CN104142437B - USB connect-disconnect life measurement jigs - Google Patents
USB connect-disconnect life measurement jigs Download PDFInfo
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- CN104142437B CN104142437B CN201310165219.2A CN201310165219A CN104142437B CN 104142437 B CN104142437 B CN 104142437B CN 201310165219 A CN201310165219 A CN 201310165219A CN 104142437 B CN104142437 B CN 104142437B
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- usb
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Abstract
A kind of USB connect-disconnect lives measurement jig, the USB include that USB interface and USB plug, the USB interface all there are some signal pins, the USB connect-disconnect lives measurement jig to include with one end of the USB plug：First dc source, one pole correspondingly connect some signal pins of the USB interface or USB plug respectively；Transistor, its grid correspondingly connect another pole of first dc source, and the source electrode of the transistor corresponds to some signal pins that the first dc source connects the USB interface or USB plug；Second dc source, one pole correspondingly connect the drain electrode of the transistor, another source electrode for extremely correspondingly connecing the transistor of second dc source respectively；Display unit, its are serially connected with the second dc source described in the transistor AND gate.The present invention can calculate the life-span that USB is plugged according to the test period at bulb no longer glittering moment and life-span；Save the time and improve operating efficiency simultaneously.
Description
【Technical field】
The present invention relates to a kind of measurement jig, and in particular to a kind of USB connect-disconnect lives measurement jig.
【Background technology】
Currently for the test in some electronic product USB interface life-spans, typically USB interface and USB plug are fixed on
Carry out plug test on plug test machine, the general requirements of wherein USB connect-disconnect lives test be 1500cycle, 2000cycle,
Or 2500cycle etc..After the plug for carrying out certain specification is tested, USB interface and USB plug are taken from plug test machine
Under, and test whether its contact turns on universal meter.However, typically reaching certain test specification using this test mode
Situations such as just being tested its break-make situation and checked friction texturizing with universal meter afterwards, so that observe USB interface and USB in time
The break-make situation of Plug contact, while cannot also calculate the life-span of USB plug tests.
In view of this, it is necessary in fact to provide a kind of USB connect-disconnect lives measurement jig to solve the above problems.
【Content of the invention】
Therefore, the present invention provides a kind of USB connect-disconnect lives measurement jig, need to reach a location survey to solve above-mentioned plug test
Examination specification can just detect the break-make situation of USB interface and USB plug contact, while the USB plug test life-spans cannot be calculated
Problem.
In order to achieve the above object, the present invention provide USB connect-disconnect life measurement jigs, the USB include USB interface and
In order to carry out repeating the USB plug for plugging test to the USB interface, the USB interface is all had with one end of the USB plug
There are some signal pins, the other end of the USB interface to be connected with the other end of the USB plug, the USB connect-disconnect lives are surveyed
Examination tool includes：
At least one first dc source, one pole connects some signal pins of the USB interface or USB plug；
Some transistors, its grid correspondingly connect another pole of first dc source, the source electrode of the transistor respectively
A pole of relatively described first dc source connects some signal pins of USB plug or USB interface respectively, so that the USB shapes
Into loop；
At least one second dc source, one pole correspondingly connect the drain electrode of the transistor, second dc source respectively
Another pole correspondingly connect the source electrode of the transistor respectively；
Some display units, its are serially connected with the second dc source described in the transistor AND gate respectively.
Optionally, first direct current power source voltage is 3V, and second direct current power source voltage is 12V.
Optionally, the extremely negative pole of the one of first dc source, an extremely positive pole of second dc source.
Optionally, the transistor is managed for N-MOS.
Optionally, the display unit carrys out corresponding some signal pins respectively with different luminescence displays.
Optionally, the display unit is bulb, and the power of the bulb is 10W.
Optionally, the USB is USB2.0 or USB3.0.
Compared to prior art, USB connect-disconnect lives measurement jig of the present invention can be according in plug test, and bulb no longer dodges
The test period in bright moment and life-span calculates the life-span of USB plugs；The light on and off of bulb constantly can be observed simultaneously, if there are
Bulb does not work, and may determine that USB is broken down, can stop life test afterwards without the need for waiting until that a test period could again
Judge, save the time and improve operating efficiency so as to substantial amounts of.
【Description of the drawings】
Fig. 1 is schematically shown as the structural representation of one preferred embodiment of USB connect-disconnect lives measurement jig of the present invention.
【Specific embodiment】
Refer to Fig. 1 to illustrate, in the present embodiment, in order to achieve the above object, the USB connect-disconnect lives that the present invention is provided are surveyed
Examination tool, the USB include usb 1 00 and in order to carry out repeating the USB plug 200 for plugging test to the USB interface,
Wherein, the USB is USB2.0, and one end of the usb 1 00 and the USB plug 200 all has four signal pins,
The other end of the usb 1 00 is connected with the other end of the USB plug 200, the USB connect-disconnect lives measurement jig bag
Include：
Four the first dc sources 300, one pole connects some signal pins of the usb 1 00 or USB plug 200；
Four transistors 400, its grid correspondingly connect another pole of first dc source 300, the transistor respectively
One pole of 400 source electrode relatively described first dc source 300 respectively connects some signals of USB plug 200 or usb 1 00
Pin, so that the USB forms loop；
Four the second dc sources 500, one pole correspondingly connect the drain electrode of the transistor 400, second direct current respectively
Another pole of power supply 500 correspondingly connects the source electrode of the transistor 400 respectively；
Four display units 600, its are serially connected with the transistor 400 and second dc source 500 respectively.
Wherein, 300 voltage of the first dc source is 3V, and 500 voltage of the second dc source is 12V.
Wherein, the extremely negative pole of the one of first dc source 300, an extremely positive pole of second dc source 500.
Wherein, the transistor 400 is managed for N-MOS.
Wherein, the display unit 600 carrys out corresponding four signal pins respectively with different luminescence displays.
Wherein, the display unit 600 is bulb, and the power of the bulb is 10W.
When test, usb 1 00 and USB plug 200 are fixed on plug test machine, when USB plug 200 connects
During usb 1 00, if between four signal pins of four signal pins of USB plug 200 and usb 1 00 being path
When, the grid of the transistor 400 is high level, the drain electrode output low level of the transistor 400, the display unit 600
Conducting is luminous, then four bulbs can enter line flicker according to the frequency of plug test, do not work if there are bulb, then understand transistor
It is not turned between 400 drain electrodes and source electrode, then explanation USB plug 200 has bad connection with usb 1 00, now then stops surveying
Try and record and the bad time occurs.
If in order to observe conveniently, USB connect-disconnect life measurement jigs can be arranged on non-active area, and utilize netting twine
It is connected with usb 1 00 with the USB plug 200 of working region, so as to realize observing USB connect-disconnect lives in non-active area
Test, it is to avoid the problem in working region will be kept the moment.Described netting twine（If distance is longer, needs computing impedance and disappear
The voltage of consumption）There are eight holding wires, the one of the every holding wire terminates the letter of the USB plug 200 or usb 1 00
Number pin, the other end correspondingly connects a pole of first dc source 300 or the source electrode of the transistor 400, to form closure
Loop.
USB connect-disconnect lives measurement jig of the present invention can be according in plug test, bulb no longer glittering moment and life-span
Test period calculate USB plug life-span；The light on and off of bulb can be constantly observed simultaneously, not working if there are bulb then can be with
Judge that USB is broken down, life test can be stopped afterwards without the need for waiting until that a test period could judge again, so as to substantial amounts of
Save the time and improve operating efficiency.
It is noted that the invention is not restricted to above-mentioned embodiment, any those skilled in the art are based on this
Any simple modification, equivalent variations and modification that bright technical scheme is made to above-described embodiment, both fall within the protection model of the present invention
In enclosing.
Claims (7)
1. a kind of USB connect-disconnect lives measurement jig, the USB include USB interface and in order to carrying out repeating to insert to the USB interface
The USB plug of test is pulled out, the USB interface all has some signal pins, the USB interface with one end of the USB plug
The other end be connected with the other end of the USB plug, it is characterised in that the USB connect-disconnect lives measurement jig includes：
At least one first dc source, one pole connects some signal pins of the USB interface or USB plug；
Some transistors, its grid correspondingly connect another pole of first dc source, the source electrode difference of the transistor respectively
Some signal pins of USB plug or USB interface are connect with respect to a pole of first dc source, so that the USB is formed back
Road；
At least one second dc source, one pole correspondingly connect the drain electrode of the transistor respectively, second dc source another
One pole correspondingly connects the source electrode of the transistor respectively；
Some display units, its are serially connected with the second dc source described in the transistor AND gate respectively.
2. USB connect-disconnect lives measurement jig according to claim 1, it is characterised in that first direct current power source voltage
For 3V, second direct current power source voltage is 12V.
3. USB connect-disconnect lives measurement jig according to claim 1, it is characterised in that the one of first dc source
Extremely negative pole, an extremely positive pole of second dc source.
4. USB connect-disconnect lives measurement jig according to claim 1, it is characterised in that the transistor is N-MOS pipes.
5. USB connect-disconnect lives measurement jig according to claim 1, it is characterised in that the display unit is sent out with different
Light shows and carrys out corresponding some signal pins respectively.
6. USB connect-disconnect lives measurement jig according to claim 1, it is characterised in that the display unit is bulb, institute
The power for stating bulb is 10W.
7. USB connect-disconnect lives measurement jig according to claim 1, it is characterised in that the USB be USB2.0 or
USB3.0.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310165219.2A CN104142437B (en) | 2013-05-07 | 2013-05-07 | USB connect-disconnect life measurement jigs |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310165219.2A CN104142437B (en) | 2013-05-07 | 2013-05-07 | USB connect-disconnect life measurement jigs |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN104142437A CN104142437A (en) | 2014-11-12 |
| CN104142437B true CN104142437B (en) | 2017-03-15 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201310165219.2A Expired - Fee Related CN104142437B (en) | 2013-05-07 | 2013-05-07 | USB connect-disconnect life measurement jigs |
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| Country | Link |
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Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6351809B1 (en) * | 1999-05-14 | 2002-02-26 | Xilinx, Inc. | Method of disguising a USB port connection |
| CN201673498U (en) * | 2010-03-03 | 2010-12-15 | 神讯电脑(昆山)有限公司 | Keyboard test system |
| CN201766242U (en) * | 2009-10-21 | 2011-03-16 | 北京兴大豪科技开发有限公司 | Insertion connection interface of main circuit board |
| CN202093115U (en) * | 2011-03-18 | 2011-12-28 | 深圳创维－Rgb电子有限公司 | Detection device for detecting connection status of chip and circuit substrate |
| TW201300800A (en) * | 2011-06-16 | 2013-01-01 | Hon Hai Prec Ind Co Ltd | Testing load circuit for USB port |
| CN203311407U (en) * | 2013-05-07 | 2013-11-27 | 神讯电脑(昆山)有限公司 | USB plugging life test fixture |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7268561B2 (en) * | 2004-09-20 | 2007-09-11 | Texas Instruments Incorporated | USB attach detection for USB 1.1 and USB OTG devices |
-
2013
- 2013-05-07 CN CN201310165219.2A patent/CN104142437B/en not_active Expired - Fee Related
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6351809B1 (en) * | 1999-05-14 | 2002-02-26 | Xilinx, Inc. | Method of disguising a USB port connection |
| CN201766242U (en) * | 2009-10-21 | 2011-03-16 | 北京兴大豪科技开发有限公司 | Insertion connection interface of main circuit board |
| CN201673498U (en) * | 2010-03-03 | 2010-12-15 | 神讯电脑(昆山)有限公司 | Keyboard test system |
| CN202093115U (en) * | 2011-03-18 | 2011-12-28 | 深圳创维－Rgb电子有限公司 | Detection device for detecting connection status of chip and circuit substrate |
| TW201300800A (en) * | 2011-06-16 | 2013-01-01 | Hon Hai Prec Ind Co Ltd | Testing load circuit for USB port |
| CN203311407U (en) * | 2013-05-07 | 2013-11-27 | 神讯电脑(昆山)有限公司 | USB plugging life test fixture |
Also Published As
| Publication number | Publication date |
|---|---|
| CN104142437A (en) | 2014-11-12 |
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