CN106789423B - Automatic testing device and method for switch - Google Patents
Automatic testing device and method for switch Download PDFInfo
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- CN106789423B CN106789423B CN201611186075.9A CN201611186075A CN106789423B CN 106789423 B CN106789423 B CN 106789423B CN 201611186075 A CN201611186075 A CN 201611186075A CN 106789423 B CN106789423 B CN 106789423B
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L43/00—Arrangements for monitoring or testing data switching networks
- H04L43/08—Monitoring or testing based on specific metrics, e.g. QoS, energy consumption or environmental parameters
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L43/00—Arrangements for monitoring or testing data switching networks
- H04L43/50—Testing arrangements
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Abstract
The invention relates to an automatic testing device and a testing method for an exchanger, wherein the testing device comprises an exchanger to be tested, a high-low temperature alternating wet and hot box, a programmable power supply, a tester and a testing host, wherein the high-low temperature alternating wet and hot box is used for providing a simulation environment for the exchanger to be tested, and the exchanger to be tested is arranged in the high-low temperature alternating wet and hot box; the programmable power supply is connected with the switch to be tested and used for providing power supply voltage for the switch to be tested; the tester is connected with the switch to be tested and used for testing the communication performance of the switch to be tested; the testing host is connected with the high-low temperature alternating wet and hot box, the programmable power supply and the tester and used for respectively controlling the high-low temperature alternating wet and hot box and the programmable power supply according to testing requirements so as to adjust the simulated environment and the power supply voltage and controlling the tester to carry out the communication performance test on the switch to be tested. The invention can accurately simulate the environment, realizes automatic test, does not need manual operation test, and has high test efficiency and low cost.
Description
Technical Field
The invention relates to the technical field of communication testing, in particular to an automatic testing device and method for a switch.
Background
The rapid growth of networks creates an advantageous environment for the popularity of switches. Especially for a developing country with large population and dense residence, such as China, broadband access to the home provides a wide foundation for the development of the switch. The enterprise network, campus network and community network constitute the "three-drive horse car" of the exchange market. The switch market of the continental China is billions of yuan each year now, and there is a great development space with the popularization of networks and the promotion of application requirements.
In the development process of the switch, an environmental test is generally required, the environmental test is to simulate that a product works under natural or artificial environmental conditions, verify the working performance of each stage of the product, evaluate the performance of the product under the actual use environmental conditions, and analyze and research the influence degree and the action mechanism of environmental factors.
In the correlation technique, the environmental test experiment to the switch is generally accomplished in professional third party's laboratory, needs the manual work to carry out each item operation test in the test experiment moreover, and degree of automation is low, and the operation is complicated, extravagant manpower, leads to test cost height, inefficiency.
Disclosure of Invention
The present invention is directed to solving, at least to some extent, one of the technical problems in the related art.
Therefore, the first purpose of the invention is to provide an automatic testing device for the switch, which can accurately simulate the environment, realize automatic testing, and has high testing efficiency and low cost.
The second purpose of the invention is to provide an automatic testing method for the switch.
In order to achieve the above object, in a first aspect, an automatic switch testing apparatus according to an embodiment of the present invention includes:
a switch to be tested;
the high-low temperature alternating wet and hot box is used for providing a simulation environment for the switch to be tested, and the switch to be tested is arranged in the high-low temperature alternating wet and hot box;
the programmable power supply is connected with the switch to be tested and used for providing power supply voltage for the switch to be tested;
the tester is connected with the switch to be tested and used for testing the communication performance of the switch to be tested;
and the test host is connected with the high-low temperature alternating wet and hot box, the programmable power supply and the tester and is used for respectively controlling the high-low temperature alternating wet and hot box and the programmable power supply according to test requirements so as to adjust the simulation environment and the power supply voltage and controlling the tester to carry out the communication performance test on the switch to be tested in the simulation environment and under the power supply voltage.
In addition, the automatic switch testing device according to the above embodiment of the present invention may further have the following additional technical features:
according to an embodiment of the present invention, the test host is specifically configured to send a test instruction to the tester, receive an analysis result fed back by the tester, and calculate a test result according to the analysis result;
the tester is specifically configured to send and receive data to and from the switch to be tested in response to the test instruction, analyze the sent and received data to obtain the analysis result, and send the analysis result to the test host.
According to one embodiment of the invention, the tester is connected with the equipment to be tested through a network cable, and the test host is connected with the high-low temperature alternating wet-heat box, the programmable power supply and the tester through a serial port cable or a network cable.
According to one embodiment of the invention, the tester is an IXIA XM12 network tester from IXIA usa or a SmartBits 6000 network tester from semborn communication corporation.
In a second aspect, an automated testing method for a switch according to an embodiment of the present invention includes:
the testing host machine issues a first power supply instruction to the programmable power supply to control the programmable power supply to work so as to provide a first power supply voltage for supplying power to the switch to be tested;
the test host controls the high-low temperature alternating wet heat box to work by issuing a first environment control instruction to the high-low temperature alternating wet heat box so as to provide a first simulation environment;
under the first power supply voltage and the first simulation environment, the test host sends a first test instruction to the tester so as to control the data receiving and sending between the tester and the switch to be tested and test the communication performance of the switch to be tested.
According to an embodiment of the invention, before the testing host controls the operation of the high-low temperature alternating wet and hot box through the first environment control command, the testing host further includes:
the testing host machine issues a first detection instruction to the switch to be tested, the switch to be tested sends first feedback information to the testing host machine after responding to the first detection instruction, the testing host machine judges whether the switch to be tested is started normally according to the first feedback information, and if the switch to be tested is started normally, the subsequent steps are continued.
According to an embodiment of the present invention, before the testing host controls the high-low temperature alternating wet heat box to work by issuing the first environment control instruction, the method further includes:
and the test host sends a second test instruction to the tester to control the data transceiving between the tester and the switch to be tested, judges whether the transceiving data is normal or not, and continues the subsequent steps if the transceiving data is normal.
According to an embodiment of the present invention, further comprising:
the testing host machine issues a first power-on/power-off instruction to the programmable power supply, and the programmable power supply is controlled to carry out at least one power-on/power-off test on the switch to be tested;
the test host machine issues a second detection instruction to the switch to be tested, the switch to be tested sends second feedback information to the test host machine after responding to the second detection instruction, the test host machine judges whether the switch to be tested is started normally according to the second feedback information, and if the switch to be tested is started normally, the subsequent steps are continued;
the test host machine issues a second power supply instruction to the programmable power supply to control the programmable power supply to work so as to provide a second power supply voltage for supplying power to the switch to be tested, wherein the voltage values of the first power supply voltage and the second power supply voltage are different;
and under the second power supply voltage and the first simulation environment, the test host sends a third test instruction to the tester so as to control the data receiving and sending between the tester and the switch to be tested and test the communication performance of the switch to be tested.
According to an embodiment of the present invention, further comprising:
the test host controls the high-low temperature alternating wet heat box to stop by issuing a second environment control instruction to the high-low temperature alternating wet heat box so as to recover to a normal environment;
the testing host machine issues a second power-on/power-off instruction to the programmable power supply, and the programmable power supply is controlled to carry out at least one power-on/power-off test on the switch to be tested;
the test host machine issues a third detection instruction to the switch to be tested, the switch to be tested sends third feedback information to the test host machine after responding to the third detection instruction, the test host machine judges whether the switch to be tested is started normally according to the third feedback information, and if the switch to be tested is started normally, the subsequent steps are continued;
the testing host machine issues a third power supply instruction to the programmable power supply to control the programmable power supply to work so as to supply power to the switch to be tested at normal pressure;
under normal pressure and normal state environment, the test host sends a fourth test instruction to the tester to control the data transceiving between the tester and the switch to be tested and judge whether the transceiving data is normal or not;
and the test host machine issues a fourth power supply instruction to the programmable power supply to control the programmable power supply to stop supplying power.
According to the automatic testing device and the testing method for the switch, provided by the embodiment of the invention, the testing host machine respectively controls the high-low temperature alternating wet and hot box and the programmable power supply according to the testing requirements so as to adjust the simulation environment and the power supply voltage, and controls the tester to test the communication performance of the switch to be tested in the simulation environment and under the power supply voltage, so that the environment can be accurately simulated, the automatic testing is realized, the manual operation testing is not needed, the testing efficiency is high, and the cost is low.
Drawings
FIG. 1 is a schematic structural diagram of an automated testing apparatus for a switch according to an embodiment of the present invention;
fig. 2 is a flowchart of an automated testing method for a switch according to an embodiment of the present invention.
The implementation, functional features and advantages of the objects of the present invention will be further explained with reference to the accompanying drawings.
Detailed Description
Reference will now be made in detail to embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein like or similar reference numerals refer to the same or similar elements or elements having the same or similar function throughout. The embodiments described below with reference to the drawings are illustrative and intended to be illustrative of the invention and are not to be construed as limiting the invention.
In the description of the present invention, it is to be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", and the like, indicate orientations and positional relationships based on those shown in the drawings, and are used only for convenience of description and simplicity of description, and do not indicate or imply that the device or element being referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus, should not be considered as limiting the present invention.
Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of the present invention, "a plurality" means two or more unless specifically defined otherwise.
In the present invention, unless otherwise expressly specified or limited, the terms "mounted," "connected," "secured," and the like are to be construed broadly and can, for example, be fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meanings of the above terms in the present invention can be understood by those skilled in the art according to specific situations.
Referring to fig. 1, an embodiment of the present invention provides an automatic switch testing apparatus, which can simulate various working environments, and perform a test on communication performance of a switch in the working environments, so as to verify and evaluate performance of the switch under an environment condition in which the switch is actually used. The test device includes: the system comprises a switch to be tested 10, a high-low temperature alternating wet heat box 20, a programmable power supply 30, a tester 40 and a test host 50.
Specifically, high low temperature alternation humid heat case 20 is used for providing the simulated environment of switch 10 that awaits measuring, switch 10 that awaits measuring set up in high low temperature alternation humid heat case 20. The high-low temperature alternating wet heat box 20 is also called an environment testing machine, can accurately simulate complex natural state environments such as low temperature, high temperature and high humidity, low temperature and low humidity and the like, and is suitable for testing products such as electronics, electric appliances, batteries and the like. Has RS-232 or RS-485 communication interface, and can design programs on the computer, monitor the test process and execute the functions of automatic power on and power off, etc.
The tester 40 is connected to the switch under test 10, and is used for testing the communication performance of the switch under test 10.
The test host 50 is connected to the high-low temperature alternating wet and hot box 20, the programmable power supply 30 and the tester 40, and is configured to control the high-low temperature alternating wet and hot box 20 and the programmable power supply 30 respectively according to test requirements to adjust the simulation environment and the power supply voltage, and control the tester 40 to perform the communication performance test on the switch 10 to be tested in the simulation environment and under the power supply voltage.
The test host 50 is generally a computer installed with automatic test script software, and controls the tester 40 to perform a test through the test script software. The test requirements are different test items and specific test processes which are set by test developers according to different factors such as working environments and the like possibly faced by the switch in practical application, for example, the simulation environment in the test items can be set to be low temperature or high temperature, and the power supply voltage is set to be low voltage, high voltage or normal voltage and the like.
In other words, on one hand, the test host 50 can control the high-low temperature alternating wet and hot box 20 and the programmable power supply 30, adjust parameters such as temperature and humidity of the high-low temperature alternating wet and hot box 20, and adjust parameters such as output voltage of the programmable power supply 30, so that the switch 10 to be tested operates in a simulation environment meeting the test requirements and is powered by the required power supply voltage. On the other hand, the test host 50 controls the tester 40 to execute a test process, and performs a communication performance test on the switch under test 10 under the above-mentioned simulated environment and the supply voltage.
More specifically, the test host 50 is specifically configured to send a test instruction to the tester 40, receive an analysis result fed back by the tester 40, and calculate a test result according to the analysis result.
The tester 40 is specifically configured to transmit and receive data to and from the switch to be tested 10 according to the test instruction, analyze the transmitted and received data to obtain the analysis result, and then send the analysis result to the test host 50.
That is, in a specific test procedure, the test host 50 sends a test instruction to the tester 40; the tester 40 receives and transmits data with the switch to be tested 10 corresponding to the test instruction, analyzes the received and transmitted data to obtain the analysis result, and then transmits the analysis result to the test host 50; the test host 50 receives the analysis result fed back by the tester 40, and calculates a test result according to the analysis result.
It is understood that the tester 40 and the switch under test 10 can be connected by network cables, and the test host 50 and the high and low temperature alternating humid heat box 20, the programmable power supply 30 and the tester 40 can be connected by serial cables (such as RS232) or network cables.
The tester 40 may be an IXIA XM12 network tester from IXIA, usa or a SmartBits 6000 network tester from semblanc communications, usa.
According to the automatic testing device for the switch, provided by the embodiment of the invention, the testing host 50 respectively controls the high-low temperature alternating wet and hot box 20 and the programmable power supply 30 according to the testing requirements to adjust the simulation environment and the power supply voltage, and controls the tester 40 to test the communication performance of the switch 10 to be tested in the simulation environment and under the power supply voltage, so that the environment can be accurately simulated, the automatic testing is realized, the manual operation testing is not needed, the testing efficiency is high, and the cost is low.
Referring to fig. 2, an embodiment of the present invention provides an automatic testing method for a switch, including the following steps:
s101, the test host 50 issues a first power supply instruction to the programmable power supply 30 to control the programmable power supply 30 to work so as to provide a first power supply voltage for supplying power to the switch 10 to be tested.
S102, the test host 50 controls the high-low temperature alternating wet heat box 20 to work by issuing a first environment control instruction to the high-low temperature alternating wet heat box 20 so as to provide a first simulation environment.
That is, in steps S101 and S102, the testing host 50 respectively controls the programmable power supply 30 and the high-low temperature alternating humid heat box 20 to operate according to the testing requirement, so that the switch 10 to be tested is in the first simulation environment and operates under the first supply voltage. For example, taking an exchange to be tested powered by ac as an example, when the communication performance of the exchange to be tested 10 in a low-temperature environment needs to be tested when the low voltage is used as a power supply voltage, the first power supply voltage output by the programmable power supply 30 is a low voltage of about 90V ac, and the high-low temperature alternating wet heat box 20 is cooled to control the temperature in a low-temperature range of about 10 ℃ below zero.
S103, under the first power supply voltage and the first simulation environment, the test host 50 sends a first test command to the tester 40 to control the tester 40 and the switch 10 to be tested to receive and send data, so as to perform a communication performance test on the switch 10 to be tested.
In an embodiment of the present invention, before the testing host 50 controls the high-low temperature alternating wet and hot box 20 to operate through the first environment control command, the method further includes:
the test host 50 issues a first detection instruction to the switch 10 to be tested, the switch 10 to be tested sends first feedback information to the test host 50 after responding to the first detection instruction, the test host 50 judges whether the switch 10 to be tested is started normally according to the first feedback information, and if the switch 10 to be tested is started normally, the subsequent steps are continued.
That is to say, before the testing host 50 controls the operation of the high-low temperature alternating wet and hot box 20, the testing host 50 sends a first detection instruction to the switch 10 to be tested to detect whether the switch 10 to be tested is normally started, and only when the switch 10 to be tested is normally started, the subsequent steps are continued, so that the influence on the test due to abnormal starting of the switch 10 to be tested can be avoided.
It should be noted that, whether the switch 10 to be tested is normally started or not may be determined according to whether the test host 50 receives the first feedback information or not.
In an embodiment of the present invention, before the testing host 50 controls the high-low temperature alternating wet and hot box 20 to operate by issuing the first environment control command to the high-low temperature alternating wet and hot box 20, the method further includes:
the test host 50 sends a second test instruction to the tester 40 to control the data transmission and reception between the tester 40 and the switch 10 to be tested, and determines whether the data transmission and reception is normal, if so, the subsequent steps are continued.
That is to say, before the test host 50 controls the operation of the high-low temperature alternating wet heat box 20, the test host 50 sends a second test instruction to the tester 40 to detect whether the data transceiving between the tester 40 and the switch to be tested 10 is normal, and only when the data transceiving between the tester 40 and the switch to be tested 10 is normal, the subsequent steps are continued, so that the switch to be tested 10 can be ensured to be in normal communication, and the problems of test failure and the like caused by communication faults of the switch to be tested 10 are avoided.
In one embodiment of the present invention, further comprising:
the test host 50 issues a first power-up/down command to the programmable power supply 30, and controls the programmable power supply 30 to perform at least one power-up/down test on the switch 10 to be tested.
The test host 50 issues a second detection instruction to the switch 10 to be tested, the switch 10 to be tested sends second feedback information to the test host 50 after responding to the second detection instruction, the test host 50 judges whether the switch 10 to be tested is started normally according to the second feedback information, and if the switch 10 to be tested is started normally, the subsequent steps are continued.
The test host 50 issues a second power supply instruction to the programmable power supply 30 to control the programmable power supply 30 to operate, so as to provide a second power supply voltage to supply power to the switch 10 to be tested, where the voltage values of the first power supply voltage and the second power supply voltage are different, for example, if it is necessary to further test the communication performance in a low-temperature environment when a high voltage is used as the power supply voltage, the second power supply voltage is a high voltage around 264V.
Under the second power supply voltage and the first simulation environment, the test host 50 sends a third test instruction to the tester 40 to control the data transmission and reception between the tester 40 and the switch to be tested 10 so as to test the communication performance of the switch to be tested 10.
That is, after the test under the first power supply voltage is completed, the test host 50 controls the programmable power supply 30 to power on and power off the switch 10 to be tested, and then detects the powered-on switch 10 to be tested to detect whether the switch 10 to be tested is normally started. After the normal start-up, the programmable power supply 30 is further controlled to adjust the supply voltage to adjust the first supply voltage to the second supply voltage. Finally, the tester 40 is controlled to perform a communication performance test on the switch 10 to be tested under the second power supply voltage, so as to complete the test under the second power supply voltage. Therefore, the switch 10 to be tested can be tested for communication performance under different power supply voltages in the same simulation environment.
In one embodiment of the present invention, further comprising:
the test host 50 issues a second environment control instruction to the high-low temperature alternating wet and hot box 20 to control the high-low temperature alternating wet and hot box 20 to stop so as to recover to a normal environment, where the normal environment is the environment where the high-low temperature alternating wet and hot box 20 is in the non-operating state.
The test host 50 issues a second power-on/power-off command to the programmable power supply 30, and controls the programmable power supply 30 to perform at least one power-on/power-off test on the switch 10 to be tested.
The test host 50 issues a third detection instruction to the switch 10 to be tested, the switch 10 to be tested sends third feedback information to the test host 50 after responding to the third detection instruction, the test host 50 judges whether the switch 10 to be tested is started normally according to the third feedback information, and if the switch 10 to be tested is started normally, the subsequent steps are continued.
The test host 50 issues a third power supply instruction to the programmable power supply 30 to control the programmable power supply 30 to operate, so as to provide a normal voltage to supply power to the switch 10 to be tested, where the normal voltage refers to ac 220V or dc 48V.
Under normal pressure and normal state, the test host 50 sends a fourth test instruction to the tester 40 to control the tester 40 and the switch 10 to be tested to receive and transmit data, and determine whether the received and transmitted data are normal.
The test host 50 issues a fourth power supply instruction to the programmable power supply 30 to control the programmable power supply 30 to stop supplying power.
That is to say, after the test under the second power supply voltage is completed, the test host 50 controls the high-low temperature alternating wet and hot box 20 to make the switch 10 to be tested in a normal environment, controls the programmable power supply 30 to perform the power-on and power-off operations on the switch 10 to be tested, and then detects the powered-on switch 10 to be tested to detect whether the switch 10 to be tested is normally started. After the normal start, the programmable power supply 30 is further controlled to adjust the supply voltage, so as to adjust the supply voltage to the normal voltage. Then, whether data transmission and reception between the tester 40 and the switch to be tested 10 are normal is detected under the normal pressure, if so, the switch to be tested 10 can normally communicate in the previous testing process, and the problems of inaccurate testing result and the like caused by communication faults of the switch to be tested 10 are avoided.
According to the automatic testing method for the switch, provided by the embodiment of the invention, the testing host 50 respectively controls the high-low temperature alternating wet and hot box 20 and the programmable power supply 30 according to the testing requirements to adjust the simulation environment and the power supply voltage, and controls the tester 40 to test the communication performance of the switch 10 to be tested in the simulation environment and under the power supply voltage, so that the environment can be accurately simulated, the automatic testing is realized, the manual operation testing is not needed, the testing efficiency is high, and the cost is low.
In the description herein, references to the description of the term "one embodiment," "some embodiments," "an example," "a specific example," or "some examples," etc., mean that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the invention. In this specification, the schematic representations of the terms used above do not necessarily refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.
Although embodiments of the present invention have been shown and described above, it is understood that the above embodiments are exemplary and should not be construed as limiting the present invention, and that variations, modifications, substitutions and alterations can be made in the above embodiments by those of ordinary skill in the art without departing from the principle and spirit of the present invention.
Claims (2)
1. An automatic testing method for a switch is characterized by comprising the following steps:
the testing host machine issues a first power supply instruction to the programmable power supply to control the programmable power supply to work so as to provide a first power supply voltage for supplying power to the switch to be tested;
the test host controls the high-low temperature alternating wet heat box to work by issuing a first environment control instruction to the high-low temperature alternating wet heat box so as to provide a first simulation environment;
under the first power supply voltage and the first simulation environment, the test host sends a first test instruction to the tester so as to control the data transmission and reception between the tester and the switch to be tested and test the communication performance of the switch to be tested;
further comprising:
the testing host machine issues a first power-on/power-off instruction to the programmable power supply, and the programmable power supply is controlled to carry out at least one power-on/power-off test on the switch to be tested;
the test host machine issues a second detection instruction to the switch to be tested, the switch to be tested sends second feedback information to the test host machine after responding to the second detection instruction, the test host machine judges whether the switch to be tested is started normally according to the second feedback information, and if the switch to be tested is started normally, the subsequent steps are continued;
the test host machine issues a second power supply instruction to the programmable power supply to control the programmable power supply to work so as to provide a second power supply voltage for supplying power to the switch to be tested, wherein the voltage values of the first power supply voltage and the second power supply voltage are different;
under the second power supply voltage and the first simulation environment, the test host sends a third test instruction to the tester so as to control the data receiving and sending between the tester and the switch to be tested and test the communication performance of the switch to be tested;
before the test host computer passes through first environment control instruction high low temperature alternation wet heat case control high low temperature alternation wet heat case work, still include:
the testing host machine issues a first detection instruction to the switch to be tested, the switch to be tested sends first feedback information to the testing host machine after responding to the first detection instruction, the testing host machine judges whether the switch to be tested is started normally according to the first feedback information, and if the switch to be tested is started normally, the subsequent steps are continued;
before the test host computer controls the high-low temperature alternating wet heat box to work by issuing a first environment control instruction, the method further comprises the following steps:
and the test host sends a second test instruction to the tester to control the data transceiving between the tester and the switch to be tested, judges whether the transceiving data is normal or not, and continues the subsequent steps if the transceiving data is normal.
2. The method for automated testing of switches of claim 1, further comprising:
the test host controls the high-low temperature alternating wet heat box to stop by issuing a second environment control instruction to the high-low temperature alternating wet heat box so as to recover to a normal environment;
the testing host machine issues a second power-on/power-off instruction to the programmable power supply, and the programmable power supply is controlled to carry out at least one power-on/power-off test on the switch to be tested;
the test host machine issues a third detection instruction to the switch to be tested, the switch to be tested sends third feedback information to the test host machine after responding to the third detection instruction, the test host machine judges whether the switch to be tested is started normally according to the third feedback information, and if the switch to be tested is started normally, the subsequent steps are continued;
the testing host machine issues a third power supply instruction to the programmable power supply to control the programmable power supply to work so as to supply power to the switch to be tested at normal pressure;
under normal pressure and normal state environment, the test host sends a fourth test instruction to the tester to control the data transceiving between the tester and the switch to be tested and judge whether the transceiving data is normal or not;
and the test host machine issues a fourth power supply instruction to the programmable power supply to control the programmable power supply to stop supplying power.
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| CN201611186075.9A CN106789423B (en) | 2016-12-20 | 2016-12-20 | Automatic testing device and method for switch |
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