CN204375743U - 一种dram 芯片的晶圆级测试结构 - Google Patents
一种dram 芯片的晶圆级测试结构 Download PDFInfo
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- CN204375743U CN204375743U CN201420850894.9U CN201420850894U CN204375743U CN 204375743 U CN204375743 U CN 204375743U CN 201420850894 U CN201420850894 U CN 201420850894U CN 204375743 U CN204375743 U CN 204375743U
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CN201420850894.9U CN204375743U (zh) | 2014-12-27 | 2014-12-27 | 一种dram 芯片的晶圆级测试结构 |
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104538060A (zh) * | 2014-12-27 | 2015-04-22 | 山东华芯半导体有限公司 | 一种dram芯片的晶圆级测试结构和测试方法 |
CN106526344A (zh) * | 2015-09-09 | 2017-03-22 | 台达电子电源(东莞)有限公司 | 电子产品测试装置及系统 |
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Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104538060A (zh) * | 2014-12-27 | 2015-04-22 | 山东华芯半导体有限公司 | 一种dram芯片的晶圆级测试结构和测试方法 |
CN104538060B (zh) * | 2014-12-27 | 2017-12-26 | 西安紫光国芯半导体有限公司 | 一种dram芯片的晶圆级测试结构和测试方法 |
CN106526344A (zh) * | 2015-09-09 | 2017-03-22 | 台达电子电源(东莞)有限公司 | 电子产品测试装置及系统 |
CN106526344B (zh) * | 2015-09-09 | 2019-02-26 | 台达电子电源(东莞)有限公司 | 电子产品测试装置及系统 |
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C14 | Grant of patent or utility model | ||
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Effective date of registration: 20170425 Address after: 710075 Shaanxi City, Xi'an province high tech Road No. 38, innovation center, A, block, floor 4 Patentee after: XI'AN UNIIC SEMICONDUCTORS Co.,Ltd. Address before: Xinluo Avenue high tech Zone of Ji'nan City, Shandong province 250101 No. 1768 Qilu Software Park building B block two layer Patentee before: Shandong Sinochip Semiconductors Co., Ltd. |
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AV01 | Patent right actively abandoned |
Granted publication date: 20150603 Effective date of abandoning: 20171226 |
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AV01 | Patent right actively abandoned |
Granted publication date: 20150603 Effective date of abandoning: 20171226 |