CN203241305U - White light interferometry Young modulus admeasuring apparatus - Google Patents

White light interferometry Young modulus admeasuring apparatus Download PDF

Info

Publication number
CN203241305U
CN203241305U CN 201320192982 CN201320192982U CN203241305U CN 203241305 U CN203241305 U CN 203241305U CN 201320192982 CN201320192982 CN 201320192982 CN 201320192982 U CN201320192982 U CN 201320192982U CN 203241305 U CN203241305 U CN 203241305U
Authority
CN
China
Prior art keywords
sliding bottom
axis
white light
fixed support
splitter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN 201320192982
Other languages
Chinese (zh)
Inventor
周雄
郭涛
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Priority to CN 201320192982 priority Critical patent/CN203241305U/en
Application granted granted Critical
Publication of CN203241305U publication Critical patent/CN203241305U/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Landscapes

  • Length Measuring Devices By Optical Means (AREA)

Abstract

The utility model discloses a white light interferometry Young modulus admeasuring apparatus. Based on a Michelson interferometer, a 45-degree retroreflector M4 and a retroreflector M5 are added, so that a first optical path and a second optical path for generating interference can be regulated to be aplantic; besides, a first sliding base is additionally arranged, so that the diameter of metal wires can be obtained by observing the position of tangent lines with a microscope on the first sliding base, and the tiny elongation of the metal wires can be measured by observing white light interferometry, and the measuring precision reaches 0.1micrometer. By observing through the microscope and measuring the diameter of metal wires through a precision worm-and-gear drive system, the precision reaches 0.1micrometer, and is 100 times higher than the measuring precision of a conventional spiral micrometer. By measuring the length of metal wires with a scale and a drive system, the measuring precision is greatly improved in comparison with the conventional meter ruler.

Description

The white light interference modulus measurer
Technical field
The utility model relates to field of measuring technique, relates in particular to a kind of white light interference modulus measurer.
Background technology
Young modulus is to describe the physical quantity of solid material opposing deformability.Young modulus is one of foundation of selected Parts Materials, is parameter commonly used in the engineering design.For example, length is that L, sectional area are that the tinsel of S extends Δ L under power F effect, and F/S is defined as stress, and its physical significance is the suffered power of this tinsel unit cross-sectional area; Δ L/L is defined as strain, and its physical significance is the corresponding elongation of tinsel unit length.Further, we define Young's modulus of lasticity E, and Young's modulus of lasticity E is numerically equal to the stress when producing unit strain, and its unit is identical with the unit of stress.Young's modulus of elasticity is the attribute of material, and is irrelevant with the shape of external force and object, depends on the composition of material.Be the tinsel of d for diameter, Young's modulus of lasticity E can be expressed as shown in following formula 1:
E = 4 FL π d 2 ΔL (formula 1)
Wherein, L represents that length wiry, d represent that diameter wiry, Δ L represent elongation wiry, and L, d, Δ L are need to be by the parameter that measures.Can find out from formula 1, if will realize the accurate measurement of Young modulus, just need respectively L, d, three parameters of Δ L to be realized precision measurement.
But there are the problems such as measuring method complexity and precision are inadequate in existing young modulus measuring device.
The utility model content
Technical problem to be solved in the utility model is, the white light interference modulus measurer is provided, and is used for solving the Young modulus measuring method complicated, the problem that precision is lower.
In order to address the above problem, the utility model proposes a kind of white light interference modulus measurer, comprise: brace table 101, be set in parallel in the first guide rail 102 of brace table upper surface, the second guide rail 103, along described first, axis between the second guide rail is arranged at the first sight glass 104 of brace table one end and the fixed pulley 105 that is arranged at the other end, on from the first sight glass to the fixed pulley direction first, set gradually the first fixed support 106 on the second guide rail, the first sliding bottom 107, the second sliding bottom 108, on described the first fixed support and the second sliding bottom relatively a side be provided with respectively the metal wire point of fixity along the axis, be used for the fixing test metal wire that connects along the axis, the opposite side of described the second sliding bottom is provided with the connecting line point of fixity along the axis, be used for fixedly passing the connecting line of the connection weight of fixed pulley;
Arrange to become to be provided with vertical the second mirror M 2 of passing the axis on the beam-splitter M1 of miter angle, described the second sliding bottom with the axis along the axis on described the first fixed support 106; Be provided with light source M0 in the position of the first support bracket fastened beam-splitter M1 one side on the described brace table, opposite side at beam-splitter M1 on described the first fixed support is disposed with the compensating plate M3 that becomes miter angle with the axis and the 3rd mirror M 4 that becomes miter angle with the axis, be provided with the second fixed support 109 on described the first sliding bottom, described second a support bracket fastened end is provided with parallel with the second reflective mirror M2 and the first reflective mirror M5 of reflection in the same way, described beam-splitter M1 to the first light path between the second reflective mirror M2 and beam-splitter M1 through compensating plate M3, but the second light path upon mediation the first sliding bottom between the 3rd mirror M 4 to first mirror M 5 satisfies interference condition;
Be provided with on described the first sight glass on the described brace table and the position between described the first fixed support and reconcile drum 110, be used for being connected with described the first sliding bottom, reconcile the also connection amount of described the first sliding bottom of reading.
Further, be vertically installed with the second sight glass 111 on described the first sliding bottom, and be used for the axis vertical direction on two point of fixity 112,113 of fixing metal line.
Described the second sight glass can be microscope, be used for to observe perpendicular to the axis laterally to be fixed in tinsel between two point of fixity 112,113 with respect to the tangent position of cross middle line, thereby determines wire diameter.
Described point of fixity 112,113 can be positioned on the second fixed support, also can be located immediately on the first sliding bottom.
Further, the side away from the axis of described first, second guide rail is provided with scale, is used for reading the distance between described the first sliding bottom, the second sliding bottom and described the first fixed support.Can read the position data of the first sliding bottom, the second sliding bottom according to scale, thereby calculate described the first light path and the second light path, also can read the length wiry of measuring elongation simultaneously.
White light interference modulus measurer of the present utility model is measured the small elongation of tinsel by observing white light interference, makes its measuring accuracy reach 0.1um.Utilize microscopic examination and accurate Worm Wheel System systematic survey wire diameter, precision reaches 0.1um, exceeds 100 times than conventional helical dial gauge measuring accuracy.Measure tinsel length by scale and kinematic train, significantly promote than having realized with traditional meter ruler measurement in measuring accuracy.
Innovation of the present utility model is:
Utilize optical principle directly to measure the small elongation of tinsel, aspect degree of accuracy, make its precision reach 0.1um, directly measure and saved existing methodical brief introduction conversion, reduced experimental error.Can measure simultaneously wire diameter, and make its degree of accuracy exceed 100 than traditional spiral dial gauge precision.Each measuring amount that affects Young modulus is realized accurately measuring, substantially improved the degree of accuracy of Young modulus.The method of measuring Young modulus than traditional optical lever method has reduced by two measuring amount, is convenient to calculate with data process.Simultaneously, this measuring instrument has been integrated in the Experiment of College Physics use, the optical lever method from the interference of light, Michelson interferometer and has been measured three Physical Experiments of Young modulus, can be used as Making Innovation Experiments of institution of higher learning's science and engineering type student and carries out.Also adapt to simultaneously factory, scientific research institution etc.
Description of drawings
Fig. 1 is the spatial structure of white light interference modulus measurer of the present utility model;
Fig. 2 is the index path of the utility model white light interference modulus measurer;
Fig. 3 is the amount of tension instrumentation plan of the utility model white light interference modulus measurer;
Fig. 4 is the diameter measurement schematic diagram of the utility model white light interference modulus measurer;
Fig. 5 is the drum-wheel structure schematic diagram of the utility model white light interference modulus measurer.
Embodiment
For making the purpose of this utility model, technical scheme and advantage clearer, below in conjunction with accompanying drawing the utility model is described in further detail.
For reaching the purpose that L, d, Δ L is accurately measured the accurate measured value of Young modulus, transform based on Michelson interferometer, obtained newly-designed white light interference modulus measurer of the present utility model.Utilize the various interference of Michelson interferometer observable (equal inclination interference, equal thickness interference, white light interference), white light interference modulus measurer of the present utility model utilizes the white light interference phenomenon to measure Young modulus wiry.When measuring Young modulus wiry, utilization remedies the deficiency of degree of accuracy on the simple mechanical meaurement method based on the accuracy of the optical measurement of interference, white light interference modulus measurer of the present utility model has the characteristics such as degree of accuracy is high, easy and simple to handle, principle is simple, carry out a comprehensive experiment use so be particularly suitable for institution of higher education, also be suitable for industrial and mining enterprises simultaneously and measure use.
As shown in Figure 1, white light interference modulus measurer of the present utility model, comprise: brace table 101, be set in parallel in the first guide rail 102 of brace table upper surface, the second guide rail 103, along described first, axis between the second guide rail is arranged at the first sight glass 104 of brace table one end and the fixed pulley 105 that is arranged at the other end, on from the first sight glass to the fixed pulley direction first, set gradually the first fixed support 106 on the second guide rail, the first sliding bottom 107, the second sliding bottom 108, on described the first fixed support and the second sliding bottom relatively a side be provided with respectively the metal wire point of fixity along the axis, be used for the fixing test metal wire that connects along the axis, the opposite side of described the second sliding bottom is provided with the connecting line point of fixity along the axis, be used for fixedly passing the connecting line of the connection weight of fixed pulley;
Arrange to become to be provided with vertical the second mirror M 2 of passing the axis on the beam-splitter M1 of miter angle, described the second sliding bottom with the axis along the axis on described the first fixed support 106; Be provided with light source M0 in the position of the first support bracket fastened beam-splitter M1 one side on the described brace table, opposite side at beam-splitter M1 on described the first fixed support is disposed with the compensating plate M3 that becomes miter angle with the axis and the 3rd mirror M 4 that becomes miter angle with the axis, be provided with the second fixed support 109 on described the first sliding bottom, described second a support bracket fastened end is provided with parallel with the second reflective mirror M2 and the first reflective mirror M5 of reflection in the same way, described beam-splitter M1 to the first light path between the second reflective mirror M2 and beam-splitter M1 through compensating plate M3, but the second light path upon mediation the first sliding bottom between the 3rd mirror M 4 to first mirror M 5 satisfies interference condition;
Be provided with on described the first sight glass on the described brace table and the position between described the first fixed support and reconcile drum 110, be used for being connected with described the first sliding bottom, reconcile the also connection amount of described the first sliding bottom of reading.
Further, be vertically installed with the second sight glass 111 on described the first sliding bottom, and be used for the axis vertical direction on two point of fixity 112,113 of fixing metal line.Described point of fixity 112,113 can be positioned on the second fixed support, also can be located immediately on the first sliding bottom.
Described the second sight glass can be microscope, be used for to observe perpendicular to the axis laterally to be fixed in tinsel between two point of fixity 112,113 with respect to the tangent position of cross middle line, thereby determines wire diameter.
Further, the side away from the axis of described first, second guide rail is provided with scale, is used for reading the distance between described the first sliding bottom, the second sliding bottom and described the first fixed support.Can read the position data of the first sliding bottom, the second sliding bottom according to scale, thereby calculate described the first light path and the second light path, also can read the length wiry of measuring elongation simultaneously.
Shown in Figure 1, only show the installation site of the first sight glass, and and the form of not shown concrete the first sight glass, it can be telescope, also can be other optical viewing arrangement, be used for demonstration and viewing optics and interfere the striped that produces, but this be not limited to the utility model.For example the first sight glass is telescope, is used for observing, records white-light fringe with crosshair in the described telescopical eyepiece and occur and the position that disappears.
By the relevant knowledge of white light interference as can be known: the virtual image M5 of the reflective mirror M5 in and if only if the structural drawing " approach with the picture of reflective mirror M2 and overlap and could be in the unilateral observation of beam-splitter M1 to white-light fringe at an angle the time.
As shown in Figure 2, provided measure the small stroke of tinsel away from schematic diagram.M0 is white light source, it is fixed in brace table 101 1 sides, irradiating angle, just, brightness all can regulate, M1 is beam-splitter, and inboard plating semi-permeable diaphragm arrives compensating plate M3 after the white light part transmission of i.e. incident, another part light arrives reflective mirror M2, M3 is compensating plate, and material is identical with beam-splitter with thickness, and the position of these two blocks of optical flats of M1, M3 is dispatched from the factory front adjusted good.M4 is that 45 degree reflective mirror normal line directions are adjustable, and M5 is the reflective mirror parallel with M2.Reflective mirror M4 and M5 are the reflective mirror that newly increases, and are used for regulating light path, measure the tinsel elongation, and its regulating device (not shown) Worm Wheel System system can record newly-increased reflective mirror moving displacement, and precision reaches 0.1um.M5 " be the virtual image position of M5 on M4, described the first light path namely refers to the light path of M1 to M2, described the second light path can be considered M1 to M5 " light path.
As shown in Figure 3, provided the configuration installation diagram when measuring, metal wire 304 is used for measuring amount of tension, be connected between the first fixed support and the second sliding bottom, connecting line 302 1 ends be connected in the second sliding bottom away from first a support bracket fastened side, link to each other with weight pallet 303 through behind the fixed pulley 105, described weight 302 is as in the weight pallet 303.So just consisted of a test path along the axis, i.e. the stressed system of tinsel.
During measurement, the reading of the second sliding bottom on scale of contrast reflective mirror M2, by regulating 45 degree reflective mirror M4 and the readings of the first sliding bottom on scale, so that beam-splitter M1 is approaching to the second light path between the reflective mirror M5 through 45 degree reflective mirror M4 to the first light path between the reflective mirror M2 and beam-splitter M1, by being fixed in the position of adjusting drum 110 adjustings the first sliding bottom on the brace table, finely tune by the fine setting drum, so that first, second light path is aplanatism.
Observe white-light fringe by the first sight glass (for example telescope) this moment, and the reading through telescope crosshair mid point of record article one color fringe, and transfer to portion transverse wire one side the crosshair in the second sight glass (for example microscope) tangent, continue to regulate drum, aplanatic point in the middle of the record (not aobvious colored point between color fringe) and the last item color fringe point.
Then, increase the counterweight in the weight pallet 303, the tinsel 304 of measuring that stretches extends under stressing conditions, so that reflective mirror M2 is to the distance increase of beam-splitter M1 on the second sliding bottom, color fringe disappears.By regulating thereby drum is finely tuned the position that changes reflective mirror M5 on the first sliding bottom, compensation is because the light path that the tinsel stress and deformation increases, just white-light fringe be can again observe, article one color fringe, middle dark line, the last item color fringe again recorded.The reading of start-of-record index dial, again observe the scale reading of white light interference phenomenon, twice difference is small elongation wiry (being accurate to 0.1um).Like this, just can measure the elongation (be accurate to 0.1um) of tinsel under stressed.
The movement of described the first sliding bottom is regulated by drum, is connected with worm gearing between the two.As shown in Figure 5, drum has coarse adjustment button 501, fine tuning button 502.
Described telescope, with crosshair, its to the distance of beam-splitter M1, just, angle all can regulate, telescope and stationary installation consist of the finder of white light interference.45 degree reflective mirror M4 are parallel with compensating plate M3, and its distance to compensating plate can be read, self angle is adjustable.
As shown in Figure 4, when measuring small elongation since the moving direction of second sliding bottom at reflective mirror M2 place always along a direction (being the tinsel prolonging direction), therefore described the first sliding bottom is in order to readjust the position of satisfying white light interference, the movement of this first sliding bottom is also in same direction, the crosshair of viewing microscope 111 and tinsel border relation records twice reading when tangent and remakes and poorly just can obtain wire diameter.401 is perpendicular line of cross cross wires among the figure, the 402nd, and the position on a limit wiry.Utilize the crosshair of reading microscope 111, so that crosshair midpoint and tinsel left end are tangent, driving the first sliding bottom by the fine setting drum in the measuring process moves, thereby driving portion transverse wire fixed thereon moves towards the direction that longitudinal metallic wire 304 stretches, when crosshair mid point and the portion transverse wire other end were tangent, twice reading when tangent was diameter wiry.As long as tinsel is strictly vertical with the base translation direction, and parallax can be accurate to 0.1um can ignore the time in theory.
Described longitudinal metallic wire namely is parallel to the linear measure longimetry of the metal wire of axis, the second sliding bottom can be placed one can the thread bush of free device on, utilize guide rail one side scale and frame of reference to measure tinsel length.And the thread bush of free device is adjustable from guide rail front end distance.
By Michelson interferometer is reequiped, method by conversion horizontal glass angle, a reflective mirror M5 of increase is regulated the increase light path, regulate light path, so that approaching, beam-splitter M1 both sides light path equates, take full advantage of accurate transmission mechanism and the guide rail of Michelson interferometer, observe the change in location of white-light fringe appearance and can read tinsel at the small elongation (being accurate to 0.1um) of stressed front and back.Utilize microscope, drum regulating device to drive microscopic examination tinsel left and right sides tangent position and measure wire diameter.Utilize scale on the interferometer guide rail and frame of reference to read the length of the longitudinal metallic wire of measuring for stretching.
Using measuring instrument of the present utility model can Accurate Measurement length L wiry, diameter wiry, elongation Δ L wiry, then just can determine Young modulus wiry according to formula 1.The utility model improves in the degree of accuracy of tinsel elongation, radius, linear measure longimetry respectively, compared with prior art has the characteristics such as degree of accuracy is high, practical, operability is good.
The above is embodiment of the present utility model only, is not limited to the utility model, and for a person skilled in the art, the utility model can have various modifications and variations.All within spirit of the present utility model and principle, any modification of doing, be equal to replacement, improvement etc., all should be included within the claim scope of the present utility model.

Claims (5)

1. white light interference modulus measurer, comprise: brace table (101), be set in parallel in first guide rail (102) of brace table upper surface, the second guide rail (103), along described first, the fixed pulley (105) that axis between the second guide rail is arranged at first sight glass (104) of brace table one end and is arranged at the other end, on from the first sight glass to the fixed pulley direction first, set gradually the first fixed support (106) on the second guide rail, the first sliding bottom (107), the second sliding bottom (108), on described the first fixed support and the second sliding bottom relatively a side be provided with respectively the metal wire point of fixity along the axis, be used for the fixing test metal wire that connects along the axis, the opposite side of described the second sliding bottom is provided with the connecting line point of fixity along the axis, be used for fixedly passing the connecting line of the connection weight of fixed pulley;
Described the first fixed support (106) is upper to be arranged to become to be provided with vertical the second catoptron (M2) that passes the axis on the beam-splitter (M1) of miter angle, described the second sliding bottom with the axis along the axis; Be provided with light source (M0) in the position of the first support bracket fastened beam-splitter (M1) side on the described brace table, opposite side at beam-splitter (M1) on described the first fixed support is disposed with the compensating plate (M3) that becomes miter angle with the axis and the 3rd catoptron (M4) that becomes miter angle with the axis, be provided with the second fixed support (109) on described the first sliding bottom, described second a support bracket fastened end is provided with parallel with the second reflective mirror (M2) and first reflective mirror (M5) of reflection in the same way, described beam-splitter (M1) to the first light path between the second reflective mirror (M2) and beam-splitter (M1) through compensating plate (M3), the 3rd catoptron (M4) to the first catoptron (M5) but between the second light path upon mediation the first sliding bottom satisfy interference condition.
2. a kind of white light interference modulus measurer as claimed in claim 1 is characterized in that,
Be provided with on described the first sight glass on the described brace table and the position between described the first fixed support and reconcile drum (110), be used for being connected with described the first sliding bottom, reconcile the also amount of movement of described the first sliding bottom of reading.
3. a kind of white light interference modulus measurer as claimed in claim 2 is characterized in that,
Be vertically installed with the second sight glass (111) on described the first sliding bottom, and be used for the axis vertical direction on two point of fixity (112,113) of fixing metal line.
4. a kind of white light interference modulus measurer as claimed in claim 3 is characterized in that,
Described the second sight glass can be microscope, be used for to observe perpendicular to the axis laterally to be fixed in tinsel between two point of fixity (112,113) with respect to the tangent position of cross middle line, thereby determines wire diameter.
5. such as claim 3 or 4 described a kind of white light interference modulus measurers, it is characterized in that,
Side away from the axis of described first, second guide rail is provided with scale, is used for reading the distance between described the first sliding bottom, the second sliding bottom and described the first fixed support; Can read the position data of the first sliding bottom, the second sliding bottom according to scale, thereby calculate described the first light path and the second light path, also can read the length wiry of measuring elongation simultaneously.
CN 201320192982 2013-04-17 2013-04-17 White light interferometry Young modulus admeasuring apparatus Expired - Fee Related CN203241305U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN 201320192982 CN203241305U (en) 2013-04-17 2013-04-17 White light interferometry Young modulus admeasuring apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN 201320192982 CN203241305U (en) 2013-04-17 2013-04-17 White light interferometry Young modulus admeasuring apparatus

Publications (1)

Publication Number Publication Date
CN203241305U true CN203241305U (en) 2013-10-16

Family

ID=49318590

Family Applications (1)

Application Number Title Priority Date Filing Date
CN 201320192982 Expired - Fee Related CN203241305U (en) 2013-04-17 2013-04-17 White light interferometry Young modulus admeasuring apparatus

Country Status (1)

Country Link
CN (1) CN203241305U (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105466769A (en) * 2015-12-30 2016-04-06 西南交通大学 Young modulus measuring instrument
CN108709798A (en) * 2018-07-25 2018-10-26 金陵科技学院 A kind of young modulus measuring device and method based on Michelson's interferometer
CN117571506A (en) * 2024-01-15 2024-02-20 西南交通大学 Shear modulus measuring device and method based on Michelson equal-thickness interference

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105466769A (en) * 2015-12-30 2016-04-06 西南交通大学 Young modulus measuring instrument
CN108709798A (en) * 2018-07-25 2018-10-26 金陵科技学院 A kind of young modulus measuring device and method based on Michelson's interferometer
CN117571506A (en) * 2024-01-15 2024-02-20 西南交通大学 Shear modulus measuring device and method based on Michelson equal-thickness interference
CN117571506B (en) * 2024-01-15 2024-03-29 西南交通大学 Shear modulus measuring device and method based on Michelson equal-thickness interference

Similar Documents

Publication Publication Date Title
CN203490010U (en) Stress meter for measuring surface stress of toughened glass
CN203241305U (en) White light interferometry Young modulus admeasuring apparatus
CN101625231A (en) White light interference profile meter
CN204632214U (en) Teaching spectrometer
CN103616127A (en) Source tracing calibrating device and source tracing method for micro cantilever beam elastic constant
CN203824948U (en) Michelson linear expansion coefficient tester
CN103115824A (en) Device and method for measuring filament Young modulus through single slit diffraction method
CN103033420B (en) Novel tensile-method young's modulus measurement instrument
CN103115896A (en) Device and method for determining filament Young modulus through Michelson interference method
CN203148844U (en) Device for measuring Young modulus of filament via Michelson interference method
CN105092987A (en) Optical detection device and method
CN202057555U (en) Aplanatism measuring device for Young modulus
CN201917535U (en) Device for measuring expansion coefficient of metal wire by single slit diffraction method
CN203376213U (en) Experimental instrument for measuring Young modulus of metal wire by tensile method
CN103018103B (en) Comprehensive designing experiment equipment and method for measuring Young modulus of metal wire
CN203672721U (en) Device for measuring filamentYoung's modulus with thin-film interference method
CN103776801B (en) The detection method of optical element refractive index and detection device thereof
CN201583451U (en) Young modulus measuring instrument
CN100483067C (en) Displacement measuring apparatus for concrete temperature-pressure tester and application thereof
CN209459573U (en) A kind of depth blind hole measuring device
CN203148785U (en) Device for measuring filament Young modulus by single-slit diffraction method
CN207300754U (en) Modulus measurer based on diffraction intensity
CN105466342A (en) Device for measuring micro displacement
CN202974766U (en) Spring type Young modulus measuring instrument
CN111077019A (en) Experimental device for measuring Young modulus of linear material based on optical fiber sensing technology

Legal Events

Date Code Title Description
C14 Grant of patent or utility model
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20131016

Termination date: 20180417

CF01 Termination of patent right due to non-payment of annual fee