CN103115896A - Device and method for determining filament Young modulus through Michelson interference method - Google Patents
Device and method for determining filament Young modulus through Michelson interference method Download PDFInfo
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- CN103115896A CN103115896A CN2013100460424A CN201310046042A CN103115896A CN 103115896 A CN103115896 A CN 103115896A CN 2013100460424 A CN2013100460424 A CN 2013100460424A CN 201310046042 A CN201310046042 A CN 201310046042A CN 103115896 A CN103115896 A CN 103115896A
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Abstract
The invention discloses a device and method for determining filament Young modulus through a Michelson interference method. The device omits an original Michelson interference reading system and a precise lead screw structure for controlling a movable mirror to move, is additionally provided with a guide rail which is vertical to an original guide rail, and changes an original fixed mirror into a movable mirror. A fixed pulley is rotated to drive the movable mirror to move, so that a filament to be measured is stretched; the number of observed indent or emergent interference fringes is counted, and moreover, pulling force applied to the filament to be measured is measured; and then the number and the force are substituted into a computational formula to directly figure out the Young modulus. The device has the advantages of measurement accuracy, convenience in operation, quickness and the like, can be used for measuring elasticity modulus of metal filaments and filaments such as hairs, fine wires and silk, and has a wide application scope; and consequently, the device has multiple advantages, is in particular suitable for popularization and application to the field and fit for comprehensive design experiments among college physics experiments of institutions of higher learning, and has wide market prospect.
Description
Technical field
The present invention relates to a kind of experimental provision that utilizes the physical optics method to measure mechanical parameters, particularly a kind of device and method that utilizes michelson interferometry to measure the filament Young modulus.
Background technology
Michelson interferometer is to utilize divide amplitude to produce twin-beam to interfere realizing, main research be the fine structure of light and the calibration of length standard, have two light paths, can survey wavelength, air refraction, can be used for measuring micro-displacement.
Young modulus is to be characterized in material tension or measuring body physical quantity in elastic limit, and it is elastic modulus longitudinally.Young's modulus of elasticity is one of foundation of selected Parts Materials, is parameter commonly used in engineering design.The method of measuring Young modulus generally has pulling method, beam deflection method, vibratory drilling method, By Internal Friction Measurements etc.In institution of higher learning's Physical Experiment, the main measuring method of Young modulus is optical lever method.The optical lever method measurement mechanism mainly consists of telescope, support, filament firmware, little plane of reflection mirror, scale, counterweight, screw-thread micrometer, vernier caliper, meter ruler etc.Need to regulate light path in measuring process, make the observer can see clearly the picture of scale from telescope.Then add gradually counterweight, filament is elongated, in the angle that the tiny length extended by filament, little plane of reflection mirror turn over and telescope picture, the relation of scale difference of reading is brought formula into, obtains the elastic modulus of filament.This kind of traditional measuring method has following shortcoming: while by mirror, seeing scale, the picture of reflection is difficult to regulate, and non-vertical light path is similar to and regards same vertical light path as, can produce error; See rod reading by telescope, the precision of scale is low, produces error.Therefore need now a kind of method or device of the new survey filament Young modulus that can address the above problem.
Summary of the invention
The present invention is in order to solve the existing above-mentioned deficiency of prior art, propose a kind of simple in structurely, design ingeniously, utilize michelson interferometry to be measured the Young modulus of filament, measurement result is accurate, and is suitable for measurement mechanism and the method for multiple unlike material filament.
Technical solution of the present invention is: a kind of michelson interferometry is measured the device of filament Young modulus, it is characterized in that: described device comprises laser instrument 1, beam expanding lens 2 and orthogonal the first guide rail 3, the second guide rail 4, intersection at the first guide rail 3 and the second guide rail 4 is provided with beam-splitter G, and beam-splitter G all becomes the miter angle setting with two guide rails, slide and be provided with the first microscope base 5 on the first guide rail 3, slide and be provided with the second microscope base 6 on the second guide rail 4, on the first microscope base 5 and the second microscope base 6, be respectively arranged with plane mirror M
1with the plane mirror M
2, and plane mirror M
1with the plane mirror M
2the back side also be provided with set screw, an end at the close beam-splitter G of the first guide rail 3 is provided with fixed mount 7, one end of filament 10 to be measured is fixed on fixed mount 7, the other end of filament 10 to be measured is fixed on the first microscope base 5, the first microscope base 5 also is connected with the first traction rope 8, the other end of the first traction rope 8 is connected with the second traction rope 11 by tautness meter 9, the other end of the second traction rope 11 is wrapped on the fixed pulley 12 that is arranged on the first guide rail 3 ends, offside at beam-splitter G with respect to the first guide rail 3, also be provided with frosted glass film viewing screen 13.
A kind of method of utilizing device as above to carry out michelson interferometry measurement filament Young modulus, it is characterized in that: described method is carried out according to following steps:
A, by length, be L, the two ends of the filament to be measured 10 that diameter is d are separately fixed on fixed mount 7 and the first microscope base 5, and rotation fixed pulley 12, stretch filament 10 to be measured,
B, adjustment plane mirror M
2position, make M
2distance and plane mirror M to beam-splitter G center
1distance to beam-splitter G center is roughly the same,
C, regulate light path, make the ring heart of interference circle appear at the central authorities of frosted glass film viewing screen 13 visual fields, now plane mirror M
1with the plane mirror M
2it is mutually vertical,
D, fine tuning plane mirror M
2position, the interference that makes to observe on frosted glass film viewing screen 13 circle striped density, brightness are suitable, are convenient to the variation number of recording interference fringe,
E, uniform rotation fixed pulley 12 lentamente, allow the second traction rope 11 at the uniform velocity be wound around on fixed pulley 12, and the first traction rope 8 pulls plane mirror M
1at the uniform velocity slide lentamente on the first guide rail 3, make filament 10 elongations to be measured, after " gushing out " or " being absorbed in " phenomenon of interference fringe is arranged on frosted glass film viewing screen 13, record the reading F of tautness meter 9
1, continue equidirectional uniform rotation fixed pulley 12 lentamente, observe and record the number N of " gushing out " or " being absorbed in " interference fringe, and record changes the number of degrees F of N striped back pull meter 9
2,
The wavelength of f, laser is λ, by above-mentioned F
1, F
2, N, L, d and λ substitution formula:
Try to achieve the Young modulus of filament 10 to be measured.
The present invention compared with the existing technology, has following advantage:
The device of the measurement filament Young modulus of this kind of version, it is simple in structure, design ingenious, rationally distributed, it is for traditional existing variety of problems of tinsel Young modulus measuring method, design a kind of Michelson interferometer of improvement type, saved the frame of reference in former Michelson interferometer and controlled the accurate lead screw structure that index glass moves, fixed pulley rotates a wherein plane mirror is moved, the movement of catoptron makes filament to be measured flexible, and the flexible change amount of filament to be measured equals the amount of movement of this plane mirror.The indentation of the interference fringe that utilization observes or the number of gushing out, measure and be applied to the pulling force on filament to be measured simultaneously, after the substitution computing formula, just can directly obtain Young modulus.The advantages such as this device has to be measured accurately, easy to operate, quick, and it is not limited to Young modulus wiry and measures, can also be for measuring the Young modulus of the filaments such as hair, fine rule, silk, range of application is comparatively extensive.Therefore can say that it has possessed multiple advantage, be particularly suitable for applying in the art, be applicable to the Comprehensive Experiments in institution of higher learning's Experiment of College Physics, its market outlook are very wide.
The accompanying drawing explanation
Fig. 1 is the structural representation of the embodiment of the present invention.
Embodiment
Below in conjunction with accompanying drawing explanation the specific embodiment of the present invention.As shown in Figure 1: a kind of michelson interferometry is measured the device of filament Young modulus, it comprises laser instrument 1, beam expanding lens 2 and orthogonal the first guide rail 3, the second guide rail 4, intersection at the first guide rail 3 and the second guide rail 4 is provided with beam-splitter G, and beam-splitter G all becomes the miter angle setting with two guide rails, slide and be provided with the first microscope base 5 on the first guide rail 3, slide and be provided with the second microscope base 6 on the second guide rail 4, on the first microscope base 5 and the second microscope base 6, be respectively arranged with plane mirror M
1with the plane mirror M
2, and plane mirror M
1with the plane mirror M
2the back side also be provided with 3 set screw, can be used for finely tuning plane mirror M
1with the plane mirror M
2angle; An end at the close beam-splitter G of the first guide rail 3 is provided with fixed mount 7, one end of filament 10 to be measured is fixed on fixed mount 7, the other end of filament 10 to be measured is fixed on the first microscope base 5, the first microscope base 5 also is connected with the first traction rope 8, the other end of the first traction rope 8 is connected with the second traction rope 11 by tautness meter 9, the other end of the second traction rope 11 is wrapped on the fixed pulley 12 that is arranged on the first guide rail 3 ends, offside at beam-splitter G with respect to the first guide rail 3, also be provided with frosted glass film viewing screen 13.
At first by length, be L, the two ends of the filament to be measured 10 that diameter is d are separately fixed on fixed mount 7 and the first microscope base 5, and rotation fixed pulley 12, stretch filament 10 to be measured,
Then adjust plane mirror M
2position, make M
2distance and plane mirror M to beam-splitter G center
1distance to beam-splitter G center is roughly the same,
Remove the beam expanding lens 2 in laser instrument 1 the place ahead, frosted glass film viewing screen 13 is positioned at the offside of beam-splitter G with respect to the first guide rail 3, opens laser instrument 1 power supply, makes laser instrument 1 and plane mirror M
1contour coaxial, plane mirror M
1, plane mirror M
2reflected light respectively after beam-splitter G transmission, reflection, two row's luminous points appear on frosted glass film viewing screen 13, accommodation reflex mirror M
13 set screw of back, make one of them the brightest luminous point be positioned at frosted glass film viewing screen 13 center, and then accommodation reflex mirror M
23 set screw of back, make on frosted glass film viewing screen 13 the brightest luminous point picture in two row's luminous points overlap.
Put into beam expanding lens 2 between laser instrument 1 and beam-splitter G, laser vertical is radiated at the center of beam expanding lens 2, to see on frosted glass film viewing screen 13 light and dark interference circle will be arranged, some ring heart Bu Ping centers that relate to annulus, can finely tune gently 3 set screw of catoptron back, the ring heart of interference circle is transferred to visual field central authorities, now mirror M
1and mirror M
2mutually vertical.
Fine tuning mirror M again
2position, the interference that makes to observe on frosted glass film viewing screen 13 circle striped density, brightness are suitable, are convenient to the variation number of recording interference fringe.
Slow uniform rotation fixed pulley 12 gently, traction rope 14 at the uniform velocity is wound around on fixed pulley 12, pulls mirror M
1on the first guide rail 3, uniform speed slow slides, and filament 10 to be measured is extended at the uniform velocity gradually, after interference fringe " indentation " or " gushing out " phenomenon are arranged on frosted glass film viewing screen 13, records tautness meter reading (as initial value) F
1, continuing equidirectional slow uniform rotation fixed pulley 12 gently, the number N of " gushing out " or " being absorbed in " interference fringe is observed and write down to rotation process, and record changes the reading F of N striped back pull meter
2.
Corresponding interference fringe " is gushed out " or " being absorbed in " N interference fringe, the pulling force that filament is subject to:
The elongation of filament equals mirror M
1displacement, equal the change amount of two light optical path differences in light path.
Try to achieve the elastic modulus of filament to be measured
The length that wherein L is filament to be measured, the diameter that d is filament to be measured,
for optical maser wavelength, L, d,
be known conditions.
Claims (2)
1. a michelson interferometry is measured the device of filament Young modulus, it is characterized in that: described device comprises laser instrument (1), beam expanding lens (2) and orthogonal the first guide rail (3), the second guide rail (4), intersection at the first guide rail (3) and the second guide rail (4) is provided with beam-splitter G, and beam-splitter G all becomes the miter angle setting with two guide rails, be provided with the first microscope base (5) upper slip of the first guide rail (3), the upper slip of the second guide rail (4) is provided with the second microscope base (6), be respectively arranged with plane mirror M on the first microscope base (5) and the second microscope base (6)
1with the plane mirror M
2, and plane mirror M
1with the plane mirror M
2the back side also be provided with set screw, an end at the close beam-splitter G of the first guide rail (3) is provided with fixed mount (7), one end of filament to be measured (10) is fixed on fixed mount (7), the other end of filament to be measured (10) is fixed on the first microscope base (5), the first microscope base (5) also is connected with the first traction rope (8), the other end of the first traction rope (8) is connected with the second traction rope (11) by tautness meter (9), the other end of the second traction rope (11) is wrapped on the fixed pulley (12) that is arranged on the first guide rail (3) end, offside at beam-splitter G with respect to the first guide rail (3), also be provided with frosted glass film viewing screen (13).
2. one kind is utilized device as claimed in claim 1 to carry out the method that michelson interferometry is measured the filament Young modulus, and it is characterized in that: described method is carried out according to following steps:
A, by length, be L, the two ends of the filament to be measured (10) that diameter is d are separately fixed at fixed mount (7) and the first microscope base (5) is upper, and rotation fixed pulley (12), stretch filament to be measured (10),
B, adjustment plane mirror M
2position, make M
2distance and plane mirror M to beam-splitter G center
1distance to beam-splitter G center is roughly the same,
C, regulate light path, make the ring heart of interference circle appear at the central authorities of frosted glass film viewing screen (13) visual field, now plane mirror M
1with the plane mirror M
2it is mutually vertical,
D, fine tuning plane mirror M
2position, the interference that makes to observe on frosted glass film viewing screen (13) circle striped density, brightness are suitable, are convenient to the variation number of recording interference fringe,
E, uniform rotation fixed pulley (12) lentamente, allow the second traction rope (11) at the uniform velocity be wound around on fixed pulley (12), and the first traction rope (8) pulls plane mirror M
1at the uniform velocity slide lentamente on the first guide rail (3), make filament to be measured (10) elongation, after " gushing out " or " being absorbed in " phenomenon of interference fringe is arranged on frosted glass film viewing screen (13), record the reading F of tautness meter (9)
1, continue equidirectional uniform rotation fixed pulley (12) lentamente, observe and record the number N of " gushing out " or " being absorbed in " interference fringe, and record changes the number of degrees F of N striped back pull meter (9)
2,
The wavelength of f, laser is λ, by above-mentioned F
1, F
2, N, L, d and λ substitution formula:
Try to achieve the Young modulus of filament 10 to be measured.
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|---|---|---|---|
| CN2013100460424A CN103115896A (en) | 2013-02-06 | 2013-02-06 | Device and method for determining filament Young modulus through Michelson interference method |
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| CN2013100460424A CN103115896A (en) | 2013-02-06 | 2013-02-06 | Device and method for determining filament Young modulus through Michelson interference method |
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Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103940677A (en) * | 2014-05-15 | 2014-07-23 | 黑龙江大学 | Device and method for measuring Young modulus by virtue of linear-frequency-modulation multi-beam laser heterodyne |
| CN104568597A (en) * | 2015-01-08 | 2015-04-29 | 齐齐哈尔大学 | Device and method for measuring elasticity modulus of metal wires by using standard wires |
| CN105466769A (en) * | 2015-12-30 | 2016-04-06 | 西南交通大学 | Young modulus measuring instrument |
| CN107798976A (en) * | 2017-11-23 | 2018-03-13 | 沈阳师范大学 | A kind of portable modular Michelson interference experimental provision |
| CN108490573A (en) * | 2018-04-24 | 2018-09-04 | 四川大学 | A kind of device accurately adjusting optical path difference and its angle for Michelson's interferometer |
| CN117571506A (en) * | 2024-01-15 | 2024-02-20 | 西南交通大学 | Shear modulus measuring device and method based on Michelson equal-thickness interference |
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Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103940677A (en) * | 2014-05-15 | 2014-07-23 | 黑龙江大学 | Device and method for measuring Young modulus by virtue of linear-frequency-modulation multi-beam laser heterodyne |
| CN103940677B (en) * | 2014-05-15 | 2016-03-02 | 黑龙江大学 | Linear frequency modulation multi-beam laser heterodyne measures device and the measuring method of Young modulus |
| CN104568597A (en) * | 2015-01-08 | 2015-04-29 | 齐齐哈尔大学 | Device and method for measuring elasticity modulus of metal wires by using standard wires |
| CN105466769A (en) * | 2015-12-30 | 2016-04-06 | 西南交通大学 | Young modulus measuring instrument |
| CN107798976A (en) * | 2017-11-23 | 2018-03-13 | 沈阳师范大学 | A kind of portable modular Michelson interference experimental provision |
| CN108490573A (en) * | 2018-04-24 | 2018-09-04 | 四川大学 | A kind of device accurately adjusting optical path difference and its angle for Michelson's interferometer |
| CN117571506A (en) * | 2024-01-15 | 2024-02-20 | 西南交通大学 | Shear modulus measuring device and method based on Michelson equal-thickness interference |
| CN117571506B (en) * | 2024-01-15 | 2024-03-29 | 西南交通大学 | Shear modulus measuring device and method based on Michelson equal-thickness interference |
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Application publication date: 20130522 |