CN202189071U - Simple multipurpose resistance-adjusting test probe - Google Patents
Simple multipurpose resistance-adjusting test probe Download PDFInfo
- Publication number
- CN202189071U CN202189071U CN2011202186238U CN201120218623U CN202189071U CN 202189071 U CN202189071 U CN 202189071U CN 2011202186238 U CN2011202186238 U CN 2011202186238U CN 201120218623 U CN201120218623 U CN 201120218623U CN 202189071 U CN202189071 U CN 202189071U
- Authority
- CN
- China
- Prior art keywords
- probe
- test probe
- screw
- test
- spring leaf
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Landscapes
- Measuring Leads Or Probes (AREA)
Abstract
The utility model discloses a simple multipurpose resistance-adjusting test probe, including a test probe body, a substrate, an insulation connector, a fine tuning part and a strong magnetic block. Wherein the test probe body comprises a test probe, a probe fixed block, a lead welding sheet and two conductive screw groups. The probe fixed block is provided with holes with the same number to the conductive screws, a thread sleeve is embedded in each hole, the tail end of a test probe passes through the thread sleeve to be fixed, a conductive screw passes through the lead welding sheet, one end of the insulation connector and the probe fixed block in sequence to be couplingly connected to the thread sleeve. The fine tuning part includes a spring leaf, a compact block, a height adjusting screw and a connection screw. One end of the spring leaf and the compact block are fixedly arranged on the substrate, the other end of the spring leaf is a cantilever end that is connected to the other end of the insulation connector, the height adjusting screw passes through the compact block and supports the spring leaf, the bottom of the substrate is embedded with the strong magnetic block, and thereby the whole probe is fixedly arranged on a probe plate. In the utility model, free regulation at front and back, left and right, up and down, and horizontal directions can be realized, arrangement is flexible, the simple multipurpose resistance-adjusting test probe can be repeatedly and flexibly used, the usage amount of probes for testing different modules to be tested can be saved, cost of a manufacturer can be saved, and the usage life of the probe is enhanced.
Description
Technical field
The utility model relates to a kind of laser trimming and uses test probe, specifically is a kind ofly can effectively regulate the three dimensions degree of freedom, and repeatedly used simple and easy many with formula resistance trimming test probe.
Background technology
In recent years; Laser Trimming Technology has obtained using fast in every field such as electronics, automobile fitting, Aeronautics and Astronautics, scientific researches; In the process of laser trimming; The measurement of electrical parameters such as resistance, voltage, electric current is one of key element of the last trimming precision of decision, and wherein the type selecting of test probe and welding manner are particularly important, and its often constraint of tested person probe self structure form.What generally adopt at present is the blade type probe, and its structure mainly comprises rigidly connected measuring probe body and blade base; Method of application is earlier according to waiting to carve resistance at the location positioning probe card of treating on the die sinking piece, makes it on the perforate correspondence treat that the die sinking piece is regional; Be welded to a pair of tool setting chip probe on the probe card then, guarantee that the measuring probe body is communicated with the lead-in wire of test module; Test probe termination on the last measuring probe body touches two measuring junctions treating the die sinking piece, thereby realizes treating the measurement of die sinking piece.
There is following shortcoming in this probe structure mode:
1, because measuring probe body and blade base are rigidly connected fixingly, lacks fine motion and buffering, if misoperation in moving the process of treating the die sinking piece so usually causes the test probe termination of fragility to be broken; Make that the life-span of this type probe is shorter, producer needs the tank farm stock of certain probe.
2, since test probe weldering extremely on probe card, can't be movable relatively; Can not regulate its spatial degrees of freedom; Moreover the system that such probe card and test probe on it constitute often can only be accurate corresponding with a kind of die sinking piece of treating; Treat the die sinking piece if changed, because it goes up resistance quantity and lines changes, still can only adopt the probe card that welds test probe again, extremely inconvenience.
3, because the use of 2 described existing test probes is inconvenient, this just causes treating in the process of die sinking piece in replacing that the new probe card of frequent employing need consume a large amount of test probes, has improved producer's cost undoubtedly.
Summary of the invention
The utility model purpose is: provide a kind of magnetic to be adsorbed on the probe card, can be movable with respect to probe card, and make probe reach all around, reach free adjustment on the level angle direction up and down, so that flexible use repeatedly simple and easy many with formula resistance trimming test probe.
The technical scheme of the utility model is: a kind of simple and easy many with formula resistance trimming test probe, comprise measuring probe body and matrix; It is characterized in that insulation connector one end is connected with the measuring probe body, the other end is connected with the cantilever end of trimming part on being installed in matrix, and realization measuring probe body and matrix insulate; The matrix bottom is embedded with magnetic block.
The same with prior art, said measuring probe body connects test module, guarantees that the termination of test probe can pass to test module with signal when the output electrode contact on the die sinking piece is treated in contact.Concrete form as for the measuring probe body can be present existing structure, also can adopt the utility model form: test probe, probe stationary piece, wire bonds sheet and two contact screws are formed; Have the hole with number such as contact screw on the said probe stationary piece, the hole is embedded in swivel nut, and the tail end of test probe crosses swivel nut and fixes; Contact screw runs through folded mutually successively wire bonds sheet, insulation connector and probe stationary piece and swivel nut and connects.During actual the use, the wire bonds of test module and is communicated with the transmission that realizes signal through contact screw with the test probe that crosses swivel nut on the wire bonds sheet.This needle head structure is simple and firmly durable.
Said micro-adjusting mechanism can be the more spring pressuring plate of existing employing, also can adopt the utility model form: on matrix, the other end is that cantilever end is connected to the insulation connector by attachment screw by screw retention for spring leaf one end and compact heap; The height adjusting screw connects compact heap and props up spring leaf.Simple in structure and the stable performance of this type height micro-adjusting mechanism.
The material of probe card is irony or similar magnetic conductive metal, and the utility model can be adsorbed on the probe card through the magnetic block that inlay the matrix bottom like this.During actual the use, according to the resistance quantity and the position of treating on the die sinking piece, absorption is many on probe card just can realize measuring to this probe.When the die sinking piece is treated in replacing, only need on probe card, to arrange again or simply increase and decrease this probe to get final product.
The utility model advantage is:
1. how to be adsorbed on the probe card through magnetic block owing to the utility model is simple and easy with formula resistance trimming test probe; So can treat that diverse location on the die sinking piece in all around of probe card, reach on the level angle direction and freely change up and down, arranges flexibly according to waiting to carve resistance; If mistake also only needs to take off test probe from probe card, reappose; So it is have very high spatial degrees of freedom adjusting function, and easy to use.
Since the utility model simple and easy many can flexible repeatedly use with formula resistance trimming test probe; So manufacturer only need prepare some these test probes and just can be competent at the multiple different resistance trimming of treating the die sinking piece, test job with a probe card, has practiced thrift cost greatly.
3. how to be provided with trimming part because the utility model is simple and easy with formula resistance trimming test probe; Can carry out the height of test probe termination freely finely tuning; Provide certain vertically to buffer distance; Prevent that effectively the situation that the termination is broken from taking place, and improved the mission life of test probe in treating die sinking piece moving process.
Description of drawings
Below in conjunction with accompanying drawing and embodiment the utility model is further described:
Fig. 1 is the utility model structural representation.
Fig. 2 is the part assembling synoptic diagram of the utility model.
Fig. 3 is the user mode synoptic diagram of the utility model.
Wherein: 1, matrix; 2, insulation connector; 3, magnetic block; 4; Test probe; 5, probe stationary piece; 6, wire bonds sheet; 7, contact screw; 8, swivel nut; 9, spring leaf; 10, compact heap; 11, height adjusting screw; 12, attachment screw; 13, probe card; 14, measuring lead wire; 15, probe card fixed orifice.
Embodiment
Embodiment: Fig. 1, shown in Figure 2 be structural representation and part thereof the assembling synoptic diagram of the utility model one specific embodiment.Map can be known, mainly is made up of measuring probe body, matrix (1), insulation connector (2), trimming part and magnetic block (3) with formula resistance trimming test probe more than this is simple and easy; Wherein the measuring probe body is made up of test probe (4), probe stationary piece (5), wire bonds sheet (6) and two contact screws (7); Have the hole with contact screw (7) number of etc.ing on the said probe stationary piece (5), the hole is embedded in swivel nut (8), and the tail end of test probe (4) crosses swivel nut (8) and fixes; Contact screw (7) runs through folded mutually successively wire bonds sheet (6), insulation connector (2) one ends and probe stationary piece (5) and connects with swivel nut (8).Said trimming part comprises spring leaf (9), compact heap (10), height adjusting screw (11) and attachment screw (12); On matrix (1), the other end is cantilever end is connected to insulation connector (2) by attachment screw (12) the other end by screw retention for spring leaf (9) one ends and compact heap (10); Height adjusting screw (11) connects compact heap (10) and props up spring leaf (9).Matrix (1) bottom is embedded with magnetic block (3), thereby whole probe is fixed on the probe card (13), can reach all around, reach free adjustment on the level angle direction up and down.The measuring probe body in the present embodiment and the structure of trimming part are all simple and practical.
When present embodiment uses; As shown in Figure 3; Treating position on the die sinking piece through probe card fixed orifice (15) position probe plate (13) according to waiting to carve resistance, making it on the perforate correspondence treat die sinking piece zone, the magnetic block of then paired present embodiment being inlayed bottom its matrix (1) (3) is adsorbed on the probe card (13); Make the termination of the test probe (4) on the measuring probe body touch two measuring junction electrodes treating the die sinking piece, thereby realize treating the measurement of die sinking piece.Wire bonds sheet (6) on the measuring probe body is gone up the measuring lead wire (14) of welding test module; Because contact screw (7) is connected with wire bonds sheet (6) and the interior test probe (4) of swivel nut (8) simultaneously, when the ohmically electrode contacts of die sinking piece is treated in contact, can signal be passed to test module so guaranteed the termination of test probe (4).
Present embodiment can be pulled flexible collocation with the magnetic conductivity probe of special use and use, and is easy to use.For the common die sinking piece resistance of treating, only need tens present embodiment just can accomplish and treat the test job of die sinking piece, practiced thrift the production cost of producer greatly.
Claims (3)
- One kind simple and easy many with formula resistance trimming test probe, comprise measuring probe body, matrix (1), insulation connector (2), trimming part and magnetic block (3) formation; It is characterized in that said measuring probe body is made up of test probe (4), probe stationary piece (5), wire bonds sheet (6) and two contact screws (7); Have the hole with contact screw (7) number of etc.ing on the probe stationary piece (5), the hole is embedded in swivel nut (8), and the tail end of test probe (4) crosses swivel nut (8) and fixes; Contact screw (7) runs through folded mutually successively wire bonds sheet (6), insulation connector (2) one ends and probe stationary piece (5) and connects with swivel nut (8); Trimming part comprises spring leaf (9), compact heap (10), height adjusting screw (11) and attachment screw (12); On matrix (1), the other end is cantilever end is connected to insulation connector (2) by attachment screw (12) the other end by screw retention for spring leaf (9) one ends and compact heap (10); Height adjusting screw (11) connects compact heap (10) and props up spring leaf (9); Matrix (1) bottom is embedded with magnetic block (3).
- 2. according to claim 1 a kind of simple and easy many with formula resistance trimming test probe; It is characterized in that the magnetic block (3) that inlay said matrix (1) bottom is adsorbed on the probe card (13), the termination of the test probe on the measuring probe body (4) touches two measuring junction electrodes treating the die sinking piece.
- 3. according to claim 1 a kind of simple and easy many with formula resistance trimming test probe, it is characterized in that the upward measuring lead wire (14) of welding test module of said wire bonds sheet (6); Contact screw (7) is connected with wire bonds sheet (6) and the interior test probe (4) of swivel nut (8) simultaneously.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011202186238U CN202189071U (en) | 2011-06-27 | 2011-06-27 | Simple multipurpose resistance-adjusting test probe |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011202186238U CN202189071U (en) | 2011-06-27 | 2011-06-27 | Simple multipurpose resistance-adjusting test probe |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN202189071U true CN202189071U (en) | 2012-04-11 |
Family
ID=45920513
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2011202186238U Expired - Fee Related CN202189071U (en) | 2011-06-27 | 2011-06-27 | Simple multipurpose resistance-adjusting test probe |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN202189071U (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104360110A (en) * | 2014-11-10 | 2015-02-18 | 上海依然半导体测试有限公司 | Knife-shaped probe clamping system |
| CN110118920A (en) * | 2019-05-30 | 2019-08-13 | 苏州天孚光通信股份有限公司 | A kind of device and method for semiconductor chip performance test |
| CN113049941A (en) * | 2021-02-01 | 2021-06-29 | 中国电子产品可靠性与环境试验研究所（（工业和信息化部电子第五研究所）（中国赛宝实验室）） | Detection device, assembly method thereof and detection system |
-
2011
- 2011-06-27 CN CN2011202186238U patent/CN202189071U/en not_active Expired - Fee Related
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104360110A (en) * | 2014-11-10 | 2015-02-18 | 上海依然半导体测试有限公司 | Knife-shaped probe clamping system |
| CN104360110B (en) * | 2014-11-10 | 2018-05-01 | 上海依然半导体测试有限公司 | Blade type probe mounting and clamping system |
| CN110118920A (en) * | 2019-05-30 | 2019-08-13 | 苏州天孚光通信股份有限公司 | A kind of device and method for semiconductor chip performance test |
| CN110118920B (en) * | 2019-05-30 | 2024-01-02 | 苏州天孚光通信股份有限公司 | Device and method for testing performance of semiconductor chip |
| CN113049941A (en) * | 2021-02-01 | 2021-06-29 | 中国电子产品可靠性与环境试验研究所（（工业和信息化部电子第五研究所）（中国赛宝实验室）） | Detection device, assembly method thereof and detection system |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN201083763Y (en) | Multipurpose type resistance-adjusting test probe | |
| CN202189071U (en) | Simple multipurpose resistance-adjusting test probe | |
| CN203825911U (en) | Pin-board electrode apparatus with accurately-adjustable electrode spacing | |
| CN105334106A (en) | Extruder used for battery detection | |
| CN101393153A (en) | Multifunction portable water quality test pencil | |
| CN213023363U (en) | Improved testing device for resonator production line | |
| CN204287258U (en) | A kind of vertical spring probe assembly | |
| CN105690774A (en) | High-stability intelligent 3D printer based on Internet of Things | |
| CN206096201U (en) | A system, tangent line probe card for test of semiconductor wafer and probe subassembly thereof | |
| CN210743356U (en) | Analog electrostatic field plotter | |
| CN208421011U (en) | A kind of polymorphic type probe test mould group | |
| CN204854855U (en) | Air mass flow meter foil gage temperature compensation circuit of adjustable sampled value | |
| CN104483512B (en) | Scanning tunneling microscope needle point corrosion instrument | |
| CN207366636U (en) | Battery pole piece resistance testing device | |
| CN103323150B (en) | Ball pen point integration measuring device | |
| CN101813451A (en) | Array measuring head for micro-nano geometrical quantity measurement | |
| CN201017691Y (en) | Metallic nano detecting probe preparing circuit | |
| CN204881944U (en) | Relay spring load characteristic testing arrangement | |
| CN201336473Y (en) | Temperature-compensation electrical connector | |
| CN203673035U (en) | Circuit board tester | |
| CN209606553U (en) | Harness conduction test device | |
| CN205175325U (en) | Portable guide rail NULL device | |
| CN103344361B (en) | Measuring ejector pin mechanism of ball-point pen point integration measuring device | |
| CN205484690U (en) | Mini -probe suitable for PCB test fixture | |
| CN110632135A (en) | Screen printing electrode connector |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C56 | Change in the name or address of the patentee | ||
| CP02 | Change in the address of a patent holder |
Address after: Business Service Center No. 311 new weir 214174 Wuxi Road, Jiangsu Province three No. 3 Building 6 building 0702 room, and laser technology Patentee after: Jiangsu Hep Laser Group Co., Ltd. Address before: Jiangsu province Wuxi City Jianghai Road 214037 No. 888 North Park Jinshan Jinshan four branch 8 No. 2 No. 2 on the south side, and laser technology Patentee before: Jiangsu Hep Laser Group Co., Ltd. |
|
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20120411 Termination date: 20140627 |
|
| EXPY | Termination of patent right or utility model |