CN204926067U - Embedded vxWorks product test system - Google Patents
Embedded vxWorks product test system Download PDFInfo
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- CN204926067U CN204926067U CN201520678518.0U CN201520678518U CN204926067U CN 204926067 U CN204926067 U CN 204926067U CN 201520678518 U CN201520678518 U CN 201520678518U CN 204926067 U CN204926067 U CN 204926067U
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- 238000012360 testing method Methods 0.000 title claims abstract description 43
- 238000011161 development Methods 0.000 claims abstract description 21
- 238000010030 laminating Methods 0.000 claims abstract description 4
- 238000012956 testing procedure Methods 0.000 abstract description 3
- 208000035126 Facies Diseases 0.000 abstract 1
- 238000013522 software testing Methods 0.000 abstract 1
- 230000018109 developmental process Effects 0.000 description 18
- 238000000034 method Methods 0.000 description 4
- 238000004590 computer program Methods 0.000 description 3
- 238000001816 cooling Methods 0.000 description 3
- 238000013461 design Methods 0.000 description 3
- 230000009286 beneficial effect Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000013307 optical fiber Substances 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 230000033772 system development Effects 0.000 description 1
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Abstract
The utility model relates to an embedded vxWorks product test system, the system include the shell, set up the vxWorks development board in the shell and the PCIe that sets up in the shell carries the card, the shell on be provided with radiator fan, the system still include PCIe connector and bus interface, the PCIe connector and bus interface set up in the shell on, the shell include first cuboid shell and highly be lighter than the second cuboid shell of first cuboid shell, second cuboid shell first side laminating with the first side of first cuboid shell, just first cuboid shell with the outer shell facies of second cuboid have a perfect understanding. Adopt the embedded vxWorks product test system of this kind of structure, the user need not to consider that embedded product surveys system's internal environment and build, simplifies the testing procedure, improves efficiency of software testing, and the range of application is extensive.
Description
Technical field
The utility model relates to automatic field, particularly relates to product test, specifically refers to a kind of embedded VxWorks product testing system.
Background technology
PCIe bus is mainly used in the field such as instrument and robotization, due to open architecture and ripe system, at present, the embedded system of Based PC Ie becomes builds first-selection that is middle-size and small-size, low price test macro, and the DUT of Based PC Ie bus standard, when developing under VxWorks or test, actual hardware is built more loaded down with trivial details, does not adopt integrated design.As shown in Figure 1, it is only connected one by one by required assembly according to topological demand that early stage hardware environment is built, such as DUT carries card by PCIe and is directly connected with VxWorks development board, and DUT and VxWorks development board do not consider that cooling system carries out cooling process etc.
There are the following problems for the product survey environment of traditional Based PC Ie:
1, tested DUT is directly connected with VxWorks development board by fixing PCI e support plate, repeatedly easily causes VxWorks development board PCIe slot deformed damaged after plug.
When 2, doing the test of environment high/low temperature, need DUT and VxWorks development board collective to send into high-low temperature chamber, large to the components and parts infringement except DUT.
3, test environment builds very complicated, and development board and DUT all need to be powered by external power source, is easy to cause system short-circuit because sequence of operation is improper during test.
4, be all separate between the device such as external power source, cooling system, development board, unified integrated, account for after environmental structure is good and seem in disorder, take volume comparatively greatly, not Portable belt, not easily later maintenance.
Utility model content
The purpose of this utility model is the shortcoming overcoming above-mentioned prior art, provides a kind of development board PCIe slot that overcomes and repeatedly plugs and cause component damage, solve the embedded VxWorks product testing system that actual field arranges a difficult problem for test environment loaded down with trivial details inconvenience.
To achieve these goals, embedded VxWorks product testing system of the present utility model has following formation:
This embedded VxWorks product testing system, its principal feature is, described system comprises shell, be arranged at VxWorks development board in shell and the PCIe be arranged in shell carries card, described shell is provided with radiator fan, described system also comprises PCIe connector and bus interface, and described PCIe connector and described bus interface are arranged on described shell.
Further, described shell comprises the first rectangular parallelepiped shell and is highly less than the second rectangular parallelepiped shell of the first rectangular parallelepiped shell, first side laminating of the second described rectangular parallelepiped shell and the first side of the first described rectangular parallelepiped shell, and the first described rectangular parallelepiped shell and the second described rectangular parallelepiped shell connect.
Further, described radiator fan comprises forefan and aft-fan, described forefan is arranged at the second side of the first described rectangular parallelepiped shell, described aft-fan is arranged at the first side of the first described rectangular parallelepiped shell, and the first side of described shell is relative both sides with the second side of described shell.
Further, described PCIe carries card and comprises year card A card and carry card B card, and described carrying blocks a B card and be arranged on described VxWorks development board, and described carries the medial surface that card A card is arranged at the second described rectangular parallelepiped shell.
Again further, described system also comprises FPGA emulator, and described FPGA emulator is arranged at the described top of carrying card A card and is positioned at the inside of the first described rectangular parallelepiped shell.
Again further, the upper surface of the second described rectangular parallelepiped shell is provided with card DUT to be measured, and described card DUT to be measured blocks A card by PCIe connector with described carrying and is connected.
Further, the upper surface of the second described rectangular parallelepiped shell is provided with power switch and power light.
Further, the second side of the first described rectangular parallelepiped shell is provided with direct supply input interface, AC power input interface and card DUT external power source selector switch to be measured.
Further, the second side of the first described rectangular parallelepiped shell is provided with Ethernet interface, serial ports and FPGA emulator USB interface.
Further, the second side of the first described rectangular parallelepiped shell is provided with FC light mouth.
Have employed the embedded VxWorks product testing system in this utility model, compared with prior art, there is following beneficial effect:
1, externally fed power supply, VxWorks embedded board, PCIe are carried card, radiator fan, Serial Port Line etc. and integrate by the embedded product examining system of innovation, user, without the need to considering that embedded product examining system internal environment is built, simplifies testing procedure, improves testing efficiency.
2, solve development board PCIe slot and repeatedly plug the problem causing loss.
3, connector part flexible can regulate length, facilitates high and low temperature environment to test, and only DUT need be extended connector by PCIe and send in high and low temperature environment, avoid the infringement that high/low temperature causes the components and parts outside DUT.
4, the embedded product examining system volume of design is little, lightweight, is easy to carry.
Accompanying drawing explanation
Fig. 1 is the structural representation of the product testing system of the Based PC Ie of prior art.
Fig. 2 is the structural representation of embedded VxWorks product testing system of the present utility model.
Fig. 3 is the schematic appearance of embedded VxWorks product testing system of the present utility model.
Fig. 4 is the front view of embedded VxWorks product testing system of the present utility model.
Fig. 5 is the rear view of embedded VxWorks product testing system of the present utility model.
Fig. 6 is the internal view of embedded VxWorks product testing system of the present utility model.
Wherein,
1 first rectangular parallelepiped shell
2FPGA emulator USB interface
3 forefans
4 power lights
5 power switches
6 second rectangular parallelepiped shells
7 aft-fans
8FC light mouth
9 direct supply input interfaces
10 card DUT external power source selector switch to be measured
11 Ethernet interfaces
12 AC power input interfaces
13 serial ports
14 years card B cards
15 years card A cards
16VxWorks development board
Embodiment
In order to more clearly describe technology contents of the present utility model, conduct further description below in conjunction with specific embodiment.
The embedded VxWorks that the present invention relates to a kind of base PCIe slot produces examining system, utilize this VxWorks to produce examining system to supporting that the DUT of PCIe bus carries out products and surveys, solve DUT and PCIe slot repeatedly directly plug cause slot device loss problem, test environment is disorderly and unsystematic and easily cause cpu system and tested DUT damage etc. problem.The emulator of FPGA on external power source, embedded system development plate, year card, radiator fan and DUT is passed through rational deployment by this product examining system, be incorporated into a function completely in system, without the need to considering that internal environment is built, solving and arranging the difficult problems such as the loaded down with trivial details inconvenience of test environment in actual field.
Refer to shown in Fig. 2 to Fig. 6, embedded VxWorks product testing system of the present utility model comprises shell, be arranged at VxWorks development board 16 in shell and the PCIe be arranged in shell carries card, described shell is provided with radiator fan, described system also comprises PCIe connector and bus interface, and described PCIe connector and described bus interface are arranged on described shell.
In a kind of preferred embodiment, described shell comprises the first rectangular parallelepiped shell 1 and is highly less than the second rectangular parallelepiped shell 6 of the first rectangular parallelepiped shell 1, first side laminating of the second described rectangular parallelepiped shell 6 and the first side of the first described rectangular parallelepiped shell 1, and the first described rectangular parallelepiped shell 1 connects with the second described rectangular parallelepiped shell 6.
In a kind of preferred embodiment, described radiator fan comprises forefan 3 and aft-fan 7, described forefan 3 is arranged at the second side of the first described rectangular parallelepiped shell 1, described aft-fan 7 is arranged at the first side of the first described rectangular parallelepiped shell 1, and the first side of described shell is relative both sides with the second side of described shell.
In a kind of preferred embodiment, described PCIe carries card and comprises year card A card 15 and carry card B card 14, and described carrying blocks a B card 14 and be arranged on described VxWorks development board, and described carries the medial surface that card A card 14 is arranged at the second described rectangular parallelepiped shell 6.
In a kind of preferred embodiment, described system also comprises FPGA emulator, and described FPGA emulator is arranged at the described top of carrying card A card 15 and is positioned at the inside of the first described rectangular parallelepiped shell.
In a kind of preferred embodiment, the upper surface of the second described rectangular parallelepiped shell 6 is provided with card DUT to be measured, and described card DUT to be measured blocks A card by PCIe connector with described carrying and is connected.
In a kind of preferred embodiment, the upper surface of the second described rectangular parallelepiped shell 6 is provided with power switch 5 and power light 4.
In a kind of preferred embodiment, the second side of the first described rectangular parallelepiped shell 1 is provided with direct supply input interface 9, AC power input interface 12 and card DUT external power source selector switch 10 to be measured.
In a kind of preferred embodiment, the second side of the first described rectangular parallelepiped shell 1 is provided with Ethernet interface 11, serial ports 13 and FPGA emulator USB interface 2.
In a kind of preferred embodiment, the second side of the first described rectangular parallelepiped shell is provided with FC light mouth 8.
In prior art, the product examining system of Based PC Ie is all that computing machine, development system, power supply, fan and emulator are pieced together desultorily, and not only environment is mixed and disorderly, and easily causes the damage of all parts.
The VxWorks that the present invention relates to a kind of Based PC Ie slot produces examining system, structurally externally fed power supply, VxWorks embedded board, PCIe are carried card, radiator fan, emulator etc. and be integrated in the cabinet in a 6U space, after cabinet, draw serial ports, Ethernet, optical fiber, emulator USB port and external power source interface etc.; Draw a PCIe breakout box from cabinet front portion, DUT can directly insert on the connector that provides of cabinet outside by user, overcomes development board PCIe slot and repeatedly plugs and cause component damage, solve a difficult problem for the loaded down with trivial details inconvenience of actual field layout test environment.
As shown in Figure 6, by POWERPC development board, ups power, carry card A card, year card B card, fan, PFGA emulator and various interface connector installation below and cover lid, be so just assembled into the embedded product examining system of Based PC Ie slot as shown in Figure 4, Figure 5;
As shown in Figure 5, FC interface optical fiber is connected to the existing FT400 tester of company; Ethernet, serial ports and emulator USB port are connected to PC; Finally connect outside 220AC power supply;
As shown in Figure 4, tested DUT is inserted and produces on year card A card of examining system, then turn on the power switch and power on to test macro and DUT;
Product special on PC is surveyed software and can be controlled to produce the process of survey and record the result of producing and surveying.
Have employed the embedded VxWorks product testing system in this utility model, compared with prior art, there is following beneficial effect:
1, externally fed power supply, VxWorks embedded board, PCIe are carried card, radiator fan, Serial Port Line etc. and integrate by the embedded product examining system of innovation, user, without the need to considering that embedded product examining system internal environment is built, simplifies testing procedure, improves testing efficiency.
2, solve development board PCIe slot and repeatedly plug the problem causing loss.
3, connector part flexible can regulate length, facilitates high and low temperature environment to test, and only DUT need be extended connector by PCIe and send in high and low temperature environment, avoid the infringement that high/low temperature causes the components and parts outside DUT.
4, the embedded product examining system volume of design is little, lightweight, is easy to carry.
Of the present utility modelly realize in the technical scheme of embedded VxWorks product testing system, each wherein included functional module and modular unit all can correspond to the particular hardware circuit in integrated circuit structure, therefore the improvement of particular hardware circuit is only related to, hardware components not only belongs to the carrier performing control software design or computer program, therefore solve corresponding technical matters and obtain the application that corresponding technique effect do not relate to any control software design or computer program yet, that is, the utility model only utilizes the improvement of the hardware circuit aspect involved by these modules and unit namely can solve technical matters to be solved, and obtain corresponding technique effect, and do not need auxiliary namely can realize corresponding function with specific control software design or computer program.
Above-described embodiment is this patent preferred embodiment; not be used for limiting practical range of the present utility model; those skilled in the art is under the prerequisite not departing from the utility model principle; the improvement done, change, combination, substitute etc., all belong within the utility model claim scope required for protection.
In this description, the utility model is described with reference to its specific embodiment.But, still can make various amendment and conversion obviously and not deviate from spirit and scope of the present utility model.Therefore, instructions and accompanying drawing are regarded in an illustrative, rather than a restrictive.
Claims (10)
1. an embedded VxWorks product testing system, it is characterized in that, described system comprises shell, be arranged at VxWorks development board in shell and the PCIe be arranged in shell carries card, described shell is provided with radiator fan, described system also comprises PCIe connector and bus interface, and described PCIe connector and described bus interface are arranged on described shell.
2. embedded VxWorks product testing system according to claim 1, it is characterized in that, described shell comprises the first rectangular parallelepiped shell and is highly less than the second rectangular parallelepiped shell of the first rectangular parallelepiped shell, first side laminating of the second described rectangular parallelepiped shell and the first side of the first described rectangular parallelepiped shell, and the first described rectangular parallelepiped shell and the second described rectangular parallelepiped shell connect.
3. embedded VxWorks product testing system according to claim 2, it is characterized in that, described radiator fan comprises forefan and aft-fan, described forefan is arranged at the second side of the first described rectangular parallelepiped shell, described aft-fan is arranged at the first side of the first described rectangular parallelepiped shell, and the first side of described shell is relative both sides with the second side of described shell.
4. embedded VxWorks product testing system according to claim 2, it is characterized in that, described PCIe carries card and comprises year card A card and carry card B card, the described card B card that carries is arranged on described VxWorks development board, and described carries the medial surface that card A card is arranged at the second described rectangular parallelepiped shell.
5. embedded VxWorks product testing system according to claim 4, it is characterized in that, described system also comprises FPGA emulator, and described FPGA emulator is arranged at the described top of carrying card A card and is positioned at the inside of the first described rectangular parallelepiped shell.
6. embedded VxWorks product testing system according to claim 4, is characterized in that, the upper surface of the second described rectangular parallelepiped shell is provided with card DUT to be measured, and described card DUT to be measured blocks A card by PCIe connector with described carrying and is connected.
7. embedded VxWorks product testing system according to claim 2, is characterized in that, the upper surface of the second described rectangular parallelepiped shell is provided with power switch and power light.
8. embedded VxWorks product testing system according to claim 2, is characterized in that, the second side of the first described rectangular parallelepiped shell is provided with direct supply input interface, AC power input interface and card DUT external power source selector switch to be measured.
9. embedded VxWorks product testing system according to claim 2, is characterized in that, the second side of the first described rectangular parallelepiped shell is provided with Ethernet interface, serial ports and FPGA emulator USB interface.
10. embedded VxWorks product testing system according to claim 2, is characterized in that, the second side of the first described rectangular parallelepiped shell is provided with FC light mouth.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520678518.0U CN204926067U (en) | 2015-09-02 | 2015-09-02 | Embedded vxWorks product test system |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520678518.0U CN204926067U (en) | 2015-09-02 | 2015-09-02 | Embedded vxWorks product test system |
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| CN204926067U true CN204926067U (en) | 2015-12-30 |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112306773A (en) * | 2020-11-05 | 2021-02-02 | 中国航空工业集团公司西安航空计算技术研究所 | Fault detection platform of FC node machine with standard serial host interface |
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2015
- 2015-09-02 CN CN201520678518.0U patent/CN204926067U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112306773A (en) * | 2020-11-05 | 2021-02-02 | 中国航空工业集团公司西安航空计算技术研究所 | Fault detection platform of FC node machine with standard serial host interface |
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| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| TR01 | Transfer of patent right | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20240122 Address after: Floor 12, Building 5, No. 18 Qingjiang South Road, Gulou District, Nanjing City, Jiangsu Province, 210000 Patentee after: NANJING QUANXIN CABLE TECHNOLOGY Co.,Ltd. Country or region after: China Address before: 200233, Room 402, 23 Gemstone Garden, No. 487 Tianlin Road, Xuhui District, Shanghai Patentee before: SHANGHAI SAIZHI INFORMATION TECHNOLOGY Co.,Ltd. Country or region before: China |