CN105093589B - Liquid crystal display die set aging testing system - Google Patents
Liquid crystal display die set aging testing system Download PDFInfo
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- CN105093589B CN105093589B CN201510524580.9A CN201510524580A CN105093589B CN 105093589 B CN105093589 B CN 105093589B CN 201510524580 A CN201510524580 A CN 201510524580A CN 105093589 B CN105093589 B CN 105093589B
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- crystal display
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
Abstract
The invention discloses a kind of liquid crystal display die set aging testing system, it includes：Downloader, the master board being connected with downloader, more sub- control panels being connected with master board, wherein, downloader, the test information of the liquid crystal display die set for receiving multiple machines to be measured；Master board is used to for the test information of the liquid crystal display die set of multiple machines to be measured to be respectively supplied to the corresponding sub- control panel connected to the liquid crystal display die set of multiple machines to be measured；Each sub- control panel is used to generate test image signal, and corresponding liquid crystal display die set will be supplied to after the test information of the liquid crystal display die set of the corresponding machine to be measured of reception and test image signal the first signal conversion of progress, so that corresponding liquid crystal display die set test image according to corresponding to being shown the signal after the conversion of the first signal, so as to realize the burn-in test to liquid crystal display die set.The present invention can be adapted to the liquid crystal display die set for testing different machines, and can improve testing efficiency.
Description
Technical field
The present invention relates to technical field of liquid crystal display, more particularly to a kind of liquid crystal display die set aging testing system.
Background technology
Liquid crystal display device (Liquid Crystal Display, LCD) have image quality is good, small volume, in light weight, low drive
The advantages of dynamic voltage, low-power consumption, relatively low radiationless and manufacturing cost, occupied an leading position at present in flat display field, liquid
Crystal device is especially suitable for applying in desktop computer, palmtop computer, personal digital assistant (Personal Digital
Assignment, PDA), portable phone, in TV and a variety of office automations and audio-visual equipment.
Liquid crystal display die set is one of key components and parts of liquid crystal display device, and liquid crystal display generally needs before dispatching from the factory
Ageing tester is used to carry out burn-in test to liquid crystal display die set, burn-in test is at high temperature for a long time (such as 100
Hour) liquid crystal display die set is switched on power to carry out Built-in Self Test to liquid crystal display die set after display image
Examination, in order to the bad point of early detection liquid crystal display die set, so as to be lifted out kinds of goods matter.Liquid crystal display die set is in aging at present
In test process, it is necessary first to which ageing tester provides initialization information to enter to liquid crystal display die set to liquid crystal display die set
Row initialization, provide test image further according to timing information and shown to liquid crystal display die set, liquid crystal display is lighted with this
Module (ensures display module display image and normal work), then in test process, whether just to judge shown image
Often, so as to realizing the burn-in test to liquid crystal display die set.At present, the initialization being adapted with each machine liquid crystal display die set
Information differs, therefore, it is impossible to share the liquid crystal display die set that an ageing tester lights different machines, that is, works as liquid crystal
Show after the machine change of module, it is necessary to the initialization information of burning ageing tester and carry out above-mentioned lighting liquid crystal display again
The process of module.It is existing a kind of for lighting MIPI (Mobile Industry Processor Interface, mobile production
Industry processor) interface liquid crystal display die set ageing tester as shown in figure 1, ageing tester shown in Fig. 1 to set
The multiple MIPI signal plates 10 being placed in ageing test box, MCU12 and interface 13 are set on every MIPI signal plates 10.It is and every
The machine of one liquid crystal display die set 11 differs, and every MIPI signal plates 10 are electrical connected a kind of liquid crystal display mode of machine
Group 11.Each MIPI signal plates 10 are independently operated, when the liquid crystal display die set 11 for needing to light some machine
When, MIPI signal plates 10 to are sent the initialization information of corresponding liquid crystal display die set 11 and timing information by interface 13
MCU12, then initialization information and timing information are converted into after MIPI signals by MCU12 and are sent to corresponding liquid crystal display mode
Group 11, to light corresponding liquid crystal display die set 11, then judge whether shown image is normal.Above-mentioned ageing tester is deposited
In problems with：Because different machine liquid crystal display die sets can not share same ageing tester, therefore, liquid crystal display die set
Machine change when, above-mentioned test device need by the modes such as burning to the corresponding burning initialization information of MIPI signal plates 10 and when
Sequence information, when liquid crystal display die set quantity is more, it is necessary to which the workload of burning is big, substantial amounts of time and people are not only resulted in so
The consuming of power, material resources, and efficiency is very low, and cost is higher.In addition, when there is some liquid crystal display die set 11 non-lit up, then
Need to re-operate MIPI signal plates and above-mentioned lighting operation process is carried out to this liquid crystal display die set 11, due to aforesaid operations process
It is more complicated, and also to carry out operating MIPI signal plates 10 in ageing test box, therefore cause operation extremely inconvenient.
The content of the invention
The present invention provides a kind of liquid crystal display die set aging testing system, suitable for the liquid crystal display die set of different machines,
And efficiency is higher.
The technical scheme is as follows：
The embodiments of the invention provide a kind of liquid crystal display die set aging testing system, suitable for testing the liquid crystal of different machines
Display module, it includes：Downloader, the master board being connected with the downloader, the more height being connected with the master board
Control panel, wherein, the downloader, the test information of the liquid crystal display die set for receiving multiple machines to be measured, and will receive
The test information of liquid crystal display die set of multiple machines to be measured be supplied to the master board；The master board, it is and described
Downloader and every sub- control panel are connected, the liquid crystal display die set of the multiple machines to be measured provided for receiving the downloader
Information is tested, and the test information of the liquid crystal display die set of multiple machines to be measured of reception is respectively supplied to and multiple machines to be measured
The connected corresponding sub- control panel of the liquid crystal display die set of kind；Each sub- control panel, with the master board and multiple liquid crystal displays
Module is connected, raw when the liquid crystal display die set of the corresponding machine to be measured provided for receiving the master board tests information
Enter into test image signal, and by the test information of the liquid crystal display die set of the corresponding machine to be measured of reception and test image signal
Corresponding liquid crystal display die set is supplied to after the conversion of the signal of row first, so that corresponding liquid crystal display die set is according to by the first letter
Number conversion after signal show corresponding to test image, to light corresponding liquid crystal display die set, so as to realize to liquid crystal display
The burn-in test of module.
In one embodiment of the invention, downloader MCU, the signal after the first signal is changed are believed into MIPI
Number.
In one embodiment of the invention, the test information includes control command, initializing signal and timing information,
The control command includes the test information of the liquid crystal display die set of each machine to be measured being respectively mapped to corresponding liquid crystal
Show the order that the order of module, control liquid crystal display die set are initialized according to initialization information, the initialization information bag
Gamma electric voltage, common electric voltage are included, the timing information includes horizontal-drive signal, vertical synchronizing signal, clock signal and enabled
Signal.
In one embodiment of the invention, the master board includes the first controller, input interface, the second control
Device, output interface；Wherein, first controller, is connected with the input interface and the second controller, and it includes and institute
The connected signal output part of second controller and control terminal are stated, first controller is used to receive institute by the input interface
The test information of the liquid crystal display die set of multiple machines to be measured of downloader offer is provided, and by the liquid of multiple machines to be measured of reception
The test information of brilliant display module is supplied to the second controller by the signal output part and the control terminal；Described
Two controllers, it is connected with first controller and the output interface, it includes multiple output channels, and each output is logical
Road is connected with an output interface, and the second controller is used to receive multiple machines to be measured that first controller provides
The test information of liquid crystal display die set, the control command in test information is by the liquid crystal display of multiple machines to be measured of reception
The test information of module is respectively mapped to corresponding output channel, and is supplied to corresponding output to connect by corresponding output channel
Mouthful.
In one embodiment of the invention, first controller, it is additionally operable to when the control terminal exports high level,
Control command in the test information of the liquid crystal display die set of multiple machines to be measured is supplied to institute by the signal output part
Second controller is stated, when the control terminal exports low level, by the test information of the liquid crystal display die set of multiple machines to be measured
In initialization information and timing information the second controller is supplied to by the signal output part.
In one embodiment of the invention, first controller is MCU, and the second controller is FPGA.
In one embodiment of the invention, the master board also includes switch, the switch and the described first control
Device is connected, described to switch for sending the control command to first controller.
In one embodiment of the invention, the input interface and the output interface are serial ports, first control
Device is additionally operable to the test information of the liquid crystal display die set of multiple machines to be measured of reception being encoded to after serial form by described
Signal output part and the control terminal are supplied to the second controller.
In one embodiment of the invention, every sub- control panel includes being connected with the output interface input port, the
Three controllers, the 4th controller and signal adapter；Wherein, the 3rd controller, with the input port, the 4th control
Device processed and the signal adapter are connected, and it includes the first output end being connected with the 4th controller and turned with the signal
The second connected output end of parallel operation, for the test for the liquid crystal display die set of corresponding machine to be measured for providing the master board
Information is decoded, and the timing information in decoded test information is supplied into the described 4th by first output end
Controller, and tested decoded after the control command in information and initialization information progress secondary signal conversion by described
Second output end is supplied to the signal adapter；4th controller, changed with the 3rd controller and the signal
Device is connected, and for generating test image signal, timing information and test image signal that the 3rd controller is provided are carried out
The signal adapter is supplied to after the conversion of 3rd signal；The signal adapter, with the 3rd controller and the described 4th
Controller is connected, including the delivery outlet being connected with liquid crystal display die set, for the control command for providing the 4th controller
And after initialization information carries out the first signal conversion, corresponding liquid crystal display die set is supplied to by delivery outlet, with to corresponding
Liquid crystal display die set is initialized, the timing information and test image signal that the 4th controller is provided, and carries out first
After signal conversion, corresponding liquid crystal display die set is supplied to by delivery outlet, so that corresponding liquid crystal display die set is according to process
First signal conversion after timing information and test image signal show corresponding to test image, to light corresponding liquid crystal display
Module, so as to realize the burn-in test to liquid crystal display die set.
In one embodiment of the invention, the master board also includes the first level translator, described per height control
Making sheet also includes second electrical level converter；Wherein, first level translator, connect with the second controller and the output
Mouth is connected, for passing through institute after the test information of the liquid crystal display die set of the corresponding machine to be measured received is converted into high level
State the second electrical level converter that the sub- control panel is supplied to behind the input port of output interface and the sub- control panel；It is described
Second electrical level converter in every sub- control panel, is connected with the input port and the 3rd controller, for by described
Input port receives the test information of the liquid crystal display die set for the corresponding machine to be measured that the master board provides, and by the phase of reception
The test information of the liquid crystal display die set of machine to be measured is answered to be supplied to the 3rd controller after being converted to low level.
In one embodiment of the invention, the secondary signal conversion is converted into SPI signal, and the 3rd signal turns
Change and be converted into TTL signal.
In one embodiment of the invention, the 3rd controller is MCU, and the 4th controller is FPGA.
The beneficial effect that technical scheme provided in an embodiment of the present invention is brought is：
The test information of the liquid crystal display die set of multiple machines to be measured is received by downloader.Master board will be multiple to be measured
The test information of the liquid crystal display die set of machine be respectively supplied to the liquid crystal display die set of multiple machines to be measured be connected it is corresponding
Sub- control panel.Each sub- control panel receives the liquid crystal display die set test information of the corresponding machine to be measured of master board offer
When, test image signal is generated, and by the test information and test image of the liquid crystal display die set of the corresponding machine to be measured of reception
(such as being converted to MIPI signals) is supplied to corresponding liquid crystal display die set after signal the first signal conversion of progress, so that accordingly
Liquid crystal display die set test image according to corresponding to being shown the signal after the conversion of the first signal, to light corresponding liquid crystal
Show module, so as to realize the burn-in test to liquid crystal display die set.Liquid crystal display die set of the embodiment of the present invention to different machines
When carrying out burn-in test, it is only necessary to the test information of different machines is provided to master board, then master board will be treated multiple
The test information for surveying the liquid crystal display die set of machine is respectively supplied to the phase being connected with the liquid crystal display die set of multiple machines to be measured
Sub- control panel is answered, so as to realize the burn-in test to liquid crystal display die set, easy to operate, flow is simple, and different machine liquid
Brilliant display module can share same test system, and each test device is burnt when avoiding switching in the prior art machine
The trouble of program is recorded, the switching machine time is saved, so as to save cost, improves testing efficiency.
Described above is only the general introduction of technical solution of the present invention, in order to better understand the technological means of the present invention,
And can be practiced according to the content of specification, and in order to allow the above and other objects, features and advantages of the present invention can
Become apparent, below especially exemplified by preferred embodiment, and coordinate accompanying drawing, describe in detail as follows.
Brief description of the drawings
Fig. 1 is a kind of main frame block diagram of existing liquid crystal display die set ageing tester；
Fig. 2 is the main frame block diagram for the liquid crystal display die set aging testing system that first embodiment of the invention provides；
Fig. 3 is the main frame block diagram for the liquid crystal display die set aging testing system that second embodiment of the invention provides；
Fig. 4 is the main frame block diagram for the liquid crystal display die set aging testing system that third embodiment of the invention provides.
Embodiment
Further to illustrate the present invention to reach the technological means and effect that predetermined goal of the invention is taken, below in conjunction with
Accompanying drawing and preferred embodiment, to according to its embodiment of liquid crystal display die set aging testing system proposed by the present invention, knot
Structure, feature and effect, describe in detail as after.
For the present invention foregoing and other technology contents, feature and effect, in the following preferable reality coordinated with reference to schema
Applying during example describes in detail to be clearly presented.By the explanation of embodiment, when predetermined mesh can be reached to the present invention
The technological means taken and effect be able to more deeply and it is specific understand, but institute's accompanying drawings are only to provide with reference to saying
It is bright to be used, not it is used for being any limitation as the present invention.
Fig. 2 is the main frame block diagram for the liquid crystal display die set aging testing system that first embodiment of the invention provides.Please
With reference to figure 2, the liquid crystal display die set aging testing system of the present embodiment is suitable to the liquid for testing different machines (such as different model)
Brilliant display module 109, refer to Fig. 2, and the liquid crystal display die set aging testing system includes：Downloader 101 and downloader
101 connected master boards 103, more sub- control panels 105 being connected with master board 103.Every sub- control panel 105 is connected more
The individual liquid crystal display die set 109 for needing to carry out the identical machine of burn-in test, and any sub- control panel 105 be connected it is more
The machine of individual liquid crystal display die set 109 is identical, and the machine for the liquid crystal display die set 109 being connected with other sub- control panel 105
Differ.Wherein, master board 103 may be disposed at outside ageing test box, and sub- control panel 105 and liquid crystal display die set 109
It may be disposed in test box, the test environment in high temperature and high humility in test box, to be carried out always to liquid crystal display die set 109
Change test.
Specifically, downloader 101, it is connected with master board 103, for receiving the liquid crystal display die set of multiple machines to be measured
Test information (such as can include control command, initialization information and timing information of liquid crystal display die set), and will receive
The test information of liquid crystal display die set of multiple machines to be measured be supplied to master board 103.
Wherein it is preferred to downloader 101 can also be connected with computer 107, for receiving multiple the treating of the offer of computer 107
Survey machine liquid crystal display die set test information (such as can include control command, the initialization information of liquid crystal display die set
And timing information), and the test information of the liquid crystal display die set of multiple machines to be measured of reception is supplied to master board 103.
Wherein, test information input interface can be shown on computer 107, user's can passes through keyboard, mouse etc. on inputting interface
Input equipment input test information.
In the present embodiment, downloader 101 can be MCU (Micro Control Unit, micro-control unit) etc..Test letter
Breath can for example include control command, the initialization information of liquid crystal display die set and sequential (Timing) information, and control command can
With the life including the test information of the liquid crystal display die set of each machine to be measured to be respectively mapped to corresponding liquid crystal display die set
Order make, controlled liquid crystal display die set to be initialized according to initialization information etc..Initialization information can include gamma electricity
The parameters such as pressure, common electric voltage.Timing information can include horizontal-drive signal (H-SYNC), vertical synchronizing signal (V-SYNC),
Clock signal (DOT CLOCK), enable signal (DE) etc..Downloader 101 is by the liquid crystal display mode of multiple machines to be measured of reception
It is, for example, by the test information burning of the liquid crystal display die set of multiple machines to be measured that the test information of group, which is supplied to master board 103,
, can be according to the test information of multiple machine burning difference machines to be measured so that the test system is fitted into master board 103
For multiple product, the scope of application is expanded, and then cause the liquid crystal display die set of various machines that special test need not be set
Device, and then reduce cost.
Master board 103, it is connected with downloader 101 and every sub- control panel 105, for receiving the offer of downloader 101
The test information of the liquid crystal display die set of multiple machines to be measured, and by the survey of the liquid crystal display die set of multiple machines to be measured of reception
Examination information (such as control command, initialization information and timing information) is respectively supplied to the liquid crystal display mode with multiple machines to be measured
The connected corresponding sub- control panel 105 of group.
Each sub- control panel 105, is connected with master board 103 and multiple liquid crystal display die sets 109, and master is received for working as
During the liquid crystal display die set test information for the corresponding machine to be measured that control panel 103 provides, test image signal is generated, and will receive
Corresponding machine to be measured liquid crystal display die set test information and test image signal carry out the first signal conversion after (such as turn
It is changed to MIPI signals) corresponding liquid crystal display die set 109 is supplied to, so that corresponding liquid crystal display die set 109 is according to by the
Test image corresponding to signal (such as MIPI signals) display after the conversion of one signal, to light corresponding liquid crystal display die set
109, so as to realize the burn-in test to liquid crystal display die set.
Wherein, during burn-in test (such as liquid crystal display die set is lighted 100 hours) also by sub- control panel or its
Its test equipment judges whether the image of display is normal, if normally, being judged as liquid crystal display die set to be measured to be qualified, if different
Often, then it is judged as liquid crystal display die set to be measured to be unqualified, so as to realize the burn-in test to liquid crystal display die set.Wherein,
The conversion of one signal is converted into MIPI signals, and which kind of signal the conversion of the first signal is specifically converted to, and is the interface by display module
Determine, i.e. signal that the first signal conversion is converted into being adapted with corresponding liquid crystal display die set (such as MIPI signals
Deng).In other embodiments, the signal of other forms can also be converted to according to the interface of display module, as long as after conversion
Signal can be adapted with the interface of display module.
Preferably, each sub- control panel 105, it is additionally operable to the test of the liquid crystal display die set of the corresponding machine to be measured of reception
Control command and initialization information in information are supplied to corresponding liquid crystal display die set 109 after carrying out signal conversion, are passing through
Under the control of control command after the conversion of first signal, using the initialization information after conversion to corresponding liquid crystal display die set
109 are initialized, and generate test image signal, by the test information of the liquid crystal display die set of the corresponding machine to be measured of reception
In timing information and test image signal carry out the first signal conversion after be supplied to corresponding liquid crystal display die set 109, make liquid
Brilliant display module 109 test image corresponding to display under the control of the timing information after the conversion of the first signal, to light
Corresponding liquid crystal display die set 109.
In the embodiment of the present invention, when the liquid crystal display die set to different machines carries out burn-in test, it is only necessary to will be multiple
The test information of the liquid crystal display die set of machine to be measured is burnt in master board 103, can be burnt according to multiple machines to be measured
Record the test information of different machines so that the test system is applied to multiple product, expands the scope of application, and then cause various
The liquid crystal display die set of machine need not set special test device, and then reduce cost.
The liquid crystal display die set aging testing system that the present embodiment provides, multiple machines to be measured are received by downloader 101
Liquid crystal display die set test information.Master board 103 divides the test information of the liquid crystal display die set of multiple machines to be measured
The indescribably supply corresponding sub- control panel 105 connected to the liquid crystal display die set of multiple machines to be measured.Each sub- control panel 105 receives
When the liquid crystal display die set of the corresponding machine to be measured provided to master board 103 tests information, test image signal is generated, and will
The test information and test image signal of the liquid crystal display die set of the corresponding machine to be measured received carry out (example after the first signal conversion
Such as be converted to MIPI signals) corresponding liquid crystal display die set 109 is supplied to, so that corresponding liquid crystal display die set 109 is according to warp
Cross the first signal conversion after signal show corresponding to test image, to light corresponding liquid crystal display die set 109, so as to realize
To the burn-in test of liquid crystal display die set.When the embodiment of the present invention carries out burn-in test to the liquid crystal display die set of different machines,
Only need to provide the test information of different machines to master board 103, then master board 103 will be by the liquid of multiple machines to be measured
The test information of brilliant display module is respectively supplied to the corresponding sub- control panel being connected to the liquid crystal display die set of multiple machines to be measured
105, so as to realize the burn-in test to liquid crystal display die set, easy to operate, flow is simple, and different machine liquid crystal display modes
Group can share same test system, avoid switching in the prior art each test device during machine and carry out burning program
Trouble, the switching machine time is saved, so as to save cost, improves testing efficiency.
Second embodiment
Fig. 3 is refer to, Fig. 3 shows the master for the liquid crystal display die set aging testing system that second embodiment of the invention provides
Want block architecture diagram.The structure of liquid crystal display die set aging testing system shown in Fig. 3 is similar to the structure shown in Fig. 2, its difference
It is in Fig. 3 is the further refinement structure of master board 103 and sub- control panel 105.
Specifically, master board 103 can include the first controller 1031, input interface 1032, second controller (such as
FPGA, Field Programmable Gate Array, field programmable gate array) 1033, output interface 1035.It is excellent
Selection of land, sub- control panel 105 can include input port 1050, the control of the 3rd controller the 1053, the 4th being connected with output interface 1035
Device (such as FPGA) 1055 processed and signal adapter 1057.
First controller 1031, is connected with input interface 1032 and second controller 1033, and it includes and second controller
1033 connected signal output part TXD and control terminal Data/Com, the first controller 1031 are used to connect by input interface 1032
The test information of the liquid crystal display die set for multiple machines to be measured that downloader 101 provides is received, and by multiple machines to be measured of reception
The test information (such as control command, initialization information and timing information) of liquid crystal display die set pass through signal output part TXD
Second controller (such as FPGA) 1033 is supplied to control terminal Data/Com.
Preferably, the first controller 1031 is additionally operable to when control terminal Data/Com exports high level, by multiple machines to be measured
Control command in the test information of the liquid crystal display die set of kind is supplied to second controller 1033 by signal output part TXD,
When control terminal Data/Com exports low level, by the initialization in the test information of the liquid crystal display die set of multiple machines to be measured
Information and timing information are supplied to second controller 1033 by signal output part TXD.Wherein, the first controller 1031 can be
MCU (Micro Control Unit, micro-control unit) etc., second controller can be FPGA.
Preferably, input interface 1032 and output interface 1035 can be serial ports, and first controller 1031 is additionally operable to
The test information of the liquid crystal display die set of multiple machines to be measured of reception is encoded to after serial form by TXD and control terminal
Data/Com is supplied to the second controller 1033.
Second controller (such as FPGA) 1033, it is connected with the first controller 1031 and output interface 1035, it includes more
Individual output channel RXD1~RXDn, each output channel RXD1~RXDn are connected with an output interface 1035, second controller
1033 are used for the test information of the liquid crystal display die set for multiple machines to be measured that the first controller 1031 of reception provides, according to test
The test information of the liquid crystal display die set of multiple machines to be measured of reception is respectively mapped to accordingly by the control command in information
Output channel RXD1~RXDn, and corresponding output interface 1035 is supplied to by corresponding output channel RXD1~RXDn.Example
Such as when control command is that the test information of the liquid crystal display die set of multiple machines to be measured is respectively mapped into corresponding whole liquid crystal
During display module, then the test information of the liquid crystal display die set of multiple machines to be measured is respectively mapped to phase by second controller 1033
The whole output channel RXD1~RXDn answered, such second controller 1033 need to prestore corresponding liquid crystal display die set and institute
There is output channel RXD1~RXDn corresponding relation, if control command is by the test of the liquid crystal display die set of 2 machines to be measured
When information is respectively mapped to the liquid crystal display die set of No.1 and No.2 machines, if the corresponding liquid that second controller 1033 prestores
Brilliant display module is corresponding with liquid crystal display die set machine No.1 and No.2 in all output channel RXD1~RXDn corresponding relation
Passage RXD1 and RXD2, then second controller 1033 the test information of the liquid crystal display die set of No.1 and No.2 machines to be measured is reflected
It is mapped to passage RXD1 and RXD2.That is, when second controller 1033 is by the survey of the liquid crystal display die set of multiple machines to be measured
When examination information is respectively mapped to corresponding whole output channel RXD1~RXDn, now each channel reception to this passage pair
The test information of the liquid crystal display die set for the machine to be measured answered, when control command is by the liquid crystal display die set of a machine to be measured
Test information MAP to corresponding individually a certain passage when, then second controller 1033 is by the liquid crystal display of a machine to be measured
When the test information MAP of module is to the output channel, only liquid of this channel reception to machine to be measured corresponding with this passage
The test information of brilliant display module, other passage no signals.
Illustrated by taking a sub- control panel 105 as an example, the 3rd controller in every sub- control panel 105 (is, for example,
MCU) 1053, it is connected with input port 1050, the 4th controller 1055 and signal adapter 1057, it includes and the 4th controller
1055 the first connected output end TD-F and the second output end SP being connected with signal adapter 1057, for by master board
The test information of the liquid crystal display die set of the 103 corresponding machines to be measured provided is decoded (such as by the data of serial form also
It is former), and the timing information in decoded test information is supplied to the 4th controller 1055 by the first output end TD-F, and
By it is decoded test information in control command and initialization information carry out secondary signal conversion after (such as be converted to SPI letter
Number) signal adapter 1057 is supplied to by the second output end SP.
4th controller (being, for example, FPGA) 1055, is connected with the 3rd controller 1053 and signal adapter 1057, is used for
Test image signal is generated, the timing information that the 3rd controller 1053 is provided and test image signal carry out the conversion of the 3rd signal
(such as being converted to TTL (Transistor transistor logic, transistor-transistor logic) signal) is supplied to letter afterwards
Number converter 1057.
Signal adapter (being, for example, MIPI converters) 1057, with the 3rd controller 1053 and the phase of the 4th controller 1055
Even, including the delivery outlet MIP being connected with liquid crystal display die set, for the control command that provides the 4th controller 1055 and initially
Change information to carry out after the first signal conversion (such as be converted to MIPI signals), (such as can be in low-speed mode by delivery outlet MIP
Under) corresponding liquid crystal display die set is supplied to, to be initialized to corresponding liquid crystal display die set, by the 4th controller 1055
The timing information and test image signal of offer, after the first signal conversion of progress (such as being converted to MIPI signals), pass through output
Mouth MIP (such as can be in high speed mode) is supplied to corresponding liquid crystal display die set, so that corresponding liquid crystal display die set 109
The test image according to corresponding to being shown the timing information after the conversion of the first signal and test image signal, it is corresponding to light
Liquid crystal display die set 109, so as to realize the burn-in test to liquid crystal display die set.During burn-in test (such as liquid crystal
Show that module is lighted 100 hours) judge whether the image of display is normal, if normally, being judged as liquid crystal display die set to be measured to close
Lattice, if abnormal, it is judged as liquid crystal display die set to be measured to be unqualified, so as to realize the burn-in test to liquid crystal display die set.
Wherein, the 3rd controller is MCU, and the 4th controller is FPGA.Signal adapter 1057 can be MIPI converters.
Secondary signal conversion is converted into SPI signal, and the 3rd signal conversion is converted into TTL signal.Secondary signal is changed and the
Which kind of signal the conversion of three signals is specifically converted to, and is determined by the interface of signal adapter 1057, i.e., and second and the 3rd signal
Conversion is converted into the signal (such as TTL signal, SPI etc.) being adapted with corresponding signal adapter 1057.In other implementations
In example, the signal of other forms can also be converted to according to the interface of signal adapter 1057, as long as the signal energy after conversion
It is enough to be adapted with the interface of signal adapter 1057.
Liquid crystal display die set burn-in test system is discussed in detail for 3 kinds with liquid crystal display die set machine (such as model) below
The course of work of system：
When needing the liquid crystal display die set to 3 machines to carry out burn-in test, the first controller of master board 103
1031 will receive the test information of the liquid crystal display die set for 3 machines to be measured that downloader 101 provides by input interface 1032,
And the test information of the liquid crystal display die set of 3 machines to be measured of reception is passed through into signal output part TXD and control terminal Data/
Com is supplied to second controller 1033.Control command of the second controller 1033 in test information treats the multiple of reception
The test information for surveying the liquid crystal display die set of machine is respectively mapped to corresponding output channel RXD1, RXD2, RXD3, and passes through phase
Output channel RXD1, RXD2, RXD3, corresponding 3 output interfaces 1035 answered are supplied to 3 sub- control panels 105.Per height control
The test of the liquid crystal display die set for the corresponding machine to be measured that the 3rd controller 1053 in making sheet 105 provides master board 103
Information is decoded (such as data convert by serial form), and the timing information in decoded test information is passed through into the
One output end TD-F is supplied to the 4th controller 1055, and by the control command and initialization information in decoded test information
(such as being converted to SPI signal) is supplied to signal adapter 1057 by the second output end SP after progress secondary signal conversion.The
Four controllers 1055, generate test image signal, and the timing information and test image signal that the 3rd controller 1053 is provided enter
(such as being converted to TTL signal) is supplied to signal adapter 1057 after the conversion of the signal of row the 3rd.Signal adapter (is, for example, MIPI
Converter) 1057, after control command and initialization information the first signal conversion of progress that the 4th controller 1055 is provided (such as
Be converted to MIPI signals), corresponding liquid crystal display die set is supplied to by delivery outlet MIP, with to corresponding liquid crystal display die set
Initialized, the timing information and test image signal that the 4th controller 1055 is provided, carry out (example after the first signal conversion
Such as be converted to MIPI signals), corresponding liquid crystal display die set is supplied to by delivery outlet MIP, so that corresponding liquid crystal display mode
The test image according to corresponding to being shown the timing information after the conversion of the first signal and test image signal of group 109, to light
Corresponding liquid crystal display die set 109, so as to realize the burn-in test to liquid crystal display die set.
The liquid crystal display die set aging testing system that the present embodiment provides, also passes through the first controller of master board 103
1031 and second controller 1033 mutual cooperation under, the test information of the liquid crystal display die set of multiple machines to be measured is reflected respectively
Corresponding output channel RXD1~RXDn is mapped to, and corresponding son control is supplied to by corresponding output channel RXD1~RXDn
Plate 105.Sub- control panel 105 under the mutual cooperation of the 3rd controller 1053, the 4th controller 1055 and signal adapter 1057,
Corresponding liquid crystal display die set 109 is lighted, so as to realize the burn-in test to liquid crystal display die set.Difference machine of the embodiment of the present invention
The liquid crystal display die set of kind can share same liquid crystal display die set ageing tester, practical, and master board
With the structure of sub- control panel is simple, cost is relatively low.
3rd embodiment
Fig. 4 is refer to, Fig. 4 shows the master for the liquid crystal display die set aging testing system that third embodiment of the invention provides
Want block architecture diagram.The structure of liquid crystal display die set aging testing system shown in Fig. 4 is similar to the structure shown in Fig. 3, its difference
It is in the master board 103 of Fig. 4 liquid crystal display die set aging testing system can also include the first level translator 1035
With switch 1037.Every sub- control panel 105 can also include second electrical level converter 1051.
Wherein, the first level translator 1035, it is connected with second controller 1033 and output interface 1036, for that will receive
To corresponding machine to be measured liquid crystal display die set test information carry out level conversion after (such as be converted to high level) pass through
The second electrical level converter 1051 of sub- control panel 105 is supplied to behind the input port 1050 of output interface UART and sub- control panel 105.
Second electrical level converter 1051, it is connected with the controller 1053 of input port 1050 and the 3rd, for passing through input port
1050 receive the test information of the liquid crystal display die set for the corresponding machine to be measured that master boards 103 provide, and by the corresponding of reception
The test information of the liquid crystal display die set of machine to be measured is supplied to the 3rd control after carrying out level conversion (such as being converted to low level)
Device 1053 processed.
Wherein, the first level translator 1035 and second electrical level converter 1051 for example can be RS232, and it is received for serial ports
Hair driving, function are increase driving forces, the first level translator 1035 in order that test information transfer apart from longer, signal is not
Can decay, that is, ensure test information from master board 103 can long-distance transmissions give sub- control panel 105, therefore the first level turn
Parallel operation 1035 is supplied to son after the test information of the liquid crystal display die set of the corresponding machine to be measured received is converted into high level
Control panel 105.The second electrical level converter 1051 of sub- control panel 105 is again by the liquid crystal display mode of the corresponding machine to be measured received
The test information of group is converted to low level, will test information and be reduced.
Preferably, the master board 103 can also include：Switch 1037, switch 1037 and the phase of the first controller 1031
Even, for sending control command to the first controller 1031.Such as control command can be included the liquid crystal of each machine to be measured
The test information of display module is respectively mapped to the order of corresponding liquid crystal display die set, control liquid crystal display die set according to initial
Change order that information is initialized etc..Wherein, switch can be button, tumbler switch etc..
The liquid crystal display die set aging testing system that the present embodiment provides, it will also be received by the first level translator 1035
To the test information of liquid crystal display die set of corresponding machine to be measured be converted to and controlled by output interface UART and son after high level
The second electrical level converter 1051 of sub- control panel 105 is supplied to behind the input port 1050 of making sheet 105.Second electrical level converter 1051
The test information of the liquid crystal display die set for the corresponding machine to be measured that master board 103 provides is received by input port 1050, and will
The test information of the liquid crystal display die set of the corresponding machine to be measured received is supplied to the 3rd controller 1053 after being converted to low level,
Test information transfer be thereby may be ensured that apart from longer, signal will not decay, and realize that test information can be remote from master board 103
Distance Transmission gives sub- control panel 105.
Control command can also be sent to the first controller 1031 by switch 1037, to be surveyed to liquid crystal display die set aging
Examination is controlled, if when a certain liquid crystal display die set is non-lit up, can individually be controlled again by switching transmission control command
Transmission test information gives this liquid crystal display die set, so that it is easy to control, it is real-time.
The above described is only a preferred embodiment of the present invention, any formal limitation not is made to the present invention, though
So the present invention is disclosed above with preferred embodiment, but is not limited to the present invention, any to be familiar with this professional technology people
Member, without departing from the scope of the present invention, when the technology contents using the disclosure above make a little change or modification
For the equivalent embodiment of equivalent variations, as long as being the technical spirit pair according to the present invention without departing from technical solution of the present invention content
Any simple modification, equivalent change and modification that above example is made, in the range of still falling within technical solution of the present invention.
Claims (12)
1. a kind of liquid crystal display die set aging testing system, suitable for testing the liquid crystal display die set of different machines, it includes：Download
Device, the master board being connected with the downloader, more sub- control panels being connected with the master board, wherein,
The downloader, the test information of the liquid crystal display die set for receiving multiple machines to be measured, and the multiple of reception are treated
The test information for surveying the liquid crystal display die set of machine is supplied to the master board；
The master board, it is connected with the downloader and every sub- control panel, for receiving the multiple of the downloader offer
The test information of the liquid crystal display die set of machine to be measured, and the test of the liquid crystal display die set of multiple machines to be measured of reception is believed
Breath is respectively supplied to the corresponding sub- control panel being connected to the liquid crystal display die set of multiple machines to be measured；
Each sub- control panel, is connected with the master board and multiple liquid crystal display die sets, and the main control is received for working as
During the liquid crystal display die set test information for the corresponding machine to be measured that plate provides, test image signal is generated, and by the corresponding of reception
The test information and test image signal of the liquid crystal display die set of machine to be measured are supplied to accordingly after carrying out the first signal conversion
Liquid crystal display die set, so that the test according to corresponding to being shown the signal after the conversion of the first signal of corresponding liquid crystal display die set
Image, to light corresponding liquid crystal display die set, so as to realize the burn-in test to liquid crystal display die set.
2. liquid crystal display die set aging testing system according to claim 1, it is characterised in that the downloader is MCU,
The signal after the first signal is changed is MIPI signal.
3. liquid crystal display die set aging testing system according to claim 1, it is characterised in that the test information includes
Control command, initializing signal and timing information, the control command are included the liquid crystal display die set of each machine to be measured
Test information is respectively mapped to the order of corresponding liquid crystal display die set, control liquid crystal display die set is carried out according to initialization information
The order of initialization, the initialization information include gamma electric voltage, common electric voltage, and the timing information is believed including horizontal synchronization
Number, vertical synchronizing signal, clock signal and enable signal.
4. liquid crystal display die set aging testing system according to claim 1, it is characterised in that the master board includes
First controller, input interface, second controller, output interface；Wherein,
First controller, is connected with the input interface and the second controller, and it includes and the second controller
Connected signal output part and control terminal, first controller are used to receive the downloader offer by the input interface
Multiple machines to be measured liquid crystal display die set test information, and by the liquid crystal display die set of multiple machines to be measured of reception
Test information is supplied to the second controller by the signal output part and the control terminal；
The second controller, it is connected with first controller and the output interface, it includes multiple output channels, each
The output channel is connected with an output interface, and the second controller is used to receive the multiple of the first controller offer
The test information of the liquid crystal display die set of machine to be measured, the control command in test information is by multiple machines to be measured of reception
The test information of liquid crystal display die set be respectively mapped to corresponding output channel, and phase is supplied to by corresponding output channel
The output interface answered.
5. liquid crystal display die set aging testing system according to claim 4, it is characterised in that first controller,
It is additionally operable to when the control terminal exports high level, by the control in the test information of the liquid crystal display die set of multiple machines to be measured
Order is supplied to the second controller by the signal output part, when the control terminal exports low level, is treated multiple
The initialization information and timing information surveyed in the test information of the liquid crystal display die set of machine are provided by the signal output part
To the second controller.
6. liquid crystal display die set aging testing system according to claim 4, it is characterised in that first controller is
MCU, the second controller are FPGA.
7. liquid crystal display die set aging testing system according to claim 4, it is characterised in that the master board is also wrapped
Switch is included, the switch is connected with first controller, described to switch for sending the control to first controller
Order.
8. liquid crystal display die set aging testing system according to claim 4, it is characterised in that the input interface and institute
It is serial ports to state output interface, and first controller is additionally operable to the test of the liquid crystal display die set of multiple machines to be measured of reception
Information is encoded to after serial form and is supplied to the second controller by the signal output part and the control terminal.
9. liquid crystal display die set aging testing system according to claim 8, it is characterised in that every sub- control panel includes
Input port, the 3rd controller, the 4th controller and the signal adapter being connected with the output interface；Wherein,
3rd controller, it is connected with the input port, the 4th controller and the signal adapter, it includes and institute
The first connected output end of the 4th controller and the second output end being connected with the signal adapter are stated, for by the master control
The test information of the liquid crystal display die set for the corresponding machine to be measured that making sheet provides is decoded, and by decoded test information
Timing information the 4th controller is supplied to by first output end, and by the control in decoded test information
The signal adapter is supplied to by second output end after order and initialization information progress secondary signal conversion；
4th controller, is connected with the 3rd controller and the signal adapter, for generating test image signal,
The timing information and test image signal that 3rd controller is provided are supplied to the signal after carrying out the conversion of the 3rd signal
Converter；
The signal adapter, be connected with the 3rd controller and the 4th controller, including with liquid crystal display die set phase
Delivery outlet even, after control command and initialization information for the 4th controller to be provided carry out the first signal conversion,
Corresponding liquid crystal display die set is supplied to by delivery outlet, to be initialized to corresponding liquid crystal display die set, by described
The timing information and test image signal that four controllers provide, after carrying out the first signal conversion, it is supplied to accordingly by delivery outlet
Liquid crystal display die set so that corresponding liquid crystal display die set is according to the timing information and test chart after the conversion of the first signal
The test image as corresponding to being shown signal, to light corresponding liquid crystal display die set, so as to realize to the old of liquid crystal display die set
Change test.
10. liquid crystal display die set aging testing system according to claim 9, it is characterised in that the master board is also
Including the first level translator, every sub- control panel also includes second electrical level converter；Wherein,
First level translator, is connected with the second controller and the output interface, for corresponding by what is received
The test information of the liquid crystal display die set of machine to be measured is converted to after high level by the output interface and the sub- control panel
Input port after be supplied to the second electrical level converter of the sub- control panel；
Second electrical level converter in every sub- control panel, is connected with the input port and the 3rd controller, is used for
The test information of the liquid crystal display die set for the corresponding machine to be measured that the master board provides is received by the input port, and will
The test information of the liquid crystal display die set of the corresponding machine to be measured received is supplied to the 3rd controller after being converted to low level.
11. liquid crystal display die set aging testing system according to claim 9, it is characterised in that the secondary signal turns
Change and be converted into SPI signal, the 3rd signal conversion is converted into TTL signal.
12. liquid crystal display die set aging testing system according to claim 9, it is characterised in that the 3rd controller
For MCU, the 4th controller is FPGA.
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| CN105652483B (en) * | 2016-03-16 | 2019-07-16 | 武汉精测电子集团股份有限公司 | A kind of liquid crystal display optical parameter measurement method and device based on fiber optic conduction |
| CN106095632B (en) * | 2016-06-20 | 2019-06-04 | 京东方科技集团股份有限公司 | The device and method of aging board |
| CN107068022A (en) * | 2017-03-08 | 2017-08-18 | 深圳市帝晶光电科技有限公司 | A kind of control circuit of efficient LCM tests |
| CN109493776A (en) * | 2018-12-28 | 2019-03-19 | 厦门天马微电子有限公司 | A kind of display panel test fixture and its test method |
| CN111479033A (en) * | 2020-03-13 | 2020-07-31 | 深圳市峰泳科技有限公司 | Multi-display synchronous display device and method and aging test device |
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Address after: 215301, 1, Longteng Road, Kunshan, Jiangsu, Suzhou Patentee after: Kunshan Longteng Au Optronics Co Address before: 215301, 1, Longteng Road, Kunshan, Jiangsu, Suzhou Patentee before: Kunshan Longteng Optronics Co., Ltd. |