CN109375126A - Integrated circuit test system self-checking device and method based on digital analog converter - Google Patents
Integrated circuit test system self-checking device and method based on digital analog converter Download PDFInfo
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- CN109375126A CN109375126A CN201811155179.2A CN201811155179A CN109375126A CN 109375126 A CN109375126 A CN 109375126A CN 201811155179 A CN201811155179 A CN 201811155179A CN 109375126 A CN109375126 A CN 109375126A
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- Prior art keywords
- integrated circuit
- analog converter
- digital analog
- test system
- test
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
- G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
Abstract
A kind of integrated circuit test system self-checking device and method based on digital analog converter provided by the invention, the calibration of the dynamic parameter of integrated circuit testing system digitizer is realized by the test process of integrated circuit test system logarithm mode converter, and need not program in integrated circuit test system and channel is controlled.The test that integrated circuit test system passes through the Signal to Noise Ratio (SNR) or total harmonic distortion THD of logarithm mode converter, and compare the Signal to Noise Ratio (SNR) or total harmonic distortion THD value of measurement result and the practical definite value of digital analog converter, realize the calibration to integrated circuit test system digitizer driving dynamic parameter.
Description
Technical field
The present invention relates to integrated circuit test system collimation technique fields, and in particular to a kind of collection based on digital analog converter
At circuit test system self-checking device and method.
Background technique
Integrated circuit test system generally has hundreds of or thousands of is uniformly controlled but resource is completely independent survey with redundancy
It pings, each channel has independent digitizer for measuring the output voltage and waveform of chip in test process, to every
The digitizer calibration in a channel is to guarantee a test system and test result accurately important ring.
Current calibration method is to output signals to each of integrated circuit test system by controlling external perimysium reference signal source
Channel number word instrument, by measurement and the preservation of digitizer as a result, and comparing signal source setting driving value and measured value
Compared with the calibration for realizing single channel single-point.In order to realize that the different ranges in all channels are calibrated, need to program change signal source
Output traverses calibration of all channels realizations to all channels to cover different ranges.Therefore, thousands of a channels are traversed and are covered
The different calibration points of each range are covered to calibration and propose huge challenge.Due to the dynamic based on digital analog converter
Single test can pass through automatic stepping and drive digital analog converter output covering digitizer in parameter mode test method
All ranges, therefore be the effective ways for solving the thousands of channel calibrations of integrated circuit test system.
Summary of the invention
In view of this, the present invention provide a kind of integrated circuit test system self-checking device based on digital analog converter and
Method automatically covers the measuring range of the digitizer of integrated circuit testing by the test process of logarithm mode converter, complete
The calibration of pairs of digitizer.
To achieve the above object, the present invention discloses a kind of integrated circuit test system based on digital analog converter and calibrates automatically
Device, described device include the digital analog converter 2 of integrated circuit test system 6 and integrated circuit test system electrical connection；
The integrated circuit test system 6 includes digitizer 5 and digital control module 4, wherein the digital control mould
Block 4 is electrically connected digital analog converter 2 by the first measurement circuit 1, and the analog signal that digital analog converter 2 exports passes through the second p-wire
Road 3 is electrically connected to digitizer 5.
In the above-mentioned technical solutions, described device further includes the system testing end being fixed in integrated circuit test system 6
60, the test circuit board 61 being installed on test lead 60, the test fixture 62 being fixed on test circuit board 61.
In the above-mentioned technical solutions, the digital analog converter 2 is connect with test fixture 62.
In the above-mentioned technical solutions, the integrated circuit test system 6 is also divided into the first high-precision integrated circuit test system
System and the second integrated circuit test system to be calibrated.
Invention additionally discloses a kind of the integrated circuit test system automatic calibrating method based on digital analog converter, the method
The following steps are included:
S1, it is repeated by the first high-precision integrated circuit test system logarithm mode converter that different time is calibrated
Test, for ensuring that the digital analog converter has the stability met the requirements, and record digital analog converter the first signal-to-noise ratio and
The first test result and test environment of first total harmonic distortion, first test result is nominal value；
S2, digital analog converter is connected to the second integrated circuit test system test lead to be calibrated by test fixture,
Test fixture and test circuit board meet the performance indicator requirement of digital analog converter, so that the described second integrated circuit to be calibrated
The test environment of test macro is consistent with the test environment of the first high-precision integrated circuit test macro；
S3, digital analog converter dynamic parametric test program, institute are compiled in the second integrated circuit test system to be calibrated
It states program and is tested for testing the signal-to-noise ratio and total harmonic distortion function of digital analog converter, operation program, save the second letter
It makes an uproar than the second test result with the second total harmonic distortion, second test result is measured value；
S4, the measured value of digital analog converter is compared and is calculated with nominal value, obtained error and be equal to equal to measured value
Nominal value is subtracted, is realized by comparing the size of measured value and nominal value to the second integrated circuit test system dynamic to be calibrated
The calibration of parameter；
In the above-mentioned technical solutions, the input range of the digital analog converter cannot cover the electricity of integrated circuit test system
Pressure driving range, the digital analog converter that can replace different input resolution ratio and different input ranges meet different accuracy and difference
The integrated circuit test system of range is tested, that is, realizes the calibration of integrated circuit test system digitizer dynamic parameter.
In the above-mentioned technical solutions, the digital analog converter includes input multiplexer, by first p-wire
Program controlled matrix switch or multiple digital analog converter concurrent testings are connected in road, are able to achieve the digitizer of integrated circuit test system
Multichannel calibrate automatically.
A kind of integrated circuit test system self-checking device and method based on digital analog converter of the present invention, has following
The utility model has the advantages that described device based on the dynamic parameter mode of digital analog converter test in single test can be by automatic stepping
And digital analog converter output covering digitizer all ranges are driven, therefore effective solution integrated circuit test system is thousands of
The calibration in channel.
Detailed description of the invention
Fig. 1 is integrated circuit test system of the present invention and digital analog converter measurement circuit connection schematic diagram；
Fig. 2 is integrated circuit test system of the present invention and digital-to-analog converter structures connection schematic diagram；
Fig. 3 is a kind of integrated circuit test system automatic calibrating method flow chart based on digital analog converter of the present invention；
Detailed description of the invention: the first measurement circuit of 1-, 2- digital analog converter, the second measurement circuit of 3-, 4- digital control module, 5-
Digitizer, 6- integrated circuit test system, 60- system testing end, 61- test circuit board, 62- test fixture.
Specific embodiment
Present invention is further described in detail with reference to the accompanying drawing, and the present invention provides a kind of collection based on digital analog converter
At circuit test system self-checking device, as shown in Figure 1, described device includes integrated circuit test system 6 and integrated circuit
The digital analog converter 2 of test macro electrical connection；
The integrated circuit test system 6 includes digitizer 5 and digital control module 4, wherein the digital control mould
Block 4 is electrically connected digital analog converter 2 by the first measurement circuit 1, and the analog signal that digital analog converter 2 exports passes through the second p-wire
Road 3 is electrically connected to digitizer 5.
Wherein, as shown in Fig. 2, described device further includes the system testing end being fixed in integrated circuit test system 6
60, the test circuit board 61 being installed on test lead 60, the test fixture 62 being fixed on test circuit board 61.
Wherein, the digital analog converter 2 is connect with test fixture 62.
In the above-mentioned technical solutions, the integrated circuit test system 6 is also divided into the first high-precision integrated circuit test system
System and the second integrated circuit test system to be calibrated.
The present invention also provides a kind of the integrated circuit test system automatic calibrating method based on digital analog converter, the method
Include the following steps, as shown in Figure 3:
S1, it is repeated by the first high-precision integrated circuit test system logarithm mode converter that different time is calibrated
Test, for ensuring that the digital analog converter has the stability met the requirements, and record digital analog converter the first signal-to-noise ratio and
The first test result and test environment of first total harmonic distortion, first test result is nominal value；
Wherein, the signal-to-noise ratio (SNR) of digital analog converter is recorded after meeting stability requirement and total harmonic distortion (THD) measures
Value SNRSTDAnd THDSTD, and record the temperature and humidity etc. of test environment.
S2, digital analog converter is connected to the second integrated circuit test system test lead to be calibrated by test fixture,
Test fixture and test circuit board meet the performance indicator requirement of digital analog converter, so that the described second integrated circuit to be calibrated
The test environment of test macro is consistent with the test environment of the first high-precision integrated circuit test macro；
S3, digital analog converter dynamic parametric test program, institute are compiled in the second integrated circuit test system to be calibrated
It states program and is tested for testing the signal-to-noise ratio and total harmonic distortion function of digital analog converter, operation program, save the second letter
It makes an uproar than the second test result with the second total harmonic distortion, second test result is measured value；
Wherein, the signal-to-noise ratio (SNR) and total harmonic distortion (THD) measured value SNR of digital analog converter are testedMEASUREWith
THDMEASURE, and as measured value.
S4, the measured value of digital analog converter is compared and is calculated with nominal value, obtained error and be equal to equal to measured value
Nominal value is subtracted, is realized by comparing the size of measured value and nominal value to the second integrated circuit test system dynamic to be calibrated
The calibration of parameter；
Wherein, the error for calculating measured value and standard value is SNRMEASURE-SNRSTDAnd THDMEASURE-THDSTD。
Wherein, the input range of the digital analog converter cannot cover the voltage driving range of integrated circuit test system,
Can the digital analog converter of the different input resolution ratio of replacement and different input range meet the integrated of different accuracy and different ranges
Circuit test system is tested, that is, realizes the calibration of integrated circuit test system digitizer dynamic parameter.
Wherein, the digital analog converter includes input multiplexer, program-controlled by connecting in first measurement circuit
Matrix switch or multiple digital analog converter concurrent testings, the multichannel for being able to achieve the digitizer of integrated circuit test system are automatic
Calibration.
The part not illustrated in specification is the prior art or common knowledge.Present embodiment is merely to illustrate the hair
It is bright, rather than limit the scope of the invention, the modifications such as equivalent replacement that those skilled in the art make the present invention are recognized
To be fallen into invention claims institute protection scope.
Claims (7)
1. a kind of integrated circuit test system self-checking device based on digital analog converter, which is characterized in that described device packet
Include the digital analog converter (2) of integrated circuit test system (6) and integrated circuit test system electrical connection；
The integrated circuit test system (6) includes digitizer (5) and digital control module (4), wherein described digital control
Module (4) is passed through by the first measurement circuit (1) electrical connection digital analog converter (2), the analog signal of digital analog converter (2) output
Second measurement circuit (3) is electrically connected to digitizer (5).
2. a kind of integrated circuit test system self-checking device based on digital analog converter according to claim 1, special
Sign is that described device further includes the system testing end (60) being fixed on integrated circuit test system (6), is installed on test lead
(60) the test circuit board (61) on, the test fixture (62) being fixed in test circuit board (61).
3. a kind of integrated circuit test system self-checking device based on digital analog converter according to claim 2, special
Sign is that the digital analog converter (2) connect with test fixture (62).
4. a kind of integrated circuit test system self-checking device based on digital analog converter according to claim 1, described
Integrated circuit test system (6) is also divided into the first high-precision integrated circuit test macro and the second integrated circuit testing system to be calibrated
System.
5. a kind of integrated circuit test system automatic calibrating method based on digital analog converter, which is characterized in that the method packet
Include following steps:
S1, it carries out repeating survey by the first high-precision integrated circuit test system logarithm mode converter that different time is calibrated
Examination for ensuring that the digital analog converter has the stability met the requirements, and records the first signal-to-noise ratio and the of digital analog converter
The first test result and test environment of one total harmonic distortion, first test result is nominal value；
S2, digital analog converter is connected to the second integrated circuit test system test lead to be calibrated by test fixture, tested
Fixture and test circuit board meet the performance indicator requirement of digital analog converter, so that the described second integrated circuit testing to be calibrated
The test environment of system is consistent with the test environment of the first high-precision integrated circuit test macro；
S3, digital analog converter dynamic parametric test program, the journey are compiled in the second integrated circuit test system to be calibrated
Sequence is used to test the signal-to-noise ratio and total harmonic distortion function of digital analog converter, and operation program is tested, and saves the second signal-to-noise ratio
With the second test result of the second total harmonic distortion, second test result is measured value；
S4, the measured value of digital analog converter is compared and is calculated with nominal value, obtain error equal to measured value be equal to subtract
Nominal value is realized to the second integrated circuit test system dynamic parameter to be calibrated by comparing the size of measured value and nominal value
Calibration.
6. a kind of integrated circuit test system automatic calibrating method based on digital analog converter according to claim 5, special
Sign is that the input range of the digital analog converter cannot cover the voltage driving range of integrated circuit test system, can replace
The digital analog converter of difference input resolution ratio and different input ranges meets different accuracy and the integrated circuit of different ranges is surveyed
Test system is tested, that is, realizes the calibration of integrated circuit test system digitizer dynamic parameter.
7. a kind of integrated circuit test system automatic calibrating method based on digital analog converter according to claim 5, described
Digital analog converter includes input multiplexer, by connecting program controlled matrix switch or multiple digital-to-analogues in first measurement circuit
Converter concurrent testing, the multichannel for being able to achieve the digitizer of integrated circuit test system are calibrated automatically.
Priority Applications (1)
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| CN201811155179.2A CN109375126A (en) | 2018-09-30 | 2018-09-30 | Integrated circuit test system self-checking device and method based on digital analog converter |
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| CN201811155179.2A CN109375126A (en) | 2018-09-30 | 2018-09-30 | Integrated circuit test system self-checking device and method based on digital analog converter |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110940909A (en) * | 2019-10-18 | 2020-03-31 | 天津大学 | Measuring unit circuit for testing direct current parameter of integrated circuit |
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| CN110940909A (en) * | 2019-10-18 | 2020-03-31 | 天津大学 | Measuring unit circuit for testing direct current parameter of integrated circuit |
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Application publication date: 20190222 |
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