CN205080072U - Big cross -section heavy gauge infrared glass internal defect detection device - Google Patents
Big cross -section heavy gauge infrared glass internal defect detection device Download PDFInfo
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- CN205080072U CN205080072U CN201520775792.XU CN201520775792U CN205080072U CN 205080072 U CN205080072 U CN 205080072U CN 201520775792 U CN201520775792 U CN 201520775792U CN 205080072 U CN205080072 U CN 205080072U
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Abstract
The utility model discloses a big cross -section heavy gauge infrared glass internal defect detection device, including parallel light source, a horizontal objective table for placing surveyed the infrared glass sample, the infrared camera lens that can focus, a turret and infrared imaging core for infrared camera lens is focused, parallel light source, optical axis of infrared camera lens and the sharing of infrared imaging core, the infrared parallel light of parallel light source outgoing pierces through and is arrived infrared camera lens behind survey infrared glass sample and the horizontal objective table, form a formation of image facula by infrared camera lens, and carry out the sensitization formation of image and send image signal to computer by the infrared imaging core, it handles to accomplish video image by the computer. Its advantage can realize big cross -section heavy gauge glass formation of image, and clear formation of image has been realized to the light exposure and the outer carousel of frame that the combine the high depth of parallelism in addition regulative mode of focusing.
Description
Technical field
The utility model relates to a kind of infrared glass detection field, particularly relates to a kind of heavy in section heavy thickness infrared glass Inner Defect Testing device.
Background technology
Along with the extensive application of thermal infrared imager and lll night vision equipment, the demand of some heavy in section heavy thickness (diameter >=70mm, thickness >=5mm) glass is increasing.And the detection of infrared glass inherent vice (as striped, crackle, crystallization, impurity, phase-splitting, cavity etc.) just becomes quality control very important link.
Current domestic discloseder inside glass defect detecting devices and process patent and document, detect for infrared glass and often there are some problems.And along with the large-scale application of infrared glass technology, clearly detect that heavy in section infrared glass inherent vice becomes a difficult problem.
As utility model patent CN102175690A, realize source of parallel light simply by a pipe, source parallel degree and homogeneity not high enough, concerning the infrared glass image checking of heavy thickness, detected image imaging definition is lower, and Detection results is poor; As utility model patent CN102226771A needs the polarizer and analyzer, structure is comparatively complicated.And above two patented technologies, once tested glass section diameter is greater than 70mm, just require that source of parallel light area size and lens opening size are greater than 70mm, so large source of parallel light and lens design are processed all more difficult, and testing cost is high; As current digit microscope is used for visual light imaging, and adopt non-collimated light sources more, such light source is used for heavy thickness and the material with certain absorptivity carries out internal imaging detected image sharpness can greatly reduce, Detection results is poor, for infrared glass Inner Defect Testing, wave band is undesirable again.Therefore, digit microscope is also improper for infrared glass Inner Defect Testing.
Utility model content
Technical problem to be solved in the utility model is to provide a kind of heavy in section heavy thickness infrared glass Inner Defect Testing device.
The utility model solves the problems of the technologies described above adopted technical scheme: a kind of heavy in section heavy thickness infrared glass Inner Defect Testing device, it is characterized in that comprising source of parallel light, for placing the horizontal objective table of tested infrared glass sample, the infrared lens that can focus, for turret and the infrared imaging movement of infrared lens focusing, source of parallel light, infrared lens and infrared imaging movement share an optical axis, infrared lens is arrived after the infrared directional light of source of parallel light outgoing penetrates tested infrared glass sample and horizontal objective table, an imaging facula is formed by infrared lens, and carry out photosensitive imaging by infrared imaging movement and picture signal is delivered to computing machine, Computer Vision is completed by computing machine.
The further preferred version of the utility model is: source of parallel light is that a beam divergence is less than below 0.5mrad and the infrared source of parallel light of power adjustable, and the clear aperature of source of parallel light is greater than the clear aperature of infrared lens.
The further preferred version of the utility model is: horizontal objective table comprises pedestal, described pedestal can move along in X-axis and Y-axis both direction in the horizontal plane, have a diameter in pedestal be greater than the through hole of 35mm and be positioned at the zero defect glass plate of a saturating infrared light above this through hole, tested infrared glass sample is positioned over described zero defect glass plate.
The further preferred version of the utility model is: described source of parallel light connects driving power module, working current display screen and power governor.
The further preferred version of the utility model is: infrared lens, infrared imaging movement and driving power module are positioned at base inner, control panel is positioned at the upper end of support, and working current display screen and the power adjustments button be connected with power governor are positioned on control panel.
The further preferred version of the utility model is: turret is one and is enclosed within disk free to rotate on infrared lens, this disk outward flange some expose from the housing of support, the central shaft of disk and the central shaft of infrared lens coaxial, disk outside surface is carved with anti-skidding annular knurl.
The further preferred version of the utility model is: described infrared imaging movement is infrared CMOS or infrared CCD.
Compared with prior art, the infrared directional light of infrared light supply outgoing of the present utility model penetrates tested infrared glass sample, glass for infrared rays plate on horizontal objective table and through hole, arrive infrared lens, an imaging facula is formed by infrared lens, and infrared imaging movement carries out photosensitive imaging, picture signal delivers to calculating the most at last, completes Computer Vision by computing machine.When the directional light light of infrared light supply outgoing is through after tested infrared glass sample, if inside glass uneven components, striped, crackle, crystallization, impurity, phase-splitting, during the situations such as cavity, inside glass spatial points can be caused the difference of infrared Absorption, thus perpendicular to the image plane of optical axis being formed intensity inequality, this image converges in imaging on infrared imaging movement photosurface through infrared lens, thus formation one width reflects the picture signal of tested inside glass defect, picture signal is after machine carries out Computer Vision as calculated, can be shown on computer screen.
The utility model has the advantage of the thickness and absorptivity difference of considering tested infrared glass, in order to the needs of satisfied test heavy thickness infrared glass, be provided with the source of parallel light of a power adjustable joint in the utility model, carry out the convenient scope light intensity through tested infrared glass being adjusted to the imaging of applicable infrared imaging movement; For infrared imaging movement, if light intensity is crossed can cause gradation of image saturation distortion by force, cause the photosurface of imaging movement cannot be photosensitive if light intensity crosses weak meeting, that situation all can not obtain infrared glass inherent vice image.The utility model is powered to source of parallel light by driving power module, light source power is achieved easily adjustable by adjusting knob, and by the working current during work of display screen display light source, image ratio shown on computer screen is more clear, and Detection results is good.
Accompanying drawing explanation
Fig. 1 is structural drawing of the present utility model;
Fig. 2 is the structural representation of horizontal objective table;
Fig. 3 is source of parallel light aperture in imaging process and infrared lens aperture relation schematic diagram;
Fig. 4 is turret positional structure schematic diagram.
Embodiment
Below in conjunction with accompanying drawing embodiment, the utility model is described in further detail.
A kind of heavy in section heavy thickness infrared glass inherent vice becomes pick-up unit, comprises source of parallel light 1, horizontal objective table 3, infrared lens 4, turret 5, infrared imaging movement 6, support 7, control panel 71, computing machine 8, and tested glass sample 2.Tested infrared glass sample 2 is seated on horizontal objective table 3, and source of parallel light 1 shares an optical axis with infrared lens 4, turret 5, infrared imaging movement 6.Source of parallel light 1 connects driving power module 11, working current display screen 12, and power governor 13.It is inner that infrared lens 4, infrared imaging movement 6 and driving power module 11 are positioned at support 7, and control panel 71 is in the upper end of support 7, and be an oblique edge-on panel, working current display screen 12 and power governor 13 are positioned on control panel.Infrared imaging movement 6 connects computing machine 8.
Source of parallel light 1 is that a beam divergence is less than below 0.5mrad, the infrared source of parallel light of power adjustable, and the clear aperature of source of parallel light 1 is greater than the clear aperature of infrared lens 4.Turret 5 is a disk being enclosed within infrared lens 4, disk outward flange some be exposed to the outside of support 7, the central shaft of disk and the central shaft of camera lens 4 coaxial, anti-skidding annular knurl is carved with on surface, and turret can freely rotate.Horizontal objective table 3 can move along X and Y-axis both direction in the horizontal plane, and central authorities have a diameter to be greater than the through hole 31 of 35mm, and through hole upper surface is covered by the zero defect glass plate 32 of a saturating infrared light.Described infrared lens 4 is can focus lens.Infrared imaging movement 6 is infrared CMOS or infrared CCD.
As shown in Figure 1, the infrared directional light of infrared light supply 1 outgoing penetrates tested infrared glass sample 2, glass for infrared rays plate 32 on horizontal objective table 3 and through hole 31, arrive infrared lens 4, an imaging facula is formed by infrared lens 4, and infrared imaging movement 6 carries out photosensitive imaging, picture signal delivers to calculating 8 the most at last, completes Computer Vision by computing machine.The structure of horizontal objective table 3 as shown in Figure 2.
When the directional light light of infrared light supply 1 outgoing is through after tested infrared glass sample 2, if inside glass uneven components, striped, crackle, crystallization, impurity, phase-splitting, during the situations such as cavity, inside glass spatial points can be caused the difference of infrared Absorption, thus in the plane perpendicular to optical axis 9, form the image of intensity inequality, this image converges in imaging on infrared imaging movement 6 photosurface 61 through infrared lens 4, thus formation one width reflects the picture signal of tested inside glass defect, picture signal is after machine 8 carries out Computer Vision as calculated, can be shown on computer screen.
For infrared lens 4, measured target is equivalent to the incident imaging of directional light, therefore only have with infrared lens 4 coaxial, and the directional light hot spot of the border circular areas that aperture is equal just can enter into infrared lens imaging, directional light beyond the clear aperature 41 of namely infrared lens 4 cannot enter into infrared lens and produce imaging effect, as shown in Figure 3.Therefore, in order to utilize the finite aperture of infrared lens to greatest extent, to two conditions below heavy in section glass imaging demand fulfillment:
1) clear aperature 14 of source of parallel light 1 must be greater than the clear aperature 41 of infrared lens 4;
2) moved along X and Y-direction by mobile and horizontal objective table 3, horizontal priming infrared glass, allows each surface area of heavy in section infrared glass can be penetrated imaging by infrared parallel rays.
Therefore, the utility model is by horizontal objective table 3 two-dimensional movement in the horizontal plane, and realizing tested infrared glass 2 arbitrary region can be shone through by source of parallel light, and by the object of infrared imaging movement 6 imaging.Like this by horizontal shift, just achieve the object that each place, inside glass space, heavy in section can be imaged detection.
And it is highly important that, consider that tested infrared glass 2 has certain thickness, plurality of layers can be divided in theory by glass through-thickness, in order to carry out blur-free imaging to every one deck, need infrared lens 4 can focal adjustment, allow measured target blur-free imaging on the photosurface of infrared imaging movement 6.For this reason, the utility model realizes the object of focal adjustment by the rotation being enclosed within the turret 5 outside infrared lens 4, thus carries out shape library imaging to multiple horizontal beddings of infrared glass 2.Rotating disk 5 has part edge to be exposed to the outside of support 7, is convenient to hand switch and moves, conveniently allow infrared lens 4 focus into sharply defined image.Turret positional structure schematic diagram as shown in Figure 4.
Consider that thickness and the absorptivity of tested infrared glass 2 are different, need the source of parallel light 1 of a power adjustable joint to carry out the convenient scope light intensity through tested infrared glass 2 being adjusted to the imaging of applicable infrared imaging movement 6.For infrared imaging movement 6, if light intensity is crossed can cause gradation of image saturation distortion by force, cause the photosurface of imaging movement cannot be photosensitive if light intensity crosses weak meeting, that situation all can not obtain infrared glass inherent vice image.The utility model powers to source of parallel light 1 by driving power module 11, achieves light source power easily adjustable by adjusting knob 13, and by the working current during work of display screen 12 display light source.Driving power module 11 and adjusting knob 13 are positioned on oblique edge-on panel 71, as shown in Figure 4.
Above a kind of heavy in section provided by the utility model heavy thickness infrared glass Inner Defect Testing device is described in detail, apply specific case herein to set forth principle of the present utility model and embodiment, the explanation of above embodiment just understands the utility model and core concept for helping.Should be understood that; for those skilled in the art; under the prerequisite not departing from the utility model principle, can also carry out some improvement and modification to the utility model, these improve and modify and also fall in the protection domain of the utility model claim.
Claims (7)
1. a heavy in section heavy thickness infrared glass Inner Defect Testing device, it is characterized in that comprising source of parallel light, for placing the horizontal objective table of tested infrared glass sample, the infrared lens that can focus, for turret and the infrared imaging movement of infrared lens focusing, source of parallel light, infrared lens and infrared imaging movement share an optical axis, infrared lens is arrived after the infrared directional light of source of parallel light outgoing penetrates tested infrared glass sample and horizontal objective table, an imaging facula is formed by infrared lens, and carry out photosensitive imaging by infrared imaging movement and picture signal is delivered to computing machine, Computer Vision is completed by computing machine.
2. a kind of heavy in section according to claim 1 heavy thickness infrared glass Inner Defect Testing device, it is characterized in that source of parallel light is that a beam divergence is less than below 0.5mrad and the infrared source of parallel light of power adjustable, and the clear aperature of source of parallel light is greater than the clear aperature of infrared lens.
3. a kind of heavy in section according to claim 1 heavy thickness infrared glass Inner Defect Testing device, it is characterized in that turret is one and is enclosed within disk free to rotate on infrared lens, this disk outward flange some expose from the housing of support, the central shaft of disk and the central shaft of infrared lens coaxial, disk outside surface is carved with anti-skidding annular knurl.
4. a kind of heavy in section according to claim 1 heavy thickness infrared glass Inner Defect Testing device, it is characterized in that horizontal objective table comprises pedestal, described pedestal can move along in X-axis and Y-axis both direction in the horizontal plane, have a diameter in pedestal be greater than the through hole of 35mm and be positioned at the zero defect glass plate of a saturating infrared light above this through hole, tested infrared glass sample is positioned on described zero defect glass plate.
5. a kind of heavy in section according to claim 1 heavy thickness infrared glass Inner Defect Testing device, is characterized in that described source of parallel light connects driving power module, working current display screen and power governor.
6. a kind of heavy in section according to claim 5 heavy thickness infrared glass Inner Defect Testing device, it is characterized in that infrared lens, infrared imaging movement and driving power module are positioned at base inner, control panel is positioned at the upper end of support, and working current display screen and the power adjustments button be connected with power governor are positioned on control panel.
7. a kind of heavy in section according to claim 1 heavy thickness infrared glass Inner Defect Testing device, is characterized in that described infrared imaging movement is infrared CMOS or infrared CCD.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520775792.XU CN205080072U (en) | 2015-10-08 | 2015-10-08 | Big cross -section heavy gauge infrared glass internal defect detection device |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201520775792.XU CN205080072U (en) | 2015-10-08 | 2015-10-08 | Big cross -section heavy gauge infrared glass internal defect detection device |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105158277A (en) * | 2015-10-08 | 2015-12-16 | 吴礼刚 | Detecting device for internal defects of large-section and big-thickness infrared glass |
| CN106226270A (en) * | 2016-07-01 | 2016-12-14 | 深圳市顶点视觉自动化技术有限公司 | The method of the detection dirty defect of image sensor surface |
-
2015
- 2015-10-08 CN CN201520775792.XU patent/CN205080072U/en active Active
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105158277A (en) * | 2015-10-08 | 2015-12-16 | 吴礼刚 | Detecting device for internal defects of large-section and big-thickness infrared glass |
| CN105158277B (en) * | 2015-10-08 | 2018-06-29 | 宁波阿贝尼红外技术有限公司 | A kind of big thickness infrared glass Inner Defect Testing device in big section |
| CN106226270A (en) * | 2016-07-01 | 2016-12-14 | 深圳市顶点视觉自动化技术有限公司 | The method of the detection dirty defect of image sensor surface |
| CN106226270B (en) * | 2016-07-01 | 2019-07-19 | 深圳睿晟自动化技术有限公司 | The method of the dirty defect of detection image sensor surface |
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