CN203443901U - Test defect identification device - Google Patents
Test defect identification device Download PDFInfo
- Publication number
- CN203443901U CN203443901U CN201320527652.1U CN201320527652U CN203443901U CN 203443901 U CN203443901 U CN 203443901U CN 201320527652 U CN201320527652 U CN 201320527652U CN 203443901 U CN203443901 U CN 203443901U
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- test defect
- recognizing device
- acquisition component
- support arm
- light source
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Abstract
The utility model provides a test defect identification device which comprises a base, a support, a light source part, a graph acquisition component and a communication component, wherein the support is vertically fixed on the base; the base comprises a sampling position; the support comprises a support arm, an end ring is arranged on the support arm, and the light source part is fixed above above the sampling position through the support arm; the graph acquisition component used for acquiring component parameter information is mounted in the end ring of the support arm; and the communication component used for receiving a signal sent by the graph acquisition component and communicated with the graph acquisition component is arranged in the base. According to the provided test defect identification device, the light source part and the graph acquisition component are fixed by the support arm, so that corresponding positions of a part can be shot and imaged, and obtained various parameter information of the part is transmitted to image analysis equipment for display and subsequent analysis, and the technical purpose of comprehensively obtaining the part parameter information is realized.
Description
Technical field
The utility model relates to part dimension discriminance analysis equipment technical field, more particularly, relates to a kind of test defect recognizing device.
Background technology
Test defect recognizing device can be used for, after the preparation of parts breach technique, its gap image is detected and export notch size information, with components of assays preparation, whether conforms with preset standard.
Existing test defect recognizing device only can be carried out actual measurement with regard to the size of parts breach mostly, and can not measure the information with other parameters of output block breach, thereby obtains all sidedly and have technical need for component information.
Utility model content
In view of this, the utility model provides a kind of test defect recognizing device, to realize the technique effect to component information Overall Acquisition.
The utility model provides a kind of test defect recognizing device, comprising: pedestal, support, light source part, figure acquisition component and communications component, wherein:
Described support is vertically fixed on described pedestal, and described pedestal comprises random sample position;
Described support comprises support arm, and described support arm has end ring, and described support arm is fixed on described light source part the top at described random sample position;
For gathering the figure acquisition component of described parts parameter information, be installed in the end ring of described support arm;
For receiving the signal that described figure acquisition component sends the described communications component being communicated with image analysis equipment, be arranged at described base interior.
Alternatively, described light source part comprises: white light emitting diode.
Described light source part is fixed on the below of described end ring.
Preferably, described figure acquisition component comprises: zoom enlarging lens, industrial camera and imager chip, and described zoom enlarging lens is arranged on described industrial camera, and described industrial camera is connected with described imager chip signal.
Preferably, the random sample position of described pedestal comprises backer's platform.
Preferably, the utility model also comprises: the electromagnetism dust cover that is sleeved on described test defect recognizing device periphery.
Preferably, the utility model also comprises: the damper rubber that is arranged at the bottom of described pedestal.
From above-mentioned technical scheme, can find out, test defect recognizing device in the utility model embodiment will be by support arm fixed light source parts and figure acquisition component, realization is taken and imaging the corresponding site of parts, and the various parameter communications of the parts that calculate are shown and subsequent analysis to image analysis equipment, reach the technical purpose of obtaining all sidedly parts parameter information.
Accompanying drawing explanation
Fig. 1 tests the structural representation of defect recognizing device in a kind of embodiment of the utility model;
In Fig. 1, the corresponding relation of component names and Reference numeral is:
Embodiment
Below in conjunction with the accompanying drawing in the utility model embodiment, the technical scheme in the utility model embodiment is clearly and completely described, obviously, described embodiment is only the utility model part embodiment, rather than whole embodiment.Embodiment based in the utility model, those of ordinary skills are not making the every other embodiment obtaining under creative work prerequisite, all belong to the scope of the utility model protection.
Please refer to Fig. 1, Fig. 1 tests the structural representation of defect recognizing device in a kind of embodiment of the utility model.
The utility model embodiment discloses a kind of test defect recognizing device, to realize the technique effect to component information Overall Acquisition.
A defect recognizing device, comprising: pedestal 1, support 2, light source part, figure acquisition component 4 and communications component, wherein:
The support arm 3 of support 2 is fixed on light source part the top, random sample position of pedestal 1;
For receiving the signal that figure acquisition component 4 sends and being arranged at the inside of pedestal 1 communications component being communicated with image analysis equipment.
It should be noted that: figure acquisition component comprises:
Light source part can utilize white light emitting diode to realize, and can be set to oblique top LED light field environment, avoids breach to form projection at interior concavo-convex interference parts breach profile, affects the precision of subsequent analysis;
It is pointed out that in addition image analysis equipment can realize by terminals such as notebook computers, communications component can be USB interface, wireless module etc., carries out connected sum data interaction with image analysis equipment.
The random sample position of pedestal 1 comprises: backer's platform, backer's platform can reduce the loaded down with trivial details horizontal cross of operator and the work such as intense adjustment longitudinally, backer's platform can arrange the projection of matching block breach, in detection, directly parts breach is ridden in to the raised tip place of backer's platform and carries out image acquisition.
In order to increase the rationality that arranges of test defect recognizing device, light source part is fixed on the below of end ring, carries out shooting and the imaging of parts in the light field of LED lamp source that is:.
Test defect recognizing device is applicable to the detection of the parts breach microscopic dimensions of various impact energy samples, sample material such as plastics, rubber, metal, pottery, timber, composite board, adhesive etc.Parts are through after the preparation of breach technique, adopt figure acquisition component 4 collected specimens breach surface images, and the effective point set of fuzzy clustering the comprehensive parameter information such as top radius-of-curvature, breach slope, angle, width of identification breach, more in depth, can demarcate virtual standard sample figure and the virtual error contour pattern producing according to standard sample, judging part processing qualification, and store in image analysis equipment, be convenient to recalling of parameter information.
On the basis of said structure, the utility model also comprises: the electromagnetism dust cover that is sleeved on test defect recognizing device periphery.Electromagnetism dust cover stops that extraneous machinery interference, heating power radiation and dust enter.
Damper rubber is arranged at the bottom of pedestal 1, avoids the impact of vibration on test process.
To sum up:
Test defect recognizing device in the utility model embodiment will be by support arm 3 fixed light source parts and figure acquisition component, realization is taken and imaging the corresponding site of parts, and the various parameter communications of the parts that calculate are shown and subsequent analysis to image analysis equipment, reach the technical purpose of obtaining all sidedly parts parameter information.
Above-mentioned explanation to the disclosed embodiments, makes professional and technical personnel in the field can realize or use the utility model.To the multiple modification of these embodiment, will be apparent for those skilled in the art, General Principle as defined herein can be in the situation that do not depart from the spirit or scope of the utility model embodiment, realization in other embodiments.Therefore, the utility model embodiment will can not be restricted to these embodiment shown in this article, but will meet the widest scope consistent with principle disclosed herein and features of novelty.
Claims (7)
1. a test defect recognizing device, is characterized in that, comprising: pedestal, support, light source part, figure acquisition component and communications component, wherein:
Described support is vertically fixed on described pedestal, and described pedestal comprises random sample position;
Described support comprises support arm, and described support arm has end ring, and described support arm is fixed on described light source part the top at described random sample position;
Figure acquisition component for acquisition component parameter information is installed in the end ring of described support arm;
For receiving the signal that described figure acquisition component sends the described communications component being communicated with image analysis equipment, be arranged at described base interior.
2. test defect recognizing device as claimed in claim 1, is characterized in that, described light source part comprises: white light emitting diode.
3. test defect recognizing device as claimed in claim 1, is characterized in that, described light source part is fixed on the below of described end ring.
4. test defect recognizing device as claimed in claim 1, it is characterized in that, described figure acquisition component comprises: zoom enlarging lens, industrial camera and imager chip, described zoom enlarging lens is arranged on described industrial camera, and described industrial camera is connected with described imager chip signal.
5. test defect recognizing device as claimed in claim 1, is characterized in that, the random sample position of described pedestal comprises backer's platform.
6. test defect recognizing device as claimed in claim 1, is characterized in that, also comprises: the electromagnetism dust cover that is sleeved on described test defect recognizing device periphery.
7. test defect recognizing device as claimed in claim 1, is characterized in that, also comprises: the damper rubber that is arranged at the bottom of described pedestal.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201320527652.1U CN203443901U (en) | 2013-08-27 | 2013-08-27 | Test defect identification device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201320527652.1U CN203443901U (en) | 2013-08-27 | 2013-08-27 | Test defect identification device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203443901U true CN203443901U (en) | 2014-02-19 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201320527652.1U Expired - Lifetime CN203443901U (en) | 2013-08-27 | 2013-08-27 | Test defect identification device |
Country Status (1)
| Country | Link |
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| CN (1) | CN203443901U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104048971A (en) * | 2014-07-08 | 2014-09-17 | 安徽康成工业产品设计有限公司 | Plastic mask surface inspection device |
| CN104502360A (en) * | 2014-12-25 | 2015-04-08 | 中国科学院半导体研究所 | Chip appearance defect detection system |
-
2013
- 2013-08-27 CN CN201320527652.1U patent/CN203443901U/en not_active Expired - Lifetime
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104048971A (en) * | 2014-07-08 | 2014-09-17 | 安徽康成工业产品设计有限公司 | Plastic mask surface inspection device |
| CN104502360A (en) * | 2014-12-25 | 2015-04-08 | 中国科学院半导体研究所 | Chip appearance defect detection system |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C56 | Change in the name or address of the patentee |
Owner name: SHANGHAI MEIOLF TECHNOLOGY SHARES CO., LTD. Free format text: FORMER NAME: SHANGHAI NORFOLK EXPERIMENTAL AUTOMATION CO., LTD. |
|
| CP01 | Change in the name or title of a patent holder |
Address after: 201999, room 1, building 1518, Lane 401, Youyi Road, Shanghai, Baoshan District Patentee after: SHANGHAI NORFOLK SCIENCE & TECHNOLOGY CO.,LTD. Address before: 201999, room 1, building 1518, Lane 401, Youyi Road, Shanghai, Baoshan District Patentee before: SHANGHAI NORFOLK EXPERIMENTAL AUTOMATION Co.,Ltd. |
|
| CP03 | Change of name, title or address |
Address after: Room 416, building 9, No. 785, Tieli Road, Baoshan District, Shanghai 201900 Patentee after: Shanghai meinuofu Technology Co.,Ltd. Address before: Room 401, building 1, Lane 1518, Youyi Road, Baoshan District, Shanghai 201999 Patentee before: SHANGHAI NORFOLK SCIENCE & TECHNOLOGY CO.,LTD. |
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| CP03 | Change of name, title or address | ||
| CX01 | Expiry of patent term |
Granted publication date: 20140219 |
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| CX01 | Expiry of patent term |