CN103675541A - Auxiliary device for RFID reader-writer aging tests - Google Patents
Auxiliary device for RFID reader-writer aging tests Download PDFInfo
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- CN103675541A CN103675541A CN201310643271.4A CN201310643271A CN103675541A CN 103675541 A CN103675541 A CN 103675541A CN 201310643271 A CN201310643271 A CN 201310643271A CN 103675541 A CN103675541 A CN 103675541A
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Abstract
The invention discloses an auxiliary device for RFID reader-writer aging tests. The auxiliary device comprises an MCU, a relay, a first serial port interface, a temperature and humidity sensor interface, a liquid crystal displayer, a storer, an expansion storer, a push key, an alarm, a level switching circuit and a second serial port interface. The relay controls a switch of a power supply. The MCU is communicated with a reader-writer in an aging box through the first serial port interface. The MCU is connected with a temperature and humidity sensor in the aging box through a temperature and humidity sensor interface. The liquid crystal displayer is connected with the MCU and displays testing information. The storer and the expansion storer are connected with the MCU and store testing information. The push key is used for testing operation on the MCU. The alarm is connected with the MCU and starts alarm when tests are completed. The level switching circuit is connected between the MCU and the second serial port interface and is used for level switching. The second serial port interface realizes the communication between the MCU and an upper computer. The auxiliary device for the RFID reader-writer aging tests is simple in structure, convenient and quick to use, and high in efficiency.
Description
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Technical field
The present invention relates to measure electric variable technical field, especially a kind of rfid interrogator burn-in test servicing unit.
Background technology
Rfid interrogator burn-in test, refer to finished product read write line to be placed into contain in water vapor, high temperature, low temperature or hot and humid comprehensive environment and test for a long time, observe the moisture-proof, heatproof degree of product, the performance of the low temperature resistant or high temperature of resistance to high humidity, to improving product design, make product meet the demand of normal work under multiple rugged surroundings.
Traditional rfid interrogator burn-in test, mostly be to be placed into the read write line in ageing oven with connection of a Serial Port Line, on the serial ports that is connected to the outer PC of ageing oven, when carrying out burn-in test, keep read write line and PC to communicate, use the upper computer software on PC to carry out the accumulation of total degree and number of success.When needs carry out read write line burn-in test in enormous quantities, often occur that serial ports is used not and buys the situation of a large amount of expensive serial port patch cord and USB deconcentrator.And while carrying out this method of testing, in ageing oven wiring chaotic, changing read write line often needs a large amount of time.In test process, tester often wants paper using pen to record the information such as current temperature and success ratio, once meet with the situations such as power-off or tester's carelessness, needs again to restart to carry out burn-in test, very trouble.
Summary of the invention
The object of the invention is to: for the problem of above-mentioned existence, provide a kind of simple in structure, easy to use and rfid interrogator burn-in test servicing unit that efficiency is high.
The technical solution used in the present invention is as follows:
The invention provides a kind of rfid interrogator burn-in test servicing unit, comprise MCU, relay, serial interface one, Temperature Humidity Sensor interface, liquid crystal display, storer, extended memory, button, alarm, level shifting circuit and serial interface two, the switch of described power source for relay control, described MCU communicates by serial interface one and the read write line in ageing oven, described MCU is connected with the Temperature Humidity Sensor in ageing oven by Temperature Humidity Sensor interface, described liquid crystal display is connected and shows detecting information with MCU, described storer is connected with MCU with extended memory and stores detecting information, described button carries out test operation to MCU, described alarm is connected with MCU and is starting and reporting to the police when test completes, described level shifting circuit is connected between MCU and serial interface two and carries out level conversion, described serial interface two is realized communicating by letter of MCU and host computer.
Such scheme is carried out preferably, and described MCU adopts MSP430F149 single-chip microcomputer.
Such scheme is carried out preferably, and described Temperature Humidity Sensor interface is DHT11 Temperature Humidity Sensor interface.
Such scheme is carried out preferably, and described liquid crystal display is LCD12864 liquid crystal display.
Such scheme is carried out preferably, and described storer and extended memory are AT24C256 storage chip.
Such scheme is carried out preferably, and described level shifting circuit adopts MAX3232 transceiver.
Such scheme is carried out preferably, and described serial interface two adopts DB9 serial port interface.
In sum, owing to having adopted technique scheme, the invention has the beneficial effects as follows:
1. the serial interface one of communicating by letter with read write line in the present invention has customized a serial communication protocol with read write line compatibility, the start frame of its each frame data and end frame be consistent with read write line all, therefore, tester without any code of revising read write line can complete with burn-in test backup system between communicate by letter.
2. the AT24C256 storage chip in the present invention can be stored the nearly data of 256KB, its data file layout is 32768pageX8bit, be that storage space is 32768 pages, every one page is containing the data of a byte, the form of storage content is " No. UID (9 bytes)+humiture data (2 bytes)+postambles (1 byte) of numbering (2 bytes)+tested card of frame head (1 byte)+test ", the such storage chip of a slice can be stored nearly 2150 test data, this has met the needs of test test substantially, unnecessary storage space will be used for storing the total degree of test, time and success ratio data.
3., after tester completes parameter setting of the present invention, without carrying out any supervision and other operations, after the end to be tested such as a need, utilize liquid crystal display inquiry test result and gather.When suddenly meeting with power-off, tester is also without carrying out any operation, meeting of the present invention when re-powering, automatically start ageing oven on breakpoint place once continue test, liberated tester completely.And this installation cost is low, volume is little, easy for installation, the fund that user only need to drop into seldom just can obtain very high efficiency.
Accompanying drawing explanation
Examples of the present invention will be described by way of reference to the accompanying drawings, wherein:
Fig. 1 is a kind of external connection structure block diagram of rfid interrogator burn-in test servicing unit;
Fig. 2 is a kind of inner connecting structure block diagram of rfid interrogator burn-in test servicing unit.
Embodiment
Disclosed all features in this instructions, or the step in disclosed all methods or process, except mutually exclusive feature and/or step, all can combine by any way.
Below in conjunction with Fig. 1, Fig. 2, the present invention is elaborated.
A kind of rfid interrogator burn-in test servicing unit, comprise MCU, relay, serial interface one, Temperature Humidity Sensor interface, liquid crystal display, storer, extended memory, button, alarm, level shifting circuit and serial interface two, the switch of described power source for relay control, described MCU communicates by serial interface one and the read write line in ageing oven, described MCU is connected with the Temperature Humidity Sensor in ageing oven by Temperature Humidity Sensor interface, described liquid crystal display is connected and shows detecting information with MCU, described storer is connected with MCU with extended memory and stores detecting information, described button carries out test operation to MCU, described alarm is connected with MCU and is starting and reporting to the police when test completes, described level shifting circuit is connected between MCU and serial interface two and carries out level conversion, described serial interface two is realized communicating by letter of MCU and host computer.
Described MCU adopts MSP430F149 single-chip microcomputer.
Described Temperature Humidity Sensor interface is DHT11 Temperature Humidity Sensor interface.
Described liquid crystal display is LCD12864 liquid crystal display.
Described storer and extended memory are AT24C256 storage chip.
Described level shifting circuit adopts MAX3232 transceiver.
Described serial interface two adopts DB9 serial port interface.
Rfid interrogator burn-in test servicing unit in the present embodiment uses the extended line of high-temp resisting high-humidity resisting that DHT11 Temperature Humidity Sensor is connected in ageing test box, by serial interface one, use serial port connecting wire to be connected with the tested read write line in being placed on ageing oven, tester manually arranges time and the number of times of test, or directly adopts the last settings that are kept at EEPROM the inside to test.This device starts after auxiliary burn-in test, to start ageing oven power supply by relay, rfid interrogator burn-in test backup system is by the test data that receives one by one read write line and send, and be kept in EEPROM according to the form of " No. UID (9 bytes)+postamble (1 byte) of numbering (2 bytes)+tested card of frame head (1 byte)+test ", preserve total degree and the success ratio of test simultaneously, once testing time or test duration arrive designated value, can cut off ageing oven power supply by relay, and send alerting signal by alarm, remind tester that test finishes.After test finishes, tester is connected PC by serial interface dual-purpose Serial Port Line with burn-in test backup system, read detecting information each time, also can directly pass through button operation LCDs, communication success ratio discrete distribution figure corresponding to humiture that shows each test point, facilitates tester to carry out test result and gathers.
Manually arrange
After rfid interrogator burn-in test servicing unit powers on, tester, according to the prompting of liquid crystal display, the total degree of testing or the T.T. of test, can complete setting by key-press input, also can, according to the last test value being kept in EEPROM storage chip, automatically complete setting.
Automatically complete
Test starting button is pressed or 15 seconds of tester during without actuation of keys, and rfid interrogator burn-in test servicing unit will start ageing test box by relay automatically.In test process, the data that system sends over the read write line receiving one by one from ageing test box, receive the humiture data that DHT11 humiture module sends over simultaneously, MCU will pack to these two data, store in EEPROM, and the number of times of statistical test and time, be updated in EEPROM.When the total degree of testing or time arrival designated value, system is cut off ageing oven power supply by relay automatically, and sends alerting signal by alarm, reminds the current test of tester to finish.
Interpretation of result
Rfid interrogator burn-in test servicing unit calculates and tests each time corresponding humiture data and test success or not information according to result each time, and in LCD screen, shows discrete distribution figure.Tester also can use serial port connecting wire to connect PC and servicing unit, by host computer, is read and is stored in the information of the test each time in EEPROM and analyzes voluntarily.
The present invention is not limited to aforesaid embodiment.The present invention can expand to any new feature or any new combination disclosing in this manual, and the arbitrary new method disclosing or step or any new combination of process.
Claims (7)
1. a rfid interrogator burn-in test servicing unit, it is characterized in that: comprise MCU, relay, serial interface one, Temperature Humidity Sensor interface, liquid crystal display, storer, extended memory, button, alarm, level shifting circuit and serial interface two, the switch of described power source for relay control, described MCU communicates by serial interface one and the read write line in ageing oven, described MCU is connected with the Temperature Humidity Sensor in ageing oven by Temperature Humidity Sensor interface, described liquid crystal display is connected and shows detecting information with MCU, described storer is connected with MCU with extended memory and stores detecting information, described button carries out test operation to MCU, described alarm is connected with MCU and is starting and reporting to the police when test completes, described level shifting circuit is connected between MCU and serial interface two and carries out level conversion, described serial interface two is realized communicating by letter of MCU and host computer.
2. a kind of rfid interrogator burn-in test servicing unit according to claim 1, is characterized in that: described MCU adopts MSP430F149 single-chip microcomputer.
3. a kind of rfid interrogator burn-in test servicing unit according to claim 1, is characterized in that: described Temperature Humidity Sensor interface is DHT11 Temperature Humidity Sensor interface.
4. a kind of rfid interrogator burn-in test servicing unit according to claim 1, is characterized in that: described liquid crystal display is LCD12864 liquid crystal display.
5. a kind of rfid interrogator burn-in test servicing unit according to claim 1, is characterized in that: described storer and extended memory are AT24C256 storage chip.
6. a kind of rfid interrogator burn-in test servicing unit according to claim 1, is characterized in that: described level shifting circuit adopts MAX3232 transceiver.
7. a kind of rfid interrogator burn-in test servicing unit according to claim 1, is characterized in that: described serial interface two adopts DB9 serial port interface.
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104297954A (en) * | 2014-09-16 | 2015-01-21 | 冀雅(廊坊)电子有限公司 | Power-up aging test device for liquid crystal display module |
| CN104569506A (en) * | 2014-11-19 | 2015-04-29 | 苏州市欧康诺电子科技有限公司 | Interface adaptor for ultra-high speed magnetic electric hard disc detection |
| CN104614622A (en) * | 2015-02-13 | 2015-05-13 | 南京六九零二科技有限公司 | Intelligent aging rack |
| CN105759136A (en) * | 2014-12-18 | 2016-07-13 | 天津中天证照印刷有限公司 | Detection method for failure mechanism of flexible RFID electronic tag during silver paste printing process |
| CN110400465A (en) * | 2019-07-24 | 2019-11-01 | 深圳市凯达尔科技实业有限公司 | Wisdom parking management method, storage medium and system based on ETC |
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| CN102353862A (en) * | 2011-08-26 | 2012-02-15 | 成都因纳伟盛科技股份有限公司 | Batch aging tooling system for information decryption module of second-generation ID (Identification) card reader |
| CN203688685U (en) * | 2013-12-05 | 2014-07-02 | 成都天志大行信息科技有限公司 | RFID reader aging test auxiliary device |
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| US7151442B1 (en) * | 2004-06-03 | 2006-12-19 | National Semiconductor Corporation | System, apparatus, and method for testing identification tags |
| CN102353862A (en) * | 2011-08-26 | 2012-02-15 | 成都因纳伟盛科技股份有限公司 | Batch aging tooling system for information decryption module of second-generation ID (Identification) card reader |
| CN203688685U (en) * | 2013-12-05 | 2014-07-02 | 成都天志大行信息科技有限公司 | RFID reader aging test auxiliary device |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104297954A (en) * | 2014-09-16 | 2015-01-21 | 冀雅(廊坊)电子有限公司 | Power-up aging test device for liquid crystal display module |
| CN104569506A (en) * | 2014-11-19 | 2015-04-29 | 苏州市欧康诺电子科技有限公司 | Interface adaptor for ultra-high speed magnetic electric hard disc detection |
| CN104569506B (en) * | 2014-11-19 | 2017-10-20 | 苏州欧康诺电子科技股份有限公司 | A kind of interface adapter detected for ultrahigh speed magnetoelectricity hard disk |
| CN105759136A (en) * | 2014-12-18 | 2016-07-13 | 天津中天证照印刷有限公司 | Detection method for failure mechanism of flexible RFID electronic tag during silver paste printing process |
| CN104614622A (en) * | 2015-02-13 | 2015-05-13 | 南京六九零二科技有限公司 | Intelligent aging rack |
| CN110400465A (en) * | 2019-07-24 | 2019-11-01 | 深圳市凯达尔科技实业有限公司 | Wisdom parking management method, storage medium and system based on ETC |
| CN110400465B (en) * | 2019-07-24 | 2021-08-20 | 深圳市凯达尔科技实业有限公司 | ETC-based intelligent parking management method, storage medium and system |
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