TWI361351B - Testing system of universal serial bus device and method thereof - Google Patents
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三達編號:TW3459PA 【發明内容】 月係有關於-種通用序列匯流排( 裝中,裝置及其方" ==;=:;:USB協定分謝對應至操作 覆蓋而無法有效地保誤而mi复有的=資訊 動:定分析儀保留對應心L優:有效地* 第-電腦種USB裝置之測試系统’用以經由 Γ第電月t系統對裝置進行複製比對測試(Copy and 。測”系統包括邏輯分析儀(L〇gic Analyzer)及 二=Z輯分析儀用以摘測U S B裝置之存取操作,並 置之存取操作發生錯誤時於驅動訊號上產Sanda number: TW3459PA [Invention content] The monthly system has a general-purpose serial bus (installation, device and its side "==;=:;: USB agreement thanks to the operation coverage and cannot be effectively saved And mi re-existing = information movement: the analyzer retains the corresponding heart L: effectively * the first - computer type USB device test system 'for the device to copy the comparison test via the first month t system (Copy and The "measurement" system includes a logic analyzer (L〇gic Analyzer) and a two-Z analyzer to extract the access operation of the USB device, and the access signal is generated when the access operation is incorrect.
Bizi'S UlSe)。測試治具接收驅動訊號並於接收到脈波 n時控制通用輸4_eneralPurp()seInputand - i条GPI0)訊號之位準由高位準變為低位準以驅動第 一電腩系統終止複製比對測試。 驟.出一種裝置之測試方法,包括步 置^ 來對腿裝置進行複製比對測試;判斷 :=Γ於驅動訊號上產生脈波;及 用輸U賴之位準由高位準 系統停止«_顯。 4齡料㈣電胳 佳實上述内容能更明顯易懂,下文特舉一較 實卜並配合所附圖式,作詳細說明如下: 1361351 三達編號:TW3459PA 【實施方式】 本實施例之通用序列匯流排(Universa 1 Sei·ia 1 Bus,USB)裝置之測試系統係透過特殊測試治具來提供與 電腦系統相容之訊號以於USB裝置操作錯誤時停止電腦系 統執行之複製比對(Copy and Compare)操作。 請參照第1及第2圖’第1圖繪示依照本發明較佳實 施例之USB裝置之測試系統的方塊圖,第2圖繪示乃第iBizi'S UlSe). The test fixture receives the drive signal and controls the universal input 4_eneralPurp() seInputand - i GPI0) when the pulse n is received. The level of the signal is changed from the high level to the low level to drive the first power system to terminate the copy comparison test. A method for testing a device, including stepping a step to perform a copy comparison test on the leg device; determining: = generating a pulse wave on the driving signal; and stopping the high level system by using the level of the output U_« Obvious. The above content can be more clearly understood. The following is a detailed description of the following and a detailed description of the following: 1361351 Sanda number: TW3459PA [Embodiment] General of this embodiment The test system of the serial bus (Universa 1 Sei·ia 1 Bus, USB) device provides a signal compatible with the computer system through a special test fixture to stop the copying comparison performed by the computer system when the USB device operates incorrectly (Copy And Compare) operation. Please refer to FIG. 1 and FIG. 2'. FIG. 1 is a block diagram showing a test system of a USB device according to a preferred embodiment of the present invention, and FIG. 2 is a diagram showing
圖中部分訊號的波形圖。USB裝置之測試系統1 〇用以對 USB裝置進行複製比對(Copy and Compare)測試,本實施 例之測试系統10係經由被程式化來執行複製比對測試之 電腦系統120來透過USB存取USB裝置以對其進行複製比 對測試。 在本實施例中USB裝置例如為讀卡機122 ,其與具有 相容規格之記憶卡124相連接’而本實施例之測試系統1 〇 用以對讀卡機122存取與記憶卡124之功能進行複製比對 測試。The waveform of some signals in the figure. The test system 1 of the USB device is used to perform a copy and compare test on the USB device. The test system 10 of the present embodiment is stored via the USB via the computer system 120 that is programmed to perform the copy comparison test. The USB device is taken to perform a copy comparison test. In the present embodiment, the USB device is, for example, a card reader 122, which is connected to a memory card 124 having a compatible specification. The test system 1 of the present embodiment is used to access the card reader 122 and the memory card 124. The function performs a copy comparison test.
測試糸統10包括邏輯分析儀(Logic Analyzer)126、 測ti治具128、USB協定分析儀130及電腦系統132。USB 協定分析單元130分別經由USB 12與14與電腦系統120 及讀卡機122耦接’以於測試系統1〇進行複製比對測試 時分析電腦系統120與讀卡機122間包括USB通訊協定指 令與資料封包之傳輸資訊。USB協定分析單元130更包括 暫存器(Buffer) ’用以於各操作時間點暫存對應之操作時 間點前後特定時間内之傳輸資訊。電腦系統132連接至USB 7 1361351The test system 10 includes a logic analyzer (Logic Analyzer) 126, a test fixture 128, a USB protocol analyzer 130, and a computer system 132. The USB protocol analysis unit 130 is coupled to the computer system 120 and the card reader 122 via the USB 12 and 14 respectively. For the test system 1 to perform the copy comparison test, the analysis between the computer system 120 and the card reader 122 includes a USB protocol. Transmission information with data packets. The USB protocol analysis unit 130 further includes a buffer (Buffer) for temporarily storing the transmission information at a specific time before and after the corresponding operation time point at each operation time point. Computer system 132 is connected to USB 7 1361351
三達編號:TW3459PA 協定分析單元130 ’用以被程式化來控制USB協定分析單 元130之動作並顯示對應之分析訊號。 邏輯分析儀126係與記憶卡124中對應之檢測接腳 (未繪示)相連接’以根據其上之訊號來偵測讀卡機122與 §己憶卡124間之存取操作。邏輯分析儀126並用以於偵測 到讀卡機122與記憶卡124間之存取操作發生錯誤時於驅 動訊號Sd上產生脈波(puise)p。邏輯分析儀126例如具 有BNC接頭(Bayonet-Naur Connector)以透過同轴纜線 (Coaxial Cable)來輸出驅動訊號Sd。 測試治具128分別與邏輯分析儀126及電腦系統120 耦接以接收驅動訊號Sd及輸出通用輸入輸出(GeneralThe Sanda number: TW3459PA protocol analysis unit 130' is used to be programmed to control the action of the USB protocol analysis unit 130 and display the corresponding analysis signal. The logic analyzer 126 is coupled to a corresponding detection pin (not shown) of the memory card 124 to detect an access operation between the card reader 122 and the memory card 124 based on the signal thereon. The logic analyzer 126 is further configured to generate a pulse p on the driving signal Sd when detecting an error in the access operation between the card reader 122 and the memory card 124. The logic analyzer 126 has, for example, a BNC connector (Bayonet-Naur Connector) for outputting the drive signal Sd through a coaxial cable. The test fixture 128 is coupled to the logic analyzer 126 and the computer system 120 to receive the driving signal Sd and the output universal input and output (General
Purpose Input and Output,GPI0)訊號 S_GPI0。其中通 用輸入輸出訊號S_GPI0之預設位準例如為高位準。而測 試治具128更用以回應於脈波P之上升緣(Rising Edge) 來控制通用輸入輸出訊號S_GPI0之位準由高位準變為低 位竽以產生下降緣(Falling Edge)。 電腦系統120包括通用輸入輸出接腳(未繪示)來接收 通用輸入輸出訊號S_GPI0’而電腦系統120係用以被程式 化來回應其通用輸入輸出接腳接收之通用輸入輸出訊號 S_GPI0的下降緣(Falling Edge)終止複製比對測試。 本實施例之測試系統10於偵測到讀卡機122與記憶 卡124間之存取錯誤時經由包括邏輯分析儀126與測試治 具128之路徑來驅動電腦系統120終止複製比對測試,使 終止電腦系統120與讀卡機122間之USB傳輸,而USB 12 8 1361351Purpose Input and Output, GPI0) Signal S_GPI0. The preset level of the general-purpose input/output signal S_GPI0 is, for example, a high level. The test fixture 128 is further configured to control the level of the general-purpose input/output signal S_GPI0 from a high level to a low level in response to a rising edge of the pulse wave P (Ring Edge) to generate a falling edge. The computer system 120 includes a universal input/output pin (not shown) for receiving the general-purpose input/output signal S_GPI0', and the computer system 120 is programmed to respond to the falling edge of the universal input/output signal S_GPI0 received by the universal input/output pin. (Falling Edge) terminates the copy alignment test. The test system 10 of the present embodiment drives the computer system 120 to terminate the copy comparison test by detecting the access error between the card reader 122 and the memory card 124 via the path including the logic analyzer 126 and the test fixture 128. Terminating USB transfer between computer system 120 and card reader 122, and USB 12 8 1361351
三達編號:TW345卯A •與Μ上之資料流量實質上接近於零。如此,可有效地於 存取錯誤發生時避免USB協定分析儀13〇中暫存之對應至 操作錯誤之傳輪資訊被此時間點後之傳輸資訊覆蓋而^ 法有校地保存之問題。這樣-來,本實施例之測試系統ι〇 可有效地保存對應至存取操作錯誤之傳輸資訊。 請參照第3 ®,其繪示乃第i圖中測試治具128的詳 細方塊圖。測試治具128例如包括單晶片系統128a及非 •揮發性記憶體,其中非揮發性記憶體例如為快閃記憶體 馨128b單曰曰片系統128a包括通用輪入輸出接聊m、m 處理器134及隨機存取記憶體138。通用輸入輸出接腳ΐ3ι 及133分別耦接至邏輯分析儀126及電腦系統12〇。 處理器134用以被程式化來設定通用輸入輸出接腳 133及131分別為輸入接腳及輸出接腳,以分別接收驅動 ^訊號Sd及輸出通用輸入輸出訊號S—GPIO。處理器134更 被程式化來於通用輸入輸出接腳133接收到脈波p時改變 ^ 通用輸入輸出訊號S_GPIO之位準為低位準。 其中快閃記憶體128b中儲存用以執行上述操作之程 式碼,並將對應之程式碼儲存於隨機存取記憶體136中。 如此,處理器134係執行隨機存取記憶體136中之程式碼 以被程式化來執行上述之操作。 在本實施例中,測試治具128具有與讀卡機122實質 上相同之硬體結構,其不同之處係在於其令包含之快閃記 憶體係存有不同之程式碼,以驅動其分別執行不同之操 作。如此,測試治具128更例如包括:USB控制器138'、 1361351Sanda number: TW345卯A • The data flow with Μ is substantially close to zero. In this way, it is possible to effectively avoid the problem that the transmission information corresponding to the operational error temporarily stored in the USB protocol analyzer 13 is overwritten by the transmission information after the time point when the access error occurs. In this way, the test system ι of the embodiment can effectively save the transmission information corresponding to the access operation error. Please refer to Section 3, which shows a detailed block diagram of test fixture 128 in Figure i. The test fixture 128 includes, for example, a single wafer system 128a and a non-volatile memory, wherein the non-volatile memory is, for example, a flash memory 128b single-chip system 128a including a universal wheel-in output, m, m processor 134 and random access memory 138. The general purpose input and output pins 3 and 133 are coupled to the logic analyzer 126 and the computer system 12A, respectively. The processor 134 is configured to be programmed to set the universal input/output pins 133 and 131 as input pins and output pins, respectively, to receive the driving signal Sd and the output general input/output signal S_GPIO. The processor 134 is further programmed to change when the general-purpose input/output pin 133 receives the pulse wave p. ^ The level of the general-purpose input/output signal S_GPIO is low. The flash memory 128b stores a program code for performing the above operation, and stores the corresponding code in the random access memory 136. Thus, processor 134 executes the code in random access memory 136 to be programmed to perform the operations described above. In the present embodiment, the test fixture 128 has substantially the same hardware structure as the card reader 122, which is different in that it includes different code codes for the included flash memory system to drive the respective executions. Different operations. As such, the test fixture 128 further includes, for example, a USB controller 138', 1361351
三^^號:TW3459PA 微型快閃記憶體(CompactFlash,CF)控制器140、智慧型 多媒體(SmartMedia,SM)/極限數位(Extreme Digital, xD)快閃記憶:體控制器142及安全數位(Secure Digital, SD)/多媒體卡(Multimedia Card,MMC)快閃記憶體控制器 144其中之一或全部’其係均透過内部匯流排與處理器I% 相連接。 在本實施例中使用者除了用以驅動電腦系統12〇執行 對應之程式來執行複製比對操作,使用者更透過電腦系统 120之系統程式提供之軟體開發套件,如微軟(Micr〇s〇ft) 作業系統提供之周邊開發套件(Driver Development Kit ’ DDK)工具來產生驅動程式來驅動電腦系統12〇回應 其通用輸入輸出接腳接收之通用輸入輸出訊號s_GPI〇的 下降緣來停止其複製比較操作。 請參照第4圖’其繪示依照本發明較佳實施例之USB 裝置之測試方法的流程圖β首先如步驟(a),提供電腦系 統120來對USB裝置進行複製比對測試,在本實施例中USB 裝置為與對應格式之記憶卡124耦接之讀卡機122。 接著如步驟(b),經由邏輯分析儀126來判斷讀卡機 122存取記憶卡124之操作是否發生錯誤;若是執行步驟 (c) ’邏輯分析儀126係於其輸出之驅動訊號如上產生脈 波P。之後如步驟(d),測試治具128回應脈波p改變通用 輸入輸出訊號S_GPI0之位準由高位準變為低位準,並輸 出通用輸入輸出訊號S—GPI0至電腦系統12〇以控制其停 止複製比對測試。Three ^^: TW3459PA Compact Flash (CF) Controller 140, SmartMedia (SM) / Extreme Digital (xD) Flash Memory: Body Controller 142 and Secure Digital (Secure One or all of the Digital, SD)/Multimedia Card (MMC) flash memory controllers 144 are connected to the processor I% via an internal bus. In this embodiment, in addition to the user to drive the computer system 12 to execute the corresponding program to perform the copy comparison operation, the user further provides a software development kit such as Microsoft (Micr〇s〇ft) provided by the system program of the computer system 120. The driver development kit (DDK) tool provided by the operating system generates a driver to drive the computer system 12 to stop the copy comparison operation in response to the falling edge of the universal input/output signal s_GPI〇 received by the universal input/output pin. . Please refer to FIG. 4, which is a flowchart of a test method for a USB device according to a preferred embodiment of the present invention. First, as step (a), a computer system 120 is provided to perform a copy comparison test on a USB device. In the example, the USB device is a card reader 122 coupled to a memory card 124 of a corresponding format. Then, as in step (b), it is determined by the logic analyzer 126 whether the operation of the card reader 122 accessing the memory card 124 is erroneous; if the step (c) is performed, the logic signal 126 is outputted by the driver signal as described above. Wave P. Then, in step (d), the test fixture 128 responds to the pulse wave p to change the level of the general-purpose input/output signal S_GPI0 from the high level to the low level, and outputs the general-purpose input/output signal S_GPI0 to the computer system 12 to control the stop. Copy the comparison test.
二達編號:TW3459PA 其中步驟(d)更例如包括下列之步驟,其中在各步驟 中系統單晶片128a係均複製快閃記憶體128b中對應之程 式碼至隨機存取記憶體136中,而處理器134係回應於隨 機存起記憶體136令之程式碼來執行對應之操作。首先如 步驟(dl),系統單晶片128a開始自快閃記憶體128b中讀 取對應之程式碼,如開機碼至隨機存取記憶體136,而處 理器134係執行隨機存取記憶體136中之程式碼來以啟動 測試治具128。 接著如步驟(d2),處理器134被程式化來設定通用輸 入輸出接腳133為輸入接腳以接收驅動訊號Sd<}然後如步 驟(d3)’處理器134被程式化來設定通用輸入輸出接腳131 為輸出接腳,以輸出通用輸入輸出訊號s_Gpi〇,其中通用 輸入輪出訊號S_GP 10之起始位準為高位準。接著如步驟 (d4),處理器134被程式化來判斷通用輸入輸出接腳133 疋否接收到脈波p ;若是執行步驟(d5),處理器134被程 式化來控制通用輸入輸出訊號s_GPI〇之位準由高位準變 為低位準。 其中而於步驟(d4)中,若通用輸入輸出接腳I%未接 收到脈波P時係重複執行步驟(d4)。而於步驟(b)中,若 讀卡機122之存取操作未發生錯誤時係重複執行步驟(匕)。 在本實施例中雖僅以與讀卡機122具有實質上相同之 硬體、、°構之測試治具丨28來產生通用輸入輸出訊號S__GPI〇 來停止電腦系統12〇之複製比對操作的情形為例做說明, 然,本實施例中應用之測試治具128並不侷限於與讀卡機 1361351Erda number: TW3459PA, wherein step (d) further includes the following steps, wherein in each step, the system single chip 128a copies the corresponding code in the flash memory 128b into the random access memory 136, and processes The device 134 responds to the code stored in the memory 136 to perform the corresponding operation. First, as step (dl), the system single chip 128a begins to read the corresponding code from the flash memory 128b, such as the boot code to the random access memory 136, and the processor 134 executes the random access memory 136. The code is used to start the test fixture 128. Then, in step (d2), the processor 134 is programmed to set the general-purpose input/output pin 133 as an input pin to receive the driving signal Sd<, and then, as in step (d3), the processor 134 is programmed to set the general-purpose input and output. The pin 131 is an output pin for outputting a general-purpose input/output signal s_Gpi〇, wherein the start position of the universal input wheel-out signal S_GP 10 is a high level. Then, as step (d4), the processor 134 is programmed to determine whether the general-purpose input/output pin 133 receives the pulse wave p; if the step (d5) is performed, the processor 134 is programmed to control the general-purpose input/output signal s_GPI. The level has changed from a high level to a low level. In the step (d4), if the general-purpose input/output pin I% is not receiving the pulse wave P, the step (d4) is repeatedly executed. In the step (b), if no error occurs in the access operation of the card reader 122, the step (匕) is repeated. In the present embodiment, the general-purpose input/output signal S__GPI〇 is generated by the test fixture 28 having substantially the same hardware and shape as the card reader 122 to stop the copying operation of the computer system 12〇. The case is taken as an example. However, the test fixture 128 applied in this embodiment is not limited to the card reader 1361351.
I號:TW3459PA 1 2 2具有相同硬體結構’而更可為其他結構;只要測試 具128可回應於驅動訊號Sd中之脈波P來產生對應之通 用輸入輸出訊號S-GPIO者均不脫離本實施例之技術範圍。 在本實施例中雖僅以USB裝置為讀卡機122之情形為 例做說明’然’本實施例之USB裝置並不侷限於為讀卡機 122而更可為其他USB裝置。I No.: TW3459PA 1 2 2 has the same hardware structure' and can be other structures; as long as the test tool 128 can respond to the pulse wave P in the driving signal Sd to generate the corresponding general-purpose input and output signal S-GPIO The technical scope of this embodiment. In the present embodiment, the case where the USB device is the card reader 122 is taken as an example. The USB device of the present embodiment is not limited to the card reader 122 but may be other USB devices.
本實施例之USB裝置之測試系統係以與待測試之讀卡 機具有實質上相同硬體結構之測試治具來回應於邏輯分 析儀回應於讀卡機之存取操作錯誤提供之驅動訊號產生 通用輸入輸出訊號,並以其停止電腦系統執行之複製比對 (Copy and Compare)操作。如此,本實施例之usb裝置之 測試系統可有效地改善傳統測試系統中保留於·協定分 析儀中對應至猶錯誤之傳輪資訊容易被操作錯 ^之後的㈣資訊覆蓋而無法有效地保存之缺點,而實質 有效地联動usb協定分析儀保留對應之傳輸資I 綜上所述,耗本發明較佳實施例揭露如上, 然其並非μ随本發明。切 常知識者,在减縣伽屬技倘域中具有通 之更動與潤飾。因此,本發明^和㈣内’當可作各種 專利範圍所界定者為準。 μ範圍*視後附之申請 12 1361351The test system of the USB device of this embodiment responds to the driving signal generated by the logic analyzer in response to the access operation error of the card reader by using a test fixture having substantially the same hardware structure as the card reader to be tested. General purpose input and output signals, and use it to stop the copy and compare operations performed by the computer system. In this way, the test system of the USB device of the present embodiment can effectively improve the (four) information coverage of the traditional test system that remains in the protocol analyzer corresponding to the error of the error, and cannot be effectively saved. Disadvantages, and substantially effective linkage of the usb protocol analyzer to retain the corresponding transmission resources I have been described above, and the preferred embodiment of the present invention is disclosed above, but it is not the same as the invention. Those who are knowledgeable are more versatile and retouched in the domain of the county. Accordingly, the invention is to be construed as being limited by the scope of the various patents. μ range* depends on the attached application 12 1361351
三達編號:TW3459PA * 【圖式簡單說明】 第1圖繪示依照本發明較佳實施例之USB裝置之測試 系統的方塊圖。 第2圖繪示乃第1圖中部分訊號的波形圖。 第3圖繪示乃第1圖中測試治具128的詳細方塊圖。 第4圖繪示依照本發明較佳實施例之USB裝置之測試 ' 方法的流程圖。 • 【主要元件符號說明】 10 : USB裝置之測試系統 12、14 : USB 120、132 :電腦系統 122 :讀卡機 124 :記憶卡 126 :邏輯分析儀 ' 128:測試治具 鲁 128a.系統早晶片 128b :快閃記憶體 130 : USB協定分析儀 131、133 :通用輸入輸出接腳 134 :處理器 136 :隨機存取記憶體 138 : USB控制器Sanda Number: TW3459PA * [Simple Description of the Drawings] Fig. 1 is a block diagram showing a test system of a USB device in accordance with a preferred embodiment of the present invention. Figure 2 is a waveform diagram of a portion of the signal in Figure 1. Figure 3 is a detailed block diagram of the test fixture 128 in Figure 1. 4 is a flow chart showing a method of testing a USB device in accordance with a preferred embodiment of the present invention. • [Main component symbol description] 10 : USB device test system 12, 14 : USB 120, 132 : Computer system 122 : Card reader 124 : Memory card 126 : Logic analyzer ' 128 : Test fixture Lu 128a. System early Wafer 128b: Flash Memory 130: USB Protocol Analyzer 131, 133: General Purpose Input/Output Pin 134: Processor 136: Random Access Memory 138: USB Controller
140、142、144 : CF 控制器、SM/xD 控制器、SD/MMC 控制器 13140, 142, 144: CF controller, SM/xD controller, SD/MMC controller 13
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