CN203588975U - Mass spectrometer and secondary off-axis detector thereof - Google Patents
Mass spectrometer and secondary off-axis detector thereof Download PDFInfo
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- CN203588975U CN203588975U CN201320782208.4U CN201320782208U CN203588975U CN 203588975 U CN203588975 U CN 203588975U CN 201320782208 U CN201320782208 U CN 201320782208U CN 203588975 U CN203588975 U CN 203588975U
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- axis detector
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- deflection
- mass analyzer
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- 230000005684 electric field Effects 0.000 abstract description 12
- 230000035945 sensitivity Effects 0.000 abstract description 3
- 150000002500 ions Chemical class 0.000 description 42
- 239000002245 particle Substances 0.000 description 15
- 230000007935 neutral effect Effects 0.000 description 14
- 230000000694 effects Effects 0.000 description 8
- 238000005516 engineering process Methods 0.000 description 3
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 2
- 239000004411 aluminium Substances 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- 238000010276 construction Methods 0.000 description 2
- 229910052802 copper Inorganic materials 0.000 description 2
- 239000010949 copper Substances 0.000 description 2
- 230000005611 electricity Effects 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 229910001220 stainless steel Inorganic materials 0.000 description 2
- 239000010935 stainless steel Substances 0.000 description 2
- 238000001514 detection method Methods 0.000 description 1
- 238000007634 remodeling Methods 0.000 description 1
- 238000004904 shortening Methods 0.000 description 1
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Abstract
The utility model brings forward a mass spectrometer and a secondary off-axis detector thereof. The mass spectrometer comprises an ion source, a mass analyzer, and a secondary off-axis detector. And the secondary off-axis detector that is used for collecting and amplifying the ion released by the mass analyzer includes: a high-energy dynode, which is arranged at the direction different from the axial direction of the mass analyzer; a deflecting electrode, which is arranged between the high-energy dynode and the mass analyzer; and a detecting device, which is opposite to the high-energy dynode axially. Besides, the secondary off-axis detector also includes a first deflection shielding cover that covers the outsides the high-energy dynode and the detecting device; and a first opening hole is formed in the first deflection shielding cover. With the mass spectrometer and the secondary off-axis detector thereof, the secondary off-axis structure is used; and because of the first deflection shielding cover, the interferences on the mass spectrometer and the secondary off-axis detector thereof by the external electric field can be effectively shielded. Moreover, the mass spectrometer and the secondary off-axis detector thereof have high sensitivity and long service lives.
Description
Technical field
The utility model relates to mass spectrometer and secondary thereof from axis detector.
Background technology
Existing mass spectrometer is mainly comprised of ion source, mass analyzer and detector, and wherein detector conventionally adopts coaxial with mass analyzer or from the structure of axle.
Coaxial configuration mainly refers to the coaxial direction that detector is positioned over to mass spectrometer mass analyzer, charged sample ions and neutral particle through mass analyzer are all directly beaten on detector, when producing signal, caused larger neutral particle noise, and easily pollution detection device, the useful life of shortening detector.
From axle construction as being once that detector is positioned over mass analyzer and axially in direction in 90 °, sets up a high energy dynode above detector from axle construction.There is deflection for the first time in the charged sample ions through mass analyzer, charged sample ions is beaten on high energy dynode and produced secondary electron under the electric field action of high energy dynode, and electronics enters detector again.Further, in mass analyzer rear end, being provided with charged deflecting electrode, there is deflection for the first time in charged sample ions direction of motion under the effect of deflecting electrode, and then deflection for the second time occur under the effect of high energy dynode electric field.These two kinds of structures have further reduced the interference of neutral particle noise, have improved sensitivity.But the deflection area of above structure is vulnerable to the interference of other electric fields, neutral noise still exists.
Therefore, provide a kind of mass spectrometer and detector thereof that can effectively shield other electric fields interference to become a large technical problem urgently to be resolved hurrily in this area.
Utility model content
The utility model will solve mass spectrometer in prior art and detector is subject to the technical problem that other electric fields disturb.
For solving the problems of the technologies described above, the utility model adopts following technical scheme:
A kind of secondary the utility model proposes is from axis detector, for gathering, amplify the ion that mass spectrometric mass analyzer discharges, comprise be arranged at the axial different directions of described mass analyzer on high energy dynode, the detector that is arranged at the deflecting electrode between described high energy dynode and described mass analyzer and is axially oppositely arranged with described high energy dynode, it is characterized in that, described secondary also comprises the first deflection radome from axis detector, described the first deflection radome covers at described high energy dynode and detector outside, described the first deflection radome is provided with one first perforate.
According to an execution mode of the present utility model, described secondary also comprises the second deflection radome from axis detector, described the second deflection radome covers at described deflecting electrode outside, described the second deflection radome is provided with two second perforates and the 3rd perforate, the position of corresponding the first perforate of described two second perforates, the axial location of described the 3rd perforate corresponding mass analyzer.
According to another execution mode, described secondary also comprises outlet focus lens group from axis detector, and described outlet condenser lens is mounted between described mass analyzer and described the 3rd perforate.
According to another execution mode, described outlet focus lens group comprises at least one first lens.
According to another execution mode, described first lens is tubular lens or sheet lens.
According to another execution mode, described secondary also comprises entrance focus lens group from axis detector, and described entrance condenser lens is mounted between described the first perforate and described the second perforate.
According to another execution mode, described entrance focus lens group comprises at least one second lens.
According to another execution mode, described the second lens are tubular lens or sheet lens.
According to another execution mode, described deflecting electrode is stick electrode or curved surface electrode.
For solving the problems of the technologies described above, the technical scheme the utility model proposes also comprises, proposes a kind of mass spectrometer, comprises ion source, mass analyzer and from axis detector, and wherein, described is that described secondary is from axis detector from axis detector.
As shown from the above technical solution, the mass spectrometer the utility model proposes and secondary thereof, from axis detector, have adopted the structure of secondary from axle, the first deflection radome effective external electrical field interference from axis detector to mass spectrometer and secondary thereof that shielded is set.And then make mass spectrometer and the secondary thereof that the utility model proposes there is higher sensitivity and longer useful life from axis detector.
Accompanying drawing explanation
Fig. 1 is the structural representation of the utility model secondary from the first execution mode of axis detector;
Fig. 2 is the structural representation of the utility model secondary from the second execution mode of axis detector.
Wherein, description of reference numerals is as follows:
1. mass analyzer; 2. outlet focus lens group; 20. first lens; 3. entrance focus lens group; 30. second lens; 4. deflecting electrode; 5. high energy dynode; 6. detector; 7. the second deflection radome; 70. second perforates; 71. the 3rd perforates; 8. the first deflection radome; 80. first perforates.
Embodiment
The exemplary embodiments that embodies the utility model feature & benefits will describe in detail in the following description.Be understood that the utility model can have various variations on different embodiment, it neither departs from scope of the present utility model, and explanation wherein and to be shown in be the use explaining in essence, but not in order to limit the utility model.
The secondary deflection detector the utility model proposes is mainly used in gathering and amplifying the ion signal that mass spectrometric mass analyzer 1 discharges, and also can be used in other ion analysis checkout equipments.
Execution mode 1
As shown in Figure 1, mass spectrometer of the present utility model and secondary deflection detector thereof mainly comprise outlet focus lens group 2, entrance focus lens group 3, deflecting electrode 4, high energy dynode 5, detector 6 and the first deflection radome 8.Wherein high energy dynode 5 and detector 6 all can adopt traditional structure.
As shown in Figure 1, outlet focus lens group 2 is arranged at mass analyzer 1 and emits one end of ion.In the present embodiment, this outlet focus lens group 2 comprises two first lens 20 of coaxial setting, but the quantity of first lens 20 is not as limit.These two first lens 20 are selected sheet lens or tubular lens, but not as limit.
As shown in Figure 1, entrance focus lens group 3 is arranged at and exports on focus lens group 2 position at an angle, export focus lens group 2 coaxial with mass analyzer, entrance focus lens group 3 and outlet focus lens group 2 disalignments, and entrance focus lens group 3 is positioned in same level with the axis of outlet focus lens group 2.In the present embodiment, this entrance focus lens group 3 is 90 ° with the axis angle of outlet focus lens group 2, but not as limit.This entrance focus lens group 3 comprises two the second lens 30 of coaxial setting, but the quantity of the second lens 30 is not as limit.These two the second lens 30 also can be selected sheet lens or tubular lens, but not as limit.
As shown in Figure 1, deflecting electrode 4 is arranged between outlet focus lens group 2 and entrance focus lens group 3, in order to provide an electric field to make charged ion carry out a deflection.This deflecting electrode 4 is selected stick electrode or curved surface electrode, but not as limit.
As shown in Figure 1, high energy dynode 5 and detector 6 are arranged at the opposite side of entrance focus lens group 3, and this high energy dynode 5 is coaxial setting with this detector 6.Space between this high energy dynode 5 and this detector 6 is positioned at axis one end of entrance focus lens group 3 in the present embodiment,, after charged ion is emitted by mass analyzer 1, a deflection by outlet focus lens group 2 through deflecting electrode 4, by entrance focus lens group 3, enter behind the space between high energy dynode 5 and detector 6 again, by high energy dynode 5, produce secondary deflection and finally enter detector 6.
As shown in Figure 1, the first deflection radome 8 covers at the outside of high energy dynode 5 and detector 6, to shield the interference of external electrical field.In the present embodiment, this first deflection radome 8 is stainless steel, has good antipollution and decay resistance.Further, this first deflection radome 8 also can aluminium, copper etc. can conduct electricity and non-magnetic metal.The space that space between high energy dynode 5 and detector 6 is charged ion carries out deflection for the second time.On this first deflection radome 8, corresponding entrance focus lens group 3 offers one first perforate 80, be that charged ion enters the first deflection radome 8 by entrance focus lens group 3 by this first perforate 80, then by high energy dynode 5, produce secondary deflection and enter detector 6.The axis of the axis of this first perforate 80 and mass analyzer 1 is positioned in same level.
The mass spectrometer the utility model proposes is mainly comprised of the secondary deflection detector of ion source, mass analyzer 1 and present embodiment, and wherein ion source and mass analyzer 1 can be selected traditional structure, but not as limit.
Under operating state, ion source inspires ion, ion is emitted charged ion and neutral particle by mass analyzer 1, these charged ions and neutral particle are through the outlet focus lens group 2 that is connected to voltage, under the effect of deflecting electrode 4, charged ion deflects, and through the entrance focus lens group 3 that is connected to voltage, the direction of motion of charged ion is deflected to Y-direction by directions X.The electric field centering particle producing due to deflecting electrode 4 does not produce effect, and therefore these neutral particle paths are not changed.Complete a charged ion after deflection and enter the first deflection radome 8 by the first perforate 80, enter the space between high energy dynode 5 and detector 6, high energy dynode 5 carries out secondary deflection to these charged ions, the direction of motion that is charged ion is deflected to Z direction by Y-direction, and charged ion enters detector 6 after secondary deflection.Wherein residual neutral particle is not owing to being subject to the effect of high energy dynode 5, and motion path does not deflect, and cannot enter detector 6, reduced neutral particle noise.
As shown in Figure 2, the second execution mode of mass spectrometer of the present utility model and secondary deflection detector thereof, present embodiment and the first execution mode are basic identical, and difference is:
As shown in Figure 2, in the present embodiment, also comprise the second deflection radome 7, this second deflection radome 7 covers at the outside of deflecting electrode 4, to shield the interference of other electric fields.In the present embodiment, this second deflection radome 7 is stainless steel, has good antipollution and decay resistance.Further, this second deflection radome 7 also can aluminium, copper etc. can conduct electricity and non-magnetic metal.The space that space in the second deflection radome 7 is charged ion carries out a deflection.On this second deflection radome 7, the corresponding position that exports focus lens group 2 and entrance focus lens group 3 offers one the 3rd perforate 71 and one second perforate 70 respectively, be that charged ion enters the second deflection radome 7 by outlet focus lens group 2 by the 3rd perforate 71, then emit through entrance focus lens group 3 by the second perforate 70.
The mass spectrometer the utility model proposes is mainly comprised of the secondary deflection detector of ion source, mass analyzer 1 and present embodiment, and wherein ion source and mass analyzer 1 also can be selected traditional structure, but not as limit.
Under operating state, ion source inspires ion, ion is emitted charged ion and neutral particle by mass analyzer 1, these charged ions and neutral particle enter the second deflection radome 7 by the outlet focus lens group 2 and one the 3rd perforate 71 that are connected to voltage, under the effect of deflecting electrode 4, charged ion deflects and is emitted by the entrance focus lens group 3 that is connected to voltage by the second perforate 70, and the direction of motion of charged ion is deflected to Y-direction by directions X.The electric field centering particle producing due to deflecting electrode does not produce effect, and therefore these neutral particle paths are not changed, and cannot be emitted by the second deflection radome 7.Complete a charged ion after deflection and enter the first deflection radome 8 by the first perforate 80, enter the space between high energy dynode 5 and detector 6, high energy dynode 5 carries out secondary deflection to these charged ions, the direction of motion that is charged ion is deflected to Z direction by Y-direction, and charged ion enters detector 6 after secondary deflection.Wherein residual neutral particle is not owing to being subject to the effect of high energy dynode 5, and motion path does not deflect, and do not enter detector 6, reduced neutral particle noise.
Though described mass spectrometer of the present utility model and secondary deflection detector thereof with reference to several exemplary embodiments, should be understood that term used is explanation and illustrative, and not restrictive.Because the utility model can specifically be implemented in a variety of forms and not depart from its design or essence, therefore, above-described embodiment is not limited to any aforesaid details, and explain widely in the design that should limit in the claim of enclosing and scope, therefore all should be the claim of enclosing, the whole variations in the claim of falling into or its equivalent scope and remodeling contains.
Claims (10)
1. a secondary is from axis detector, be used for gathering the ion that amplifies mass spectrometric mass analyzer (1) release, comprise and being arranged at and the axially high energy dynode (5) on different directions, the detector (6) that is arranged at the deflecting electrode (4) between described high energy dynode (5) and described mass analyzer (1) and is axially oppositely arranged with described high energy dynode (5) of described mass analyzer (1), it is characterized in that, described secondary also comprises from axis detector:
The first deflection radome (8), covers at described high energy dynode (5) and detector (6) outside, and described the first deflection radome (8) is provided with one first perforate (80).
2. secondary according to claim 1 is from axis detector, it is characterized in that, described secondary also comprises the second deflection radome (7) from axis detector, described the second deflection radome (7) covers at described deflecting electrode (4) outside, described the second deflection radome (7) is provided with two second perforates (70) and the 3rd perforate (71), the position of described two second corresponding the first perforates of perforate (70) (80), the axial location of described the 3rd perforate (71) corresponding mass analyzer (1).
3. secondary according to claim 2 is from axis detector, it is characterized in that, described secondary also comprises outlet focus lens group (2) from axis detector, and described outlet focus lens group (2) is located between described mass analyzer (1) and described the 3rd perforate (71).
4. secondary according to claim 3, from axis detector, is characterized in that, described outlet focus lens group (2) comprises at least one first lens (20).
5. secondary according to claim 4, from axis detector, is characterized in that, described first lens (20) is tubular lens or sheet lens.
6. secondary according to claim 2 is from axis detector, it is characterized in that, described secondary also comprises entrance focus lens group (3) from axis detector, and described entrance focus lens group (3) is located between described the first perforate (80) and described the second perforate (70).
7. secondary according to claim 6, from axis detector, is characterized in that, described entrance focus lens group (3) comprises at least one second lens (30).
8. secondary according to claim 7, from axis detector, is characterized in that, described the second lens (30) are tubular lens or sheet lens.
9. secondary according to claim 1, from axis detector, is characterized in that, described deflecting electrode (4) is stick electrode or curved surface electrode.
10. a mass spectrometer, comprises ion source, mass analyzer (1) and from axis detector, it is characterized in that, described from axis detector be in claim 1～9 secondary described in any one from axis detector.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201320782208.4U CN203588975U (en) | 2013-11-27 | 2013-11-27 | Mass spectrometer and secondary off-axis detector thereof |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201320782208.4U CN203588975U (en) | 2013-11-27 | 2013-11-27 | Mass spectrometer and secondary off-axis detector thereof |
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| Publication Number | Publication Date |
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| CN203588975U true CN203588975U (en) | 2014-05-07 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201320782208.4U Expired - Lifetime CN203588975U (en) | 2013-11-27 | 2013-11-27 | Mass spectrometer and secondary off-axis detector thereof |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110137071A (en) * | 2019-05-24 | 2019-08-16 | 中国计量科学研究院 | Split type process mass spectrograph |
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2013
- 2013-11-27 CN CN201320782208.4U patent/CN203588975U/en not_active Expired - Lifetime
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110137071A (en) * | 2019-05-24 | 2019-08-16 | 中国计量科学研究院 | Split type process mass spectrograph |
| CN110137071B (en) * | 2019-05-24 | 2021-02-23 | 中国计量科学研究院 | Split process mass spectrometer |
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| Date | Code | Title | Description |
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| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CX01 | Expiry of patent term | ||
| CX01 | Expiry of patent term |
Granted publication date: 20140507 |