CN102075261A - Method and system for automatically testing millimeter-wave front end - Google Patents
Method and system for automatically testing millimeter-wave front end Download PDFInfo
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- CN102075261A CN102075261A CN2010105486855A CN201010548685A CN102075261A CN 102075261 A CN102075261 A CN 102075261A CN 2010105486855 A CN2010105486855 A CN 2010105486855A CN 201010548685 A CN201010548685 A CN 201010548685A CN 102075261 A CN102075261 A CN 102075261A
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Abstract
The invention provides a method for automatically testing a millimeter-wave front end. The method is characterized by comprising the following steps: firstly a user detects hardware connection of a system, configures or detects key settings of the test system such as equipment correspondence addresses and the like, and then starts system software for system initialization and data acquisition; the user configures and detects parameters for the test in the software; after the test is started, the software controls the test equipment according to a test plan, configures parameters of test instruments according to a test flow, and acquires and processes data; if an exception occurs during the test process, the software informs an operator by means of a dialog box, and prompts the user to handle with the exception; and after the test is completed, test results are read and recorded, is displayed through a diagram and can be printed based on the need of the operator at the same.
Description
Technical field
The present invention relates to a kind of method and system thereof of automatic test millimeter wave front end.
Background technology
Present head end test system relies on manual operation fully, and the demand of millimeter wave tester is big, has obstructed finishing smoothly of test job greatly, and therefore, the head end test system of research and development one cover automation seems extremely urgent.
This test macro, by the test control system program, computer control tester operation is finished automatically to the equipment under test performance detection, and in this course, the user can not need or seldom carry out operation to equipment.At last, software writes down automatically, handles and shows test data, and the result is shown to the user with the form of form.The development of this system can reduce the millimeter wave test instrumentation of half, greatly reduces the use of human resources, has improved testing efficiency and accurate testing degree.
Summary of the invention
This test macro is made up of computer hardware platforms, head end test systems soft ware, spectrum analyzer, signal source, standard antenna, polarization turntable, pitching turntable, azimuth rotating platform, the long-range amplification controller of millimeter wave etc., as shown in Figure 1.
Basic functional principle is as follows:
1) user at first the hardware of check system connect, each devices communicating address of configuration or checkout system etc. are crucial to be provided with, start-up system software then, software will carry out the initialization of system and obtain;
2) user's parameter to this test in software is configured and checks;
3) start test, software will be controlled testing equipment according to testing scheme, and according to testing process tester is carried out parameter configuration, obtains data, and deal with data;
4) in test process if unusual, software will be with the mode notifying operation personnel of dialog box, the prompting user handles;
5) test is finished, and reads and logging test results, shows test results with graph mode, can print according to operating personnel's needs simultaneously.
The Hardware Design:
Hardware components mainly comprises 3 cover turntables, 1 cover turntable controller and the long-range amplification controller of 1 cover in the head end test system.Turntable is respectively: polarization turntable, pitching turntable, azimuth rotating platform.Wherein, turntable controller, adopting the unsurpassed DSP signal processing of performance core TMS320LF2407A is kernel control chip, this chip can be handled signal in good time, allow signal finish input and output operations at official hour, its arithmetic speed, Signal Processing ability and chip self characteristics are far away from being on the chip of master controller with MCS-51.The type of drive of driver adopts the type of drive of segmentation, by changing the size of segmentation electric current, stepping motor is operated steadily under user's setting.
Long-range amplification controller is for from grinding instrument, provide and.
Design of System Software:
Adopt the development environment of the Lab Windows/CVI of NI company as this test system and test software, the user interface that it is good, based on the development environment of C language, powerful built-in function and debugging method have conveniently greatly shortened the construction cycle.
This testing software has the function of system configuration, testing scheme configuration, test process control, test data processing.Wherein, system configuration mainly is that the interface to equipment is configured, as the connected mode of equipment, port, address etc.This is that test macro is necessary, and system test software is remembered these configurations automatically so that do not need the user to be provided with once more when calling next time.Testing scheme is the core of test macro, it has comprised testing process, the configuration of test point and parameter etc., require the user to be familiar with the flow process of test job and the operation principle of software, so that operating personnel can carry out proper configuration to the parameter of testing scheme by close friend's interface, the information of software prompt is done correct response.In native system, the user can be provided with by the parameter of interface to test.Test process control, in the test process, software is provided with instrument and equipment according to set testing procedure scheme, scheduling, and after test is finished from testing equipment reading of data, the user can control the flow process of test macro as required, understands task executions situation etc. in real time, has good procedural information and shows and condition prompting.Test data is handled, and after testing successfully end, testing software is deposited into test data in the test result data storehouse, and submits to user's demonstration from test result data generation data sheet, comprises in the form accurately and sufficient information.The user can this form of selective printing, the test result form can be stored in the mode of file, also can read historical test result file, and the content that software can display file is also printed.
Testing software can finish the automatic test to technical performance index in the scheme, and software is finished test by scheduling signals source, turntable and spectrum analyzer, and basic control flow as shown in Figure 2.
The design's advantage:
Existing relatively test macro, the native system design has following advantage:
1) building of this test macro saved the millimeter wave tester of half, greatly reduced testing cost.
2) this system also can finish the test to the antenna index of correlation except realizing the test of front end.
3) have good user interface, system configuration interface and operation prompt information to be user-friendly to and testing process is monitored;
4) allow the user that self-defined configuration is carried out in test;
5) user can be provided with the system instrument relevant parameter;
6) test result data is managed, and energy generation, preservation and printing test form.
The design shows through test of many times checking: can substitute other existing manual testing system fully, and manipulate more simple, make things convenient for, strengthened the reliability of system.
Range of application:
The design can be widely used in particularly needing to learn fast the applied environment of measured piece performance in the index of correlation test of front end, has broad application prospects in various fields such as Industry Control.
Description of drawings
The present invention will illustrate by example and with reference to the mode of accompanying drawing, wherein:
Fig. 1 is the head end test block diagram of system.
Fig. 2 obtains single test data control flow chart.
Embodiment
Disclosed all features in this specification, or the step in disclosed all methods or the process except mutually exclusive feature and/or step, all can make up by any way.
Disclosed arbitrary feature in this specification (comprising any accessory claim, summary and accompanying drawing) is unless special narration all can be replaced by other equivalences or the alternative features with similar purpose.That is, unless special narration, each feature is an example in a series of equivalences or the similar characteristics.
Testing scheme is the core of test macro, it has comprised testing process, the configuration of test point and parameter etc., require the user to be familiar with the flow process of test job and the operation principle of software, so that operating personnel can carry out proper configuration to the parameter of testing scheme by close friend's interface, the information of software prompt is done correct response.In native system, the user can be provided with by the parameter of interface to test.Test process control, in the test process, software is provided with instrument and equipment according to set testing procedure scheme, scheduling, and after test is finished from testing equipment reading of data, the user can control the flow process of test macro as required, understands task executions situation etc. in real time, has good procedural information and shows and condition prompting.Test data is handled, and after testing successfully end, testing software is deposited into test data in the test result data storehouse, and submits to user's demonstration from test result data generation data sheet, comprises in the form accurately and sufficient information.The user can this form of selective printing, the test result form can be stored in the mode of file, also can read historical test result file, and the content that software can display file is also printed.
The present invention is not limited to aforesaid embodiment.The present invention expands to any new feature or any new combination that discloses in this manual, and the arbitrary new method that discloses or step or any new combination of process.
Claims (2)
1. automatic method of test millimeter wave front end is characterized in that may further comprise the steps:
The user at first hardware of check system connects, and each devices communicating address of configuration or checkout system etc. are crucial to be provided with, start-up system software then, and software will carry out the initialization of system and obtain;
User's parameter to this test in software is configured and checks;
Start test, software will be controlled testing equipment according to testing scheme, and according to testing process tester is carried out parameter configuration, obtains data, and deal with data;
If unusual, software will be with the mode notifying operation personnel of dialog box in test process, and the prompting user handles;
Test is finished, and reads and logging test results, shows test results with graph mode, can print according to operating personnel's needs simultaneously.
2. an application rights requires the system of the method for 1 described automatic test millimeter wave front end, it is characterized in that this system comprises computer hardware platforms, head end test systems soft ware, spectrum analyzer, signal source, standard antenna, polarization turntable, pitching turntable, azimuth rotating platform, the long-range amplification controller of millimeter wave etc.
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| Application Number | Priority Date | Filing Date | Title |
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| CN2010105486855A CN102075261A (en) | 2010-11-18 | 2010-11-18 | Method and system for automatically testing millimeter-wave front end |
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| CN2010105486855A CN102075261A (en) | 2010-11-18 | 2010-11-18 | Method and system for automatically testing millimeter-wave front end |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102307070A (en) * | 2011-05-26 | 2012-01-04 | 中国科学院上海微系统与信息技术研究所 | Automatic testing system and testing method for non-contact transmission characteristics of millimeter waveband |
| CN102435890A (en) * | 2011-10-21 | 2012-05-02 | 上海凌世电子有限公司 | EMS test method and test device |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101738604A (en) * | 2009-12-18 | 2010-06-16 | 中国科学院空间科学与应用研究中心 | Automatic test system for millimeter wave receiver |
| CN101789831A (en) * | 2009-12-25 | 2010-07-28 | 上海磁浮交通发展有限公司 | Millimeter wave communication test system |
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2010
- 2010-11-18 CN CN2010105486855A patent/CN102075261A/en active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101738604A (en) * | 2009-12-18 | 2010-06-16 | 中国科学院空间科学与应用研究中心 | Automatic test system for millimeter wave receiver |
| CN101789831A (en) * | 2009-12-25 | 2010-07-28 | 上海磁浮交通发展有限公司 | Millimeter wave communication test system |
Non-Patent Citations (1)
| Title |
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| 张 伟 孙 厚军 何 巍: "毫米波天线自动测试系统设计", 《仪器仪表智能化》, 30 November 2005 (2005-11-30), pages 26 - 27 * |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102307070A (en) * | 2011-05-26 | 2012-01-04 | 中国科学院上海微系统与信息技术研究所 | Automatic testing system and testing method for non-contact transmission characteristics of millimeter waveband |
| CN102307070B (en) * | 2011-05-26 | 2013-11-27 | 中国科学院上海微系统与信息技术研究所 | Automatic testing system and testing method for non-contact transmission characteristics of millimeter waveband |
| CN102435890A (en) * | 2011-10-21 | 2012-05-02 | 上海凌世电子有限公司 | EMS test method and test device |
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Application publication date: 20110525 |