CN203171388U - Device for preparing transmission electron microscope film sample - Google Patents
Device for preparing transmission electron microscope film sample Download PDFInfo
- Publication number
- CN203171388U CN203171388U CN 201320142992 CN201320142992U CN203171388U CN 203171388 U CN203171388 U CN 203171388U CN 201320142992 CN201320142992 CN 201320142992 CN 201320142992 U CN201320142992 U CN 201320142992U CN 203171388 U CN203171388 U CN 203171388U
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- CN
- China
- Prior art keywords
- cylinder
- hole
- handle
- central
- sample
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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- 230000005540 biological transmission Effects 0.000 title claims abstract description 14
- 238000002360 preparation method Methods 0.000 abstract description 7
- 238000000034 method Methods 0.000 abstract description 3
- 239000000523 sample Substances 0.000 description 21
- 244000137852 Petrea volubilis Species 0.000 description 2
- 238000010521 absorption reaction Methods 0.000 description 2
- 238000005498 polishing Methods 0.000 description 2
- 239000013068 control sample Substances 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 239000003292 glue Substances 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
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- Sampling And Sample Adjustment (AREA)
Abstract
The utility model provides a device for preparation of transmission electron microscope film sample, including the cylinder of central through-hole, with cylinder central through-hole matched with handle, its characterized in that the handle is the T type, and T type pole upper portion is for taking the screwed cylinder, the smooth cylinder in T type pole lower part position, the upper portion of cylinder central through-hole be with handle complex screw thread, the lower part of cylinder central through-hole is glossy through-hole, sets up the magnet disk bottom the handle, magnet disk diameter is not more than central through-hole diameter. The utility model directly adsorbs the thin wafer sample for the transmission electron microscope and then grinds the sample, and can gradually and manually adjust the distance between the handle and the bottom of the cylinder according to the thickness of the sample in the grinding process to achieve the purpose of rapid thinning, and ensure that the sample can reach ideal thickness, parallelism and flatness; the device has simple structure, easy processing, low cost and simple and convenient operation.
Description
Technical field
The utility model belongs to metal material sample preparation field, relates in particular to a kind of transmission electron microscope film sample preparation facilities that is applicable to.
Background technology
At present, the sample requirement thickness of observing under transmission electron microscope must be in 5-50nm.Conventional method is that sample is sticked with glue on the object carrier of bulks such as rubber or metal with the thin slice that wire cutting machine cuts into about thick 500nm, be thinned to below the 200nm at sand paper or polishing machine grinding by hand, cut into the thin discs of φ 3mm again, then thin discs is carried out the electrobrightening attenuate.But because sample itself is very thin, thus have only 200nm thick when grinding attenuate hand-power to be difficult to control sample attenuate even, sample grinds inclined to one side even broken easily.Follow-up electrobrightening attenuate is hard to carry on, the thin district that certainly can't the electron gain bundle can penetrate.Patent CN201442215U provides a kind of hand-ground dish that can be placed on sand paper or the grinding and polishing machine, if but pasting uneven meeting influence grinding effect, and device needs extra the purchase to increase cost.Patent CN202420943U provides a kind of mechanical device that directly disk of 500nm φ 3mm is thinned to 15nm, but the depth of parallelism of sample and flatness are difficult to guarantee.
In-depth along with scientific research, the workload of transmission electron microscope increases day by day, therefore need badly and a kind ofly can make things convenient for the device for preparing the transmission electron microscope film sample fast, the mechanical reduction stage that is particularly useful for sample, can be directly the thin discs of φ 3mm be thinned to 30nm, can guarantee the depth of parallelism and the flatness of sample again, require the processing, with low cost, simple to operate easily of this device simultaneously.
The utility model content
The purpose of this utility model is to overcome the problems referred to above provides a kind of device, this installation cost for the preparation of transmission electron microscope film sample cheap, simple to operate with deficiency, is particularly useful for the mechanical reduction stage of sample.
A kind of device for the preparation of transmission electron microscope film sample, comprise the cylinder of central through hole, the handle that matches with the cylinder central through hole, it is characterized in that described handle is the T type, T type bar top is screwed cylinder, the smooth cylinder in position under the T type bar, the top of described cylinder central through hole is the screw thread that cooperates with handle, the bottom of cylinder central through hole is smooth through hole, the handle bottom arranges the magnet disk, the bottom of cylinder central through hole is smooth cylinder, the handle bottom arranges the magnet disk, and magnet disk diameter is not more than the central through hole diameter.
The utility model directly grinds used in transmission electron microscope φ 3mm thin discs sample after the absorption, and at any time can be easily in the process of grinding according to sample thickness gradually the distance between manual adjustments handle and the cylinder bottom and guarantee that sample can reach desirable thickness, the depth of parallelism and flatness reaching the purpose of quick attenuate; This apparatus structure is simple, be easy to processing, with low cost, easy and simple to handle.
Description of drawings
Fig. 1 is the utility model front view.
1 is cylinder among the figure, and 2 is the magnet disk, and 3 is handle, through hole centered by 4.
The specific embodiment
As shown in Figure 1, a kind of device for the preparation of transmission electron microscope film sample, mainly comprise the cylinder 1 of central through hole 4, the handle 3 that matches with cylinder 1 central through hole 4, it is characterized in that described handle 3 is the T type, T type bar top is screwed cylinder, the smooth cylinder in position under the T type bar, the top of described cylinder 1 central through hole 4 is the screw thread that cooperates with handle 3, the bottom of cylinder 1 central through hole 4 is smooth through hole, handle 3 bottoms arrange magnet disk 2, and magnet disk diameter is not more than the central through hole diameter.
The utility model directly grinds used in transmission electron microscope φ 3mm thin discs sample after the absorption, and at any time can be easily in the process of grinding according to sample thickness gradually the distance between manual adjustments handle and the cylinder bottom and guarantee that sample can reach desirable thickness, the depth of parallelism and flatness reaching the purpose of quick attenuate; This apparatus structure is simple, be easy to processing, with low cost, easy and simple to handle.
Claims (1)
1. one kind is used for the device that the transmission electron microscope film sample prepares, the cylinder (1) that comprises central through hole (4), the handle (3) that matches with cylinder (1) central through hole (4), it is characterized in that described handle (3) is the T type, T type bar top is screwed cylinder, the smooth cylinder in position under the T type bar, the top of described cylinder (1) central through hole (4) is the screw thread that cooperates with handle (3), the bottom of cylinder (1) central through hole (4) is smooth through hole, handle (3) bottom arranges magnet disk (2), and magnet disk (2) diameter is not more than central through hole (4) diameter.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201320142992 CN203171388U (en) | 2013-03-27 | 2013-03-27 | Device for preparing transmission electron microscope film sample |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201320142992 CN203171388U (en) | 2013-03-27 | 2013-03-27 | Device for preparing transmission electron microscope film sample |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203171388U true CN203171388U (en) | 2013-09-04 |
Family
ID=49068141
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 201320142992 Expired - Fee Related CN203171388U (en) | 2013-03-27 | 2013-03-27 | Device for preparing transmission electron microscope film sample |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN203171388U (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103700562A (en) * | 2013-12-25 | 2014-04-02 | 苏州新锐合金工具股份有限公司 | Height adjustment type scanning electron microscope sampler holder |
| CN105093512A (en) * | 2015-09-21 | 2015-11-25 | 核工业理化工程研究院 | Height-difference-adjustable microscope combined object table |
| CN111515853A (en) * | 2020-05-13 | 2020-08-11 | 深圳宜特检测技术有限公司 | Sample grinding auxiliary device and grinding method thereof |
-
2013
- 2013-03-27 CN CN 201320142992 patent/CN203171388U/en not_active Expired - Fee Related
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103700562A (en) * | 2013-12-25 | 2014-04-02 | 苏州新锐合金工具股份有限公司 | Height adjustment type scanning electron microscope sampler holder |
| CN105093512A (en) * | 2015-09-21 | 2015-11-25 | 核工业理化工程研究院 | Height-difference-adjustable microscope combined object table |
| CN111515853A (en) * | 2020-05-13 | 2020-08-11 | 深圳宜特检测技术有限公司 | Sample grinding auxiliary device and grinding method thereof |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20130904 Termination date: 20200327 |