CN203311407U - USB plugging life test fixture - Google Patents

USB plugging life test fixture Download PDF

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Publication number
CN203311407U
CN203311407U CN2013202406063U CN201320240606U CN203311407U CN 203311407 U CN203311407 U CN 203311407U CN 2013202406063 U CN2013202406063 U CN 2013202406063U CN 201320240606 U CN201320240606 U CN 201320240606U CN 203311407 U CN203311407 U CN 203311407U
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China
Prior art keywords
usb
direct supply
connect
plug
measurement jig
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Withdrawn - After Issue
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CN2013202406063U
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Chinese (zh)
Inventor
张荣斌
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Mitac Computer Kunshan Co Ltd
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Mitac Computer Kunshan Co Ltd
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Priority to CN2013202406063U priority Critical patent/CN203311407U/en
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Publication of CN203311407U publication Critical patent/CN203311407U/en
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Withdrawn - After Issue legal-status Critical Current

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Abstract

Provided is a USB plugging life test fixture. A USB comprises a USB interface and a USB plug, and one end of the USB interface and one end of the USB plug are respectively provided with a plurality of signal pins. The USB plugging life test fixture comprises first direct-current power supplies, transistors, second direct-current power supplies and display units, wherein one electrodes of the first direct-current power supplies are correspondingly connected with the signal pins of the USB interface or the signal pins of the USB plug respectively, the grid electrodes of the transistors are correspondingly connected with the other electrodes of the first direct-current power supplies, the source electrodes of the transistors correspond to the first direct-current power supplies and are connected with the signal pins of the USB interface or the signal pins of the USB plug, one electrodes of the second direct-current power supplies are correspondingly connected with the drain electrodes of the transistors respectively, the other electrodes of the second direct-current power supplies are correspondingly connected with the source electrodes of the transistors, and the display units are connected in the transistors and the second direct-current power supplies in series. According to the USB plugging life test fixture, the plugging life of the USB can be calculated according to the time that a bulb does not shine any more and the life test period, meanwhile, time is saved, and working efficiency is improved.

Description

USB connect-disconnect life measurement jig
[technical field]
The utility model relates to a kind of measurement jig, is specifically related to a kind of USB connect-disconnect life measurement jig.
[background technology]
Current test for some electronic product USB interface life-spans, normally USB interface and USB plug are fixed on the plug test machine and plugs test, wherein the USB connect-disconnect life general requirements of testing is 1500cycle, 2000cycle or 2500cycle etc.After the plug test of carrying out certain specification, USB interface and USB plug are taken off from the plug test machine, and with multimeter, test it and contact whether conducting.Yet, utilize this test mode normally to reach after certain test specification just with multimeter, to test its break-make situation and check the situations such as friction texturizing, thereby can not observe in time the break-make situation that USB interface contacts with USB plug, also can't calculate the life-span of USB plug test simultaneously.
In view of this, be necessary to provide a kind of USB connect-disconnect life measurement jig to address the above problem in fact.
[summary of the invention]
Therefore, the utility model provides a kind of USB connect-disconnect life measurement jig, need reach certain test specification and just can detect the break-make situation that USB interface contact with USB plug to solve above-mentioned plug test, can't calculate the problem that the life-span is tested in the USB plug simultaneously.
In order to achieve the above object, the USB connect-disconnect life measurement jig that the utility model provides, described USB comprises that USB interface reaches in order to described USB interface is repeated to plug the USB plug of test, one end of described USB interface and described USB plug all has some signal pins, the other end of described USB interface is connected with the other end of described USB plug, and described USB connect-disconnect life measurement jig comprises:
At least one the first direct supply, the one utmost point connect some signal pins of described USB interface or USB plug;
Some transistors, its grid are corresponding another utmost point that connects described the first direct supply respectively, and a described transistorized source electrode utmost point of relatively described the first direct supply respectively connects some signal pins of USB plug or USB interface, so that described USB forms loop;
At least one the second direct supply, the one utmost point correspondence respectively connect described transistorized drain electrode, and another utmost point of described the second direct supply correspondence respectively connects described transistorized source electrode;
Some display units, it is serially connected with respectively in described the second direct supply of described transistor AND gate.
Optionally, described the first direct supply voltage is 3V, and described the second direct supply voltage is 12V.
Optionally, a negative pole very of described the first direct supply, described the second direct supply one very anodal.
Optionally, described transistor is the N-MOS pipe.
Optionally, described display unit carrys out respectively corresponding described some signal pins with different luminescence displays.
Optionally, described display unit is bulb, and the power of described bulb is 10W.
Optionally, described USB is USB2.0 or USB3.0.
Compared to prior art, the utility model USB connect-disconnect life measurement jig can be according to when plug be tested, and the moment that bulb is no longer glittering and the test period in life-span calculate the life-span of USB plug; Simultaneously can observe constantly the light on and off of bulb, if having bulb not work can judge that USB breaks down, can stop afterwards life test without waiting until that again a test period could judge, thus a large amount of savings time and improved work efficiency.
[accompanying drawing explanation]
Fig. 1 illustrates the structural representation into one preferred embodiment of the utility model USB connect-disconnect life measurement jig.
[embodiment]
Referring to Fig. 1 illustrates, in the present embodiment, in order to achieve the above object, the USB connect-disconnect life measurement jig that the utility model provides, described USB comprises that usb 1 00 reaches in order to described USB interface is repeated to plug the USB plug 200 of test, wherein, described USB is USB2.0, described usb 1 00 all has four signal pins with an end of described USB plug 200, the other end of described usb 1 00 is connected with the other end of described USB plug 200, and described USB connect-disconnect life measurement jig comprises:
Four the first direct supplys 300, the one utmost point connects some signal pins of described usb 1 00 or USB plug 200;
Four transistors 400, its grid is corresponding another utmost point that connects described the first direct supply 300 respectively, the source electrode of described transistor 400 utmost point of relatively described the first direct supply 300 respectively connects some signal pins of USB plug 200 or usb 1 00, so that described USB forms loop;
Four the second direct supplys 500, the one utmost point are the corresponding drain electrode that connects described transistor 400 respectively, and another utmost point of described the second direct supply 500 is the corresponding source electrode that connects described transistor 400 respectively;
Four display units 600, it is serially connected with respectively in described transistor 400 and described the second direct supply 500.
Wherein, described the first direct supply 300 voltages are 3V, and described the second direct supply 500 voltages are 12V.
Wherein, a negative pole very of described the first direct supply 300, described the second direct supply 500 one very anodal.
Wherein, described transistor 400 is the N-MOS pipe.
Wherein, described display unit 600 carrys out respectively corresponding described four signal pins with different luminescence displays.
Wherein, described display unit 600 is bulb, and the power of described bulb is 10W.
When test, usb 1 00 and USB plug 200 are fixed on the plug test machine, when USB plug 200 connects usb 1 00, if while between four signal pins of four signal pins of USB plug 200 and usb 1 00, being path, the grid of described transistor 400 is high level, the drain electrode output low level of described transistor 400, described display unit 600 conductings are luminous, four bulbs can glimmer according to the frequency of plug test, if there is bulb not work, between transistor 400 drain electrodes as can be known and source electrode, there is no conducting, illustrate that USB plug 200 and usb 1 00 have bad connection, now stop testing and recording the bad time that occurs.
If in order to observe conveniently, USB connect-disconnect life measurement jig can be arranged on to the inoperative zone, and utilize netting twine to be connected with usb 1 00 with the USB plug 200 of perform region, thereby realize observing the test of USB connect-disconnect life in the inoperative zone, avoided constantly keeping the problem in perform region.Described netting twine is (if distance is longer, the voltage that needs computing impedance and consumption) have eight signal wires, the described USB plug 200 of one termination of described every signal wire or the signal pins of usb 1 00, other end correspondence connects a utmost point of described the first direct supply 300 or the source electrode of described transistor 400, to form closed-loop path.
The utility model USB connect-disconnect life measurement jig can be according to when plug be tested, and the moment that bulb is no longer glittering and the test period in life-span calculate the life-span of USB plug; Simultaneously can observe constantly the light on and off of bulb, if having bulb not work can judge that USB breaks down, can stop afterwards life test without waiting until that again a test period could judge, thus a large amount of savings time and improved work efficiency.
Be pointed out that; the utility model is not limited to above-mentioned embodiment; any simple modification, equivalent variations and modification that any those skilled in the art do above-described embodiment based on technical solutions of the utility model, all fall in protection domain of the present utility model.

Claims (7)

1. USB connect-disconnect life measurement jig, described USB comprises that USB interface reaches in order to described USB interface is repeated to plug the USB plug of test, one end of described USB interface and described USB plug all has some signal pins, the other end of described USB interface is connected with the other end of described USB plug, it is characterized in that, described USB connect-disconnect life measurement jig comprises:
At least one the first direct supply, the one utmost point connect some signal pins of described USB interface or USB plug;
Some transistors, its grid are corresponding another utmost point that connects described the first direct supply respectively, and a described transistorized source electrode utmost point of relatively described the first direct supply respectively connects some signal pins of USB plug or USB interface, so that described USB forms loop;
At least one the second direct supply, the one utmost point correspondence respectively connect described transistorized drain electrode, and another utmost point of described the second direct supply correspondence respectively connects described transistorized source electrode;
Some display units, it is serially connected with respectively in described the second direct supply of described transistor AND gate.
2. USB connect-disconnect life measurement jig according to claim 1, is characterized in that, described the first direct supply voltage is 3V, and described the second direct supply voltage is 12V.
3. USB connect-disconnect life measurement jig according to claim 1, is characterized in that, a negative pole very of described the first direct supply, described the second direct supply one very anodal.
4. USB connect-disconnect life measurement jig according to claim 1, is characterized in that, described transistor is the N-MOS pipe.
5. USB connect-disconnect life measurement jig according to claim 1, is characterized in that, described display unit carrys out respectively corresponding described some signal pins with different luminescence displays.
6. USB connect-disconnect life measurement jig according to claim 1, is characterized in that, described display unit is bulb, and the power of described bulb is 10W.
7. USB connect-disconnect life measurement jig according to claim 1, is characterized in that, described USB is USB2.0 or USB3.0.
CN2013202406063U 2013-05-07 2013-05-07 USB plugging life test fixture Withdrawn - After Issue CN203311407U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN2013202406063U CN203311407U (en) 2013-05-07 2013-05-07 USB plugging life test fixture

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN2013202406063U CN203311407U (en) 2013-05-07 2013-05-07 USB plugging life test fixture

Publications (1)

Publication Number Publication Date
CN203311407U true CN203311407U (en) 2013-11-27

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CN2013202406063U Withdrawn - After Issue CN203311407U (en) 2013-05-07 2013-05-07 USB plugging life test fixture

Country Status (1)

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CN (1) CN203311407U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104142437A (en) * 2013-05-07 2014-11-12 神讯电脑(昆山)有限公司 Jig for testing plugging and unplugging service life of USB

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104142437A (en) * 2013-05-07 2014-11-12 神讯电脑(昆山)有限公司 Jig for testing plugging and unplugging service life of USB
CN104142437B (en) * 2013-05-07 2017-03-15 神讯电脑(昆山)有限公司 USB connect-disconnect life measurement jigs

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C14 Grant of patent or utility model
GR01 Patent grant
AV01 Patent right actively abandoned
AV01 Patent right actively abandoned

Granted publication date: 20131127

Effective date of abandoning: 20171114