CN204405576U - Based on the thermal conductivity measurement mechanism of conllinear method - Google Patents
Based on the thermal conductivity measurement mechanism of conllinear method Download PDFInfo
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- CN204405576U CN204405576U CN201520075461.5U CN201520075461U CN204405576U CN 204405576 U CN204405576 U CN 204405576U CN 201520075461 U CN201520075461 U CN 201520075461U CN 204405576 U CN204405576 U CN 204405576U
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- beam splitting
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Abstract
Thermal conductivity measurement mechanism based on conllinear method belongs to field of photoelectric technology; This device comprises nanosecoud pulse laser, be arranged at the first beam splitting chip on nanosecoud pulse laser emitting light path, for receiving the silicon detector of the first beam splitting chip reflected light path, the electric signal of output as trigger pip, for showing the oscillograph of silicon detector Received signal strength; Helium-neon laser, 1/2nd slides and polarization spectro sheet, also comprise dichroic mirror, the light path of emitting light path after dichroic mirror transmission of nanosecoud pulse laser, with the light path conllinear of helium-neon laser after dichroic mirror reflects, successively after the second beam splitting chip, lens, converge on sample; The reflected light path of polarization spectro sheet and the reflected light path of the second beam splitting chip are gathered by two-way detector, and the result after subtracting each other is by oscilloscope display; The application's thermal conductivity measurement mechanism, not only utilizes conllinear method to improve signal to noise ratio (S/N ratio), is easy to regulate spots coincide, and can compensates the impact of instability on measurement result of helium-neon laser.
Description
Technical field
Thermal conductivity measurement mechanism based on conllinear method belongs to field of photoelectric technology.
Background technology
Along with the fast development of science and technology, increasing macromolecular material and nano film material continue to bring out out.And for the thermal conductivity measuring of various novel substance new material, the exploitation for Novel heat-conducting, thermal insulation film material is laid solid theoretical foundation with research.
For the measurement of thermal conductivity, have developed a kind of measurement of instability method nearly decades.The method is used for studying high heat conductive material, or measures under the high temperature conditions.For unstable state thermal conductivity measurement mechanism, traditional structure as shown in Figure 1.In the apparatus, the laser beam that nanosecoud pulse laser sends is transferred through catoptron, from the center convergence of lens to sample surfaces, and the laser beam that helium-neon laser sends is successively after 1/2nd slides, polarization spectro sheet and another sheet catoptron, converge to sample surfaces from the non-central of lens, this laser beam reflects from centrosymmetric position, after the 3rd catoptron reflection, received by detector, and by oscilloscope display.
Such apparatus structure has following shortcoming:
The first, the laser beam that the laser beam that sends of nanosecoud pulse laser and helium-neon laser send adopts non-colinear mode, and luminous point space coincidence not easily regulates, and it is lower to measure the signal to noise ratio (S/N ratio) obtaining signal;
The second, the impact that helium-neon laser instability is brought to measurement result cannot be overcome.
Utility model content
In order to solve the problem, the utility model discloses a kind of thermal conductivity measurement mechanism based on conllinear method, this device passes through nanosecoud pulse laser and helium-neon laser light-beam collinear, introduce reference light simultaneously, not only increase signal to noise ratio (S/N ratio), and avoid the unstable impact brought to measurement result of helium-neon laser.
The purpose of this utility model is achieved in that
Based on the thermal conductivity measurement mechanism of conllinear method, comprise nanosecoud pulse laser, be arranged at the first beam splitting chip on nanosecoud pulse laser emitting light path, for receiving the silicon detector of the first beam splitting chip reflected light path, for showing the oscillograph of silicon detector Received signal strength; Helium-neon laser, 1/2nd slides and polarization spectro sheet, also comprise dichroic mirror, the light path of emitting light path after dichroic mirror transmission of nanosecoud pulse laser, with the light path altogether road of helium-neon laser after dichroic mirror reflects, successively after the second beam splitting chip, lens, converge on sample; The reflected light path of polarization spectro sheet and the reflected light path of the second beam splitting chip are gathered by two-way detector, and the result after subtracting each other is by oscilloscope display.
The above-mentioned thermal conductivity measurement mechanism based on conllinear method, the reflected light path of described polarization spectro sheet, after multiple reflections, enters two-way detector.
The above-mentioned thermal conductivity measurement mechanism based on conllinear method, the reflected light path of described second beam splitting chip, after multiple reflections, enters two-way detector.
Beneficial effect:
The first, owing to being provided with dichroic mirror, the light path of emitting light path after dichroic mirror transmission of nanosecoud pulse laser simultaneously, with the light path altogether road of helium-neon laser after dichroic mirror reflects, therefore laser beam that nanosecoud pulse laser sends and the laser beam conllinear that helium-neon laser sends can be realized, signal to noise ratio (S/N ratio) is lower, is conducive to regulating luminous point space coincidence;
The second, owing to drawing the reflected light path of polarization spectro sheet, and add the second beam splitting chip extraction reflected light path, the reflected light path of polarization spectro sheet and the reflected light path of the second beam splitting chip are gathered by two-way detector simultaneously, therefore can under the condition of nanosecoud pulse laser 0 incidence, by the difference of two reflected light paths is adjusted to 0, compensate the instability of helium-neon laser, improve measurement result precision.
Accompanying drawing explanation
Fig. 1 is the structural representation of existing thermal conductivity measurement mechanism.
Fig. 2 is the structural representation of the utility model based on the thermal conductivity measurement mechanism of conllinear method.
In figure: 1 nanosecoud pulse laser, 2 first beam splitting chips, 3 silicon detectors, 4 oscillographs, 5 helium-neon lasers, 1/6th two slide, 7 polarization spectro sheets, 8 dichroic mirrors, 9 second beam splitting chips, 10 lens, 11 samples, 12 two-way detectors.
Embodiment
Below in conjunction with accompanying drawing, the utility model embodiment is described in further detail.
The thermal conductivity measurement mechanism based on conllinear method of the present embodiment, structural representation as shown in Figure 2.This thermal conductivity measurement mechanism comprises nanosecoud pulse laser 1, is arranged at the first beam splitting chip 2 on nanosecoud pulse laser 1 emitting light path, for receiving the silicon detector 3 of the first beam splitting chip 2 reflected light path, for showing the oscillograph 4 of silicon detector 3 Received signal strength; Helium-neon laser 5,1/2nd slide 6 and polarization spectro sheet 7, also comprise dichroic mirror 8, the light path of emitting light path after dichroic mirror 8 transmission of nanosecoud pulse laser 1, with the light path altogether road of helium-neon laser 5 after dichroic mirror 8 reflects, successively after the second beam splitting chip 9, lens 10, converge on sample 11; The reflected light path of polarization spectro sheet 7 and the reflected light path of the second beam splitting chip 9 are after multiple reflections, and gathered by two-way detector 12, the result after subtracting each other is shown by oscillograph 4.
After oscillograph 4 collection signal, how to obtain thermal conductivity and belong to prior art, in this application no longer repeat specification.
Claims (3)
1. based on the thermal conductivity measurement mechanism of conllinear method, comprise nanosecoud pulse laser (1), be arranged at the first beam splitting chip (2) on nanosecoud pulse laser (1) emitting light path, for receiving the silicon detector (3) of the first beam splitting chip (2) reflected light path, for showing the oscillograph (4) of silicon detector (3) Received signal strength; Helium-neon laser (5), 1/2nd slides (6) and polarization spectro sheet (7), it is characterized in that, also comprise dichroic mirror (8), the light path of emitting light path after dichroic mirror (8) transmission of nanosecoud pulse laser (1), with the light path altogether road of helium-neon laser (5) after dichroic mirror (8) reflects, successively after the second beam splitting chip (9), lens (10), converge on sample (11); The reflected light path of polarization spectro sheet (7) and the reflected light path of the second beam splitting chip (9) are gathered by two-way detector (12), and the result after subtracting each other is shown by oscillograph (4).
2. the thermal conductivity measurement mechanism based on conllinear method according to claim 1, is characterized in that, the reflected light path of described polarization spectro sheet (7), after multiple reflections, enters two-way detector (12).
3. the thermal conductivity measurement mechanism based on conllinear method according to claim 1, is characterized in that, the reflected light path of described second beam splitting chip (9), after multiple reflections, enters two-way detector (12).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520075461.5U CN204405576U (en) | 2015-02-03 | 2015-02-03 | Based on the thermal conductivity measurement mechanism of conllinear method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
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| CN201520075461.5U CN204405576U (en) | 2015-02-03 | 2015-02-03 | Based on the thermal conductivity measurement mechanism of conllinear method |
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| CN204405576U true CN204405576U (en) | 2015-06-17 |
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| CN201520075461.5U Expired - Fee Related CN204405576U (en) | 2015-02-03 | 2015-02-03 | Based on the thermal conductivity measurement mechanism of conllinear method |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108169279A (en) * | 2017-12-28 | 2018-06-15 | 电子科技大学 | One kind is based on VO2The thermal conductivity of thin film measuring device and method of film |
| JP7477500B2 (en) | 2018-08-28 | 2024-05-01 | ユニバーシティ オブ バージニア パテント ファウンデーション | Steady-state thermoreflectance method and system for measuring thermal conductivity - Patents.com |
-
2015
- 2015-02-03 CN CN201520075461.5U patent/CN204405576U/en not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108169279A (en) * | 2017-12-28 | 2018-06-15 | 电子科技大学 | One kind is based on VO2The thermal conductivity of thin film measuring device and method of film |
| JP7477500B2 (en) | 2018-08-28 | 2024-05-01 | ユニバーシティ オブ バージニア パテント ファウンデーション | Steady-state thermoreflectance method and system for measuring thermal conductivity - Patents.com |
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| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20150617 Termination date: 20170203 |
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| CF01 | Termination of patent right due to non-payment of annual fee |