TW200844730A - Testing system of universal serial bus device and method thereof - Google Patents

Abstract

A testing system of a universal serial bus (USB) device for performing a copy and compare test via first computer system comprises a logic analyzer and a test fixture. The logic analyzer is for detecting the accessing operation of the USB device and triggering a pulse signal on a driving signal when accessing operation error occurs. The test fixture is for receiving the driving signal and altering the level of a general purpose input and output (GPIO) signal from high to low for controlling the first computer system stop the copy and compare test when the test fixture receives the pulse signal.

Description

200844730

· TW3459PA _ IX, invention description: [Technical field of the invention] The present invention relates to a universal serial bus (USB) device test system, and in particular, an effective A test system that stores corresponding transmission information when the USB device operates incorrectly. [Prior Art] Since the Universal Serial Bus (USB) device has advantages such as easy-to-use, high support, and high transmission efficiency, it has been widely used in various electronic products, such as card readers ( Card Reader). In general, the USB device is repeatedly copied and compared by the USB device and the execution software (CQpy 〇. 3(9) operation, and through the logic analyzer (L〇gjc Ana|yzer) and the USB protocol analyzer device The access operation and display include the transmission information of the USB transmission protocol command and the nurturing packet. When the access control operation error occurs when the coffee device is detected, the π 疋 疋 analysis analysis age corresponds to the access operation error. 'Install ^ so, the operator can use the corresponding transmission information to the coffee FL = wrong. So 'how to find out that can effectively save the transmission corresponding to the direction 1 gift error #_ means the industry is constantly committed 5

TW3459PA 200844730 [Summary of the Invention] The present invention is based on (4) in the crane and the use of the device (Universa 1 Sei^l Bus, _ device test device and its material, which can be effectively = system 保留 retained in the 分析 analyzer Corresponding to the shortcomings of the operation information of the second operation, the transmission information is saved after the operation error time point, and substantially has the advantage of effectively driving the coordination/knife analyzer to retain the corresponding transmission information. The invention proposes a test system for the device to perform a copy comparison test (Copy and C〇: Pa^) 〇Anaiyzer) on the (4) device via the brother-computer system. The logic analyzer is used to detect the access operation of the USB device (4), ^ Γ ^ receiving the driving signal and receiving the pulse wave = controlling the general input output (General pur_ Input _ utput ' GPIO) The high level becomes ☆ A computer system terminates the copying than the test, w...the driver is proposed according to the present invention - a USB device test method, providing a computer system to copy the USB device to the comparison device ζ USB device Whether the access operation has an error; when the coffee device is stored = an error occurs on the drive signal to generate a pulse wave; and back to the library pulse: the above-mentioned inner valley of the rainy month is more obvious and easy to understand, the following special - more The following is a detailed description of the example 'with the drawing': 200844730

遂 遂 TW TW TW3459PA ^ [Embodiment] The test system of the universal serial bus (USB) device of the present embodiment provides a signal compatible with the computer system for operation of the USB device through a special test fixture. When the error occurs, the copy and compare operations performed by the computer system are stopped. Referring to Figures 1 and 2, Figure 1 is a block diagram of a test system for a USB device in accordance with a preferred embodiment of the present invention, and Figure 2 is a waveform diagram of a portion of the signal in the Figure. The test system 1 of the USB device is configured to perform a copy and compare test on the Lu USB device. The test system 10 of the present embodiment is stored via the USB via the computer system 120 that is programmed to perform the copy comparison test. The USB device is taken to perform a copy comparison test. In this embodiment, the USB device is, for example, a card reader 122, which is connected to a memory card 124 having a compatible specification, and the test system 1 of the embodiment is used to access the card reader 122 and the memory card 124. Function for copy comparison test〇

The test system 10 includes a logic analyzer (Logic Analyzer) 126, a test fixture 128, a USB protocol analyzer 130, and a computer system 132. The USB protocol analysis unit 130 is coupled to the computer system 120 and the card reader 122 via the USB 12 and 14 respectively, so that the test system 1 performs the copy comparison test, and the analysis between the computer system 120 and the card reader 122 includes a USB protocol. Transmission information with data packets. The USB protocol analysis unit 130 further includes a buffer (Buffer) for temporarily storing the transmission information at a specific time before and after the corresponding operation time point at each operation time point. Computer system 132 is connected to USB 7 200844730

The second numbness: TW3459PA protocol analysis unit 130 is used to be programmed to control the action of the USB protocol analysis unit 130 and display the corresponding analysis signal. The logic analyzer 126 is coupled to a corresponding detection pin (not shown) of the memory card 124 to detect an access operation between the card reader 122 and the card 124 according to the signal thereon. The logic analyzer 126 is further configured to generate a pulse p on the driving signal Sd when detecting an error in the access operation between the card reader 122 and the memory card 124. The logic analyzer 126 has, for example, a BNC connector (Bayonet-Naui* Connector) for outputting the drive signal sd through a coaxial cable. The test fixture 128 is coupled to the logic analyzer 126 and the computer system 12A to receive the driving signal sd and output the general-purpose input and output (General

Purpose I_t and Output, GPI〇) Signal S-GPI0. The preset level of the general-purpose input and output nickname S-GP10 is, for example, a high level. The test fixture 128 is further configured to control the general input/output signal S_GPI0 from the high level to the low level 10 to generate a falling edge in response to the rising edge of the pulse wave p (Rising Edge). The computer system 120 includes a universal input/output pin (not shown) for receiving the universal input round-trip signal S-GPI0, and the computer system 12 is configured to be programmed to respond to the general-purpose input and output signals received by the universal input/output pin. S-GPI0, Falling Edge terminates the replication alignment test. The test system of the embodiment is configured to drive the electrical system through the path including the logic analyzer 126 and the test process, 128 when the access error between the card reader 122 and the memory card 124 is detected. The comparison test terminates the transmission between the computer system 120 and the card reader 122, while the intestines 12 8 200844730

Erda number: TW3459PA • The data flow with 14 is substantially close to zero. In this way, it is possible to effectively avoid the problem that the transmission information corresponding to the operation error of the USB protocol analysis is overwritten by the transmission information after the time point when the access error occurs, and there is no problem of saving the school. In this way, the test system 1 of the present embodiment can effectively save the corresponding access operation error. Please refer to FIG. 3, which is a second m-transition block diagram. The test fixture 128 includes, for example, a single wafer system wrist and a non-volatile 5 memory, wherein the non-volatile memory is, for example, a flash memory 128b. The single chip system 128a includes a general purpose input and output pin m] 33, a processor 134, and a random access memory 138. The general purpose input and output pins l3i and 133 are coupled to the logic analyzer 126 and the computer system, respectively. The processor 134 is configured to be programmed to set the general-purpose input and output pins and 131 as input pins and output pins, respectively, to receive the driving signal sd and the output general-purpose input/output signal s-Gpi. The processor 134 is further programmed to change when the general-purpose input/output pin 133 receives the pulse wave p. The level of the input/output signal S_GPI0 is low. The flash memory 128b stores a program code for performing the above operation and stores the corresponding code in the random access memory 136. Thus, processor 134 executes the process in random access memory 136 to be programmed to perform the operations described above. In the present embodiment, the test fixture 128 has substantially the same hardware structure as the card reader 122, except that the flash memory 1 contains a different code to drive the test fixture 128. Different operations are performed separately. Thus, the test fixture 128 includes, for example, a USB controller 138, 200844730.

Sanda number: TW3459PA Compact Flash (CF) controller 140, SmartMedia (SM) / Extreme Digital (xD) flash memory controller 142 and Secure Digital (Secure Digital, One or all of the SD)/Multimedia Card (MMC) flash memory controllers 144 are connected to the processor 134 via an internal bus. In this embodiment, the user develops a software development kit such as Microsoft (Micr〇s〇) provided by the system program of the computer system 120 in addition to the computer system 12 for executing the program corresponding to the execution of the copy comparison operation. Ft) The Driver Devel卯Kit (DM) tool provided by the operating system to generate a driver to drive the computer system 12 to respond to the falling edge of the general-purpose input/output signal S-GpI〇 received by its universal I/O pin. It replicates the comparison operation. Please refer to FIG. 4, which is a flow chart showing a test method of a USB device according to a preferred embodiment of the present invention. First, as step (a), the computer system 120 is provided to perform a copy comparison test on the USB device. In the embodiment, the USB device is a card reader 122 coupled to the memory card 24 of the corresponding format. Then, as step (b), the logic analyzer 126 determines whether the card reader 122 accesses the memory card 124 by an error; if the step (c) is performed, the logic analyzer 126 is connected to the output of the driving signal 3 (1). Pulse wave P is generated. Then, in step (d), the test fixture 128 responds to the pulse wave p to change the level of the general input/output signal S-GPI0 from the high level to the low level, and outputs the general input and output signal SJJPIO to the computer system. 12〇 to control its stop copy comparison test. 200844730

Erda number: TW3459PA, wherein step (d) further includes the following steps, wherein in each step, the system single chip 128a copies the corresponding code in the flash memory 128b into the random access memory 136, and processes The 134 is responsive to the code stored in the memory 136 to perform the corresponding operation. First, as shown in step (dl), the system single chip i28a starts to read the corresponding code from the flash memory i28b, such as the boot code to the random access memory 136, and the processor 134 executes the random access memory 136. The code is used to start the _ test fixture 12 8 . Then, as in step (d2), the processor 134 is programmed to set the general-purpose input/output pin 133 as an input pin to receive the drive signal S (i. Then, as in step (d3), the processor 134 is programmed to set the universal input. The output pin i3l is an output pin to output a general-purpose input/output signal s_Gpi〇, wherein the start level of the general-purpose input/output signal S_GPI0 is a high level. Then, as step (J14), the processor 134 is programmed to determine the universal input. The output pin receives the pulse wave P; if the step (d5) is executed, the processor 134 is programmed to control the level of the general-purpose input/output signal S_GPIO from the high level to the low level. In (d4), if the general-purpose input/output pin 133 is not connected to the pulse wave P, the step (d4) is repeatedly executed. In the step (1)), if the access operation of the card dispenser 122 does not occur. Repeat step (b). In the present embodiment, the test fixture 128 having substantially the same hardware structure as the card reader 122 is used to stop the copying operation of the computer system 12 by the input/output signal s_Gpi〇. It should be noted that the test fixture 128 used in the present embodiment is not limited to the same hardware structure as the card reader 200844730 Sanda number: TW3459PA 122, but may be other structures; as long as the test fixture 128 can respond to The pulse wave P in the driving signal Sd is generated to generate the corresponding general-purpose input/output signal S-GPI0 without departing from the technical scope of the embodiment. In the embodiment, the case where the USB device is the card reader 122 is taken as an example. However, the USB device of the embodiment is not limited to the card reader 122 but may be other USB devices.

The test system of the SB device of the present embodiment responds to the driving signal provided by the logic analyzer in response to the access operation error of the card reader by using a test fixture having substantially the same hardware structure as the card reader to be tested. Generates a general-purpose input and output signal and uses it to stop the copy and compare operations performed by the computer system. In this way, the test system of the usB device of the embodiment can effectively improve the transmission of the corresponding test in the U s B protocol analyzer in the U s B protocol, which is easy to be transmitted after the error time. Effective (4) shortcomings, and substantially have the ability to effectively drive the USB protocol analyzer to retain the corresponding transmission information. Although the present invention has been disclosed in a preferred embodiment, the present invention is used to define the present invention. . It is to be understood that the scope of the invention is intended to be embraced by the appended claims. Ύ ^ 12 200844730

Erlang Ma Hang * TW3459PA ' [Simple Description of the Drawings] Fig. 1 is a block diagram showing a test system of a USB device in accordance with a preferred embodiment of the present invention. Figure 2 is a waveform diagram of a portion of the signal in Figure 1. Figure 3 is a detailed block diagram of the test fixture 128 in Figure 1. Figure 4 is a flow chart showing the test method of the 1^6 device in accordance with a preferred embodiment of the present invention. _ [Main component symbol description] 10 : USB device test system 12, 14 : USB 120, 132 : Computer system 122 : Card reader 124 : Memory card 126 : Logic analyzer 128 : Test fixture • 128a : System single chip 128b: Flash memory 130: USB protocol analyzer 131, 133: General-purpose input/output pin 134: Processor 136: Random access memory 138: USB controller

140, 142, 144: CF controller, SM/xD controller, SD/MMC controller 13

Claims (1)

200844730 Sanda number: TW3459PA ' X. Patent application scope: 1. A universal serial bus (USB) device test system for copying and comparing a USB device via a first computer system ( Copy and Compare), the test system includes: a logic analyzer (Logic Analyzer) for detecting an access operation of the USB device, and detecting a drive signal when the access operation of the USB device is incorrect Generating a pulse (Pulse); and a test fixture, receiving the driving signal and controlling the level of a General Purpose Input and Output (GPIO) signal to change from a high level to receiving the pulse wave The low level is used to drive the first computer system to terminate the replication comparison test. 2. The test system of claim 1, wherein the test fixture comprises: a first-one universal input/output pin and a second universal input/output pin respectively transferred to the logic analyzer and the a first computer system; and a processor configured to be programmed to set the first and second universal input and output pins as input and output pins, respectively, to receive the drive signal and output the universal input Outputting a signal, and the processor changes the level of the general-purpose input and output signal to a low level when the first universal input/output pin receives the pulse wave. 3. The test system of claim 1, further comprising: a USB protocol analysis unit, wherein the first computer system is analyzed by the USB protocol, and the element is connected to the USB device, and the USB protocol analysis unit is used for A USB communication protocol between the first computer system and the USB device is analyzed; 200844730 逶3: TW3459PA • and a second computer system are connected to the _ protocol analysis unit for sub-programming to control and display the USB mosquito Analysis unit analysis operation. 4. In the test system described in claim i, the test fixture in the basin has a substantially identical hardware structure to the oscillating surface. 5. The test system described in claim 1 of the patent scope, The younger brother-computer is connected to the USB, and is stored in the coffee device. Take-test (four)' and compile the job (four) and - copy the comparison test. Ye Shu is responsible for the 6--general sequence bus (UniversalSeriaiB, the test method of the touch device, including: (a) providing - computer system to - copy and compare the device (Copy and Compare); (b) Determining whether an error occurs in the access operation of the USB device; (c) generating a pulse on a driving signal when an error occurs in the access operation of the USB device; and (d) responding to the pulse wave to change a general pulse The level of the input and output (Generi Purpose Input and Output, GPI0) signal changes from a high level to a low level to control the computer system to stop the copy comparison test. 7 · The test method described in claim 6 of the patent application, wherein The step (d) further includes: (dl) starting a test fixture, the test fixture includes a first universal input/output pin and a second universal input/output pin; (d2) setting the first universal input/output connection The foot is an input pin to connect 15 200844730 Erda Navigator. rW3459PA receives the driving signal; (d3) sets the second general-purpose input and output pin as an output pin to output the high-level general-purpose input and output signal; (d4) Determining whether the first universal input/output pin receives the pulse wave; and (d5) controlling the level of the general-purpose input/output signal to change from a high level to a low level when the first universal input/output pin receives the pulse wave quasi. 8. The test method of claim 7, wherein after the step (d4), the method further comprises: repeating the step W4) when the first universal input/output pin does not receive the pulse. 9. The test method of claim 6, wherein after step (b) further comprises: 'when the USB device is accessed (b). Repeat steps when no error occurs 16