CN201532442U - Device for carrying out batch environment testing of restoring chips - Google Patents
Device for carrying out batch environment testing of restoring chips Download PDFInfo
- Publication number
- CN201532442U CN201532442U CN200920281367XU CN200920281367U CN201532442U CN 201532442 U CN201532442 U CN 201532442U CN 200920281367X U CN200920281367X U CN 200920281367XU CN 200920281367 U CN200920281367 U CN 200920281367U CN 201532442 U CN201532442 U CN 201532442U
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- Prior art keywords
- testing
- restoring
- chips
- chip
- resets
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- Expired - Fee Related
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- 238000012360 testing method Methods 0.000 title claims abstract description 87
- 230000007613 environmental effect Effects 0.000 claims description 23
- 238000004519 manufacturing process Methods 0.000 abstract description 3
- 238000013461 design Methods 0.000 abstract description 2
- 230000002950 deficient Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 230000007257 malfunction Effects 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
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- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The utility model discloses a device for carrying out batch environment testing of restoring chips, which belongs to a testing device of restoring chips, wherein the structure of the device comprises a testing mainboard, a voltage-stabilized power supply, an environment test chamber and a testing instrument, the testing mainboard is provided with a power supply interface and a restoring chip interface, the voltage-stabilized power supply is connected with the power supply interface of the testing mainboard, the environment test chamber is connected with the testing mainboard which is positioned in the environment test chamber, and the testing instrument is connected with the restoring chip interface of the testing mainboard. Compared with the prior art, the device for carrying out batch environment testing of restoring chips can carry out the environment testing of a plurality of restoring chips, and the number of the restoring chips can be hundreds, thereby being able to fully test whether the restoring chips can be reliably reset under different environments, and the device for carrying out batch environment testing of restoring chips has the characteristics of reasonable design, simple structure, easy manufacturing, convenient use, low cost, strong operability and the like.
Description
Technical field
The utility model relates to a kind of proving installation of the chip that resets, specifically a kind of device that the chip that resets is carried out in batches environmental testing.
Background technology
The quality of bringing owing to the chip manufacturer production technology that resets, the difference of material use reduces, the production batch failure and other reasons, cause the chip that resets in different working environments, can not normally reset, thereby cause the tax control product cisco unity malfunction, as do not start shooting, operation irregularity etc.
Reset the at present environmental testing of chip mainly is to be undertaken by complete machine.This method of testing mainly contains two defectives: one, system test a slice chip that resets, and efficient is low, and operability is not strong, and test event is incomplete; Two, the test limited amount can not be reacted problem fully.
The utility model content
Technical assignment of the present utility model is at above weak point, can carry out environmental testing to a plurality of chips that reset simultaneously and can fully test a kind of device that the chip that resets is carried out in batches environmental testing that can the chip that reset under the different environment reset reliably thereby provide a kind of.
The technical scheme that its technical matters that solves the utility model adopts is: comprise testing host and stabilized voltage supply, environmental test chamber, testing tool; Testing host is provided with power interface, chip interface resets; Stabilized voltage supply connects the power interface of testing host; Environmental test chamber is connected with testing host, and testing host is placed in the environmental test chamber; Testing tool links to each other with the chip interface that resets of testing host.
Testing tool comprises reometer, oscillograph.
The chip interface that resets of testing host is 1～100.
Step when the utility model uses is:
1, the chip that resets to be measured is installed on the chip interface that resets, quantity is installed decides, can reach 100 at most according to test case;
Whether 2, by the stabilized voltage supply power supply, control each chip that resets by short-circuited conducting sleeve and work on power on testing host, promptly each chip that resets works alone;
3, under normal temperature environment, at first whether the working current of testing each chip that resets with reometer meets the demands; Secondly with the oscillograph electric voltage dropping parameter of monitoring input voltage, the chip reseting pin that resets respectively, the two is compared, and judges whether the chip that resets is unusual, and then realizes test purpose;
4, the testing host that the chip that resets will be installed is put into environmental test chamber, carries out the low-temperature working test; After the end, carry out the operation of step 3;
5, carry out low tempertaure storage, hot operation, high temperature storage, constant damp and hot work, constant damp and hot storage test respectively according to step 4;
6, according to above test, thereby can the test reset chip reset reliably fully.
A kind of device that the chip that resets is carried out environmental testing in batches of the present utility model is compared with prior art, can carry out environmental testing to a plurality of chips that reset simultaneously, quantity can reach up to a hundred, thereby can fully test under the different environment, and can the chip that reset reset reliably; Have reasonable in design, simple in structure, be easy to processing, easy to use, cost is low, characteristics such as workable, thereby, have good value for applications.
Description of drawings
Below in conjunction with accompanying drawing the utility model is further specified.
Accompanying drawing 1 is a kind of structural representation block diagram that the chip that resets is carried out in batches the device of environmental testing.
Embodiment
The utility model is described in further detail below in conjunction with the drawings and specific embodiments.
Of the present utility modelly a kind of the chip that resets is carried out the device of environmental testing in batches, its structure comprises testing host and stabilized voltage supply, environmental test chamber, testing tool; Testing host is provided with power interface, chip interface resets; Stabilized voltage supply connects the power interface of testing host; Environmental test chamber is connected with testing host, and testing host is placed in the environmental test chamber; Testing tool links to each other with the chip interface that resets of testing host.
Testing tool comprises reometer, oscillograph.
The chip interface that resets of testing host is 100.
During use, the chip that resets to be measured is installed on the chip interface that resets of testing host, then testing host is put into environmental test chamber, carry out high temperature, low temperature, steady-state damp heat test after, with reometer, oscillograph reset coil sheet to be measured is tested.
Except that the described technical characterictic of instructions, be the known technology of those skilled in the art.
Claims (3)
1. one kind is carried out the device of environmental testing in batches to the chip that resets, and it is characterized in that comprising testing host and stabilized voltage supply, environmental test chamber, testing tool; Testing host is provided with power interface, chip interface resets; Stabilized voltage supply connects the power interface of testing host; Environmental test chamber is connected with testing host, and testing host is placed in the environmental test chamber; Testing tool links to each other with the chip interface that resets of testing host.
2. according to claim 1ly a kind of the chip that resets is carried out the device of environmental testing in batches, it is characterized in that testing tool comprises reometer, oscillograph.
3. according to claim 1ly a kind of the chip that resets is carried out the device of environmental testing in batches, it is characterized in that the chip interface that resets of testing host is 1～100.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN200920281367XU CN201532442U (en) | 2009-11-23 | 2009-11-23 | Device for carrying out batch environment testing of restoring chips |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN200920281367XU CN201532442U (en) | 2009-11-23 | 2009-11-23 | Device for carrying out batch environment testing of restoring chips |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN201532442U true CN201532442U (en) | 2010-07-21 |
Family
ID=42527845
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN200920281367XU Expired - Fee Related CN201532442U (en) | 2009-11-23 | 2009-11-23 | Device for carrying out batch environment testing of restoring chips |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN201532442U (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105548859A (en) * | 2015-12-09 | 2016-05-04 | 上海精密计量测试研究所 | Testing equipment and method for environment testing |
| CN106908711A (en) * | 2017-02-06 | 2017-06-30 | 张家港市欧微自动化研发有限公司 | A kind of high/low temperature test device for being applied to IC tests |
| CN111913095A (en) * | 2020-08-06 | 2020-11-10 | 易佰特新能源科技有限公司 | Method for detecting and maintaining faults of main board of automatic lithium battery formation equipment |
-
2009
- 2009-11-23 CN CN200920281367XU patent/CN201532442U/en not_active Expired - Fee Related
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105548859A (en) * | 2015-12-09 | 2016-05-04 | 上海精密计量测试研究所 | Testing equipment and method for environment testing |
| CN106908711A (en) * | 2017-02-06 | 2017-06-30 | 张家港市欧微自动化研发有限公司 | A kind of high/low temperature test device for being applied to IC tests |
| CN111913095A (en) * | 2020-08-06 | 2020-11-10 | 易佰特新能源科技有限公司 | Method for detecting and maintaining faults of main board of automatic lithium battery formation equipment |
| CN111913095B (en) * | 2020-08-06 | 2022-12-23 | 易佰特新能源科技有限公司 | Method for detecting and maintaining faults of main board of automatic lithium battery formation equipment |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C17 | Cessation of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20100721 Termination date: 20121123 |