CN201273813Y - Thickness measurement instrument for CCD optical bias resistant non-invasive detection - Google Patents

Thickness measurement instrument for CCD optical bias resistant non-invasive detection Download PDF

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Publication number
CN201273813Y
CN201273813Y CNU2008201495196U CN200820149519U CN201273813Y CN 201273813 Y CN201273813 Y CN 201273813Y CN U2008201495196 U CNU2008201495196 U CN U2008201495196U CN 200820149519 U CN200820149519 U CN 200820149519U CN 201273813 Y CN201273813 Y CN 201273813Y
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China
Prior art keywords
ccd
steel plate
light
measured
rectangular
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Expired - Fee Related
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CNU2008201495196U
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Chinese (zh)
Inventor
焦善奇
彭跃远
郝向军
曹跃威
马明晓
胡立新
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Wuyang Iron and Steel Co Ltd
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Wuyang Iron and Steel Co Ltd
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Priority to CNU2008201495196U priority Critical patent/CN201273813Y/en
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Abstract

The utility model relates to an anti-partial non-destructive thickness tester for CCD optical signals. In the technical proposal, a first optical signal transmitting and receiving unit which comprises a first laser transmitter, a first reflector, a first compressor and a first CCD photoelectric converter is used for projecting the upper surface of a tested steel plate; a second optical signal transmitting and receiving unit which comprises a second laser transmitter, a second reflector, a second compressor and a second CCD photoelectric converter is used for projecting the lower surface of the steel plate to be tested; the flares projected by the two optical signal transmitting and receiving units onto the tested steel plate correspond to each other from the upper surface to the lower surface; the electric signal output ends of the first CCD photoelectric converter and the second CCD photoelectric converter are respectively connected with the first signal input end and the second signal input end of a driving and signal processing unit; the positions of the light transmitting port of the first laser transmitter and the second laser transmitter are respectively provided with a first non-spherical rectangular flare lens group and a second non-spherical rectangular flare lens group; the first non-spherical rectangular flare lens group and the second non-spherical rectangular flare lens group are identical with each other and are arranged symmetrically; and the laser can form rectangular flares on the tested steel plate after being processed by the non-spherical rectangular flare lens groups. Therefore, the utility model can prevent the undetected condition and improve the reliability of the thickness tester.

Description

The anti-Non-Destructive Testing thicknessmeter partially of a kind of CCD light letter
Technical field
The utility model relates to the laser thickness gauge technical field, relates in particular to the anti-Non-Destructive Testing thicknessmeter partially of a kind of CCD light letter.
Background technology
The principle of work of existing steel plate laser thickness gauge is based on the principle of triangulation, and two groups of laser transmitting systems project the upper and lower surface of steel plate respectively with hot spot up and down, and the scattered light that receiving system will be shone hot spot images on the electrooptical device CCD.The electric signal of computing machine after according to conversion calculates the real time position of steel plate upper and lower surface, then the upper and lower surface position asked difference can obtain the instantaneous thickness measurements of steel plate.Because measuring error depends primarily on the optical signalling receiving system, make to comprise reception base and adjustment rack, the reception camera lens, CCD adjusts seat becomes important adjustment device.The selection in general measure zone is that the scope of beating that the steel plate measured adds upper steel plate decides.The chosen position of first measurement zone is 20mm under the roller plane, and the focusing ring of second step by rotating lens becomes clearly as on the photosurface of CCD luminous point; The whole CCD of the 3rd step adjusts seat drops on the photosurface of CCD luminous point, and the standard maximal value that measurement can access is the maximal value of the electric signal of CCD output; Can withdraw from saturated by adjusting aperture size and changing sample frequency if the original signal of CCD output is saturated in the 4th step debug process.Problem is when steel plate wooden dipper song, out-of-flatness or steel plate when beating severity, often there is the scattering hot spot on the surface of steel plate to depart from CCD reception photosurface (20*0.08mm), have only 0.08mm because of CCD receives the photosurface transverse width, omission occurring mainly is that hot spot runs from xsect.CCD receives photosurface and does not receive steel plate thickness that signal makes and leak and pick up.Though this not survey frequency and be at random seldom, be difficult to eliminate.
The utility model content
The purpose of this utility model provides a kind of anti-Non-Destructive Testing thicknessmeter partially of CCD light letter of test leakage when avoiding the steel plate signal to depart from.
The anti-Non-Destructive Testing thicknessmeter partially of a kind of CCD light letter, comprise first, second generating laser, first, second catoptron, first, second compressor reducer, first, the 2nd CCD electrooptical device, drive and signal processing unit, first generating laser, first catoptron, first compressor reducer, first light signal emission receiving element that the one CCD electrooptical device constitutes is used to throw the upper surface of steel plate to be measured, second generating laser, second catoptron, second compressor reducer, second light signal emission receiving element that the 2nd CCD electrooptical device constitutes is used to throw the lower surface of steel plate to be measured, first, the hot spot that second light signal emission receiving element throws on steel plate to be measured is corresponding up and down, first, the electrical signal of the 2nd CCD electrooptical device connects first of driving and signal processing unit respectively, the secondary signal input end, wherein: first, second light signal emission receiving element is provided with first respectively on the light path before the district to be measured, the second aspheric surface rectangular light spot lens combination.
The anti-Non-Destructive Testing thicknessmeter partially of described CCD light letter, wherein: described first, second aspheric surface rectangular light spot lens combination is arranged at the light emission port place of first, second generating laser respectively, first, second aspheric surface rectangular light spot lens combination is identical, is symmetrical arranged.
The utility model adopts technique scheme will reach following technique effect:
The anti-Non-Destructive Testing thicknessmeter partially of CCD light letter of the present utility model, in first, second light signal emission receiving element is provided with first respectively on the light path before the district to be measured, the second aspheric surface rectangular light spot lens combination, first, the laser that second generating laser sends is respectively through first, the second aspheric surface rectangular light spot lens combination and corresponding catoptron, compressor reducer, on steel plate to be measured, form the rectangular light spot of strip, the direction of motion of the long edge steel plate of rectangular light spot, when this rectangular light spot reflexes on the photosurface of corresponding C CD electrooptical device, the corresponding corresponding photosurface in the long limit of rectangular light spot laterally, the circular light spot that reflexes to because of the existing relatively laser thickness gauge in the long limit of rectangular light spot on the photosurface of its CCD electrooptical device extends greatly, and width much larger than the photosurface of CCD electrooptical device, therefore, even the wooden dipper song takes place in the steel plate measured point, when distortion or steel plate are beated situation such as severity, the light of reflection still can arrive the photosurface of CCD electrooptical device, therefore, can avoid the situation of omission, improve the anti-reliability of Non-Destructive Testing thicknessmeter partially of CCD light letter.
Description of drawings
Fig. 1 is the anti-structural representation of Non-Destructive Testing thicknessmeter partially of the utility model CCD light letter;
Fig. 2 believes the comparison diagram of the rectangular light spot that anti-Non-Destructive Testing thicknessmeter partially forms on steel plate to be measured at the circular light spot that forms on the steel plate to be measured and the utility model CCD light for existing laser thickness gauge.
Embodiment
Embodiment:
The anti-Non-Destructive Testing thicknessmeter partially of a kind of CCD light letter, its structure as shown in Figure 1, comprise first, the second generating laser A1, A2, first, the second catoptron B1, B2, first, the second compressor reducer C1, C2, first, the 2nd CCD electrooptical device E1, E2, drive and signal processing unit F, the first generating laser A1, the first catoptron B1, the first compressor reducer C1, first light signal emission receiving element that the one CCD electrooptical device E1 constitutes is used to throw the upper surface of steel plate D to be measured, the second generating laser A2, the second catoptron B2, the second compressor reducer C2, second light signal emission receiving element that the 2nd CCD electrooptical device E2 constitutes is used to throw the lower surface of steel plate D to be measured, first, the hot spot that second light signal emission receiving element throws on steel plate D to be measured is corresponding up and down, first, the 2nd CCD electrooptical device E1, the electrical signal of E2 connects first of driving and signal processing unit F respectively, the secondary signal input end, wherein: first, the second generating laser A1, the light emission port place of A2 is provided with first respectively, the second aspheric surface rectangular light spot lens combination P1, P2, first, the second aspheric surface rectangular light spot lens combination P1, P2 is identical, symmetrical setting.
In the present embodiment, described first, second aspheric surface rectangular light spot lens combination P1, P2 are existing mature technology, by clipping the effective sunlight of light chopper direction in the hot spot outside, and make the circular light spot of former imaging be transformed into rectangular light spot.
In use, first, the second generating laser A1, the laser that A2 sends is respectively through first, the second aspheric surface rectangular light spot lens combination P1, after P2 handles again through corresponding catoptron B1, B2, compressor reducer C1, C2 handles, respectively at the upper surface of steel plate to be measured, the lower surface corresponding point respectively form the rectangular light spot of a strip, two rectangular light spots are corresponding up and down, and its long limit is the direction of motion along steel plate, two rectangular light spots reflex to corresponding C CD electrooptical device E1 respectively, in the time of on the photosurface of E2, the horizontal of corresponding corresponding photosurface distinguished on the long limit of two rectangular light spots, corresponding C CD electrooptical device E1, the light signal that E2 receives its photosurface changes into electric signal and sends into and drive and signal processing unit is handled, driving and signal processing unit utilize the inverted triangle method to calculate the locus of steel plate upper and lower surface laser projections point to be measured, obtain locus how much poor of 2 laser projections points, this geometry difference is exactly the steel plate thickness between the steel plate upper and lower surface laser projections point to be measured; Circular light spot diameter on the photosurface that reflexes to its CCD electrooptical device that the existing relatively laser thickness gauge in the long limit of cause two rectangular light spots forms extends greatly, see shown in Figure 2, the circular light spot G1 diameter that existing laser thickness gauge forms is 0.1mm, and the rectangular light spot G2 area that the anti-Non-Destructive Testing thicknessmeter partially of the utility model CCD light letter forms is 0.1mm * 20mm, the length 20mm of rectangular light spot G2 is much larger than the photosurface of CCD electrooptical device (the width 0.08mm of 20mm * 0.08mm), therefore, even the wooden dipper song takes place in steel plate D measured point, when distortion or steel plate are beated situation such as severity, the light of rectangular light spot G2 reflection still can arrive corresponding CCD electrooptical device E1, the photosurface of E2, therefore, can avoid the situation of omission, improve the anti-reliability of Non-Destructive Testing thicknessmeter partially of CCD light letter.

Claims (2)

1, the anti-Non-Destructive Testing thicknessmeter partially of a kind of CCD light letter, comprise first, second generating laser, first, second catoptron, first, second compressor reducer, first, the 2nd CCD electrooptical device, drive and signal processing unit, first generating laser, first catoptron, first compressor reducer, first light signal emission receiving element that the one CCD electrooptical device constitutes is used to throw the upper surface of steel plate to be measured, second generating laser, second catoptron, second compressor reducer, second light signal emission receiving element that the 2nd CCD electrooptical device constitutes is used to throw the lower surface of steel plate to be measured, first, the hot spot that second light signal emission receiving element throws on steel plate to be measured is corresponding up and down, first, the electrical signal of the 2nd CCD electrooptical device connects first of driving and signal processing unit respectively, the secondary signal input end is characterized in that: first, second light signal emission receiving element is provided with first respectively on the light path before the district to be measured, the second aspheric surface rectangular light spot lens combination.
2, the anti-Non-Destructive Testing thicknessmeter partially of CCD light letter as claimed in claim 1, it is characterized in that: described first, second aspheric surface rectangular light spot lens combination is arranged at the light emission port place of first, second generating laser respectively, first, second aspheric surface rectangular light spot lens combination is identical, is symmetrical arranged.
CNU2008201495196U 2008-09-28 2008-09-28 Thickness measurement instrument for CCD optical bias resistant non-invasive detection Expired - Fee Related CN201273813Y (en)

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Application Number Priority Date Filing Date Title
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Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101825438A (en) * 2010-05-26 2010-09-08 华中科技大学 Laser measuring device for measuring thickness of plate
CN102679892A (en) * 2012-05-11 2012-09-19 华中科技大学 Single-lens laser trigonometry thickness measuring instrument
CN103363911A (en) * 2013-04-25 2013-10-23 谢逢春 Laser thickness gauge taking laser as light source
CN105203036A (en) * 2015-10-22 2015-12-30 茂莱(南京)仪器有限公司 Device and method for measuring thickness of center of lens according to non-contact method
CN103363911B (en) * 2013-04-25 2016-11-30 谢逢春 Laser thickness gauge using laser as light source
CN109373917A (en) * 2018-12-12 2019-02-22 常州工学院 Thickness measurement with laser manually visualizes detection device and method to hot spot is penetrated
CN114791605A (en) * 2021-01-26 2022-07-26 南京大量数控科技有限公司 Optical system for measuring depth of inner layer of printed circuit board
CN116678331A (en) * 2023-06-03 2023-09-01 湖北武汉亮测科技有限公司 Laser thickness measuring instrument

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101825438A (en) * 2010-05-26 2010-09-08 华中科技大学 Laser measuring device for measuring thickness of plate
CN102679892A (en) * 2012-05-11 2012-09-19 华中科技大学 Single-lens laser trigonometry thickness measuring instrument
CN102679892B (en) * 2012-05-11 2014-11-12 华中科技大学 Single-lens laser trigonometry thickness measuring instrument
CN103363911B (en) * 2013-04-25 2016-11-30 谢逢春 Laser thickness gauge using laser as light source
CN103363911A (en) * 2013-04-25 2013-10-23 谢逢春 Laser thickness gauge taking laser as light source
CN105203036B (en) * 2015-10-22 2018-08-28 茂莱(南京)仪器有限公司 The device and method that eyes with non-contact method measures lens centre thickness
CN105203036A (en) * 2015-10-22 2015-12-30 茂莱(南京)仪器有限公司 Device and method for measuring thickness of center of lens according to non-contact method
CN109373917A (en) * 2018-12-12 2019-02-22 常州工学院 Thickness measurement with laser manually visualizes detection device and method to hot spot is penetrated
CN109373917B (en) * 2018-12-12 2020-12-29 常州工学院 Manual visual detection device and method for laser thickness measurement correlation light spots
CN114791605A (en) * 2021-01-26 2022-07-26 南京大量数控科技有限公司 Optical system for measuring depth of inner layer of printed circuit board
CN114791605B (en) * 2021-01-26 2023-08-22 南京大量数控科技有限公司 Optical system for measuring depth of inner layer of printed circuit board
CN116678331A (en) * 2023-06-03 2023-09-01 湖北武汉亮测科技有限公司 Laser thickness measuring instrument
CN116678331B (en) * 2023-06-03 2023-12-15 湖北武汉亮测科技有限公司 Laser thickness measuring instrument

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Granted publication date: 20090715

Termination date: 20140928

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