CN202093115U

CN202093115U - Detection device for detecting connection status of chip and circuit substrate

Info

Publication number: CN202093115U
Application number: CN2011200721736U
Authority: CN
Inventors: 杨军治; 涂志雄
Original assignee: Shenzhen Skyworth RGB Electronics Co Ltd
Current assignee: Shenzhen Skyworth RGB Electronics Co Ltd
Priority date: 2011-03-18
Filing date: 2011-03-18
Publication date: 2011-12-28
Anticipated expiration: 2021-03-18

Abstract

The utility model provides a detection device for detecting connection status of a chip and a circuit substrate, which comprises a plurality of detecting circuits (100) and a detecting output circuit (200). The detecting circuits (100) are coupled between each pin (11) of the chip (1) and the circuit substrate (4), the detecting output circuit (200) is used for outputting alarm signals when failure in connection between the pins (11) of the chip and the circuit substrate (4) is detected by any of the detecting circuits (100), and the detecting output circuit (200) is connected with output ends of the detecting circuits (100). The circuit structure of the detection device can be widely used for circuit boards where the chip needs to be plugged and pulled frequently and has the advantages of fine universality.

Description

The pick-up unit that is used for detection chip and circuit substrate connection status

Technical field

The utility model relates to a kind of testing circuit, especially relates to a kind of pick-up unit that is used for detection chip and circuit substrate connection status.

Background technology

Along with making rapid progress of infotech, in various electronic installations, the development of internal components is very swift and violent.Wherein the core devices of most of products is a chip, and it is the main object that determines properties of product.Thereby extremely important to the detection of chip, protection, whether contact between each pin that especially needs detection chip and the circuit substrate good, can operate as normal to guarantee chip.

Even, in research and development and manufacture process, can use some general burning devices, these devices substantially all be chip inserted on socket, in case convenient plug is when chip and socket loose contact, the duty of replication tool is just undesired, and mistake can appear in the data of programming.

Whether therefore, how contact well between each pin of detection chip and the circuit substrate, be to guarantee electronic product performance even manufacture one of technical matters that electronic product institute must solution.

The utility model content

The utility model proposes a kind of pick-up unit that is used for detection chip and circuit substrate connection status, solve at present effectively whether contact the good technical problem between each pin of detection chip and circuit substrate.

The utility model has adopted following technical scheme to realize: a kind of pick-up unit that is used for detection chip and circuit substrate connection status, and it comprises: be coupled in several testing circuits 100 between chip 1 each pin 11 and the circuit substrate 4 respectively; Be used for sending when any one described testing circuit 100 detects loose contact between the pin 11 of chip 1 and the circuit substrate 4 the detection output circuit 200 of alarm signal, this detects the output terminal that output circuit 200 connects several described testing circuits 100.

Wherein, described testing circuit comprises: base stage and emitter couple the transistor Q1 of the pin 11 of circuit substrate 4 and chip 1 respectively, and its grounded collector and emitter connect power supply by current-limiting resistance R2; And the collector of transistor Q1 connects the negative electrode of diode D1, and the anode joint detection output circuit 200 of this diode D1.

Wherein, described transistor Q1 is a PNP transistor.

Wherein, the pin 11 of described chip 1 is welded on first card extender 2, and second card extender 3 directly is welded on the circuit substrate 4 by contact pin 31.

Wherein, the emitter of described transistor Q1 connects first check point 23 on the contact pin that is arranged on first card extender 2, and base stage connects second check point 33 on the contact pin that is arranged on second card extender 3.

Wherein, the emitter of described transistor Q1 is connected described first check point 23 and described second check point 33 with base stage respectively by winding displacement.

Wherein, described first check point 23 is connected by winding displacement respectively with described second check point 33 jack is set, and the emitter of described transistor Q1 and base stage connect described jack with described first check point 23 and the 33 corresponding settings of described second check point respectively by contact pin.

Wherein, described detection output circuit 200 comprises: base stage connects the NPN transistor Q2 of the output terminal of several described testing circuits 100, the grounded emitter of this transistor Q2, base stage and collector connecting resistance R3 and resistance R 4 respectively are connected to power supply, and the collector of transistor Q2 connects the control end of thyristor VS1; And the plus earth of this thyristor VS1 is connected in series between its anode and the power supply and is subjected to thyristor VS1 control to send the caution original paper of alarm signal.

Wherein, described caution original paper is a LED 1, and its negative electrode connects the anode of thyristor VS1, and anode series current-limiting resistance R5 connects power supply.

Pick-up unit of the present utility model is when detecting between chip and the circuit substrate loose contact, can send loose contact between information warning prompting chip and the circuit substrate by caution original paper (such as light emitting diode), having guaranteed like this could operate as normal when chip has only contact good.The utlity model has the simple advantage of circuit structure; Can also be widely used on the circuit board that often needs the plug chip, have the good advantage of versatility.

Description of drawings

Fig. 1 is the annexation synoptic diagram of chip and circuit board;

Fig. 2 is a circuit module synoptic diagram of the present utility model;

Fig. 3 is the circuit diagram of an embodiment of the utility model.

Embodiment

As shown in Figure 1, chip 1 is welded to connect pad 22 on first card extender 2 by pin 11, is used to replace second card extender 3 of socket directly to be welded on circuit substrate 4 by contact pin 31; And first card extender 2 connects the jack 32 of second card extender 3 by contact pin 21, thereby reaches convenient plug.

In addition, first check point 23 is set on the contact pin 21 of first card extender 2, second check point 33 is set on the contact pin 31 of second card extender 3; Because chip 1 is directly to be welded on first card extender 2, and second card extender 3 is directly to be welded on the circuit substrate 4, in view of welding is the problem that does not have loose contact, whether well contact so whether detection chip 1 and circuit substrate 4 well contact between the jack 32 of the contact pin 21 that just is converted into first card extender 2 and second card extender 3.Detect first check point 23, second check point 33 detected can detect between first card extender 2 and second card extender 3 by the pick-up unit that the utility model proposes and whether well contact.

As shown in Figure 2, the pick-up unit that the utility model proposes comprises: several testing circuits and detection output circuit.In conjunction with shown in Figure 3, wherein, testing circuit 100 comprises: emitter (a point) and base stage (b point) are connected the PNP transistor Q1 of first check point 23 and second check point 33 respectively, be connected resistance R 1 between its grounded collector and collector and the base stage, and emitter connects power supply VCC by resistance R 2; And the emitter of transistor Q1 connects the negative electrode of diode D1, and the anode joint detection output circuit 200 of this diode D1.Detecting output circuit 200 comprises: base stage connects the NPN transistor Q2 of the anode of diode D1, the grounded emitter of this transistor Q2, base stage is connected power supply to VCC with collector difference connecting resistance R3 with resistance R 4, and the collector of transistor Q2 connects the control end of thyristor (being controllable silicon again) VS1; The plus earth of this thyristor VS1, anode connects the negative electrode of LED 1, connects power supply VCC behind the anode series current-limiting resistance R5 of this LED 1.

Wherein, power supply VCC and chip 1 can not shared same power supplys.And LED 1 also can be other controlled caution original papers, such as the sounding original paper, as hummer.

The principle of work of the pick-up unit that the utility model proposes is as follows: when chip 1 contacts with circuit substrate 4 when good, promptly be that first check point 23 well contacts and short circuit with second check point 33, short circuit between a, the b in the testing circuit 100 just, therefore, PNP transistor Q1 ends, NPN transistor Q2 conducting, thyristor VS1 ends, and LED 1 does not work; When chip 1 and circuit substrate 4 loose contacts, promptly be that a, b point does not have to connect and open circuit, PNP transistor Q1 conducting, NPN transistor Q2 ends, thyristor VS1 conducting, the bright expression loose contact of LED 1 lamp.

If it is positive integer more than or equal to 1 that chip 1 has N(N) during individual pin, use the detection output circuit 200 among 100,1 Fig. 3 of N testing circuit so.When all pins of chip 1 contact when good, NPN transistor Q2 is conducting always, and the LED lamp does not work always; When some pin loose contacts, PNP transistor Q1 conducting, PNP transistor Q2 ends, and the LED lamp is bright, and the pin loose contact of expression chip 1 need plug chip 1 again.

In addition, a in the testing circuit 100, b point has multiple with the connected mode of first check point 23 and second check point 33 respectively among Fig. 3.Such as, a in the testing circuit 100, b point directly is connected respectively on first check point 23 and second check point 33 through winding displacement; Perhaps, newly establish a jack on first card extender 2, with a contact pin second check point 33 is connected to this jack of newly establishing of first card extender 2, then, a in the testing circuit 100, b point connects first check point 23 and second check point 33 by contact pin.

The utility model can be selected different circuit models for use according to different application scenarios in actual applications, combines the power supply of direct control system, no longer detailed description such as components and parts such as using latch and relay.

To sum up, pick-up unit of the present utility model is when detecting between chip and the circuit substrate loose contact, can by the caution original paper (such as Fig. 3 light emitting diode) send loose contact between information warning prompting chip and the circuit substrate, guaranteed that like this chip has only that contact could operate as normal when good.

The above only is preferred embodiment of the present utility model; not in order to restriction the utility model; all any modifications of within spirit of the present utility model and principle, being done, be equal to and replace and improvement etc., all should be included within the protection domain of the present utility model.

Claims

1. a pick-up unit that is used for detection chip and circuit substrate connection status is characterized in that, comprising: be coupled in several testing circuits (100) between each pin of chip (1) (11) and the circuit substrate (4) respectively; Be used for sending when any one described testing circuit (100) detects loose contact between the pin (11) of chip (1) and the circuit substrate (4) the detection output circuit (200) of alarm signal, this detection output circuit (200) connects the output terminal of several described testing circuits (100).

2. according to the described pick-up unit that is used for detection chip and circuit substrate connection status of claim 1, it is characterized in that, described testing circuit comprises: base stage and emitter couple the transistor Q1 of the pin (11) of circuit substrate (4) and chip (1) respectively, and its grounded collector and emitter connect power supply by current-limiting resistance R2; And the emitter of transistor Q1 connects the negative electrode of diode D1, and the anode joint detection output circuit (200) of this diode D1.

3. according to the described pick-up unit that is used for detection chip and circuit substrate connection status of claim 2, it is characterized in that described transistor Q1 is a PNP transistor.

4. according to the described pick-up unit that is used for detection chip and circuit substrate connection status of claim 2, it is characterized in that, the pin (11) of described chip (1) is welded on first card extender (2), and second card extender (3) directly is welded on the circuit substrate (4) by contact pin (31).

5. according to the described pick-up unit that is used for detection chip and circuit substrate connection status of claim 4, it is characterized in that, the emitter of described transistor Q1 connects first check point (23) on the contact pin that is arranged on first card extender (2), and base stage connects second check point (33) on the contact pin that is arranged on second card extender (3).

6. according to the described pick-up unit that is used for detection chip and circuit substrate connection status of claim 5, it is characterized in that the emitter of described transistor Q1 is connected described first check point (23) and described second check point (33) with base stage respectively by winding displacement.

7. according to the described pick-up unit that is used for detection chip and circuit substrate connection status of claim 6, it is characterized in that, described first check point (23) is connected by winding displacement respectively with described second check point (33) jack is set, and the emitter of described transistor Q1 and base stage connect described jack with described first check point (23) and the corresponding setting of described second check point (33) respectively by contact pin.

8. according to the described pick-up unit that is used for detection chip and circuit substrate connection status of claim 1, it is characterized in that, described detection output circuit (200) comprising: base stage connects the transistor Q2 of the output terminal of several described testing circuits (100), the grounded emitter of this transistor Q2, base stage and collector connecting resistance R3 and resistance R 4 respectively are connected to power supply, and the collector of transistor Q2 connects the control end of thyristor VS1; And the plus earth of this thyristor VS1 is connected in series between its anode and the power supply and is subjected to thyristor VS1 control to send the caution original paper of alarm signal.

9. the described according to Claim 8 pick-up unit that is used for detection chip and circuit substrate connection status is characterized in that described transistor Q2 is a NPN transistor.

10. the described according to Claim 8 pick-up unit that is used for detection chip and circuit substrate connection status is characterized in that described caution original paper is a LED 1, and its negative electrode connects the anode of thyristor VS1, and anode series current-limiting resistance R5 connects power supply.