CN201662507U - Novel digital dynamic photo-elastic meter testing system - Google Patents
Novel digital dynamic photo-elastic meter testing system Download PDFInfo
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- CN201662507U CN201662507U CN200920208989XU CN200920208989U CN201662507U CN 201662507 U CN201662507 U CN 201662507U CN 200920208989X U CN200920208989X U CN 200920208989XU CN 200920208989 U CN200920208989 U CN 200920208989U CN 201662507 U CN201662507 U CN 201662507U
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Abstract
The utility model relates to a novel digital dynamic photo-elastic meter testing system, which comprises a light source, an object lens, a collimating lens, a polarizing plate 1, a quarter wave plate 1, a loading device, a quarter wave plate 2, a polarizing plate 2, a converging lens, a high-speed CMOS photographic system, a synchronous trigger line and a computer control system, wherein the loading device is used for placing a tested object, the light source is aligned with the object lens, the light-emitting opening of the object lens is aligned with the collimating lens, the light-emitting opening of the collimating lens is aligned with the polarizing plate 1, the light-emitting opening of the polarizing plate 1 is aligned with the quarter wave plate 1, the light-emitting opening of the quarter wave plate 1 is aligned with the tested object, the light-emitting opening of the tested object is aligned with the quarter wave plate 2, the light-emitting opening of the quarter wave plate 2 is aligned with the polarizing plate 2, the light-emitting opening of the polarizing plate 2 is aligned with the converging lens, the converging lens is aligned with the high-speed CMOS photographic system, and the high-speed CMOS photographic system is connected with the computer control system. Compared with the prior art, the utility model has the advantages of simple structure, convenient use and the like.
Description
Technical field
The utility model relates to a kind of dynamic photo-elasticity instrument pilot system, especially relates to a kind of new digital formula dynamic photo-elasticity instrument pilot system.
Background technology
The dynamic photo-elasticity method has been proved to be the effective ways of research material dynamic property and structure dynamic response, it has the characteristics of the whole audience, intuitive, the factor of stress concentration and the dynamic stress distribution situation of structure can be obtained easily, the propagation condition of stress wave can be observed clearly.When being subjected to impact loading in the elastooptic mateiral of high-elastic mould, its stress wave speed can reach 2000m/s ~ 3000m/s, and this has very short film speed and high-speed record mobile device with regard to requiring camera.The conventional dynamic photoelastic test takes many sparks dynamic photo-elasticity instrument to carry out photoelastic stripe pattern collection mostly.Many sparks dynamic photo-elasticity instrument weak point be can only camera negative and subsequent treatment loaded down with trivial details, can not carry out collecting image of computer and processing, spark light source and camera lens can produce aberration not on primary optical axis in addition.
Summary of the invention
The purpose of this utility model is exactly to provide a kind of new digital formula dynamic photo-elasticity instrument pilot system simple in structure, easy to use for the defective that overcomes above-mentioned prior art existence.
The purpose of this utility model can be achieved through the following technical solutions:
A kind of new digital formula dynamic photo-elasticity instrument pilot system, it is characterized in that, this system comprises light source, object lens, collimating mirror, polaroid one, quarter-wave plate one, be used to place the charger of measured object, quarter-wave plate two, polaroid two, condenser, the high-speed cmos camera chain, the synchronous triggering line, computer control system, described source alignment object lens, the light-emitting window of these object lens is aimed at collimating mirror, the light-emitting window polarizer alignment one of this collimating mirror, the light-emitting window of this polaroid one is aimed at quarter-wave plate one, the light-emitting window of this quarter-wave plate one is aimed at measured object, the light-emitting window of this measured object is aimed at quarter-wave plate two, the light-emitting window polarizer alignment two of this quarter-wave plate two, the light-emitting window of this polaroid two is aimed at condenser, this condenser is aimed at the high-speed cmos camera chain, this high-speed cmos camera chain is connected by lead with computer control system, described high-speed cmos camera chain and charger, measured object connects by the synchronous triggering line respectively.
Described light source is a semiconductor laser light resource.
The enlargement ratio of described object lens is 6.5 times.
The diameter of described collimating mirror, polaroid one, quarter-wave plate one, quarter-wave plate two, polaroid two all is 300mm.
The diameter of described condenser is 50mm.
Compared with prior art, the utlity model has following advantage:
1, use the high-speed cmos camera system, picking rate can reach for 100000 frame/seconds in real time, and acquisition time is long;
2, be applied in the photoelasticity ambulatory stress test technology, can gather the digital picture of the test specimen isodiff striped under the shock load in real time, make things convenient for successive image to handle;
070414009
Description of drawings
Fig. 1 is the structural representation of a kind of new digital formula of the utility model dynamic photo-elasticity instrument pilot system.
Below in conjunction with the drawings and specific embodiments the utility model is elaborated.
Embodiment
Embodiment
As shown in Figure 1, a kind of new digital formula dynamic photo-elasticity instrument pilot system, this system of this system comprises light source 1, object lens 2, collimating mirror 3, polaroid 1, quarter-wave plate 1, be used to place the charger 6 of measured object, quarter-wave plate 27, polaroid 28, condenser 9, high-speed cmos camera chain 10, synchronous triggering line 11, computer control system 12, described light source 1 is aimed at object lens 2, the light-emitting window of these object lens 2 is aimed at collimating mirror 3, the light-emitting window polarizer alignment 1 of this collimating mirror 3, the light-emitting window of this polaroid 1 is aimed at quarter-wave plate 1, the light-emitting window of this quarter-wave plate 1 is aimed at measured object 13, the light-emitting window of this measured object 13 is aimed at quarter-wave plate 27, the light-emitting window polarizer alignment 28 of this quarter-wave plate 27, the light-emitting window of this polaroid 28 is aimed at condenser 9, this condenser 9 is aimed at high-speed cmos camera chain 10, this high-speed cmos camera chain 10 and computer control system 12 are connected described high-speed cmos camera chain 10 and charger 6 by lead, measured object 13 connects by synchronous triggering line 11 respectively.Described light source 1 is a semiconductor laser light resource.The enlargement ratio of described object lens 2 is 6.5 times.The diameter of described collimating mirror 3, polaroid 1, quarter-wave plate 1, quarter-wave plate 27, polaroid 28 all is 300mm.Described light source 1 is a semiconductor laser light resource.The enlargement ratio of described object lens 2 is 6.5 times.The diameter of described collimating mirror 3, polaroid 1, quarter-wave plate 1, quarter-wave plate 27, polaroid 28 all is 300mm.The diameter of described condenser 9 is 50mm.
Choose certain structure member photoelastic model as measured object 13, the present inserts high-speed cmos camera chain 10 in the light path, takes the dynamic photo-elasticity image information.Collect the image of 340 microseconds, 490 microseconds, 640 microseconds, 790 microseconds respectively.
Claims (5)
1. new digital formula dynamic photo-elasticity instrument pilot system, it is characterized in that, this system comprises light source, object lens, collimating mirror, polaroid one, quarter-wave plate one, be used to place the charger of measured object, quarter-wave plate two, polaroid two, condenser, the high-speed cmos camera chain, the synchronous triggering line, computer control system, described source alignment object lens, the light-emitting window of these object lens is aimed at collimating mirror, the light-emitting window polarizer alignment one of this collimating mirror, the light-emitting window of this polaroid one is aimed at quarter-wave plate one, the light-emitting window of this quarter-wave plate one is aimed at measured object, the light-emitting window of this measured object is aimed at quarter-wave plate two, the light-emitting window polarizer alignment two of this quarter-wave plate two, the light-emitting window of this polaroid two is aimed at condenser, this condenser is aimed at the high-speed cmos camera chain, this high-speed cmos camera chain is connected by lead with computer control system, described high-speed cmos camera chain and charger, measured object connects by the synchronous triggering line respectively.
2. a kind of new digital formula dynamic photo-elasticity instrument pilot system according to claim 1 is characterized in that described light source is a semiconductor laser light resource.
3. a kind of new digital formula dynamic photo-elasticity instrument pilot system according to claim 1 is characterized in that the enlargement ratio of described object lens is 6.5 times.
4. a kind of new digital formula dynamic photo-elasticity instrument pilot system according to claim 1 is characterized in that the diameter of described collimating mirror, polaroid one, quarter-wave plate one, quarter-wave plate two, polaroid two all is 300mm.
5. a kind of new digital formula dynamic photo-elasticity instrument pilot system according to claim 1 is characterized in that the diameter of described condenser is 50mm.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN200920208989XU CN201662507U (en) | 2009-09-21 | 2009-09-21 | Novel digital dynamic photo-elastic meter testing system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN200920208989XU CN201662507U (en) | 2009-09-21 | 2009-09-21 | Novel digital dynamic photo-elastic meter testing system |
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| CN201662507U true CN201662507U (en) | 2010-12-01 |
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| CN200920208989XU Expired - Fee Related CN201662507U (en) | 2009-09-21 | 2009-09-21 | Novel digital dynamic photo-elastic meter testing system |
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Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103558092A (en) * | 2013-11-08 | 2014-02-05 | 东南大学 | Photoelastic sensors and test device for testing earth pressure coefficient at rest of earth body |
| CN104266915A (en) * | 2014-09-26 | 2015-01-07 | 天津大学 | Shear wave stimulating device applicable to dynamic photo-elasticity experiment |
| CN108303202A (en) * | 2018-02-09 | 2018-07-20 | 苏州利力升光电科技有限公司 | Laser photo-elastic instrument |
| CN108827799A (en) * | 2018-07-02 | 2018-11-16 | 中国矿业大学(北京) | A kind of photoelastic-loading by means of digital image correlation method synchronization the experimental system and method for dynamically load |
| CN109164038A (en) * | 2018-08-03 | 2019-01-08 | 中国矿业大学(北京) | Coarse fissure-plane shearing slip Dynamic stress field test macro under Dynamic Loading |
| CN109932395A (en) * | 2017-12-15 | 2019-06-25 | 中国矿业大学(北京) | A kind of electrical measurement-caustics the experimental system and method for dynamic fracture-mechanics experiment |
| CN109959570A (en) * | 2017-12-14 | 2019-07-02 | 中国矿业大学(北京) | Explosively loading electrical measurement-dynamic photo-elasticity combined experiments system and method |
-
2009
- 2009-09-21 CN CN200920208989XU patent/CN201662507U/en not_active Expired - Fee Related
Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103558092A (en) * | 2013-11-08 | 2014-02-05 | 东南大学 | Photoelastic sensors and test device for testing earth pressure coefficient at rest of earth body |
| CN103558092B (en) * | 2013-11-08 | 2015-07-08 | 东南大学 | Photoelastic sensors and test device for testing earth pressure coefficient at rest of earth body |
| CN104266915A (en) * | 2014-09-26 | 2015-01-07 | 天津大学 | Shear wave stimulating device applicable to dynamic photo-elasticity experiment |
| CN104266915B (en) * | 2014-09-26 | 2016-08-24 | 天津大学 | A kind of shearing wave excitation apparatus being applicable to Dynamic photoelasticity |
| CN109959570A (en) * | 2017-12-14 | 2019-07-02 | 中国矿业大学(北京) | Explosively loading electrical measurement-dynamic photo-elasticity combined experiments system and method |
| CN109932395A (en) * | 2017-12-15 | 2019-06-25 | 中国矿业大学(北京) | A kind of electrical measurement-caustics the experimental system and method for dynamic fracture-mechanics experiment |
| CN108303202A (en) * | 2018-02-09 | 2018-07-20 | 苏州利力升光电科技有限公司 | Laser photo-elastic instrument |
| CN108827799A (en) * | 2018-07-02 | 2018-11-16 | 中国矿业大学(北京) | A kind of photoelastic-loading by means of digital image correlation method synchronization the experimental system and method for dynamically load |
| CN109164038A (en) * | 2018-08-03 | 2019-01-08 | 中国矿业大学(北京) | Coarse fissure-plane shearing slip Dynamic stress field test macro under Dynamic Loading |
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| Date | Code | Title | Description |
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| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20101201 Termination date: 20140921 |
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| EXPY | Termination of patent right or utility model |