CN106326059A - Embedded equipment automatic testing system - Google Patents
Embedded equipment automatic testing system Download PDFInfo
- Publication number
- CN106326059A CN106326059A CN201610828476.3A CN201610828476A CN106326059A CN 106326059 A CN106326059 A CN 106326059A CN 201610828476 A CN201610828476 A CN 201610828476A CN 106326059 A CN106326059 A CN 106326059A
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- Prior art keywords
- data
- test system
- automatization
- card
- source device
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Classifications
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2268—Logging of test results
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/273—Tester hardware, i.e. output processing circuits
- G06F11/2733—Test interface between tester and unit under test
Abstract
An embedded equipment automatic testing system comprises data source equipment, a USB interface, an SD card storage system and an automatic testing system. Data is generated by the data source equipment, and the USB interface is installed on the data source equipment and used for transmitting the data generated by the data source equipment and testing instructions issued by the automatic testing system to the data source equipment; the SD card storage system comprises an SD storage card and an RTC clock controller; the automatic testing system is in bidirectional communication connection with the SD card storage system, and received data is transmitted to the automatic testing system in real time through the SD card storage system. The automatic testing system is used for sending the testing instructions to the data source equipment. The embedded equipment automatic testing system is convenient and easy to operate, bidirectional communication transmission of data is achieved, data can be automatically saved, and the data source equipment is automatically tested. The data has higher timeliness, inquiry during data analysis can be simplified, and testing efficiency is greatly improved.
Description
Technical field
The present invention relates to automatic field, particularly relate to a kind of embedded device automatization test system.
Background technology
Embedded system is one of the most rising IT application field, is widely used in industry control at present
The various aspects such as system, home appliance, intelligent artifact.Compared with general purpose type computer system, embedded system has following excellent: a. merit
Consume low, reliability is high；The most powerful, the ratio of performance to price is high；The most real-time, support multitask；D. take up room little, efficiency
High；E. towards application-specific, can flexible customization as required.
Serial ports (RS232/RS485 etc.) data logger of current commercial type or usb data monitor, be typically all
Transferring data to preserve in SD or Flash by serial ports, the data of collection can manage on PC and analyze.But exist with
Lower weak point: 1, data transmission belongs to one-way transmission, is sent data to SD card to preserve by serial ports from data source.Protect
Deposit for clear data, not free mark, need time-consuming Query Information when data are derived and are analyzed；Particularly data are spy
Fix time for information about, it is impossible to judge the ageing of data by data.2, data one-way communication, user cannot be to data
Source device operates, and need to interrupt data acquisition to operation, causes data to preserve imperfect, is not carried out automatic test effect.
When product is tested, sometimes can only test to equipment crawl log by transmitting order to lower levels, such as mobile unit,
Be inconvenient to use PC to carry out test operation, more existing method of testing complex steps and can only causing from individual event functional test
Efficiency test is the lowest.
Summary of the invention
The invention provides a kind of embedded device automatization test system, can with data in Real-time Collection test process,
And carry out multiple function test simultaneously, it is achieved the two-way communication transmission of data in test process.
The present invention is achieved by the following technical solutions:
A kind of embedded device automatization test system, including:
Data-source device, described data-source device generates data, and transfers data to SD card storage system；
USB interface, described USB interface is arranged in described data-source device, and described USB interface is used for transmitting data source and sets
The test command that data-source device is issued by the standby data generated and automatization test system；
SD card storage system, including SD storage card, RTC clock controller, described SD storage card is used for storing data source and sets
The standby data transmitted, when described SD card storage system receives data, the time receiving data is entered by described RTC clock controller
Row calibration, when described SD card storage system preserves data, data are added time-tagging by described RTC clock controller；
Automatization test system, described automatization test system is connected with the storage system bidirectional communication of described SD card, described
SD card storage system sends the data of reception to described automatization test system in real time；Described automatization test system is for sending out
Send test command to data-source device.
Above-mentioned a kind of embedded device automatization test system, wherein, described SD card storage system also include battery and
Switch, described battery is for being powered SD card storage system, and described switch is used for controlling battery.
Above-mentioned a kind of embedded device automatization test system, wherein, described SD card storage system also includes LED,
When data are sent to described SD card storage system, described LED flashes.
Above-mentioned a kind of embedded device automatization test system, wherein, described automatization test system uses script literary composition
Part configures.
Above-mentioned a kind of embedded device automatization test system, wherein, arranges one in described automatization test system
Clock chip, described RTC clock controller real time calibration clock chip, by described clock chip in described automatic test system
In system set send test command time, described automatization test system according to send test command time timing or every
Test command is sent to data-source device every certain time.
Above-mentioned a kind of embedded device automatization test system, wherein, sets in described automatization test system and returns
Returning value and test command corresponding to return value, the data that described automatization test system transmits according to SD card storage system determine
Return value, and issue test command to data-source device according to return value.
Above-mentioned a kind of embedded device automatization test system, wherein, in described automatic test module, also sets up
One data memory module, described data memory module is for storing the return value of setting and the test command that return value is corresponding.
In sum, owing to have employed technique scheme, the present invention compared with prior art, has the advantage that with useful
Effect:
The present invention is convenient, easily operate, and can automatically save data, and be automatically performed the test to data-source device.Pass through RTC
Function time calibration of clock controller so that the data of preservation have time tag, make data have more ageing, can simplify
Inquiry during data analysis.
The present invention regularly or sends test command at interval of certain time to data-source device, sets according to data source meanwhile
Standby related data issues test command, and both combine, and individual event functional test is changed into multiple function test, substantially increases
Testing efficiency.
The automatization test system of the present invention uses script file configuration, writes issuing of test command by configuration script
Time and mode, the function of the present invention is set by programming and can be adjusted, and therefore can be widely used in different product
In test, it is achieved automatic multifunctional is tested.By issuing test command, can realize data-source device and SD card storage system,
The two-way communication transmission of automatization test system, when system test, make test scope more comprehensively, more system, more efficient.
Accompanying drawing explanation
Fig. 1 is the schematic diagram of the present invention a kind of embedded device automatization test system.
Detailed description of the invention
Below in conjunction with the accompanying drawings the detailed description of the invention of the present invention is described in detail.
Referring to Fig. 1, the present embodiment provides a kind of embedded device automatization test system, and described test system includes:
Data-source device and the USB interface being arranged in data-source device, SD card storage system and automatization test system.
Described data-source device is for generating the related data of equipment, and transfers data to SD card storage system.
Described USB interface is used for transmitting the data of data-source device generation and automatization test system under data-source device
The test command sent out.
Described SD card storage system includes that SD storage card, RTC clock controller, described SD storage card are used for storing data source
The data that equipment transmits, SD storage card volume is little and memory capacity big, easy to use.Data are received in described SD card storage system
Time, the time receiving data is calibrated by described RTC clock controller, when described SD card storage system preserves data, and institute
State RTC clock controller and data are added time-tagging.
The data of data-source device are saved in real time in SD storage card by the present invention by USB interface, and the data of preservation are
Transparent data, data leading portion, by arranging RTC clock controller, can be added time tag, simplify data analysis by the present invention
Time inquiry.
Further, described SD card storage system also includes battery, switch and LED, and described on-off control battery is to SD card
Storage system is powered, and when data are sent to described SD card storage system, described LED flashes, and represents that data receiver becomes
Merit, and store with file mode.
The data that the present invention uses USB2.0 wiring to realize between data-source device and SD card storage system are transmitted and number
Transmission according to the test command between source device and automatization test system.USB2.0 wiring is a kind of high speed supporting hot plug
Serial transmission bus, uses differential signal to be transmitted data.
Described automatization test system is connected with the storage system bidirectional communication of described SD card, and described SD card storage system is real-time
Send the data of reception to described automatization test system；Described automatization test system is used for sending test command to data
Source device.
Clock chip, described RTC clock controller real time calibration clock core are set in described automatization test system
Sheet, described clock chip sets the time sending test command, described automatic test system in described automatization test system
Unite according to sending the time timing of test command or sending test command at interval of certain time to data-source device.
Use said method, regularly or send test command at interval of certain time to data-source device, it is not necessary to interrupt setting
Standby operation and data collection, data-source device when real-time testing that can be simple and convenient runs, be one the most easily
Automated testing method.
Described automatization test system use script file configuration, in described automatization test system set return value with
And test command corresponding to the test command that return value is corresponding, return value and return value is stored in a data memory module.
The data that described automatization test system real-time statistic analysis SD card storage system transmits, and determine return value according to data, under
Send out test command corresponding to return value to data-source device.
Use said method, can the related data of analytical data source device in real time, and issue test according to related data
Order, can effectively prevent data-source device from breaking down.Return value can also be fixed according to related data, issue according to return value
Test command controls the operation of equipment, automatically presets testing process, automatic jumps to when equipment runs preset testing process,
The test of completion system, it is not necessary to interrupt operation and the data collection of equipment, be one automated testing method the most easily.
By said method, the present invention regularly or sends test command at interval of certain time to data-source device, meanwhile,
Related data according to data-source device issues test command, and both combine, and individual event functional test is changed into multiple function and surveys
Examination, high optimizes testing efficiency.
In sum, the present invention is to set based on USB interface, SD storage card, the portable embedded of RTC clock controller
Standby automatization test system, the present invention is convenient, easily operate, and can automatically save data, and be automatically performed the survey to data-source device
Examination.
By function time calibration of RTC clock controller so that the data of preservation have time tag, make data more
Effective property, can simplify inquiry during data analysis.
The automatization test system of the present invention uses script file configuration, writes issuing of test command by configuration script
Time and mode, the function of the present invention is set by programming and can be adjusted, and therefore can be widely used in different product
In test, it is achieved automatic multifunctional is tested.By issuing test command, can realize data-source device and SD card storage system,
The two-way communication transmission of automatization test system, when system test, make test scope more comprehensively, more system, more efficient.
The SD card storage system of the present invention uses battery to power, and has portability, can use in different environments, and make
It is independent of PC by process.After test completes, SD storage card can be taken out, read the data in SD storage card by card reader,
And can be analyzed detecting the ageing of data and function accuracy on PC.
Embodiment described above is merely to illustrate technological thought and the feature of the present invention, in its object is to make this area
Technical staff will appreciate that present disclosure and implement according to this, it is impossible to only limit the patent model of the present invention with the present embodiment
Enclose, the most all equal changes made according to disclosed spirit or modification, still fall in the scope of the claims of the present invention.
Claims (7)
1. an embedded device automatization test system, it is characterised in that including:
Data-source device, described data-source device generates data, and transfers data to SD card storage system；
USB interface, described USB interface is arranged in described data-source device, and it is raw that described USB interface is used for transmitting data-source device
The test command that data-source device is issued by the data become and automatization test system；
SD card storage system, including SD storage card, RTC clock controller, described SD storage card is used for storing data-source device and passes
The data sent, when described SD card storage system receives data, described RTC clock controller carries out school to the time receiving data
Standard, when described SD card storage system preserves data, data are added time-tagging by described RTC clock controller；
Automatization test system, described automatization test system is connected with the storage system bidirectional communication of described SD card, described SD card
Storage system sends the data of reception to described automatization test system in real time；Described automatization test system is used for sending survey
Examination order is to data-source device.
A kind of embedded device automatization test system the most according to claim 1, it is characterised in that described SD card stores
System also includes battery and switch, and described battery is for being powered SD card storage system, and described switch is used for controlling battery.
A kind of embedded device automatization test system the most according to claim 2, it is characterised in that described SD card stores
System also includes LED, and when data are sent to described SD card storage system, described LED flashes.
A kind of embedded device automatization test system the most according to claim 1, it is characterised in that described automatization surveys
Test system uses script file configuration.
A kind of embedded device automatization test system the most according to claim 4, it is characterised in that in described automatization
Test system arranges clock chip, described RTC clock controller real time calibration clock chip, is existed by described clock chip
Setting the time sending test command in described automatization test system, described automatization test system is according to sending test command
Time timing or send test command at interval of certain time to data-source device.
A kind of embedded device automatization test system the most according to claim 4, it is characterised in that in described automatization
Setting return value and test command corresponding to return value in test system, described automatization test system according to the storage of SD card is
The data that system transmits determine return value, and issue test command to data-source device according to return value.
A kind of embedded device automatization test system the most according to claim 6, it is characterised in that in described automatization
In test module, also setting up a data memory module, described data memory module is for storing return value and the return of setting
The test command that value is corresponding.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
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| CN201610828476.3A CN106326059B (en) | 2016-09-18 | 2016-09-18 | A kind of embedded device automatization test system |
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| CN201610828476.3A CN106326059B (en) | 2016-09-18 | 2016-09-18 | A kind of embedded device automatization test system |
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| CN106326059A true CN106326059A (en) | 2017-01-11 |
| CN106326059B CN106326059B (en) | 2019-01-08 |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106685767A (en) * | 2017-03-22 | 2017-05-17 | 百通赫思曼工业（苏州）有限公司 | Multi-pair-data automatic testing system |
| CN110379149A (en) * | 2019-08-15 | 2019-10-25 | 珠海格力智能装备有限公司 | Equipment detection method and device |
| CN113156855A (en) * | 2021-04-07 | 2021-07-23 | 杭州永谐科技有限公司成都分公司 | Miniature data acquisition and processing system |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2882151Y (en) * | 2006-03-16 | 2007-03-21 | 南京师范大学 | Vehicle recorder |
| CN101324799A (en) * | 2007-06-11 | 2008-12-17 | 群联电子股份有限公司 | Portable memory device and synchronization method thereof |
| CN102222373A (en) * | 2011-06-23 | 2011-10-19 | 奇瑞汽车股份有限公司 | On-vehicle recorder |
| CN203502040U (en) * | 2013-04-17 | 2014-03-26 | 深圳市凌启电子有限公司 | Test system for vehicle multimedia terminal |
| CN104767995A (en) * | 2015-03-25 | 2015-07-08 | 青岛歌尔声学科技有限公司 | Method for recording electronic product test data and recording module |
| US9135132B2 (en) * | 2011-09-20 | 2015-09-15 | Samsung Electronics Co., Ltd. | Method of testing a device under test, device under test, and semiconductor test system including the device under test |
| CN105527878A (en) * | 2014-09-28 | 2016-04-27 | 炬芯（珠海）科技有限公司 | Data acquisition method, data acquisition device and data acquisition and debugging system |
-
2016
- 2016-09-18 CN CN201610828476.3A patent/CN106326059B/en active Active
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2882151Y (en) * | 2006-03-16 | 2007-03-21 | 南京师范大学 | Vehicle recorder |
| CN101324799A (en) * | 2007-06-11 | 2008-12-17 | 群联电子股份有限公司 | Portable memory device and synchronization method thereof |
| CN102222373A (en) * | 2011-06-23 | 2011-10-19 | 奇瑞汽车股份有限公司 | On-vehicle recorder |
| US9135132B2 (en) * | 2011-09-20 | 2015-09-15 | Samsung Electronics Co., Ltd. | Method of testing a device under test, device under test, and semiconductor test system including the device under test |
| CN203502040U (en) * | 2013-04-17 | 2014-03-26 | 深圳市凌启电子有限公司 | Test system for vehicle multimedia terminal |
| CN105527878A (en) * | 2014-09-28 | 2016-04-27 | 炬芯（珠海）科技有限公司 | Data acquisition method, data acquisition device and data acquisition and debugging system |
| CN104767995A (en) * | 2015-03-25 | 2015-07-08 | 青岛歌尔声学科技有限公司 | Method for recording electronic product test data and recording module |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106685767A (en) * | 2017-03-22 | 2017-05-17 | 百通赫思曼工业（苏州）有限公司 | Multi-pair-data automatic testing system |
| CN110379149A (en) * | 2019-08-15 | 2019-10-25 | 珠海格力智能装备有限公司 | Equipment detection method and device |
| CN113156855A (en) * | 2021-04-07 | 2021-07-23 | 杭州永谐科技有限公司成都分公司 | Miniature data acquisition and processing system |
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| CN106326059B (en) | 2019-01-08 |
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