CN202710741U - Integrated circuit test system voltage transfer standard device - Google Patents
Integrated circuit test system voltage transfer standard device Download PDFInfo
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- CN202710741U CN202710741U CN 201220369786 CN201220369786U CN202710741U CN 202710741 U CN202710741 U CN 202710741U CN 201220369786 CN201220369786 CN 201220369786 CN 201220369786 U CN201220369786 U CN 201220369786U CN 202710741 U CN202710741 U CN 202710741U
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- test system
- circuit test
- voltage transfer
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Abstract
An integrated circuit test system voltage transfer standard device is characterized in that the integrated circuit test system voltage transfer standard device comprises a power supply terminal, an input terminal, an output terminal and a group of control terminals, and a standard device circuit comprises a parallel analog-to-digital converter (AD), a digital comparator, and a power supply management chip. The integrated circuit test system voltage transfer standard device has the advantages that a standard substance as a transfer standard of an integrated circuit test system becomes possible, and the full-scale range calibration of the integrated circuit test system voltage driving is guaranteed. Either microelectronic metering system construction, metering technology research, calibrating device development, and metering supervision and management, or metering standard establishment and metering technology service, or even test equipment comparison and check, and test verification need to use the voltage transfer standard device, the voltage transfer standard device has a wide application prospect and substantial social and economic benefits.
Description
Technical field
The utility model relates to the microelectronics field of measuring techniques, specifically a kind of integrated circuit test system voltage transfer calibrator.
Background technology
The method of microelectronics magnitude tracing, transmission and approach are to hinder the key issue that microelectronics measurement verification, calibration and comparison work are carried out always.Standard substance is the good approach that realizes magnitude tracing and transmission, have be convenient for carrying, calibration process is simple, can field calibration etc. plurality of advantages.Yet the transfer calibrator that is fit to integrated circuit test system does not but almost have.It is a main DC parameter of integrated circuit test system that voltage drives, because the technical indicator of different integrated circuit test systems is inconsistent, even the same type test macro also has multiple range voltage driving force simultaneously, the accuracy of every grade of range is also different.The voltage of intactly calibrating integrated circuit test system such as need drives, and common way is to choose some representative values by range respectively it to be calibrated, and then the voltage transfer calibrator also must possess programmable high-accuracy voltage value in the certain limit.
At present, industry also has the value that adopts integrated circuit to carry out test macro to compare, verify, and common way is to choose the specific parameter of certain integrated circuit to test at different test macros, carries out the test macro performance test with this.This type of generally is selected from the market existing integrated circuit with the integrated circuit that compares, and the parameter value is single and stability is not high, and is not suitable for the Transfer Standards of test macro.In view of above consideration, we must construct a kind of high-precision programmable voltage transfer calibrator, make it to be suitable for calibrating, calibration and the comparison that integrated circuit test system voltage drives.
Summary of the invention
The utility model proposes a kind of structure of integrated circuit test system voltage transfer calibrator, purpose be adopt a kind of more portable, method solves the calibration problem that integrated circuit test system voltage drives fast.
A kind of integrated circuit test system voltage of the utility model transfer calibrator, comprise: a power supply supply side, an input end, an output terminal and one group of control end, standard circuit are that AD, digital comparator, power management chip form by the high precision parallel A/D converter.Annexation between each circuit of described standard is as follows: the input end of standard connects the input of AD, the output terminal of standard connects the output of digital comparator, the output of AD links to each other with one group of input end of digital comparator, another group input end of digital comparator links to each other with the control end of standard, and the output terminal of power management chip connects the power end of AD and digital comparator.
That this standard has is simple in structure, precision is high, be easy to the characteristics such as use, adopts dip, and has the programmable voltage value, the settle the standard standard voltage value of device of the set of number signal of standard control end input.When input terminal voltage is less than or equal to this standard value, output terminal Real-time Feedback one low level; Input terminal voltage is during greater than this standard value, output terminal Real-time Feedback one high level.This standard is with a mapping table, and each the group numeral on the mapping table is corresponding one by one with standard value, and has uniqueness, and this mapping table obtains to the standard definite value by the high-performance instrument.
A kind of advantage of transfer calibrator of integrated circuit test system voltage calibration is: make standard substance become possibility as the Transfer Standards of integrated circuit test system, guaranteed the gamut calibration that integrated circuit test system voltage drives.No matter be the construction of microelectronics measuring system, measurement technology research, calibrating installation development, metrological supervision and administration, or About Settling Measurement Standard, measurement technology service, and even testing apparatus comparison, verification and testing authentication all need to use the voltage transfer calibrator, have a extensive future, social and economic benefits is remarkable.
Description of drawings
Fig. 1 is voltage transfer calibrator circuit structure diagram.
Fig. 2 is voltage transfer calibrator mapping table.
Embodiment
Below in conjunction with Figure of description embodiment of the present utility model is described.
The circuit structure diagram of voltage transfer calibrator as shown in Figure 1, circuit comprises a power supply supply side, an input end, an output terminal and one group of control end.Whole main circuit will be that AD, digital comparator, power management chip form by the high precision parallel A/D converter.Wherein, the input end of standard connects the input of AD, and the output terminal of standard connects the output of digital comparator.The output of AD links to each other with one group of input end of digital comparator, and another group input end of digital comparator links to each other with the control end of standard, and the output terminal of power management chip connects the power end of AD and digital comparator.AD is converted to one group of n position digital signal with input terminal voltage, digital comparator is used for the n position output signal of AD is carried out data relatively with the n position input signal of control end, if the output signal of AD is less than or equal to the n position digital signal of control end input, then export a low level to output terminal; If the output signal of AD is then exported a high level to output terminal greater than the n position digital signal of control end input.
Wherein, effective conversion accuracy of AD is not less than 12bit, and input range is not less than 0～10V, and sampling rate is not less than 100kSPS.Standard simultaneously with a mapping table as shown in Figure 2, each group n bit digital on the mapping table is corresponding one by one with standard value, and has uniqueness, the standard value of this standard adopts through confirming accurate measuring method, via high-performance instrument definite value, the accuracy of instrument will be higher than 3～5 times by school test macro voltage driving accuracy at least.
When this standard is used for the driving of calibration or verification integrated circuit test system voltage, standard input end connecting test system is by the school voltage drive unit, output terminal connecting test systematic comparison device, the settle the standard standard value V of device of control end connecting test system digits passage, the set of number signal of control end input
StdDuring calibration, supply voltage is the magnitude of voltage of regulation, and output terminal applies the comparative level of regulation, and input terminal voltage is risen gradually by the ground voltage value or descended gradually by supply voltage, and when the output logic state was changed, the input terminal voltage of this moment was designated as V
DrvThe error that obtains thus the driving of test macro voltage is V
DrvWith V
StdDifference.
Claims (3)
1. integrated circuit test system voltage transfer calibrator, it is characterized in that: comprise a power supply supply side, an input end, an output terminal and one group of control end, the standard circuit is AD, digital comparator, power management chip by the high precision parallel A/D converter; Annexation between each circuit of described standard is as follows: the input end of standard connects the input of AD, the output terminal of standard connects the output of digital comparator, the output of AD links to each other with one group of input end of digital comparator, another group input end of digital comparator links to each other with the control end of standard, and the output terminal of power management chip connects the power end of AD and digital comparator.
2. root a tree name a kind of integrated circuit test system voltage transfer calibrator claimed in claim 1, it is characterized in that: the effective conversion accuracy of the AD of described standard is not less than 12bit, and input range is not less than 0～10V, and sampling rate is not less than 100kSPS.
3. root a tree name a kind of integrated circuit test system voltage transfer calibrator claimed in claim 1, it is characterized in that: described standard is simultaneously with a mapping table, each group control word on the mapping table is corresponding one by one with standard value, and has uniqueness, this standard value obtains to the standard definite value by the high-performance instrument, and the accuracy of instrument will be higher than 3～5 times by school test macro voltage driving accuracy at least.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201220369786 CN202710741U (en) | 2012-07-30 | 2012-07-30 | Integrated circuit test system voltage transfer standard device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201220369786 CN202710741U (en) | 2012-07-30 | 2012-07-30 | Integrated circuit test system voltage transfer standard device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN202710741U true CN202710741U (en) | 2013-01-30 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 201220369786 Expired - Lifetime CN202710741U (en) | 2012-07-30 | 2012-07-30 | Integrated circuit test system voltage transfer standard device |
Country Status (1)
| Country | Link |
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| CN (1) | CN202710741U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109375126A (en) * | 2018-09-30 | 2019-02-22 | 中国船舶重工集团公司第七0九研究所 | Integrated circuit test system self-checking device and method based on digital analog converter |
| CN109375127A (en) * | 2018-09-30 | 2019-02-22 | 中国船舶重工集团公司第七0九研究所 | Integrated circuit test system self-checking device and method based on analog-digital converter |
-
2012
- 2012-07-30 CN CN 201220369786 patent/CN202710741U/en not_active Expired - Lifetime
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109375126A (en) * | 2018-09-30 | 2019-02-22 | 中国船舶重工集团公司第七0九研究所 | Integrated circuit test system self-checking device and method based on digital analog converter |
| CN109375127A (en) * | 2018-09-30 | 2019-02-22 | 中国船舶重工集团公司第七0九研究所 | Integrated circuit test system self-checking device and method based on analog-digital converter |
| CN109375127B (en) * | 2018-09-30 | 2020-11-06 | 中国船舶重工集团公司第七0九研究所 | Automatic calibration device and method for integrated circuit test system based on analog-to-digital converter |
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Legal Events
| Date | Code | Title | Description |
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| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CX01 | Expiry of patent term | ||
| CX01 | Expiry of patent term |
Granted publication date: 20130130 |