) | 2015-11-13 | 2015-11-13 | Measurement system is interfered to heterodyne convenient to adjust splitting ratio |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN205102776U true CN205102776U (en) | 2016-03-23 |
Family
ID=55518553
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201520902729.8U Active CN205102776U (en) | 2015-11-13 | 2015-11-13 | Measurement system is interfered to heterodyne convenient to adjust splitting ratio |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN205102776U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105300274A (en) * | 2015-11-13 | 2016-02-03 | 山东神戎电子股份有限公司 | Heterodyne interference measuring system convenient in splitting ratio adjustment |
-
2015
- 2015-11-13 CN CN201520902729.8U patent/CN205102776U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105300274A (en) * | 2015-11-13 | 2016-02-03 | 山东神戎电子股份有限公司 | Heterodyne interference measuring system convenient in splitting ratio adjustment |
| CN105300274B (en) * | 2015-11-13 | 2018-06-12 | 山东神戎电子股份有限公司 | A kind of heterodyne interferometry system convenient for adjusting splitting ratio |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN102183234B (en) | Method and device for measuring frequency scanning absolute distance based on femtosecond optical frequency comb | |
| CN104897270B (en) | Michelson heterodyne laser vialog based on monophone light modulation and polarization spectro | |
| CN110411335A (en) | Differential type sinusoidal phase modulation laser interference surface nanometer-displacement device and method | |
| CN101446687B (en) | Collinear femto-second laser polarized pump detecting system | |
| CN102175430B (en) | Device and method for measuring 1/8 wave plate phase retardation and fast axis azimuth angle | |
| CN101413783A (en) | Double-frequency laser interferometry apparatus | |
| CN102878938A (en) | Optical reading head based on diffraction grating | |
| CN105300274A (en) | Heterodyne interference measuring system convenient in splitting ratio adjustment | |
| CN105785386B (en) | High-precision FM-CW laser ranging system based on F P etalons | |
| CN110716397B (en) | Exposure light beam phase measuring method in laser interference photoetching and photoetching system | |
| CN103308150B (en) | A kind of whole audience vibration measurement with laser system | |
| CN104914444A (en) | Long-distance laser heterodyne interference range-finding structure | |
| CN105157576A (en) | Laser measuring device and method capable of achieving three-dimensional displacement measurement | |
| CN202033175U (en) | Measuring device of phase retardation and fast axis azimuth of one-eighth wave plate | |
| CN105333814A (en) | Phase modulation type laser feedback raster interferometer and measuring method thereof | |
| CN104729411A (en) | High-resolution grating interferometer based on high-density gratings | |
| CN105547197A (en) | Method and device for simultaneously measuring angle and vibration based on laser self mixing interference | |
| CN203324388U (en) | Optical crystal electric field sensor based on DFB laser | |
| CN103091681A (en) | Continuous wave with frequency modulation interferometer based on multiple refection technology | |
| CN103292891B (en) | Optical fiber type synchronous tunable vibration measurement system | |
| CN102410809B (en) | Complete common-path type microchip laser feedback interferometer | |
| CN104931833A (en) | Photoelectric detector amplitude-frequency response calibration method | |
| CN105698710B (en) | A dynamic angle measurement apparatus and application thereof | |
| CN107941353B (en) | Two-photon correlation-based coherent vortex topology charge measurement method | |
| CN205102776U (en) | Measurement system is interfered to heterodyne convenient to adjust splitting ratio |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant |