CN203688685U - RFID reader aging test auxiliary device - Google Patents
RFID reader aging test auxiliary device Download PDFInfo
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- CN203688685U CN203688685U CN201320789622.8U CN201320789622U CN203688685U CN 203688685 U CN203688685 U CN 203688685U CN 201320789622 U CN201320789622 U CN 201320789622U CN 203688685 U CN203688685 U CN 203688685U
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- mcu
- test
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- burn
- humidity sensor
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Abstract
The utility model discloses a RFID reader aging test auxiliary device including a MCU, a relay, an interface One, an interface of a temperature and humidity sensor, a liquid crystal display, a storage, an extended memory, a button, an alarm, a level switching circuit, a interface Two, a switch of a power source for relay control, the MCU communicates with a reader inside an aging chamber via the interface One and is connected with the temperature and humidity sensor inside the aging chamber via the interface of the temperature and humidity sensor, the liquid crystal display is connected with the MCU and displays the testing information, the storage and the extended memory are connected with the MCU and store the testing information, the MCU is tested by the button, the alarm is connected with the MCU and activates alarm upon finishing the test, the level switching circuit is connected between the MCU and the interface Two to switch the level, the communication between the MCU and the upper computer is realized by the interface Two. The utility model with simple structure and high efficiency is convenient to use.
Description
Technical field
The utility model relates to measures electric variable technical field, especially a kind of rfid interrogator burn-in test servicing unit.
Background technology
Rfid interrogator burn-in test, refer to finished product read write line to be placed into contain in water vapor, high temperature, low temperature or hot and humid comprehensive environment and test for a long time, observe the moisture-proof, heatproof degree of product, the performance of the low temperature resistant or high temperature of resistance to high humidity, to improving product design, make product meet the demand of normal work under multiple rugged surroundings.
Traditional rfid interrogator burn-in test, mostly be to be placed into the read write line in ageing oven with connection of a Serial Port Line, on the serial ports that is connected to the outer PC of ageing oven, when carrying out burn-in test, keep read write line and PC to communicate, use the upper computer software on PC to carry out the accumulation of total degree and number of success.In the time that needs carry out read write line burn-in test in enormous quantities, often occur that serial ports uses not and buys the situation of a large amount of expensive serial port patch cord and USB deconcentrator.And while carrying out this method of testing, in ageing oven wiring chaotic, changing read write line often needs a large amount of time.In test process, tester often wants paper using pen to record the current information such as temperature and success ratio, once meet with the situations such as power-off or tester's carelessness, needs again to restart to carry out burn-in test, very trouble.
Utility model content
Goal of the invention of the present utility model is: for the problem of above-mentioned existence, provide a kind of simple in structure, easy to use and rfid interrogator burn-in test servicing unit that efficiency is high.
The technical solution adopted in the utility model is as follows:
The utility model provides a kind of rfid interrogator burn-in test servicing unit, comprise MCU, relay, serial interface one, Temperature Humidity Sensor interface, liquid crystal display, storer, extended memory, button, alarm, level shifting circuit and serial interface two, the switch of described power source for relay control, described MCU communicates by serial interface one and the read write line in ageing oven, described MCU is connected with the Temperature Humidity Sensor in ageing oven by Temperature Humidity Sensor interface, described liquid crystal display is connected and shows detecting information with MCU, described storer is connected with MCU with extended memory and stores detecting information, described button carries out test operation to MCU, described alarm is connected with MCU and is starting and reporting to the police in the time that test completes, described level shifting circuit is connected between MCU and serial interface two and carries out level conversion, described serial interface two is realized communicating by letter of MCU and host computer.
Such scheme is carried out preferably, and described MCU adopts MSP430F149 single-chip microcomputer.
Such scheme is carried out preferably, and described Temperature Humidity Sensor interface is DHT11 Temperature Humidity Sensor interface.
Such scheme is carried out preferably, and described liquid crystal display is LCD12864 liquid crystal display.
Such scheme is carried out preferably, and described storer and extended memory are AT24C256 storage chip.
Such scheme is carried out preferably, and described level shifting circuit adopts MAX3232 transceiver.
Such scheme is carried out preferably, and described serial interface two adopts DB9 serial port interface.
In sum, owing to having adopted technique scheme, the beneficial effects of the utility model are:
1. the serial interface one of communicating by letter with read write line in the utility model customized one with the serial communication protocol of read write line compatibility, all consistent with read write line of the start frame of its each frame data and end frame, therefore, tester can complete communicating by letter between burn-in test backup system without any code of amendment read write line.
2. the AT24C256 storage chip in the utility model can be stored the nearly data of 256KB, its data file layout is 32768pageX8bit, be that storage space is 32768 pages, every one page is containing the data of a byte, the form of storage content is " No. UID (9 bytes)+humiture data (2 bytes)+postambles (1 byte) of numbering (2 bytes)+tested card of frame head (1 byte)+test ", the such storage chip of a slice can be stored nearly 2150 test data, this has met the needs of test test substantially, unnecessary storage space will be used for storing the total degree of test, time and success ratio data.
3. tester is after to the utility model parameter, setting completes, and without carrying out any supervision and other operations, only after the end to be tested such as need, utilizes liquid crystal display inquire about test result and gather.In the time suddenly meeting with power-off, tester is also without carrying out any operation, the utility model can in the time re-powering, automatically start ageing oven on breakpoint place continuation once test, liberated tester completely.And this installation cost is low, volume is little, easy for installation, user only need to drop into little fund just can obtain very high efficiency.
Brief description of the drawings
The utility model will illustrate by example and with reference to the mode of accompanying drawing, wherein:
Fig. 1 is a kind of external connection structure block diagram of rfid interrogator burn-in test servicing unit;
Fig. 2 is a kind of inner connecting structure block diagram of rfid interrogator burn-in test servicing unit.
Embodiment
Disclosed all features in this instructions, or step in disclosed all methods or process, except mutually exclusive feature and/or step, all can combine by any way.
Below in conjunction with Fig. 1, Fig. 2, the utility model is elaborated.
A kind of rfid interrogator burn-in test servicing unit, comprise MCU, relay, serial interface one, Temperature Humidity Sensor interface, liquid crystal display, storer, extended memory, button, alarm, level shifting circuit and serial interface two, the switch of described power source for relay control, described MCU communicates by serial interface one and the read write line in ageing oven, described MCU is connected with the Temperature Humidity Sensor in ageing oven by Temperature Humidity Sensor interface, described liquid crystal display is connected and shows detecting information with MCU, described storer is connected with MCU with extended memory and stores detecting information, described button carries out test operation to MCU, described alarm is connected with MCU and is starting and reporting to the police in the time that test completes, described level shifting circuit is connected between MCU and serial interface two and carries out level conversion, described serial interface two is realized communicating by letter of MCU and host computer.
Described MCU adopts MSP430F149 single-chip microcomputer.
Described Temperature Humidity Sensor interface is DHT11 Temperature Humidity Sensor interface.
Described liquid crystal display is LCD12864 liquid crystal display.
Described storer and extended memory are AT24C256 storage chip.
Described level shifting circuit adopts MAX3232 transceiver.
Described serial interface two adopts DB9 serial port interface.
Rfid interrogator burn-in test servicing unit in the present embodiment uses the extended line of high-temp resisting high-humidity resisting that DHT11 Temperature Humidity Sensor is connected in ageing test box, use serial port connecting wire to be connected with the tested read write line being placed in ageing oven by serial interface one, tester manually arranges time and the number of times of test, or directly adopts the last settings that are kept at EEPROM the inside to test.This device starts after auxiliary burn-in test, to start ageing oven power supply by relay, rfid interrogator burn-in test backup system is by the test data that receives one by one read write line and send, and be kept in EEPROM according to the form of " No. UID (9 bytes)+postamble (1 byte) of numbering (2 bytes)+tested card of frame head (1 byte)+test ", preserve total degree and the success ratio of test simultaneously, once testing time or test duration arrive designated value, can cut off ageing oven power supply by relay, and send alerting signal by alarm, remind tester that test finishes.After test finishes, tester is connected PC by serial interface dual-purpose Serial Port Line with burn-in test backup system, read detecting information each time, also can directly pass through button operation LCDs, communication success ratio discrete distribution figure corresponding to humiture that shows each test point, facilitates tester to carry out test result and gathers.
Manually arrange
After rfid interrogator burn-in test servicing unit powers on, tester, according to the prompting of liquid crystal display, the total degree of testing or the T.T. of test, can complete setting by key-press input, also can, according to the last test value being kept in EEPROM storage chip, automatically complete setting.
Automatically complete
Test starting button is pressed or 15 seconds of tester during without actuation of keys, and rfid interrogator burn-in test servicing unit will start ageing test box by relay automatically.In test process, the data that system sends over the read write line receiving one by one from ageing test box, receive the humiture data that DHT11 humiture module sends over simultaneously, MCU will pack to these two data, store in EEPROM, and the number of times of statistical test and time, be updated in EEPROM.In the time of the total degree of testing or time arrival designated value, system is cut off ageing oven power supply by relay automatically, and sends alerting signal by alarm, reminds the current test of tester to finish.
Interpretation of result
Rfid interrogator burn-in test servicing unit calculates and tests each time corresponding humiture data and test success or not information according to result each time, and in LCD screen, shows discrete distribution figure.Tester also can use serial port connecting wire to connect PC and servicing unit, is read and is stored in the information of the test each time in EEPROM and analyzes voluntarily by host computer.
The utility model is not limited to aforesaid embodiment.The utility model can expand to any new feature or any new combination disclosing in this manual, and the arbitrary new method disclosing or step or any new combination of process.
Claims (7)
1. a rfid interrogator burn-in test servicing unit, it is characterized in that: comprise MCU, relay, serial interface one, Temperature Humidity Sensor interface, liquid crystal display, storer, extended memory, button, alarm, level shifting circuit and serial interface two, the switch of described power source for relay control, described MCU communicates by serial interface one and the read write line in ageing oven, described MCU is connected with the Temperature Humidity Sensor in ageing oven by Temperature Humidity Sensor interface, described liquid crystal display is connected and shows detecting information with MCU, described storer is connected with MCU with extended memory and stores detecting information, described button carries out test operation to MCU, described alarm is connected with MCU and is starting and reporting to the police in the time that test completes, described level shifting circuit is connected between MCU and serial interface two and carries out level conversion, described serial interface two is realized communicating by letter of MCU and host computer.
2. a kind of rfid interrogator burn-in test servicing unit according to claim 1, is characterized in that: described MCU adopts MSP430F149 single-chip microcomputer.
3. a kind of rfid interrogator burn-in test servicing unit according to claim 1, is characterized in that: described Temperature Humidity Sensor interface is DHT11 Temperature Humidity Sensor interface.
4. a kind of rfid interrogator burn-in test servicing unit according to claim 1, is characterized in that: described liquid crystal display is LCD12864 liquid crystal display.
5. a kind of rfid interrogator burn-in test servicing unit according to claim 1, is characterized in that: described storer and extended memory are AT24C256 storage chip.
6. a kind of rfid interrogator burn-in test servicing unit according to claim 1, is characterized in that: described level shifting circuit adopts MAX3232 transceiver.
7. a kind of rfid interrogator burn-in test servicing unit according to claim 1, is characterized in that: described serial interface two adopts DB9 serial port interface.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201320789622.8U CN203688685U (en) | 2013-12-05 | 2013-12-05 | RFID reader aging test auxiliary device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201320789622.8U CN203688685U (en) | 2013-12-05 | 2013-12-05 | RFID reader aging test auxiliary device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203688685U true CN203688685U (en) | 2014-07-02 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201320789622.8U Withdrawn - After Issue CN203688685U (en) | 2013-12-05 | 2013-12-05 | RFID reader aging test auxiliary device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN203688685U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103675541A (en) * | 2013-12-05 | 2014-03-26 | 成都天志大行信息科技有限公司 | Auxiliary device for RFID reader-writer aging tests |
| CN105203900A (en) * | 2015-09-01 | 2015-12-30 | 捷开通讯科技(上海)有限公司 | Touch screen power-on state test method |
-
2013
- 2013-12-05 CN CN201320789622.8U patent/CN203688685U/en not_active Withdrawn - After Issue
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103675541A (en) * | 2013-12-05 | 2014-03-26 | 成都天志大行信息科技有限公司 | Auxiliary device for RFID reader-writer aging tests |
| CN105203900A (en) * | 2015-09-01 | 2015-12-30 | 捷开通讯科技(上海)有限公司 | Touch screen power-on state test method |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| AV01 | Patent right actively abandoned |
Granted publication date: 20140702 Effective date of abandoning: 20151209 |
|
| C25 | Abandonment of patent right or utility model to avoid double patenting |