CN203800922U - Function switching circuit suitable for chip test - Google Patents
Function switching circuit suitable for chip test Download PDFInfo
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- CN203800922U CN203800922U CN201420148740.5U CN201420148740U CN203800922U CN 203800922 U CN203800922 U CN 203800922U CN 201420148740 U CN201420148740 U CN 201420148740U CN 203800922 U CN203800922 U CN 203800922U
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Abstract
The utility model provides a function switching circuit suitable for chip test. The function switching circuit suitable for chip test mainly comprises a test pad, a serial-to-parallel circuit, a control circuit and an n-bit level conversion circuit. The control circuit controls the serial-to-parallel circuit, so that 1-bit level signals outputted by the test pad can be converted into m-bit parallel signals through the serial-to-parallel circuit, wherein the m-bit parallel signals are outputted, and m<=n; and finally the m-bit parallel signals are subjected to m-bit level conversion in the n-bit level conversion circuit, and then are outputted. According to the function switching circuit suitable for chip test of the utility model, a traditional fuse circuit is replaced by the test pad; an external-connection probe can prick the test pad, so that different signals can be inputted; and with only one test pad adopted, the functions of an n-bit fuse circuit in the prior art can be realized.
Description
Technical field
The utility model relates to a kind of function commutation circuit that is applicable to chip testing.
Background technology
In the design and manufacture thereof of chip, often can use fuse circuit.The Main Function of fuse is: after chip production completes, according to the setting of test result or function, need to switch fuse, its switching is mainly by laser, fuse default in chip to be blown, realize the change of circuit rigid connection, thereby change operating state or the function of circuit.
Because the not equal reason of working power, the output signal of fuse circuit can not directly be used to circuit.The signal demand of fuse circuit is just exported to other circuit after processing through level shifting circuit and is used.Conventionally, each fuse circuit connects a bit level change-over circuit.As shown in Figure 1, be fuse circuit structure of the prior art, in figure, n position fuse circuit connects n bit level change-over circuit and is used in conjunction with.
N position fuse circuit itself need to take larger area, and can not recover after being blown by laser, be difficult to reuse in chip testing or function setting operation, so integrated cost is higher.
Utility model content
In order to solve the problem that traditional scheme integrated cost is higher, the utility model proposes a kind of new function commutation circuit that is applicable to chip testing.
Basic solution of the present utility model is as follows:
Be applicable to a function commutation circuit for chip testing, mainly comprise that testing weld pad, string turn also circuit, control circuit and n bit level change-over circuit; String is turned described control circuit and circuit is controlled, and 1 bit level signal of testing weld pad output turned and circuit conversion is m parallel-by-bit signal by string, and m≤n here, finally by exporting after the m bit level conversion in n bit level change-over circuit.
Based on above-mentioned basic scheme, the utility model is also done following concrete optimization:
Above-mentioned control circuit comprises logical circuit, clock circuit and counting circuit, logical circuit is for turning to string and circuit, clock circuit and counting circuit send control signal, and the count value of returning according to counting circuit is controlled clock circuit and turned and circuit sends clock signal to string.
Above-mentioned string turns and circuit comprises n position datawire and corresponding n subelement, and one end of n subelement is as parallel signal output, and the other end connects altogether as serial signal input; Two metal-oxide-semiconductors that each subelement comprises pair of phase inverters and connects respectively enable signal and clock signal.
Advantage of the present utility model:
The utility model adopts testing weld pad to replace traditional fuse circuit, can prick testing weld pad by external probe and input different signals, only uses 1 testing weld pad, has just realized the function of n position fuse circuit in prior art.
1. although increased control circuit, string → and change-over circuit, with respect to n position fuse circuit, the circuit area of increase is very little, and power consumption is also very little.
2. by n position fuse circuit, be changed to 1 testing weld pad, do not need to change the hard link of circuit, increased the flexibility of circuit.
3. in technique, the realization of testing weld pad is simpler.
Accompanying drawing explanation
Fig. 1 is the schematic diagram of traditional scheme.
Fig. 2 is the schematic diagram of the utility model embodiment mono-.
Fig. 3 is the schematic diagram of the utility model embodiment bis-.
Fig. 4 is the structural representation of control circuit in the utility model.
Fig. 5 is that in the utility model, string turns the also structural representation of circuit.
Embodiment
Embodiment mono-
As shown in Figure 2, original n position fuse circuit changes 1 bit test pad into, connects string → and change-over circuit (transformation from serial to parallel).By string → and change-over circuit, 1 Bits Serial signal is converted into n parallel-by-bit signal, and n parallel-by-bit signal is by n bit level change-over circuit, can realize conversion under multiple different level and export to other circuit and use.Accordingly, need to arrange extra control circuit to string → and change-over circuit control.
As shown in Figure 4, the utility model has provided a kind of basic structure of control circuit.Control circuit Main Function is to control string → and the operating state of change-over circuit.It comprises logical circuit, clock circuit and counting circuit, and logical circuit is controlled clock circuit and counting circuit.
Suppose that the string here turns and only needs to be converted to m position (m≤n, this circuit can be changed being less than or equal to any position circuit of n position).Logical circuit sends control signal to clock circuit and counting circuit, simultaneously also to string → and change-over circuit send enable signal.Clock circuit and counting circuit are prepared to start working.It is m that counting circuit is set count value.Afterwards logical circuit control clock circuit to string → and change-over circuit send clock signal, coincidence circuit starts counting, when counting circuit counting reaches the value m of setting, send signal controlling clock circuit stop to string → and change-over circuit continue transmitted signal, coincidence circuit is issued logical circuit signal, logical circuit receive the backward string of signal that counting circuit sends → and change-over circuit send control signal.
Logical circuit is to consist of simple digital circuit, is not just here described in detail, as long as can realize similar function.
A kind of way of realization that has just provided control circuit here, is not limited to this in reality, as long as can realize above-mentioned similar functions.
Fig. 5 has provided a kind of string → and the concrete example of change-over circuit.In figure, the left side is 1 position datawire, and the right is n position datawire, also comprises n subelement simultaneously.The subelement is here simple 6 pipe (metal-oxide-semiconductor) unit, wherein in each inverter, comprises two metal-oxide-semiconductors, and the grid of two other metal-oxide-semiconductor connects respectively clock signal, for example clock signal C 1(clock1) and enable signal EN.
Specific works process is as follows: signal transmits from left to right.The enable signal EN being sent by control circuit first turn-offs rightmost metal-oxide-semiconductor in subelement, afterwards along with n bit clock c1, c2 ... cn arrives successively, in subelement, leftmost metal-oxide-semiconductor is opened successively, note can only having the metal-oxide-semiconductor on the left side in a unit, seat to open (holding wire of being sent by control circuit here should be n position simultaneously, be respectively c1, c2 ... cn), the serial signal on the left side exists in n subelement successively, after clock signal stops, the enable signal EN being sent by control circuit first opens rightmost metal-oxide-semiconductor in subelement, n bit data parallel output.
String described in the utility model turns and circuit is not limited to foregoing circuit structure, and those skilled in the art also can adopt other to realize the circuit of the arbitrary form of similar functions.
Embodiment bis-
As shown in Figure 3, original n position fuse circuit changes testing weld pad into, connects 1 bit level change-over circuit, signal is converted to the level of setting, then pass through to go here and there → and change-over circuit output n parallel-by-bit signal.Accordingly, need to arrange extra control circuit to string → and change-over circuit control.
Control circuit and string → and the concrete example of change-over circuit can be with reference to above-described embodiment one realization.
Claims (3)
1. a function commutation circuit that is applicable to chip testing, is characterized in that: mainly comprise that testing weld pad, string turn also circuit, control circuit and n bit level change-over circuit; String is turned described control circuit and circuit is controlled, and 1 bit level signal of testing weld pad output turned and circuit conversion is m parallel-by-bit signal by string, and m≤n here, finally by exporting after the m bit level conversion in n bit level change-over circuit.
2. the function commutation circuit that is applicable to chip testing according to claim 1, it is characterized in that: described control circuit comprises logical circuit, clock circuit and counting circuit, logical circuit is for turning to string and circuit, clock circuit and counting circuit send control signal, and the count value of returning according to counting circuit is controlled clock circuit and turned and circuit sends clock signal to string.
3. the function commutation circuit that is applicable to chip testing according to claim 1 and 2, it is characterized in that: described string turns and circuit comprises n position datawire and corresponding n subelement, one end of n subelement is as parallel signal output, and the other end connects altogether as serial signal input; Two metal-oxide-semiconductors that each subelement comprises pair of phase inverters and connects respectively enable signal and clock signal.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420148740.5U CN203800922U (en) | 2014-03-28 | 2014-03-28 | Function switching circuit suitable for chip test |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420148740.5U CN203800922U (en) | 2014-03-28 | 2014-03-28 | Function switching circuit suitable for chip test |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203800922U true CN203800922U (en) | 2014-08-27 |
Family
ID=51383106
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201420148740.5U Withdrawn - After Issue CN203800922U (en) | 2014-03-28 | 2014-03-28 | Function switching circuit suitable for chip test |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN203800922U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103916132A (en) * | 2014-03-28 | 2014-07-09 | 西安华芯半导体有限公司 | Function switching circuit applicable to chip testing |
-
2014
- 2014-03-28 CN CN201420148740.5U patent/CN203800922U/en not_active Withdrawn - After Issue
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103916132A (en) * | 2014-03-28 | 2014-07-09 | 西安华芯半导体有限公司 | Function switching circuit applicable to chip testing |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C56 | Change in the name or address of the patentee | ||
| CP01 | Change in the name or title of a patent holder |
Address after: 710055 Shaanxi City, Xi'an province high tech Road No. 38, innovation center, A, block, floor 4 Patentee after: XI'AN UNIIC SEMICONDUCTORS Co.,Ltd. Address before: 710055 Shaanxi City, Xi'an province high tech Road No. 38, innovation center, A, block, floor 4 Patentee before: Xi'an Sinochip Semiconductors Co., Ltd. |
|
| AV01 | Patent right actively abandoned | ||
| AV01 | Patent right actively abandoned | ||
| AV01 | Patent right actively abandoned |
Granted publication date: 20140827 Effective date of abandoning: 20180821 |
|
| AV01 | Patent right actively abandoned |
Granted publication date: 20140827 Effective date of abandoning: 20180821 |