CN204359695U - Single wavelength excites, energy-dispersion X-ray fluorescence spectrometer - Google Patents
Single wavelength excites, energy-dispersion X-ray fluorescence spectrometer Download PDFInfo
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- CN204359695U CN204359695U CN201520068597.3U CN201520068597U CN204359695U CN 204359695 U CN204359695 U CN 204359695U CN 201520068597 U CN201520068597 U CN 201520068597U CN 204359695 U CN204359695 U CN 204359695U
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Abstract
The utility model discloses that a kind of Single wavelength excites, energy-dispersion X-ray fluorescence spectrometer, comprise X-ray tube, hyperboloid analyzing crystal, detector, incident angle between the central point of X-ray tube and hyperboloid analyzing crystal is a, incident angle between the central point of hyperboloid analyzing crystal and sample is b, emergence angle between sample and detector is c, wherein a is 5 ° ~ 80 °, and b is 10 ° ~ 85 °, and c is 10 ° ~ 70 °.Single wavelength of the present utility model excites, energy-dispersion X-ray fluorescence spectrometer, and the fluorescent X-ray of electromagnetic radiation is directly injected detector and detected, and high resolving power energy dispersion makes to detect multiple element; Adopt hyperboloid analyzing crystal, by the monochromatization of X ray continuous spectrum, reduce the interference of continuous background to detection elements, reduce detection limit.
Description
Technical field
The utility model belongs to X-ray check field, particularly relates to that a kind of Single wavelength excites, energy-dispersion X-ray fluorescence spectrometer.
Background technology
Applicant has declared on October 9th, 2014 patent of invention that name is called " the hyperboloid bent crystal, the combined type hyperboloid bent crystal and Single wavelength dispersion X-ray fluorescence spectrophotometer ", its ultimate principle is by the principle of crystal to X ray Bragg diffraction, the heterogeneous X-ray that micro-focal spot Cr target X-ray tube sends is carried out monochromatization, monochromator is the hyperboloid bent crystal of ultrahigh in efficiency, independent research, it is the Ka ray of Single wavelength Cr after monochromatic, for element specific in excited sample, obtain the characteristic fluorescence X ray of element to be measured.Owing to inciding the X ray of sample except selected wavelength, continuous background is very low, so the X ray penetrated from sample, there is scattering background hardly, signal to noise ratio (S/N ratio) is very high, is conducive to reducing detection limit.But the X-ray fluorescence spectrophotometer that foregoing invention is recorded only can detect the single element in sample, and sensing range is limited.
Utility model content
The technical problems to be solved in the utility model is to provide and a kind ofly can detects that the Single wavelength of multiple element in sample excites, energy-dispersion X-ray fluorescence spectrometer.
For solving the problems of the technologies described above, the utility model adopts following technical scheme:
A kind of Single wavelength excites, energy-dispersion X-ray fluorescence spectrometer, comprise X-ray tube, hyperboloid analyzing crystal, detector, incident angle between the central point of X-ray tube and hyperboloid analyzing crystal is a, incident angle between the central point of hyperboloid analyzing crystal and sample is b, emergence angle between sample and detector is c, wherein a is 5 ° ~ 80 °, and b is 10 ° ~ 85 °, and c is 10 ° ~ 70 °.
Single wavelength of the present utility model excites, energy-dispersion X-ray fluorescence spectrometer, and wherein said a is 30 ° ~ 50 °.
Single wavelength of the present utility model excites, energy-dispersion X-ray fluorescence spectrometer, and wherein said b is 30 ° ~ 50 °.
Single wavelength of the present utility model excites, energy-dispersion X-ray fluorescence spectrometer, and wherein said c is 40 ° ~ 60 °.
Single wavelength of the present utility model excites, energy-dispersion X-ray fluorescence spectrometer, and wherein said detector adopts SDD detector or Si-PIN detector.
Single wavelength of the present utility model excites, energy-dispersion X-ray fluorescence spectrometer, and the fluorescent X-ray of electromagnetic radiation is directly injected detector and detected, and high resolving power energy dispersion makes to detect multiple element; Adopt hyperboloid analyzing crystal, by the monochromatization of X ray continuous spectrum, reduce the interference of continuous background to detection elements, reduce detection limit.
Below in conjunction with accompanying drawing, Single wavelength of the present utility model is excited, energy-dispersion X-ray fluorescence spectrometer is described further.
Accompanying drawing explanation
Fig. 1 is that the utility model Single wavelength excites, the structural representation of energy-dispersion X-ray fluorescence spectrometer.
Embodiment
As shown in Figure 1, the utility model Single wavelength excites, energy-dispersion X-ray fluorescence spectrometer comprises X-ray tube 1, hyperboloid analyzing crystal 2, detector 3, incident angle between the central point of X-ray tube 1 and hyperboloid analyzing crystal 2 is a, incident angle between the central point of hyperboloid analyzing crystal 2 and sample 4 is b, emergence angle between sample 4 and detector 3 is c, wherein a is 5 ° ~ 80 °, and b is 10 ° ~ 85 °, and c is 10 ° ~ 70 °.Detector adopts SDD detector or Si-PIN detector.
Single wavelength of the present utility model excites, energy-dispersion X-ray fluorescence spectrometer, and wherein a is preferably 30 ° ~ 50 °, and b is preferably 30 ° ~ 50 °, and c is preferably 40 ° ~ 60 °, and the result detected in preferred range of angles is more accurate.
The utility model Single wavelength excites, energy-dispersion X-ray fluorescence spectrometer, the X ray that X-ray tube 1 is launched obtains pure X ray after hyperboloid analyzing crystal 2 focuses on, pure excitation of X-rays testing sample 4, produce fluorescent X-ray, fluorescent X-ray is injected SDD detector 3 and is obtained fluorescence spectrum figure.
The utility model Single wavelength excites, energy-dispersion X-ray fluorescence spectrometer has the following advantages:
1, by the monochromatization of X ray continuous spectrum, reduce the interference of continuous background to detection elements, reduce detection limit, detection limit can reach ppm level, solves detection elements content low, be difficult to take out in continuous spectrum survey the problem of the characteristic spectrum of element;
2, hyperboloid analyzing crystal is adopted, the ray of phase co-wavelength is allowed to incide crystal with same Bragg angle, more X ray is so just had to participate in diffraction, improve diffraction efficiency and diffracted intensity, pointolite can be focused on pointolite, play the effect of " strong focusing ", the detector of small size exploration hole is more easily detected;
3, the fluorescent X-ray of electromagnetic radiation is directly injected detector and is detected, and high resolving power energy dispersion makes to detect multiple element;
4, detector adopts SDD detector or Si-PIN detector, and SDD detector energy resolution is very high, excellent performance, and noise is low;
5, carried out further restriction to X ray, fluorescent X-ray angle that is incident and outgoing, the result detected in preferred range of angles is more accurate.
Above-described embodiment is only be described preferred implementation of the present utility model; not scope of the present utility model is limited; under the prerequisite not departing from the utility model design spirit; the various distortion that those of ordinary skill in the art make the technical solution of the utility model and improvement, all should fall in protection domain that the utility model claims determine.
Claims (5)
1. a Single wavelength excite, energy-dispersion X-ray fluorescence spectrometer, it is characterized in that: comprise X-ray tube, hyperboloid analyzing crystal, detector, incident angle between the central point of X-ray tube and hyperboloid analyzing crystal is a, incident angle between the central point of hyperboloid analyzing crystal and sample is b, emergence angle between sample and detector is c, wherein a is 5 ° ~ 80 °, and b is 10 ° ~ 85 °, and c is 10 ° ~ 70 °.
2. Single wavelength according to claim 1 excite, energy-dispersion X-ray fluorescence spectrometer, it is characterized in that: described a is 30 ° ~ 50 °.
3. Single wavelength according to claim 2 excite, energy-dispersion X-ray fluorescence spectrometer, it is characterized in that: described b is 30 ° ~ 50 °.
4. Single wavelength according to claim 3 excite, energy-dispersion X-ray fluorescence spectrometer, it is characterized in that: described c is 40 ° ~ 60 °.
5. the Single wavelength according to any one of Claims 1 to 4 excites, energy-dispersion X-ray fluorescence spectrometer, it is characterized in that: described detector adopts SDD detector or Si-PIN detector.
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| CN201520068597.3U CN204359695U (en) | 2015-01-30 | 2015-01-30 | Single wavelength excites, energy-dispersion X-ray fluorescence spectrometer |
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Cited By (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105115999A (en) * | 2015-09-08 | 2015-12-02 | 北京安科慧生科技有限公司 | High-sensitivity monochrome stimulation type multi-element X-ray fluorescence spectrophotometer |
| CN108802081A (en) * | 2017-04-27 | 2018-11-13 | 北京安科慧生科技有限公司 | X-ray fluorescence (XRF) spectroscopy systems and methods |
| CN109030529A (en) * | 2018-10-30 | 2018-12-18 | 上海爱斯特电子有限公司 | Monochromatic excitation Xray fluorescence spectrometer |
| US10207296B2 (en) | 2015-07-16 | 2019-02-19 | UHV Technologies, Inc. | Material sorting system |
| US10625304B2 (en) | 2017-04-26 | 2020-04-21 | UHV Technologies, Inc. | Recycling coins from scrap |
| US10710119B2 (en) | 2016-07-18 | 2020-07-14 | UHV Technologies, Inc. | Material sorting using a vision system |
| US10722922B2 (en) | 2015-07-16 | 2020-07-28 | UHV Technologies, Inc. | Sorting cast and wrought aluminum |
| US10823687B2 (en) | 2015-08-03 | 2020-11-03 | UHV Technologies, Inc. | Metal analysis during pharmaceutical manufacturing |
| CN113030139A (en) * | 2021-05-31 | 2021-06-25 | 中国工程物理研究院激光聚变研究中心 | Novel crystal and compact imaging device |
| CN113960092A (en) * | 2021-11-10 | 2022-01-21 | 天津海关化矿金属材料检测中心 | Method for rapidly detecting ash content of coal |
| US11278937B2 (en) | 2015-07-16 | 2022-03-22 | Sortera Alloys, Inc. | Multiple stage sorting |
| CN114324434A (en) * | 2022-03-15 | 2022-04-12 | 天津海关动植物与食品检测中心 | X-ray fluorescence spectrometer and Chinese herbal medicine heavy metal rapid detection method |
| CN114740031A (en) * | 2022-04-13 | 2022-07-12 | 苏州佳谱科技有限公司 | X-ray fluorescence analysis system and analysis method thereof |
| US11964304B2 (en) | 2015-07-16 | 2024-04-23 | Sortera Technologies, Inc. | Sorting between metal alloys |
| US11969764B2 (en) | 2022-02-08 | 2024-04-30 | Sortera Technologies, Inc. | Sorting of plastics |
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2015
- 2015-01-30 CN CN201520068597.3U patent/CN204359695U/en active Active
Cited By (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11278937B2 (en) | 2015-07-16 | 2022-03-22 | Sortera Alloys, Inc. | Multiple stage sorting |
| US11964304B2 (en) | 2015-07-16 | 2024-04-23 | Sortera Technologies, Inc. | Sorting between metal alloys |
| US11471916B2 (en) | 2015-07-16 | 2022-10-18 | Sortera Alloys, Inc. | Metal sorter |
| US10207296B2 (en) | 2015-07-16 | 2019-02-19 | UHV Technologies, Inc. | Material sorting system |
| US10722922B2 (en) | 2015-07-16 | 2020-07-28 | UHV Technologies, Inc. | Sorting cast and wrought aluminum |
| US10823687B2 (en) | 2015-08-03 | 2020-11-03 | UHV Technologies, Inc. | Metal analysis during pharmaceutical manufacturing |
| CN105115999A (en) * | 2015-09-08 | 2015-12-02 | 北京安科慧生科技有限公司 | High-sensitivity monochrome stimulation type multi-element X-ray fluorescence spectrophotometer |
| US10710119B2 (en) | 2016-07-18 | 2020-07-14 | UHV Technologies, Inc. | Material sorting using a vision system |
| US10625304B2 (en) | 2017-04-26 | 2020-04-21 | UHV Technologies, Inc. | Recycling coins from scrap |
| US11260426B2 (en) | 2017-04-26 | 2022-03-01 | Sortera Alloys, hic. | Identifying coins from scrap |
| CN108802081B (en) * | 2017-04-27 | 2021-07-30 | 北京安科慧生科技有限公司 | X-ray fluorescence (XRF) spectroscopy systems and methods |
| CN108802081A (en) * | 2017-04-27 | 2018-11-13 | 北京安科慧生科技有限公司 | X-ray fluorescence (XRF) spectroscopy systems and methods |
| CN109030529A (en) * | 2018-10-30 | 2018-12-18 | 上海爱斯特电子有限公司 | Monochromatic excitation Xray fluorescence spectrometer |
| CN113030139A (en) * | 2021-05-31 | 2021-06-25 | 中国工程物理研究院激光聚变研究中心 | Novel crystal and compact imaging device |
| CN113960092A (en) * | 2021-11-10 | 2022-01-21 | 天津海关化矿金属材料检测中心 | Method for rapidly detecting ash content of coal |
| US11969764B2 (en) | 2022-02-08 | 2024-04-30 | Sortera Technologies, Inc. | Sorting of plastics |
| CN114324434A (en) * | 2022-03-15 | 2022-04-12 | 天津海关动植物与食品检测中心 | X-ray fluorescence spectrometer and Chinese herbal medicine heavy metal rapid detection method |
| CN114740031A (en) * | 2022-04-13 | 2022-07-12 | 苏州佳谱科技有限公司 | X-ray fluorescence analysis system and analysis method thereof |
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Address after: 101102 Room 101, 1st floor, building 21, yard 2, huanke Middle Road, Tongzhou District, Beijing Patentee after: BEIJING ANCHOR WISDOM TECHNOLOGY Co.,Ltd. Address before: 101101 building 11, yard 6, yuanzhongyuan, Financial Street, Tongzhou District, Beijing Patentee before: BEIJING ANCHOR WISDOM TECHNOLOGY Co.,Ltd. |
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