CN201993421U - System for automatically testing front ends of millimeter waves - Google Patents
System for automatically testing front ends of millimeter waves Download PDFInfo
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- CN201993421U CN201993421U CN2010206124202U CN201020612420U CN201993421U CN 201993421 U CN201993421 U CN 201993421U CN 2010206124202 U CN2010206124202 U CN 2010206124202U CN 201020612420 U CN201020612420 U CN 201020612420U CN 201993421 U CN201993421 U CN 201993421U
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Abstract
The utility model relates to a system for automatically testing front ends of millimeter waves, which is characterized by comprising a computer hardware platform, a front end test system software, a spectrum analyzer, a signal source, a standard antenna, a polarization turntable, a pitching turntable, a position turntable, a millimeter wave long-distance amplification controller and the like. The hardware part of the front end test system essentially includes the polarization turntable, the pitching turntable, the position turntable, a set of turntable controller and a set of the millimeter wave long-distance amplification controller.
Description
Technical field
The utility model relates to a kind of system of automatic test millimeter wave front end.
Background technology
Present head end test system relies on manually-operated fully, and the demand of millimeter wave testing tool is big, has obstructed finishing smoothly of test job greatly, and therefore, the head end test system of research and development one cover robotization seems extremely urgent.
This test macro, by the test control system program, computer control testing tool operation is finished automatically to the equipment under test performance detection, and in this course, the user can not need or seldom carry out operation to equipment.At last, software writes down automatically, handles and shows test data, and the result is shown to the user with the form of form.The development of this system can reduce the millimeter wave test instrumentation of half, greatly reduces the use of human resources, has improved testing efficiency and accurate testing degree.
Summary of the invention
The utility model is in order to solve the background technology problem, disclose a kind of system of automatic test millimeter wave front end, it is characterized in that this system comprises hardware components in computer hardware platforms, the head end test system, spectrum analyzer, signal source, standard antenna, polarization turntable, pitching turntable, azimuth rotating platform, the long-range amplification controller of millimeter wave; Hardware components mainly comprises polarization turntable, pitching turntable, azimuth rotating platform, 1 cover turntable controller and the long-range amplification controller of the 1 described millimeter wave of cover in the described head end test system; Wherein, aforementioned turntable controller, adopting DSP signal Processing core TMS320LF2407A is kernel control chip, is used for signal is handled in good time, allows signal finish the input and output operation at official hour; The turntable that wherein polarizes is connected with reference antenna; Signal source is connected with the long-range amplification controller of millimeter wave; The long-range amplification controller of millimeter wave is connected with PC, as shown in Figure 1.
Basic functional principle is as follows:
1) user at first the hardware of check system connect, each devices communicating address of configuration or checkout system etc. are crucial to be provided with, start-up system software then, software will carry out the initialization of system and obtain;
2) user's parameter to this test in software is configured and checks;
3) start test, software will carry out parameter configuration, obtain data testing tool according to testing process according to the testing scheme controlling testing equipment, and deal with data;
4) in test process if unusual, software will be with the mode notifying operation personnel of dialog box, the prompting user handles;
5) test is finished, and reads and logging test results, shows test results with graph mode, can print according to operating personnel's needs simultaneously.
The Hardware Design:
Hardware components mainly comprises 3 cover turntables, 1 cover turntable controller and the long-range amplification controller of 1 cover in the head end test system.Turntable is respectively: polarization turntable, pitching turntable, azimuth rotating platform.Wherein, turntable controller, adopting the unsurpassed DSP signal Processing of performance core TMS320LF2407A is kernel control chip, this chip can be handled signal in good time, allow signal finish input and output operations at official hour, its arithmetic speed, Signal Processing ability and chip self characteristics are far away from being on the chip of master controller with MCS-51.The type of drive of driver adopts the type of drive of segmentation, by changing the size of segmentation electric current, stepper motor is operated steadily under user's setting.
Long-range amplification controller is for grinding instrument certainly.
Design of System Software:
Adopt the development environment of the Lab Windows/CVI of NI company as this test system and test software, the user interface that it is good, based on the development environment of C language, powerful built-in function and debugging method have conveniently greatly shortened the construction cycle.
This testing software has the function of system configuration, testing scheme configuration, test process control, test data processing.Wherein, system configuration mainly is that the interface to equipment is configured, as the connected mode of equipment, port, address etc.This is that test macro is necessary, and system test software is remembered these configurations automatically so that do not need the user to be provided with once more when calling next time.Testing scheme is the core of test macro, it has comprised testing process, the configuration of test point and parameter etc., require the user to be familiar with the flow process of test job and the principle of work of software, so that operating personnel can carry out proper configuration to the parameter of testing scheme by close friend's interface, the information of software prompt is done correct response.In native system, the user can be provided with by the parameter of interface to test.Test process control, in the test process, software is provided with instrument and equipment according to set testing procedure scheme, scheduling, and after test is finished from testing apparatus reading of data, the user can control the flow process of test macro as required, understands task executions situation etc. in real time, has good procedural information and shows and condition prompting.Test data is handled, and after testing successfully end, testing software is deposited into test data in the test result data storehouse, and submits to user's demonstration from test result data generation data sheet, comprises in the form accurately and sufficient information.The user can this form of selective printing, the test result form can be stored in the mode of file, also can read historical test result file, and the content that software can display file is also printed.
Testing software can finish the automatic test to technical performance index in the scheme, and software is finished test by scheduling signals source, turntable and spectrum analyzer, and basic control flow as shown in Figure 2.
The design's advantage:
Existing relatively test macro, the native system design has following advantage:
Building of this test macro saved the millimeter wave testing tool of half, greatly reduced testing cost.
This system also can finish the test to the antenna index of correlation except realizing the test of front end.
Have good user interface, system configuration interface and operation prompt information to be user-friendly to and testing process is monitored;
Allow the user that self-defined configuration is carried out in test;
The user can be provided with the system instrument correlation parameter;
Test result data is managed, and energy generation, preservation and printing test form.
The design has been successfully applied in the index of correlation test of front end, and checking shows through test of many times: can substitute other existing manual testing system fully, and manipulate more simply, conveniently, strengthen the reliability of system.
Range of application:
The design can be widely used in particularly needing to learn fast the applied environment of measured piece performance in the index of correlation test of front end, has broad application prospects in various fields such as Industry Control.
Description of drawings
The utility model will illustrate by example and with reference to the mode of accompanying drawing, wherein:
Fig. 1 is the head end test block diagram of system.
Fig. 2 obtains single test data control flow chart.1--reference antenna in the accompanying drawing 1, the 2--turntable that polarizes, 3 is spectrum analyzer, 4 representatives are low-frequency control signals, and 5 are represented as the turntable control signal, and 6 representatives are LAN/GPIB, front end/antenna is surveyed in 7 expression schools, and 8 representatives are front end low-frequency control signals, and 9,10 representatives are turntable control signals, the long-range amplification controller of 11 representatives, the 12nd, turntable controller, 13 representatives are USB, 14 representatives are USB/RS-232, and 15 represent PC, 16,17 representation signal sources, the 18th, GPIB, 19 representatives are special softwares.
Embodiment
Disclosed all features in this instructions, or the step in disclosed all methods or the process except mutually exclusive feature and/or step, all can make up by any way.
Disclosed arbitrary feature in this instructions (comprising any accessory claim, summary and accompanying drawing) is unless special narration all can be replaced by other equivalences or the alternative features with similar purpose.That is, unless special narration, each feature is an example in a series of equivalences or the similar characteristics.
Testing scheme is the core of test macro, it has comprised testing process, the configuration of test point and parameter etc., require the user to be familiar with the flow process of test job and the principle of work of software, so that operating personnel can carry out proper configuration to the parameter of testing scheme by close friend's interface, the information of software prompt is done correct response.In native system, the user can be provided with by the parameter of interface to test.Test process control, in the test process, software is provided with instrument and equipment according to set testing procedure scheme, scheduling, and after test is finished from testing apparatus reading of data, the user can control the flow process of test macro as required, understands task executions situation etc. in real time, has good procedural information and shows and condition prompting.Test data is handled, and after testing successfully end, testing software is deposited into test data in the test result data storehouse, and submits to user's demonstration from test result data generation data sheet, comprises in the form accurately and sufficient information.The user can this form of selective printing, the test result form can be stored in the mode of file, also can read historical test result file, and the content that software can display file is also printed.
The utility model is not limited to aforesaid embodiment.The utility model expands to any new feature or any new combination that discloses in this manual, and the arbitrary new method that discloses or step or any new combination of process.
Claims (1)
1. a system that tests the millimeter wave front end automatically is characterized in that this system comprises hardware components in computer hardware platforms, the head end test system, spectrum analyzer, signal source, standard antenna, polarization turntable, pitching turntable, azimuth rotating platform, the long-range amplification controller of millimeter wave; Hardware components mainly comprises polarization turntable, pitching turntable, azimuth rotating platform, 1 cover turntable controller and the long-range amplification controller of the 1 described millimeter wave of cover in the described head end test system; Wherein, aforementioned turntable controller, adopting DSP signal Processing core TMS320LF2407A is kernel control chip, is used for signal is handled in good time, allows signal finish the input and output operation at official hour; Wherein said polarization turntable is connected with reference antenna; Signal source is connected with the long-range amplification controller of described millimeter wave; The long-range amplification controller of described millimeter wave is connected with PC.
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CN2010206124202U CN201993421U (en) | 2010-11-18 | 2010-11-18 | System for automatically testing front ends of millimeter waves |
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CN2010206124202U CN201993421U (en) | 2010-11-18 | 2010-11-18 | System for automatically testing front ends of millimeter waves |
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Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103837749A (en) * | 2012-11-22 | 2014-06-04 | 北京航空航天大学 | Millimeter wave frequency spectrum analyzer based on array waveguide grating processing |
CN104635217A (en) * | 2015-02-15 | 2015-05-20 | 南京理工大学 | Echo-free isolation box for testing of millimeter wave alternating current radiometer |
CN105548768A (en) * | 2016-01-13 | 2016-05-04 | 西安艾力特电子实业有限公司 | Device and method for testing millimeter wave rotary joint variation |
CN108055091A (en) * | 2017-11-24 | 2018-05-18 | 中科院杭州射频识别技术研发中心 | A kind of millimeter wave self calibration virtual instrument and its implementation |
-
2010
- 2010-11-18 CN CN2010206124202U patent/CN201993421U/en not_active Expired - Fee Related
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103837749A (en) * | 2012-11-22 | 2014-06-04 | 北京航空航天大学 | Millimeter wave frequency spectrum analyzer based on array waveguide grating processing |
CN104635217A (en) * | 2015-02-15 | 2015-05-20 | 南京理工大学 | Echo-free isolation box for testing of millimeter wave alternating current radiometer |
CN105548768A (en) * | 2016-01-13 | 2016-05-04 | 西安艾力特电子实业有限公司 | Device and method for testing millimeter wave rotary joint variation |
CN105548768B (en) * | 2016-01-13 | 2018-04-03 | 西安艾力特电子实业有限公司 | A kind of device and method for testing millimeter wave rotary joint variable quantity |
CN108055091A (en) * | 2017-11-24 | 2018-05-18 | 中科院杭州射频识别技术研发中心 | A kind of millimeter wave self calibration virtual instrument and its implementation |
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C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20110928 Termination date: 20151118 |
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EXPY | Termination of patent right or utility model |