CN108709798A - A kind of young modulus measuring device and method based on Michelson's interferometer - Google Patents
A kind of young modulus measuring device and method based on Michelson's interferometer Download PDFInfo
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- CN108709798A CN108709798A CN201810823178.4A CN201810823178A CN108709798A CN 108709798 A CN108709798 A CN 108709798A CN 201810823178 A CN201810823178 A CN 201810823178A CN 108709798 A CN108709798 A CN 108709798A
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- pulling force
- michelson
- interferometer
- force sensor
- mirror
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- 238000000034 method Methods 0.000 title claims abstract description 18
- 230000003287 optical effect Effects 0.000 claims abstract description 29
- 238000005259 measurement Methods 0.000 claims abstract description 21
- 238000009966 trimming Methods 0.000 claims description 7
- 238000000691 measurement method Methods 0.000 claims description 4
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims description 3
- 239000010931 gold Substances 0.000 claims description 3
- 229910052737 gold Inorganic materials 0.000 claims description 3
- 238000006073 displacement reaction Methods 0.000 claims 1
- 239000002184 metal Substances 0.000 description 5
- 229910052751 metal Inorganic materials 0.000 description 5
- 241000602910 Chroococcus minutus Species 0.000 description 4
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 description 4
- 238000010586 diagram Methods 0.000 description 2
- 238000002474 experimental method Methods 0.000 description 2
- LPLLVINFLBSFRP-UHFFFAOYSA-N 2-methylamino-1-phenylpropan-1-one Chemical compound CNC(C)C(=O)C1=CC=CC=C1 LPLLVINFLBSFRP-UHFFFAOYSA-N 0.000 description 1
- 240000003023 Cosmos bipinnatus Species 0.000 description 1
- 235000005956 Cosmos caudatus Nutrition 0.000 description 1
- 241000219000 Populus Species 0.000 description 1
- 238000000429 assembly Methods 0.000 description 1
- 230000000712 assembly Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 230000007257 malfunction Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/02—Details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/08—Investigating strength properties of solid materials by application of mechanical stress by applying steady tensile or compressive forces
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/0058—Kind of property studied
- G01N2203/0069—Fatigue, creep, strain-stress relations or elastic constants
- G01N2203/0075—Strain-stress relations or elastic constants
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/02—Details not specific for a particular testing method
- G01N2203/026—Specifications of the specimen
- G01N2203/0262—Shape of the specimen
- G01N2203/0278—Thin specimens
- G01N2203/028—One dimensional, e.g. filaments, wires, ropes or cables
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/02—Details not specific for a particular testing method
- G01N2203/06—Indicating or recording means; Sensing means
- G01N2203/0641—Indicating or recording means; Sensing means using optical, X-ray, ultraviolet, infrared or similar detectors
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- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Instruments For Measurement Of Length By Optical Means (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
The present invention provides a kind of young modulus measuring device and method based on Michelson's interferometer, this device includes S types pulling force sensor, wire, drum supporting rod, gear assembly housing, pulling force sensor support base, pulling force sensor display, Michelson's interferometer main body（Including M1Mirror, Mobile base, M2Mirror, adjusting knob, screw rod, compensating plate, vernier knob and beam-splitter）, optical screen, line array CCD, He-Ne lasers, optical screen supporting rod, support rail, laser support base and microcontroller, pulling force sensor display is connected with S type pulling force sensors, wire left end is connected with the hook of S type pulling force sensors, wire right end and M1Mirror is connected, and optical screen back is equipped with line array CCD, and microcontroller is connected with line array CCD, and He-Ne lasers are placed on the left of Michelson's interferometer rear end, and right side face He-Ne lasers are equipped with beam-splitter and M2Mirror, the present invention can increase the convenience of measurement process, and can improve the precision of measurement result.
Description
Technical field
The present invention relates to wire Young's modulus fields of measurement, more particularly to a kind of poplar based on Michelson's interferometer
Family name's modulus measuring device and method.
Background technology
In Experiment of College Physics with static stretch method measure metal Young's modulus key be to wire in stress
The measurement of Chroococcus minutus, common optical lever method have the shortcomings that measuring instrument is heavy, measurement accuracy is not high enough, the reason is that
In experiment, when observing the reading on scale picture by optical lever, slight disturbance may result in scale picture and shake, serious shadow
The accuracy of reading is rung, simultaneously because failing to completely eliminate the influence of parallax, when reading rod reading, it is likely that will appear slightly
Big error.
Invention content
Above-mentioned in order to solve the problems, such as, the present invention provides a kind of Young's modulus measurement based on Michelson's interferometer
Device and method, can utilize Michelson's interferometer measure Chroococcus minutus and using line array CCD to moving interference fringes from
It is dynamic to count, to increase the convenience of measurement process, and improve the precision of measurement result.
The present invention provides a kind of young modulus measuring device based on Michelson's interferometer, this device includes S type pulling force
Sensor, drum supporting rod, gear assembly housing, pulling force sensor support base, Michelson's interferometer main body, is drawn wire
Force snesor display, M1Mirror, Mobile base, M2Mirror, optical screen, line array CCD, adjusting knob, He-Ne lasers, optical screen supporting rod,
Support rail, laser support base, screw rod, compensating plate, vernier knob, beam-splitter and microcontroller, the pulling force sensor branch
It supports and drum supporting rod is housed on pedestal, the drum supporting rod right end is equipped with S type pulling force sensors, and the pulling force sensor is shown
Device is connected with S type pulling force sensors, and the wire left end is connected with the hook of S type pulling force sensors, the wire right end
With M1The Mobile base of mirror bottom is connected, and the screw rod of the Michelson's interferometer main body passes through Mobile base, and the Mobile base is along spiral shell
Bar moves, and the support rail left end is connected with drum supporting rod, and Michelson's interferometer master is passed through among the support rail
Body, the support rail right end are connected with optical screen supporting rod, and the optical screen back is equipped with line array CCD, the microcontroller and linear array
CCD is connected, and is placed with He-Ne lasers on the left of the Michelson's interferometer rear end, the He-Ne lasers pass through laser
Support base is fixed, and right side face He-Ne lasers are equipped with M2Mirror, the M2There is compensation between mirror and the camera lens of He-Ne lasers
Plate and beam-splitter, the Michelson's interferometer rear portion are equipped with gear assembly housing, and the gear assembly housing is built-in with gear set, institute
It states gear set case back and adjusting knob is housed, right side is equipped with vernier knob.
Structure of the invention is further improved, and the pulling force sensor display is connected with S type pulling force sensors.
Structure of the invention is further improved, and the wire left end is connected with the hook of S type pulling force sensors, right end with
M1 mirrors are connected.
Structure of the invention is further improved, and the microcontroller is connected with line array CCD.
Structure of the invention is further improved, and the Michelson's interferometer back is equipped with gear assembly housing, built-in with teeth
Wheel group, gear set case back are equipped with adjusting knob, and right side is equipped with vernier knob.
As another aspect of the present invention, the present invention provides a kind of metal based on Michelson's interferometer and line array CCD
Silk Young's modulus measurement method, includes the following steps：
Step S1：Make the centre for the light beam directive beam-splitter that laser sends out, adjusts M1、M2The screw of mirror behind, makes
Occurs the interference fringe of circular ring shape on optical screen, and fringe center is located at optical screen center；
Step S2：The slowly trimming hand wheel of rotation Michelson's interferometer, makes M1Mirror is moved to optical screen direction, to make gold
Belong to pulling force in silk to become larger, observe the pulling force registration on deformeter display screen, until become 10.00N, using the value of thrust as
The original state of measurement measures the length L of wire at this time as former length and diameter d, press on microcontroller start counting up by
Button；
Step S3：Continue the trimming hand wheel of slow rotation Michelson's interferometer in the same direction, microcontroller can aiming screen
On interference circle movement number count automatically, make pulling force registration increase Δ F, record annulus move number N, calculate M1The position of mirror
λ/2 shifting amount Δ x=N, λ is the wavelength of laser, wavelength 632.8nm in formula；
Step S4：Wire is removed, by pulling force sensor and M1Mirror is directly connected to, using pulling force registration be 10.00N when as
Original state, presses to press again after microcontroller reset button and starts counting up button, slowly rotates the fine tuning hand of Michelson's interferometer
Wheel makes pulling force registration equally increase Δ F, and record annulus moves number N ', deformation quantity ε=N ' λ of calculating pulling force sensor itself/
2；
Step S5：Calculate the deformation elongation Δ L=Δ x- ε of wire；
Step S6：According to formulaCalculate the Young's modulus of wire.
It is further improved as the method for the present invention, step S3-S5 continues to increase pulling force and takes multiple measurements, and is used in combination by poor method
Calculate Δ L.
This patent provides a kind of young modulus measuring device and method based on Michelson's interferometer, mainly improves
Point is as follows：
Existing Michelson's interferometer is transformed in measuring device of the present invention, is passed through with the straight metal bar of a root long dry
The vertical frame for fixing wire is placed in the center of interferometer pedestal, one end, and the other end places optical screen and line array CCD, metal to be measured
Silk one end is connected with pulling force sensor, and the other end is fixed on the M of interferometer1On mirror, M can be made by rotating turntable1Mirror moves
It is dynamic, to change pulling force and the elongation of wire, M on Michelson's interferometer1When the position of mirror often changes λ/2, interference circle
Center is emerged or is retracted a ring, and reading fringe moves number N, and the variation of position can be obtained according to λ/2 Δ x=N, and line array CCD is available
In the light intensity signal of capture laser interference, it is used in combination mcu programming to count move of stripe automatically to facilitate reading, reduce and malfunction
Rate, the S types pulling force sensor is used to measure the pulling force F in wire, since pulling force sensor itself also will produce deformation, because
This determines the deformation data of sensor, and removal can obtain the elongation Δ L=Δ x- ε of wire from total elongation when calculating.
The present invention improves the experimental provision and method that measure the elasticity modulus of wire, can utilize Michael
Inferior interferometer measurement Chroococcus minutus simultaneously counts moving interference fringes using line array CCD automatically, to increase measurement process
Convenience, and improve the precision of measurement result.
Description of the drawings
Fig. 1 is partial schematic diagram of the present invention；
Fig. 2 is partial schematic diagram of the present invention；
It illustrates：
1, S types pulling force sensor；2, wire；3, drum supporting rod；4, gear assembly housing；5, pulling force sensor supports bottom
Seat；6, Michelson's interferometer main body；7, pulling force sensor display；8, M1 mirrors；9, Mobile base；10, M2 mirrors；11, optical screen；
12, line array CCD；13, adjusting knob；14, He-Ne lasers；15, optical screen supporting rod；16, support rail；17, laser supports
Pedestal；18, screw rod；19, compensating plate；20, vernier knob；21, beam-splitter；22, microcontroller.
Specific implementation mode
Present invention is further described in detail with specific implementation mode below in conjunction with the accompanying drawings：
The present invention provides a kind of young modulus measuring device and method based on Michelson's interferometer, can utilize mikey
The inferior interferometer measurement Chroococcus minutus of that simultaneously counts moving interference fringes using line array CCD automatically, to increase measurement process
Convenience, and improve the precision of measurement result.
As an embodiment of the present invention, the present invention provide one kind as illustrated in fig. 1 and 2 be based on Michelson's interferometer with
The metal wire young modulus measuring device of line array CCD, this device include S types pulling force sensor 1, wire 2, drum supporting rod 3,
Gear assembly housing 4, pulling force sensor support base 5, Michelson's interferometer main body 6, pulling force sensor display 7, M1Mirror 8,
Mobile base 9, M2Mirror 10, optical screen 11, line array CCD 12, adjusting knob 13, He-Ne lasers 14, optical screen supporting rod 15, support are horizontal
Bar 16, laser support base 17, screw rod 18, compensating plate 19, vernier knob 20, beam-splitter 21 and microcontroller 22, the pulling force
Drum supporting rod 3 is housed, 3 right end of drum supporting rod is equipped with S types pulling force sensor 1, the drawing on sensor support pedestal 5
Force snesor display 7 is connected with S types pulling force sensor 1, the hook phase of 2 left end of the wire and S types pulling force sensor 1
Even, 2 right end of the wire is connected with the Mobile base 9 of 8 bottom of M1 mirrors, and the screw rod 18 of the Michelson's interferometer main body 6 is worn
Mobile base 9 is crossed, the Mobile base 9 is moved along screw rod 18, and 16 left end of the support rail is connected with drum supporting rod 3, the branch
It supports and passes through Michelson's interferometer main body 6 among cross bar 16,16 right end of the support rail is connected with optical screen supporting rod 15, described
11 back of optical screen is equipped with line array CCD 12, and the microcontroller 22 is connected with line array CCD 12, and the Michelson's interferometer rear end is left
Side is placed with He-Ne lasers 14, and the He-Ne lasers 14 are fixed by laser support base 17, right side face He-Ne
Laser 14 is equipped with M2 mirrors 10, there is compensating plate 19 and beam-splitter 21, institute between the M2 mirrors 10 and the camera lens of He-Ne lasers 14
It states Michelson's interferometer rear portion and gear assembly housing 4 is housed, the gear assembly housing 4 is built-in with gear set, outside the gear set
4 back of shell is equipped with adjusting knob 13, and right side is equipped with vernier knob 20.
The wire Young's modulus measurement method based on Michelson's interferometer and line array CCD of the present invention, specific steps
For：
Step S1：Make the centre for the light beam directive beam-splitter that laser sends out, adjusts M1、M2The screw of mirror behind, makes
Occurs the interference fringe of circular ring shape on optical screen, and fringe center is located at optical screen center.
Step S2：The slowly trimming hand wheel of rotation Michelson's interferometer, makes M1 mirrors be moved to optical screen direction, to make gold
Belong to pulling force in silk to become larger, observe the pulling force registration on deformeter display screen, until become 10.00N, using the value of thrust as
The original state of measurement measures wire length L (long as original) at this time and diameter d, presses starting counting up on microcontroller
Button.
Step S3：Continue the trimming hand wheel of slow rotation Michelson's interferometer in the same direction, microcontroller can aiming screen
On interference circle movement number count automatically, make pulling force registration increase Δ F, record annulus move number N, calculate M1The position of mirror
λ/2 shifting amount Δ x=N, λ is the wavelength (632.8nm) of laser in formula.
Step S4：Wire is removed, by pulling force sensor and M1Mirror is directly connected to, using pulling force registration be 10.00N when as
Original state, presses to press again after microcontroller reset button and starts counting up button, slowly rotates the fine tuning hand of Michelson's interferometer
Wheel makes pulling force registration equally increase Δ F, and record annulus moves number N ', deformation quantity ε=N ' λ of calculating pulling force sensor itself/
2。
Step S5：Calculate deformation elongation Δ L=Δ x- ε (the sustainable increase drawings of step S3-S5 in practical measurement of wire
Power takes multiple measurements, and is used in combination and calculates Δ L by poor method).
Step S6：According to formulaCalculate the Young's modulus of wire.
Line array CCD of the present invention uses STM32F103 microcontrollers, belongs to 32 ARM microcontrollers of low and middle-end, has cost
Low, small, feature-rich feature.For works using blue III sensor assemblies of cosmos electronic linear CCD, the product is public using TAOS
The TSL1401 chips of department have 128 photosensitive elements, and have re-started circuit design, have small, light-weight, use
Simply, it is easy to the advantages that fixed, interface is simple.TSL1401 linear transducer drivers are write by C language, are closed by providing
Suitable CLK and SI signals control the time for exposure, and AO pins will be sequentially output the analog signal of 128 pixels.
The above described is only a preferred embodiment of the present invention, being not the limit for making any other form to the present invention
System, and according to the technical essence of the invention made by any modification or equivalent variations, still fall within present invention model claimed
It encloses.
Claims (7)
1. a kind of young modulus measuring device based on Michelson's interferometer, this device includes S types pulling force sensor (1), gold
Belong to silk (2), drum supporting rod (3), gear assembly housing (4), pulling force sensor support base (5), Michelson's interferometer main body
(6), pulling force sensor display (7), M1Mirror (8), Mobile base (9), M2Mirror (10), line array CCD (12), adjusts rotation at optical screen (11)
Button (13), He-Ne lasers (14), optical screen supporting rod (15), support rail (16), laser support base (17), screw rod
(18), compensating plate (19), vernier knob (20), beam-splitter (21) and microcontroller (22), it is characterised in that；The pulling force sensor
Drum supporting rod (3) is housed, drum supporting rod (3) right end is equipped with S types pulling force sensor (1), described in support base (5)
Pulling force sensor display (7) is connected with S types pulling force sensor (1), wire (2) left end and S types pulling force sensor (1)
Hook be connected, wire (2) right end and M1The Mobile base (9) of mirror (8) bottom is connected, the Michelson's interferometer master
The screw rod (18) of body (6) passes through Mobile base (9), and the Mobile base (9) is mobile along screw rod (18), support rail (16) left end
It is connected with drum supporting rod (3), passes through Michelson's interferometer main body (6), the support horizontal among the support rail (16)
Bar (16) right end is connected with optical screen supporting rod (15), and optical screen (11) back is equipped with line array CCD (12), the microcontroller (22)
It is connected with line array CCD (12), He-Ne lasers (14) is placed on the left of the Michelson's interferometer rear end, the He-Ne swashs
Light device (14) is fixed by laser support base (17), and right side face He-Ne lasers (14) are equipped with M2Mirror (10), the M2
There are compensating plate (19) and beam-splitter (21), the Michelson's interferometer between mirror (10) and the camera lens of He-Ne lasers (14)
Rear portion is equipped with gear assembly housing (4), and the gear assembly housing (4) is built-in with gear set, and gear assembly housing (4) back is equipped with
Adjusting knob (13), right side are equipped with vernier knob (20).
2. a kind of young modulus measuring device based on Michelson's interferometer according to claim 1, it is characterised in that：
The pulling force sensor display (7) is connected with S types pulling force sensor (1).
3. a kind of young modulus measuring device based on Michelson's interferometer according to claim 1, it is characterised in that：
Wire (2) left end is connected with the hook of S types pulling force sensor (1), right end and M1Mirror (8) is connected.
4. a kind of young modulus measuring device based on Michelson's interferometer according to claim 1, it is characterised in that：
The microcontroller (22) is connected with line array CCD (12).
5. a kind of young modulus measuring device based on Michelson's interferometer according to claim 1, it is characterised in that：
The Michelson's interferometer back is equipped with gear assembly housing (4), is built-in with gear set, gear assembly housing (4) back is equipped with tune
Knob (13) is saved, right side is equipped with vernier knob (20).
6. the measurement method based on the measuring device described in claim 1-5 any one, it is characterised in that：
Step S1：Make the centre for the light beam directive beam-splitter that laser sends out, adjusts M1、M2The screw of mirror behind, makes optical screen
On there is the interference fringe of circular ring shape, and fringe center is located at optical screen center；
Step S2：The slowly trimming hand wheel of rotation Michelson's interferometer, makes M1 mirrors be moved to optical screen direction, to make wire
Middle pulling force becomes larger, and observes the pulling force registration on deformeter display screen, until becoming 10.00N, using the value of thrust as measurement
Original state, measure the length L of wire at this time as former length and diameter d, press and start counting up button on microcontroller；
Step S3：Continue the trimming hand wheel of slow rotation Michelson's interferometer in the same direction, microcontroller is understood on aiming screen
Interference circle movement number counts automatically, and pulling force registration is made to increase Δ F, and record annulus moves number N, calculates M1The displacement of mirror
λ/2 Δ x=N, λ is the wavelength of laser, wavelength 632.8nm in formula；
Step S4：Wire is removed, by pulling force sensor and M1Mirror is directly connected to, using pulling force registration be 10.00N when as initially
State, presses to press again after microcontroller reset button and starts counting up button, slowly rotates the trimming hand wheel of Michelson's interferometer, makes
Pulling force registration equally increases Δ F, and record annulus moves number N ', calculate deformation quantity ε=λ/2 N ' of pulling force sensor itself；
Step S5：Calculate the deformation elongation Δ L=Δ x- ε of wire；
Step S6：According to formulaCalculate the Young's modulus of wire.
7. the measurement method of measuring device according to claim 6, it is characterised in that：Step S3-S5 continues to increase pulling force
It takes multiple measurements, is used in combination and calculates Δ L by poor method.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810823178.4A CN108709798A (en) | 2018-07-25 | 2018-07-25 | A kind of young modulus measuring device and method based on Michelson's interferometer |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810823178.4A CN108709798A (en) | 2018-07-25 | 2018-07-25 | A kind of young modulus measuring device and method based on Michelson's interferometer |
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| CN108709798A true CN108709798A (en) | 2018-10-26 |
Family
ID=63874397
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201810823178.4A Pending CN108709798A (en) | 2018-07-25 | 2018-07-25 | A kind of young modulus measuring device and method based on Michelson's interferometer |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111665620A (en) * | 2020-06-10 | 2020-09-15 | 伊普希龙（天津）科技有限公司 | Michelson interferometer measuring device and measuring method thereof |
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|---|---|---|---|---|
| CN201397268Y (en) * | 2009-05-27 | 2010-02-03 | 广东外语外贸大学 | Measurement system of young modulus |
| CN102636123A (en) * | 2012-04-13 | 2012-08-15 | 四川大学 | Young's modulus of metal wire measured by Michelson interference |
| CN203241305U (en) * | 2013-04-17 | 2013-10-16 | 周雄 | White light interferometry Young modulus admeasuring apparatus |
| CN105466769A (en) * | 2015-12-30 | 2016-04-06 | 西南交通大学 | Young modulus measuring instrument |
| CN106017304A (en) * | 2016-04-19 | 2016-10-12 | 青岛滨海学院 | He-Ne laser sensor used for Michelson interferometer |
| CN208596078U (en) * | 2018-07-25 | 2019-03-12 | 金陵科技学院 | A kind of young modulus measuring device based on Michelson's interferometer |
-
2018
- 2018-07-25 CN CN201810823178.4A patent/CN108709798A/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN201397268Y (en) * | 2009-05-27 | 2010-02-03 | 广东外语外贸大学 | Measurement system of young modulus |
| CN102636123A (en) * | 2012-04-13 | 2012-08-15 | 四川大学 | Young's modulus of metal wire measured by Michelson interference |
| CN203241305U (en) * | 2013-04-17 | 2013-10-16 | 周雄 | White light interferometry Young modulus admeasuring apparatus |
| CN105466769A (en) * | 2015-12-30 | 2016-04-06 | 西南交通大学 | Young modulus measuring instrument |
| CN106017304A (en) * | 2016-04-19 | 2016-10-12 | 青岛滨海学院 | He-Ne laser sensor used for Michelson interferometer |
| CN208596078U (en) * | 2018-07-25 | 2019-03-12 | 金陵科技学院 | A kind of young modulus measuring device based on Michelson's interferometer |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111665620A (en) * | 2020-06-10 | 2020-09-15 | 伊普希龙（天津）科技有限公司 | Michelson interferometer measuring device and measuring method thereof |
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