CN204463777U - For showing the aging testing system of module - Google Patents
For showing the aging testing system of module Download PDFInfo
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- CN204463777U CN204463777U CN201420823941.0U CN201420823941U CN204463777U CN 204463777 U CN204463777 U CN 204463777U CN 201420823941 U CN201420823941 U CN 201420823941U CN 204463777 U CN204463777 U CN 204463777U
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- 238000012360 testing method Methods 0.000 title claims abstract description 65
- 230000032683 aging Effects 0.000 title claims abstract description 22
- 230000009191 jumping Effects 0.000 claims description 3
- 230000007704 transition Effects 0.000 claims description 3
- 238000000034 method Methods 0.000 description 6
- 238000004088 simulation Methods 0.000 description 4
- 230000001681 protective effect Effects 0.000 description 3
- 238000001514 detection method Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 241000272173 Calidris Species 0.000 description 1
- 230000003679 aging effect Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
Abstract
The utility model relates to a kind of aging testing system for showing module, comprising: testing host, for providing test data; Interface board, comprises power interface, data-interface and Control Component; Described power interface is used for being connected with display module to be tested, thinking that described display module provides power supply, described data-interface is for being connected with display module to be tested, to send test data to described display module, and described Control Component is used for being connected with display module to be tested, normally showing to control described display module or carry out burn-in test.Above-mentioned aging testing system, only can use set of system just can test multiple display module respectively, not need to utilize the mainboard of mobile phone or flat board to test.
Description
Technical field
The utility model relates to the measuring technology of display module, particularly relates to a kind of aging testing system for showing module.
Background technology
For mobile phone and dull and stereotyped display module, major part all requires to carry out brush screen test (i.e. burn-in test, display module is allowed constantly to carry out the display of red, green, blue, the picture such as black, white, grey), with the ageing properties of detection display module, during especially risky in LCD (i.e. glass) design of module or leak, this test often enjoys the attention of module factory client, and require that shipment all carries out brush screen detection, even do not stint and provide mobile phone or dull and stereotyped mainboard to test to module factory.Tradition all adopts provides mobile phone or flat board (burning special brush screen program) to module factory to realize brush screen test.
But do like this, have following shortcoming:
1) cost is too high: mobile phone or dull and stereotyped factory need a lot of mainboard of extra production to be used for test, scrap because have a lot of mainboard in brush screen ageing process;
2) method of testing is complicated: every a slice display module all needs connection one piece of mainboard to test; Need analog switch machine process if run into and normally show two kinds of test requests, also needing repeatedly to upgrade mainboard program;
3) program updates is complicated, consuming time: whenever needs refresh test program, need to burning program in each mainboard, and mainboard program is huger, recordable time is long, and therefore time cost is higher.
4) business procedure is complicated: part mobile phone or dull and stereotyped factory require that module factory buys its mobile phone or flat board is tested, and causes module factory cost to improve like this, commercial affairs and process of exchange complicated, even may involve third party (as glass factory etc.).
Utility model content
Based on this, be necessary to provide a kind of aging testing system not needing to utilize the mainboard of mobile phone or flat board to carry out the burn-in test of display module.
For showing an aging testing system for module, comprising:
Testing host, for providing test data;
Interface board, comprises power interface, data-interface and Control Component; Described power interface is used for being connected with display module to be tested, thinking that described display module provides power supply, described data-interface is for being connected with display module to be tested, to send test data to described display module, and described Control Component is used for being connected with display module to be tested, normally showing to control described display module or carry out burn-in test.
Wherein in an embodiment, described Control Component comprises the grounding switch for being connected with display module to be tested.
Wherein in an embodiment, described grounding switch comprises the wire jumper and jumping cap that cooperatively interact.
Wherein in an embodiment, described interface board also comprises relay and control relay circuit; Described interface board comprises the power supply chip for exporting 5V voltage, and the output terminal of described relay is connected with the control end of power supply chip, and the signal output part of described control relay circuit is connected with the input end of relay.
Wherein in an embodiment, described control relay circuit comprises at least one in timer sum counter.
Wherein in an embodiment, described interface board also comprises operating voltage circuit, and described operating voltage circuit connects the power end of described power supply chip and display module to be tested, for 5V voltage transitions being become three tunnel operating voltage needed for display module to be tested.
Wherein in an embodiment, described relay comprises heavy-current relay and weakness relay, and described heavy-current relay input 220V voltage is as Electromagnetic Drive operating voltage, and described light-current relay exports control voltage and controls heavy-current relay;
Described control relay circuit comprises timer sum counter, and described timer exports control signal and controls described light-current relay, and described counter exports control signal and controls described heavy-current relay.
Above-mentioned aging testing system, the mainboard of test data and the interface board that can be connected display module can be provided by using, can only use set of system just can test multiple display module respectively, and do not need the mainboard of the cell phone mainboard in terminal or panel computer to carry out connecting test display module, thus possess good versatility.Meanwhile, it Control Component possessed, can provide and control the control signal that display module enters brush screen pattern, thus can realize brush screen test.
Accompanying drawing explanation
Fig. 1 is the aging testing system module map of an embodiment;
Fig. 2 is the detailed block diagram of aging testing system in Fig. 1;
Fig. 3 is composition and the annexation schematic diagram of relay in Fig. 2.
Embodiment
As shown in Figure 1, be the aging testing system of an embodiment.This aging testing system 10 is for carrying out display burn-in test to display module 90.Aging testing system 10 comprises testing host 100 and interface board 200.
Namely testing host 100, for providing test data, also allows the data of display module displays specific image, such as, make the data of display module displays red, green, blue, black, white, horizontal GTG, the perpendicular picture such as GTG and Crosstalk.
Interface board 200 comprises power interface 210, data-interface 220 and Control Component 230.Power interface 210 shows module 90 provide power supply for being connected with display module 90 to be tested, thinking.Data-interface 220 is for being connected with display module 90 to be tested, to send to showing module 90 test data obtained from testing host 100.Control Component 230 normally shows for being connected with display module 90 to be tested, to control showing module 90 or carrying out burn-in test.
Display module 90 generally includes test data conversion the driving chip of the curtage signal being pixel cell, driving chip utilizes simple low and high level signal to control its display mode, such as, be normal display or brush screen (can be used for burn-in test).Control Component 230 is then such as, for providing the signal controlling display module 90 display mode, low and high level.
Particularly, in one embodiment, as shown in Figure 2, Control Component 230 comprises grounding switch 231 for being connected with display module 90 to be tested and protective resistance R1.Grounding switch 231 one end ground connection, the other end is connected to display module 90 by protective resistance R1.In the present embodiment, the driving chip 910 of display module 90 has the pin controlling its display mode.Grounding switch 231 is connected with this pin by protective resistance R1.When grounding switch 231 closes, pin is low level, display module 90 with brush screen mode operation, will can carry out burn-in test.When grounding switch 231 disconnects, pin is high level, display module 90 runs in the normal mode.
In the present embodiment, grounding switch 231 comprises the wire jumper and jumping cap that cooperatively interact.Jump cap to be placed on wire jumper stitch in the mode of short circuit at ordinary times.When needs carry out burn-in test to display module 90, only need aging testing system display module 90 being connected to the present embodiment, apply operating voltage, provide test data, burn-in test can start automatically simultaneously.
Further, as shown in Figure 2, interface board 200 also comprises relay 240, control relay circuit 250, power supply chip 260 and operating voltage circuit 270.The output terminal of relay 240 is connected with the control end of power supply chip 260, and the signal output part of control relay circuit 250 is connected with the input end of relay 240.Operating voltage circuit 270 connects the power end of power supply chip 260 and display module 90 to be tested.Power supply chip 260 is for exporting 5V voltage, and operating voltage circuit 270, for 5V voltage transitions being become three tunnel operating voltage VGH/VGL/AVDD needed for display module to be tested, makes display module 90 to light.
Control relay circuit 250 comprises at least one in timer sum counter.Timer can according to the control timer 240 of setting, and counter then can according to the number of times pilot relay 240 of setting.As shown in Figure 3, relay 240 comprises heavy-current relay and weakness relay, and described heavy-current relay input 220V voltage is as Electromagnetic Drive operating voltage, and described light-current relay exports control voltage and controls heavy-current relay.Control relay circuit 250 comprises timer sum counter, and described timer exports control signal and controls described light-current relay, and described counter exports control signal and controls described heavy-current relay.
Utilize timer sum counter, the test of analog switch machine can be realized.The switching on and shutting down of display module, i.e. the break-make of corresponding power.The simulation of the on/off of switching on and shutting down then needs to control make-and-break time and frequency, to reach the effect of simulation.Utilize timer sum counter, then can reach this effect.Timer is such as utilized to be set as by make-and-break time close with the process time of mobile phone open and close.Set by timer, can for the demand of mobile phone and dull and stereotyped factory, frequency is as required simulated, thus realizes simulation and the test of the switching on and shutting down process of display module.
Be no matter the brush screen of aforesaid burn-in test, or switching on and shutting down simulation test all can be selected to carry out brush screen according to time length, or carry out brush screen according to certain number of times.Carry out brush screen according to time length, namely specify the T.T. of brush screen, carry out brush screen according to certain number of times, namely specify the total degree of brush screen.This is realized by choice for use timer or counter, selects timer, then can according to time length; Gated counter, then can carry out brush screen according to certain number of times.
Each technical characteristic of the above embodiment can combine arbitrarily, for making description succinct, the all possible combination of each technical characteristic in above-described embodiment is not all described, but, as long as the combination of these technical characteristics does not exist contradiction, be all considered to be the scope that this instructions is recorded.
The above embodiment only have expressed several embodiment of the present utility model, and it describes comparatively concrete and detailed, but therefore can not be interpreted as the restriction to utility model patent scope.It should be pointed out that for the person of ordinary skill of the art, without departing from the concept of the premise utility, can also make some distortion and improvement, these all belong to protection domain of the present utility model.Therefore, the protection domain of the utility model patent should be as the criterion with claims.
Claims (7)
1. for showing an aging testing system for module, it is characterized in that, comprising:
Testing host, for providing test data;
Interface board, comprises power interface, data-interface and Control Component; Described power interface is used for being connected with display module to be tested, thinking that described display module provides power supply, described data-interface is for being connected with display module to be tested, to send test data to described display module, and described Control Component is used for being connected with display module to be tested, normally showing to control described display module or carry out burn-in test.
2. the aging testing system for showing module according to claim 1, is characterized in that, described Control Component comprises the grounding switch for being connected with display module to be tested.
3. the aging testing system for showing module according to claim 2, is characterized in that, described grounding switch comprises the wire jumper and jumping cap that cooperatively interact.
4. the aging testing system for showing module according to claim 1, is characterized in that, described interface board also comprises relay and control relay circuit; Described interface board comprises the power supply chip for exporting 5V voltage, and the output terminal of described relay is connected with the control end of power supply chip, and the signal output part of described control relay circuit is connected with the input end of relay.
5. the aging testing system for showing module according to claim 4, is characterized in that, described control relay circuit comprises at least one in timer sum counter.
6. the aging testing system for showing module according to claim 4, it is characterized in that, described interface board also comprises operating voltage circuit, described operating voltage circuit connects the power end of described power supply chip and display module to be tested, for 5V voltage transitions being become three tunnel operating voltage needed for display module to be tested.
7. the aging testing system for showing module according to claim 4, it is characterized in that, described relay comprises heavy-current relay and light-current relay, described heavy-current relay input 220V voltage is as Electromagnetic Drive operating voltage, and described light-current relay exports control voltage and controls heavy-current relay;
Described control relay circuit comprises timer sum counter, and described timer exports control signal and controls described light-current relay, and described counter exports control signal and controls described heavy-current relay.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420823941.0U CN204463777U (en) | 2014-12-18 | 2014-12-18 | For showing the aging testing system of module |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201420823941.0U CN204463777U (en) | 2014-12-18 | 2014-12-18 | For showing the aging testing system of module |
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| CN204463777U true CN204463777U (en) | 2015-07-08 |
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Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105093589A (en) * | 2015-08-25 | 2015-11-25 | 昆山龙腾光电有限公司 | Aging testing system for liquid crystal display modules |
| CN107068022A (en) * | 2017-03-08 | 2017-08-18 | 深圳市帝晶光电科技有限公司 | A kind of control circuit of efficient LCM tests |
| CN109493776A (en) * | 2018-12-28 | 2019-03-19 | 厦门天马微电子有限公司 | A kind of display panel test fixture and its test method |
| CN109613725A (en) * | 2018-11-23 | 2019-04-12 | 肇庆金鹏实业有限公司 | A kind of display module ageing testing method and device |
| CN110189703A (en) * | 2019-06-28 | 2019-08-30 | 上海天马有机发光显示技术有限公司 | A kind of display panel and display device |
| WO2020087579A1 (en) * | 2018-10-30 | 2020-05-07 | 重庆先进光电显示技术研究院 | Detection apparatus for display panel and detection method therefor |
| WO2020093506A1 (en) * | 2018-11-08 | 2020-05-14 | 惠科股份有限公司 | Circuit for aging display panel, and display panel |
| CN111579903A (en) * | 2020-05-18 | 2020-08-25 | 格力电器（合肥）有限公司 | Display module testing tool and testing method |
-
2014
- 2014-12-18 CN CN201420823941.0U patent/CN204463777U/en not_active Expired - Fee Related
Cited By (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105093589A (en) * | 2015-08-25 | 2015-11-25 | 昆山龙腾光电有限公司 | Aging testing system for liquid crystal display modules |
| CN105093589B (en) * | 2015-08-25 | 2018-01-16 | 昆山龙腾光电有限公司 | Liquid crystal display die set aging testing system |
| CN107068022A (en) * | 2017-03-08 | 2017-08-18 | 深圳市帝晶光电科技有限公司 | A kind of control circuit of efficient LCM tests |
| WO2020087579A1 (en) * | 2018-10-30 | 2020-05-07 | 重庆先进光电显示技术研究院 | Detection apparatus for display panel and detection method therefor |
| US11176857B2 (en) | 2018-10-30 | 2021-11-16 | Chongqing Advance Display Technology Research | Display panel testing apparatus and testing method |
| WO2020093506A1 (en) * | 2018-11-08 | 2020-05-14 | 惠科股份有限公司 | Circuit for aging display panel, and display panel |
| CN109613725A (en) * | 2018-11-23 | 2019-04-12 | 肇庆金鹏实业有限公司 | A kind of display module ageing testing method and device |
| CN109493776A (en) * | 2018-12-28 | 2019-03-19 | 厦门天马微电子有限公司 | A kind of display panel test fixture and its test method |
| CN110189703A (en) * | 2019-06-28 | 2019-08-30 | 上海天马有机发光显示技术有限公司 | A kind of display panel and display device |
| CN110189703B (en) * | 2019-06-28 | 2022-02-18 | 武汉天马微电子有限公司 | Display panel and display device |
| CN111579903A (en) * | 2020-05-18 | 2020-08-25 | 格力电器（合肥）有限公司 | Display module testing tool and testing method |
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Legal Events
| Date | Code | Title | Description |
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| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CP03 | Change of name, title or address | ||
| CP03 | Change of name, title or address |
Address after: 516003 Guangdong province Huizhou Zhongkai hi tech Development Zone No. 23 District Patentee after: CHINA DISPLAY OPTOELECTRONICS TECHNOLOGY (HUIZHOU) Co.,Ltd. Address before: 516003 Guangdong province Huizhou Jiangbei Road No. 21 Yunshan Yunshan Industrial Zone No. nine TCL Patentee before: TCL DISPLAY TECHNOLOGY (HUIZHOU) Co.,Ltd. |
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| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20150708 |