CN208443766U - A kind of fluorescent X-ray absorption spectrum detector - Google Patents
A kind of fluorescent X-ray absorption spectrum detector Download PDFInfo
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- CN208443766U CN208443766U CN201821040985.0U CN201821040985U CN208443766U CN 208443766 U CN208443766 U CN 208443766U CN 201821040985 U CN201821040985 U CN 201821040985U CN 208443766 U CN208443766 U CN 208443766U
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- fluorescent
- narrow slit
- absorption spectrum
- ray absorption
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Abstract
The utility model creation provides a kind of fluorescent X-ray absorption spectrum detector, including laboratory sample storehouse, two one-dimensional narrow slit structures are arranged in laboratory sample storehouse front end, second one-dimensional narrow slit structure with first one-dimensional narrow slit structure is in 90 ° stacks, large-scale semiconductor photodiode detector is arranged in one-dimensional narrow slit structure rear end, and one-dimensional narrow slit structure includes aluminium frame, and several blades are equipped in aluminium frame, wherein the installation of blade is overlapped with the directions of rays of focus, and focus is distance of the slit to sample；Large-scale semiconductor photodiode detector includes aluminum enclosure, and photodiode is fixed on aluminum enclosure, and exports electric signal by BNC signal draw socket.The utility model, which is created, then has the function of two-dimentional slit for two one-dimensional narrow slit structure combinations in 90 °, and improve effect fluorescence passes through efficiency；The utility model creates detection efficient height, and detection sensitivity is high, and structure is simple, and production is simple, at low cost.
Description
Technical field
The invention belongs to structure of matter analysis Instrument equipment field, more particularly, to a kind of fluorescent X-ray absorption spectra
Detector.
Background technique
Fig. 1 is the structural schematic diagram of the LYTLE type fluorescent X-ray ionization chamber detector of U.S. EXAFS company production.Its work
Make principle: passing through the sample being fixed on specimen holder when synchrotron radiation X light beam enters laboratory sample storehouse, excited by incident X-rays
Sample generate specific x-ray fluorescence, comprising carrying the ingredient of the information of sample structure in the x-ray fluorescence, while also wrapping
Containing interference component.In order to improve signal-to-noise ratio, it is provided with filter plate before the detectors to filter out interference component.But it is glimmering in X-ray
Second-order fluorescence transmitting can occur for filter plate under light action, become new interference source.It is set after filter plate in order to solve this problem
A two-dimentional slit is set, the focus of slit is located on sample, then can pass through slit to the greatest extent by the fluorescence that sample generates
And detector is reached, but filter plate, so largely being stopped by slit, cannot pass through not in the focus of slit.Detector is set
It sets in slit back, which uses a kind of ionisation chamber of big receiving area as detector, for being converted to fluorescent X-ray
Electric signal output obtains sample structure information so as to data collection and analysis.
Its basic structure is made of the ionisation chamber of two-dimentional slit and big receiving area and weak current signal amplifier.The two
All there is biggish difficulty in design and manufacture, and there is also the spaces of raising for the measurement accuracy of the equipment.
Summary of the invention
In view of this, the invention is directed to a kind of fluorescent X-ray absorption spectrum detector, to improve detection efficient,
And the sensitivity of detection.
In order to achieve the above objectives, the technical solution of the invention is achieved in that
A kind of fluorescent X-ray absorption spectrum detector, including laboratory sample storehouse, laboratory sample storehouse front end setting two are one-dimensional narrow
Crack structure, wherein second one-dimensional narrow slit structure with first one-dimensional narrow slit structure is in 90 ° stacks, one-dimensional narrow slit structure rear end
Large-scale semiconductor photodiode detector is set, for converting optical signals into electric signal output.
Further, the one-dimensional narrow slit structure includes aluminium frame, be equipped with several blades in the aluminium frame, wherein blade
Installation is overlapped with the directions of rays of focus, and focus is distance of the slit to sample.
Further, the blade selects 11.
Further, the large-scale semiconductor photodiode detector includes aluminum enclosure, and photodiode is fixed on
Aluminum enclosure, and electric signal is exported by BNC signal draw socket.
Further, the photodiode uses shore pine S4276-02, and effective area is 48 × 48mm.
Compared with the existing technology, a kind of fluorescent X-ray absorption spectrum detector described in the invention has the advantage that
(1) the invention by two one-dimensional narrow slit structures it is in 90 ° stack combination then have the function of two-dimentional slit, raising
Effect fluorescence passes through efficiency；
(2) the invention constitutes detector, substitution using large-scale semiconductor photodiode (shore pine S4276-02)
Detector of the ionisation chamber of big receiving area as photoelectric conversion, has higher detectivity, and structure is simple, makes work
Skill is simple；
(3) the invention detection efficient is high, and detection sensitivity is high, and structure is simple, and production is simple, at low cost.
Detailed description of the invention
The attached drawing for constituting a part of the invention is used to provide to further understand the invention, present invention wound
The illustrative embodiments and their description made are used to explain the present invention creation, do not constitute the improper restriction to the invention.?
In attached drawing:
Fig. 1 is LYTLE type x-ray fluorescence spectroscopy panel detector structure schematic diagram described in the invention embodiment；
Fig. 2 is photodiode storehouse inside top figure described in the invention embodiment；
Fig. 3 is the sectional view in photodiode storehouse described in the invention embodiment；
Fig. 4 is the top view of one-dimensional narrow slit structure described in the invention embodiment；
Fig. 5 is the sectional view of one-dimensional narrow slit structure described in the invention embodiment.
Description of symbols:
1- photodiode；2- aluminum enclosure；3-BNC signal draw socket；4- blade；5- focus；6- aluminium frame.
Specific embodiment
It should be noted that in the absence of conflict, the feature in embodiment and embodiment in the invention can
To be combined with each other.
In the description of the invention, it is to be understood that term " center ", " longitudinal direction ", " transverse direction ", "upper", "lower",
The orientation or positional relationship of the instructions such as "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outside" is
It is based on the orientation or positional relationship shown in the drawings, is merely for convenience of description the invention and simplifies description, rather than indicate
Or imply that signified device or element must have a particular orientation, be constructed and operated in a specific orientation, therefore cannot understand
For the limitation to the invention.In addition, term " first ", " second " etc. are used for description purposes only, and should not be understood as indicating
Or it implies relative importance or implicitly indicates the quantity of indicated technical characteristic." first ", " second " etc. are defined as a result,
Feature can explicitly or implicitly include one or more of the features.In the description of the invention, unless separately
It is described, the meaning of " plurality " is two or more.
In the description of the invention, it should be noted that unless otherwise clearly defined and limited, term " peace
Dress ", " connected ", " connection " shall be understood in a broad sense, for example, it may be being fixedly connected, may be a detachable connection, or integrally
Connection；It can be mechanical connection, be also possible to be electrically connected；Can be directly connected, can also indirectly connected through an intermediary,
It can be the connection inside two elements.For the ordinary skill in the art, on being understood by concrete condition
State concrete meaning of the term in the invention.
The present invention will be described in detail below with reference to the accompanying drawings and embodiments creates.
As shown in Figs. 1-5, the invention provides a kind of fluorescent X-ray absorption spectrum detector, comprising: one-dimensional slit knot
Structure, large-scale semiconductor photodiode detector are a kind of fluorescent X-ray absorption spectrum detector that main component combination is constituted,
Window in laboratory sample storehouse is once fixedly mounted one-dimensional narrow slit structure, second one-dimensional narrow slit structure and first it is in 90 ° folded
It puts, is finally large-scale semiconductor photodiode detector, thus constitutes the entirety of fluorescent X-ray absorption spectrum detector；
As illustrated in figures 4-5, one-dimensional slit includes: aluminium frame 6；For fixed blade；Blade 4, one-dimensional slit are by one group
The blade of specific installation site forms；Focus 5 has a focus 5, in fluorescent X-ray absorption spectrum detector for one-dimensional slit
Overall structure in, focus should be on the sample, i.e., the distance of slit to sample is F, and each blade 4, installation should be with cokes
The directions of rays of point is overlapped as shown in Figure 5.The blocking effect of more pairs of the quantity of blade interference is higher, but the percent of pass of effectively light
Also it reduces, comprehensively considers the design and select 11 blades.The invention is stacked two one-dimensional slits are in 90 °, then is equally played
The effect of two-dimentional slit, but its design and manufacture all greatly simplify, and easy to produce, furthermore the result of this substitution improves effectively
Fluorescence passes through efficiency；
As shown in Figure 2,3, large-scale semiconductor photodiode detector feature includes: photodiode (shore pine
S4276-02) 1, aluminum enclosure 2, BNC signal draw socket 3；Wherein, shore pine S4276-02 photodiode effective area be 48 ×
48mm is used to reduce dark current using no-bias, dark current > 15pA.Aluminum enclosure is shielded visible using being integrally machined
Light, photodiode are fixed on shell.Detector, substitution are constituted with large-scale semiconductor photodiode (shore pine S4276-02)
Detector of the ionisation chamber of big receiving area as photoelectric conversion.Identical as ionisation chamber, photodiode can also be by X-ray
Electric current is converted to, due to its ionization energy magnitude lower than the ionization energy of gas, so his detectivity is high.Furthermore outside it
Portion's structure is simple, so manufacture craft is simple, and weak current signal amplifier is omitted.
A kind of fluorescent X-ray absorption spectrum detector of the invention has detection efficient high, and detection sensitivity is high, structure
Simply, advantage at low cost, makes it possible to manufacture and provides.
The foregoing is merely the preferred embodiments of the invention, are not intended to limit the invention creation, all at this
Within the spirit and principle of innovation and creation, any modification, equivalent replacement, improvement and so on should be included in the invention
Protection scope within.
Claims (5)
1. a kind of fluorescent X-ray absorption spectrum detector, it is characterised in that: including laboratory sample storehouse, the setting of laboratory sample storehouse front end
Two one-dimensional narrow slit structures, wherein second one-dimensional narrow slit structure with first one-dimensional narrow slit structure is in 90 ° stacks, it is one-dimensional narrow
Large-scale semiconductor photodiode detector is arranged in crack structure rear end, for converting optical signals into electric signal output.
2. a kind of fluorescent X-ray absorption spectrum detector according to claim 1, it is characterised in that: the one-dimensional slit knot
Structure includes aluminium frame, is equipped with several blades in the aluminium frame, and wherein the installation of blade is overlapped with the directions of rays of focus, and focus is
Distance of the slit to sample.
3. a kind of fluorescent X-ray absorption spectrum detector according to claim 2, it is characterised in that: the blade selects 11
Piece.
4. a kind of fluorescent X-ray absorption spectrum detector according to claim 1, it is characterised in that: the large area is partly led
Body photodiode detector includes aluminum enclosure, and photodiode is fixed on aluminum enclosure, and is exported by BNC signal draw socket
Electric signal.
5. a kind of fluorescent X-ray absorption spectrum detector according to claim 4, it is characterised in that: the photodiode
Using shore pine S4276-02, effective area is 48 × 48mm.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821040985.0U CN208443766U (en) | 2018-06-29 | 2018-06-29 | A kind of fluorescent X-ray absorption spectrum detector |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201821040985.0U CN208443766U (en) | 2018-06-29 | 2018-06-29 | A kind of fluorescent X-ray absorption spectrum detector |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108469446A (en) * | 2018-06-29 | 2018-08-31 | 天津敬慎坊科技有限公司 | A kind of fluorescent X-ray absorption spectrum detector |
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2018
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108469446A (en) * | 2018-06-29 | 2018-08-31 | 天津敬慎坊科技有限公司 | A kind of fluorescent X-ray absorption spectrum detector |
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