CN202949392U - High-precision temperature compensated crystal oscillator system - Google Patents
High-precision temperature compensated crystal oscillator system Download PDFInfo
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- CN202949392U CN202949392U CN 201220704223 CN201220704223U CN202949392U CN 202949392 U CN202949392 U CN 202949392U CN 201220704223 CN201220704223 CN 201220704223 CN 201220704223 U CN201220704223 U CN 201220704223U CN 202949392 U CN202949392 U CN 202949392U
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Abstract
The utility model relates to a high-precision temperature compensated crystal oscillator system, which comprises a computer, a power supply, an incubator, a frequency meter, a frequency marker, a digital-to-analog conversion unit, a data transmission unit and a data display unit. A test control panel is arranged in the incubator. The main board of the computer is inserted with a DIO card for driving the test control panel, and a GPIB card for driving the incubator, the frequency meter and the power supply. The frequency marker and the interface of the frequency meter are connected together. The digital-to-analog conversion unit is in electrical connection with an internal chip of the crystal oscillator through the data transmission unit so as to control the data writing and data reading operation of the internal chip of the crystal oscillator. The data display unit displays data through the frequency meter, the power supply and the incubator and stores the data in the database of the computer. According to the technical scheme of the utility model, the accuracy of temperature compensation is improved to be -0.28 ppm to +0.28 ppm within a wide temperature range. Based on the reserved address bits of the test control panel, the extension of the address bits can be realized to enable the mass production. Therefore, the working efficiency is greatly improved.
Description
Technical field
The utility model relates to the crystal oscillator temperature compensation system, particularly a kind of high precision temperature compensation crystal oscillator system.
Background technology
The compensation way of temperature compensating crystal oscillator (TCXO) mainly is divided into analog compensation and digital compensation two classes, and the former utilizes the temperature feedback of thermistor network to come the frequency-temperature characteristic curve of analog compensation crystal element; The latter adopts some digital circuits and crystal element, realizes by depositing compensation control data, sensing temperature and digital-to-analogue conversion.Present stage, digital compensation utilizes the voltage signal that hygrosensor produces to generate cubic curve, controls the size of variable capacitance.The cubic curve that generates carries out shaping by the adjustment function circuit for generating, to adapt to different crystal.Its frequency temperature stability can only reach ± 1ppm-± 2.5ppm in-40 ℃ of-85 ℃ of wide temperature ranges, but along with the development of the market demand, this precision can not satisfy the demand in high-end technology field.At present, the compensation precision of raising temperature compensation system has become a urgent problem.Therefore, be badly in need of a kind of high precision temperature compensation of exploitation system and overcome above defective.
The utility model content
The utility model is intended to solve the problems referred to above that existing crystal oscillator temperature compensation system exists, and a kind of high precision temperature compensation crystal oscillator system is provided.
In order to achieve the above object, the technical solution adopted in the utility model is:
A kind of high precision temperature compensation crystal oscillator system comprises computer, power supply, incubator, frequency meter, frequency marking, D/A conversion unit, data transmission unit and data display unit, and described incubator inside is placed with test control panel; Described computer motherboard inserts for the DIO card that drives test control panel with for the GPIB card that drives incubator, frequency meter, power supply; Described frequency marking is connected with the interface of frequency meter; Described D/A conversion unit is electrically connected to the crystal oscillator inside chip by data transmission unit, the data of controlling the crystal oscillator inside chip write and read, described data display unit shows data, and it is stored in Computer Database by frequency meter, power supply, incubator.
As preferred version, described frequency marking is high accuracy atom frequency marker.The short-term stability of high accuracy atom frequency marker can reach the 1E-14 magnitude, in order to the frequency reference source as crystal oscillator, has improved the frequency temperature stability of temperature compensating crystal oscillator and the accuracy of frequency accuracy.
As preferred version, native system also comprises for the interconnected interfacing expansion module of external equipment.Compatible powerful, carry the multiple popular interface such as serial ports, print.er port, USB, be convenient to the analysis of various device joint test.
In the technical program, pass through GPIB card control power supply, incubator and frequency meter based on event driven software; Choose the address of each crystal oscillator on test control panel by the DIO card control; Read by frequency meter setting each temperature spot many class frequencys value and the data that read are stored in system database.In the temperature range of setting, multi-group data is fitted to a plurality of five rank functions based on event driven software, to organize five rank curves by the rudimentary algorithm of software infinitely approaches more, draw a best curve, extract every coefficient of this best curve, convert numerical value in the crystal oscillator chip internal register to by A/D converter, thereby change the electric capacity quantity that register is controlled, reach the crystal oscillator high accuracy (purpose of temperature-compensating of frequency temperature stability in wide temperature range ± 0.28ppm) with this.
Compared with prior art, the utility model has improved the temperature-compensating precision, and it is reached ± 0.28ppm in wide temperature (40 ℃-85 ℃) scope; Test control panel exist to be reserved address bit, can carry out on this basis the address bit expansion, can large-scale production, greatly improved operating efficiency.
Description of drawings
Fig. 1 is the utility model embodiment system configuration schematic diagram.
Fig. 2 is the utility model embodiment working-flow figure.
Fig. 3 is the utility model effect temperature compensation figure.
In figure: control unit 1, transfer of data and display unit 2, test control panel 3, crystal oscillator 4, power supply 101, frequency marking 102, frequency meter 103, computer 104, incubator 105, D/A conversion unit 201, data transmission unit 202, data display unit 203.
Embodiment
Description by following examples and by reference to the accompanying drawings, it is more clear that the utility model will become, and these accompanying drawings are used for explaining embodiment of the present utility model.
Referring to Fig. 1, the hardware configuration of this high precision temperature compensation crystal oscillator system is comprised of control unit 1, transfer of data and display unit 2, test control panel 3, crystal oscillator 4, control unit 1 is comprised of power supply 101, frequency marking 102, frequency meter 103, computer 104, incubator 105, and transfer of data and display unit 2 are comprised of D/A conversion unit 201, data transmission unit 202, data display unit 203.
The inner test control panel 3 of placing of incubator 105 arranges crystal oscillator 4 on test control panel 3, computer 104 mainboards insert DIO card and GPIB card.The DIO card is used for driving test control panel 3, and the GPIB card is used for driving incubator 105, frequency meter 103 and power supply 101, and frequency marking 102 is connected with the interface of frequency meter 103, and frequency marking 102 adopts high accuracy atom frequency marker.
Pass through GPIB card control power supply 205, incubator 202 and frequency meter 203 in control unit 101 based on event driven software; Choose the address of each crystal oscillator 4 on test control panel 3 by the DIO card control in control unit 1; Read by frequency meter 103 setting each temperature spot many class frequencys value and the data that read are stored in system database.D/A conversion unit 201 is electrically connected to crystal oscillator 4 inside chips by data transmission unit 202, the conversion of solution analog signal and digital signal with communicate by letter; Data transmission unit 202 adopts total line traffic control transmission, and the data of controlling crystal oscillator 4 inside chips write and read; Data display unit 203 shows data, and it is stored in Computer Database by frequency meter 103, power supply 101, incubator 105.
Need to prove, in the utility model, the quantity of test control panel 3 depends on the size in incubator 105 spaces, can increase according to actual needs.Owing to adopting multiple shield technology, in the batch production crystal oscillator, guaranteed the stability of crystal oscillator.In order to adapt to the product of Multiple Type, can be according to the different test fixture of model customization of product.
Referring to Fig. 2, the workflow of this high precision temperature compensation crystal oscillator system is as follows:
A. initial value setting.Needed parameter in the design temperature compensation process.The for example setting of nominal frequency, frequency temperature stability, frequency accuracy, temperature range, Temperature of Warm Case precision, each temperature spot soak time, supply voltage, five function coefficients.
B. the crystal oscillator address bit chooses.The crystal oscillator 4 that control unit 1 is chosen on test control panel 3 by the driving logic chip is tested.
C. the calculating of the crystal linearity.Choose two temperature spots in temperature range, soaked 10 minutes at each temperature spot, reading frequency is according to the numerical computations crystal linearity that reads.
D. the frequency-temperature characteristic of crystal oscillator.The nominal frequency of setting crystal oscillator 4 is F1, and the frequency under normal temperature (25 ℃ ± 2 ℃) is F2, suppose to choose a plurality of temperature spots and carry out reading out data in-40 ℃ of-85 ℃ of temperature ranges, as every 5 ℃ a bit, data streams read is set as F3.Frequency temperature stability computing formula is as follows: (F3-F2)/F1.
E. temperature scanning, data extraction procedure.Some temperature spots in the design temperature scope carry out data and extract.When the initial value setting up procedure, system is provided with five function coefficients, and there is a step value in each function coefficient, and 11 groups of data can occur in the process that data are extracted: first group of data depends on initial set value; Second group of data is that all the other four function coefficients of setting are constant, and first function coefficient increases a step value, reading out data; The 3rd group of data are that all the other four function coefficients of setting are constant, and first function coefficient reduces a step value, reading out data; By parity of reasoning, obtains all the other and respectively organize data.
F. data write.11 groups of data in step e are fitted to 11 group of five rank function curve in whole temperature range, use least square method infinitely to approach out a best curve based on event driven software, extract each time item coefficient of this curve, be voltage signal with each time item coefficients conversion, change voltage signal into digital quantity by A/D converter, digital quantity is write in register.Digital quantity is addressing in chip register, obtains the bucking voltage amount corresponding with it, then changes the formation bucking voltage by D/A.
G. the accuracy of adjusting frequency.Control unit 1 sends instruction, and incubator 105 runs to 25 ℃ ± 0.3 ℃, soaks 10 minutes.
H. temperature test.Data writing is calculated value, and need to carry out to crystal oscillator 4 100% test in-40 ℃ of-85 ℃ of temperature ranges: the nominal frequency of setting crystal oscillator 4 is F1, a plurality of temperature spots is set, reading out data F3 in-40 ℃ of-85 ℃ of wide temperature ranges; 25 ℃ that choose wherein are reference temperature, reading out data F2; Frequency temperature stability computing formula is as follows: (F3-F2)/F1, extract | the maximum of (F3-F2)/F1| and 0.28ppm comparison, be judged to be defectively greater than 0.28ppm, it is qualified to be judged to be less than 0.28ppm.
Referring to Fig. 3, Fig. 3 has provided the effect temperature compensation figure that the present embodiment provides.Show in figure, temperature compensation system reaches ± 0.15ppm the compensation precision of the frequency temperature stability of crystal oscillator in-40 ℃ of-85 ℃ of scopes, satisfies the index of frequency temperature stability ± 0.28ppm in wide temperature range far away.
Claims (3)
1. a high precision temperature compensation crystal oscillator system, comprise computer, power supply, incubator, frequency meter, frequency marking, D/A conversion unit, data transmission unit and data display unit, it is characterized in that, described incubator inside is placed with test control panel; Described computer motherboard inserts for the DIO card that drives test control panel with for the GPIB card that drives incubator, frequency meter, power supply; Described frequency marking is connected with the interface of frequency meter; Described D/A conversion unit is electrically connected to the crystal oscillator inside chip by data transmission unit, the data of controlling the crystal oscillator inside chip write and read, described data display unit shows data, and it is stored in Computer Database by frequency meter, power supply, incubator.
2. the system of high precision temperature compensation crystal oscillator as claimed in claim 1, is characterized in that, described frequency marking is high accuracy atom frequency marker.
3. high precision temperature compensation crystal oscillator as claimed in claim 1 system, is characterized in that, also comprises for the interconnected interfacing expansion module of external equipment.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201220704223 CN202949392U (en) | 2012-12-19 | 2012-12-19 | High-precision temperature compensated crystal oscillator system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201220704223 CN202949392U (en) | 2012-12-19 | 2012-12-19 | High-precision temperature compensated crystal oscillator system |
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| CN202949392U true CN202949392U (en) | 2013-05-22 |
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| CN 201220704223 Expired - Lifetime CN202949392U (en) | 2012-12-19 | 2012-12-19 | High-precision temperature compensated crystal oscillator system |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103036505A (en) * | 2012-12-19 | 2013-04-10 | 同方国芯电子股份有限公司 | High-accuracy temperature compensation crystal oscillator system and operational method thereof |
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2012
- 2012-12-19 CN CN 201220704223 patent/CN202949392U/en not_active Expired - Lifetime
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103036505A (en) * | 2012-12-19 | 2013-04-10 | 同方国芯电子股份有限公司 | High-accuracy temperature compensation crystal oscillator system and operational method thereof |
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Effective date of registration: 20160704 Address after: 064100 Yutian Hebei Xin Xing Industrial Park Patentee after: TANGSHAN GUOXIN JINGYUAN ELECTRONICS Co.,Ltd. Address before: 064100 Yutian County, Hebei Province, no end of West Street, No. 3129, No. Patentee before: TONGFANG GUOXIN ELECTRONICS Co.,Ltd. |
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| CX01 | Expiry of patent term |
Granted publication date: 20130522 |
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| CX01 | Expiry of patent term |