CN113433479B - Programmable power supply test system, simulation method, device, storage medium and terminal - Google Patents
Programmable power supply test system, simulation method, device, storage medium and terminal Download PDFInfo
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- CN113433479B CN113433479B CN202110672574.3A CN202110672574A CN113433479B CN 113433479 B CN113433479 B CN 113433479B CN 202110672574 A CN202110672574 A CN 202110672574A CN 113433479 B CN113433479 B CN 113433479B
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Abstract
The invention discloses a programmable power supply testing system, a simulation method, a simulation device, a storage medium and a terminal, wherein the relation between time information and voltage information when a power supply to be tested executes various power supply instructions is simulated by programming so as to replace the traditional method of realizing power supply simulation by adopting external hardware, so that the circuit design period is greatly shortened, and the testing efficiency is effectively improved; the voltage precision of the power supply simulated by programming is high, and the actual test condition of the power supply to be tested is better met; the voltage adjustable range of the simulated power supply is large, and the requirements of various power supply instructions are met; the method can be realized by programming aiming at different power supplies to be tested, and has wide application range and good flexibility.
Description
Technical Field
The invention relates to the technical field of power supply testing, in particular to a programmable power supply testing system, a simulation method, a simulation device, a storage medium and a terminal.
Background
The power supply is the core of the circuitry, which is related to whether the device is functioning properly. Due to the difference of semiconductor materials and design circuits, the rising slope and the falling slope of the power supply voltage of different power supply products are changeable, and the phenomenon that the voltage of different circuits shakes in a certain interval possibly exists due to design defects. The stability requirements of the norflash, nandflash and spi nandflash on the power supply and the power supply of the memory device are extremely high, for example, voltages of Toshiba and magnesium light, which are regulated to be critical values of 2.5V (normal power supply voltage is 2.7-3.3V) in nandflash and spi nandflash, cannot jitter, or internal voltage time sequence disorder or firmware loading abnormity is caused. Due to design defects, when the voltage drop of some norflash chips cannot reach 0v within a certain time, the internal circuit is also disordered in time sequence, and irretrievable physical damage is caused to the chips. Therefore, the simulation of various voltages of the power supply is very important, whether the chip has defects or not can be effectively detected through the power supply simulation, the power-on time sequence requirement is regulated in advance, and the uncontrollable risk is reduced. Secondly, through voltage simulation, the environment that the client end fails due to power supply factors can be manufactured, the problem can be quickly positioned, and the problem solving period is greatly shortened.
The existing POWER supply simulation is generally realized through external hardware, for example, through a design circuit, the existing design circuit generally consists of hardware modules such as an MCU, a DC POWER, a sine wave generating circuit, an amplifier, a comparator and an adjustable resistor, and the defects are obvious: 1. the circuit design cycle is long, resulting in low test efficiency. 2. The voltage precision of the simulated power supply is low. 3. The voltage adjustable range of the simulated power supply is small. 4. The applicability and the flexibility are poor, and one circuit needs to be designed for each power supply to be tested.
Therefore, the prior art still needs to be improved and developed.
Disclosure of Invention
The invention aims to provide a programmable power supply testing system, a simulation method, a simulation device, a storage medium and a terminal, and aims to solve one or more problems in the prior art.
The technical scheme of the invention is as follows: this technical scheme provides a programmable power supply test system, includes:
the Programmable power module is used for programming simulation of the power supply to be tested to obtain the relationship between time information and voltage information when the power supply to be tested executes various instructions;
the program testing module Plan finds the relation between the time information and the voltage information when the power supply to be tested executes the test instruction according to the test instruction, and supplies power to the product needing power supply according to the relation between the time information and the voltage information to obtain a test result;
the Pattern program module Pattern program outputs a test result;
and the Device definition file is used for defining the pin connection relationship between the product to be powered and the programmable power supply test system.
Further, the programmable power supply test system is realized by adopting an Integrated Circuit (IC) tester.
The technical scheme also provides a programmable power supply simulation method, which specifically comprises the following steps:
acquiring an analog signal when a power supply to be tested executes a certain power supply instruction;
converting the analog signal to a digital signal;
the analog signal is divided into a plurality of sections to obtain the voltage information of each section of analog signal, and the time information corresponding to the voltage information of each section of analog signal is found in the digital signal according to the corresponding relation between the analog signal and the digital signal;
setting a plurality of arrays, wherein the number of the arrays is consistent with the number of segments of the segmentation of the analog signals;
putting the time information and the voltage information corresponding to each section of analog signal into a corresponding array;
and programming according to the time information and the voltage information in each array, and simulating a digital waveform diagram when the power supply to be tested executes the power supply instruction.
And further, acquiring an analog signal of the power supply to be tested when the power supply to be tested executes a certain power supply instruction through an oscilloscope.
Further, the analog signal and the digital signal are both stored in a CSV file format.
Further, the analog signal is divided into a plurality of segments to obtain voltage information of each segment of analog signal, and time information corresponding to the voltage information of each segment of analog signal is found in the digital signal according to a corresponding relationship between the analog signal and the digital signal, and the specific process is as follows: dividing the analog signal into a plurality of sections, wherein a rising step or a falling step of a voltage value exists between two adjacent sections of analog signals, the voltage information of the first section of analog signal is the voltage value of the power supply to be tested before executing the power supply instruction, and the voltage information of each section of analog signal is the voltage information of the previous section of analog signal plus the voltage value of the rising step or the falling step, so that the voltage information of the next section of analog signal is obtained; and after voltage information of all the sections of analog signals is obtained, time information corresponding to the voltage information of each section of analog signal is found in the digital signals according to the corresponding relation between the analog signals and the digital signals.
Further, the formula of the rising or falling step voltage value is as follows: VCC/N, VCC is the difference between the voltage value that needs to be reached when the power supply to be tested executes the current power supply instruction and the voltage value that needs to be reached when the power supply to be tested executes the last power supply instruction, and N is the segment number of the segmentation of the analog signal.
The technical scheme also provides a programmable power supply simulation device, which specifically comprises the following steps:
the analog signal acquisition module acquires an analog signal when the power supply to be tested executes a certain power supply instruction;
the analog-to-digital conversion module is used for converting the analog signal into a digital signal;
the voltage information and time information acquisition module is used for segmenting the analog signal into a plurality of segments to obtain the voltage information of each segment of analog signal, and finding the time information corresponding to the voltage information of each segment of analog signal in the digital signal according to the corresponding relation between the analog signal and the digital signal;
the array module is provided with a plurality of arrays, and the number of the arrays is consistent with the number of segments for segmenting the analog signals;
the information input module is used for inputting the time information and the voltage information corresponding to each section of analog signal into a corresponding array;
and the analog module is programmed according to the time information and the voltage information in each array and simulates a digital oscillogram when the power supply to be tested executes the power supply instruction.
The present invention also provides a storage medium, in which a computer program is stored, and when the computer program runs on a computer, the computer is caused to execute any one of the methods described above.
The technical solution also provides a terminal, which includes a processor and a memory, wherein the memory stores a computer program, and the processor is used for executing any one of the methods by calling the computer program stored in the memory.
According to the technical scheme, the relation between the time information and the voltage information when the power supply to be tested executes various power supply instructions is simulated by programming, so that the traditional method that external hardware is adopted to realize power supply simulation is replaced, the circuit design period is greatly shortened, and the test efficiency is effectively improved; the voltage precision of the power supply simulated by programming is high, and the actual test condition of the power supply to be tested is better met; the voltage adjustable range of the simulated power supply is large, and the requirements of various power supply instructions are met; the method can be realized by programming aiming at different power supplies to be tested, and has wide application range and good flexibility.
Drawings
FIG. 1 is a schematic diagram of a programmable power test system according to the present invention.
FIG. 2 is a flow chart of the steps of the programmable power supply simulation method of the present invention.
FIG. 3 is a schematic diagram of capturing an analog signal by an oscilloscope in accordance with the present invention.
Fig. 4 is a CSV format file open interface of an analog signal in the present invention.
FIG. 5 is a digital waveform diagram of the power supply under test executing a power command according to the present invention.
FIG. 6 is a schematic diagram of a programmable power supply emulation device of the present invention.
Fig. 7 is a schematic diagram of a terminal in the present invention.
Detailed Description
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all of the embodiments. The components of the embodiments of the present application, as generally described and illustrated in the figures herein, could be arranged and designed in a wide variety of different configurations. Thus, the following detailed description of the embodiments of the present application, presented in the accompanying drawings, is not intended to limit the scope of the claimed application, but is merely representative of selected embodiments of the application. All other embodiments, which can be derived by a person skilled in the art from the embodiments of the present application without making any creative effort, shall fall within the protection scope of the present application.
It should be noted that: like reference numbers and letters refer to like items in the following figures, and thus, once an item is defined in one figure, it need not be further defined and explained in subsequent figures. Meanwhile, in the description of the present application, the terms "first", "second", and the like are used only for distinguishing the description, and are not construed as indicating or implying relative importance.
As shown in fig. 1, a programmable power supply test system includes:
the Programmable power supply module is used for programming simulation of the power supply to be tested to obtain the relationship between time information and voltage information when the power supply to be tested executes various instructions;
the program testing module Plan finds the relation between the time information and the voltage information when the power supply to be tested executes the test instruction according to the test instruction, and supplies power to the product to be powered according to the relation between the time information and the voltage information to obtain a test result;
a Pattern program module Pattern program outputs a test result;
and the Device definition file is used for defining the pin connection relationship between the product to be powered and the programmable power supply module.
In this embodiment, the programmable power supply test system is implemented by using an integrated circuit IC tester to perform programming simulation on a power supply to be tested.
In the Plan program of the test program module, a user writes a program with a test function, sets test conditions, executes parameter tests and function tests through the program, and controls the whole test sequence.
The Pattern program module Pattern program uses an original Pattern language to describe Pattern data, for example, an oscilloscope is used to output a test result.
Wherein, the Device definition file defines how each DUT (diode transistor logic) pin is used in the test, and defines the corresponding relation between the DUT pin number and the Programmable power module's Programmable pin name and pin group name; the test program module Plan program can use these names to define a device definition file.
As shown in fig. 2, a programmable power supply simulation method specifically includes the following steps:
s1: and acquiring an analog signal when the power supply to be tested executes a certain power supply instruction.
The analog signal of the power supply to be tested when executing various instructions may be captured by an oscilloscope (as shown in fig. 3) and stored in a CSV format, where the CSV format may store waveform data of a current channel of the oscilloscope.
The data in the CSV format can be opened by Excel, access or a text file. FIG. 4 is the interface after opening a CSV file with Excel.
S2: the analog signal is converted to a digital signal.
The CSV-format analog signal (the CSV-format analog signal comprises time information and voltage information of the power supply to be tested) is converted into the CSV-format digital signal, and the CSV-format digital signal can accurately display the relation between time and voltage when the power supply to be tested executes various instructions.
S3: and dividing the analog signal into a plurality of sections to obtain the voltage information of each section of analog signal, and finding the time information corresponding to the voltage information of each section of analog signal in the digital signal according to the corresponding relation between the analog signal and the digital signal.
The power supply to be tested can execute various power supply instructions and can be actually summarized into the power-on and power-off processes of the power supply to be tested.
The analog signals are divided into N sections, rising or falling steps of a voltage value exist between two adjacent sections of analog signals, the voltage value of each rising or falling step is equal to VCC/N, and VCC is the difference value between the voltage value which needs to be reached when the power supply to be tested executes the current power supply instruction and the voltage value which needs to be reached when the power supply to be tested executes the last power supply instruction. Assuming that the voltage information corresponding to the previous section of analog signal is V1, and the voltage information corresponding to the next section of analog signal is V1+ VCC/N; and then according to the corresponding relation between the analog signals and the digital signals, finding time information corresponding to the voltage information of each section of analog signals in the digital signals.
N can be set according to requirements, and the larger N is, the closer the obtained digital signal waveform is to the actual upper and lower electrical waveforms of the analog signal.
S4: and setting a plurality of arrays, wherein the number of the arrays is consistent with the number of segments for segmenting the analog signals.
S5: and putting the time information and the voltage information corresponding to each section of analog signal into a corresponding array.
And defining N arrays, and putting the time information and the voltage information corresponding to each section of analog signal into the corresponding array.
S6: and programming according to the time information and the voltage information in each array, and simulating a digital waveform diagram of the power supply to be tested when the power supply to be tested executes the power supply instruction, as shown in fig. 5.
And during programming, the step of power-on/power-off is divided into N steps, the voltage rise or drop value of each step is VCC/N, and the waiting time is the waiting time of the current step minus the waiting time of the previous step.
Therefore, the digital oscillogram of the power supply to be tested when executing various power supply instructions is simulated.
During testing, the Plan program module Plan supplies power to the product needing power supply according to the simulated digital oscillogram according to the test instruction, and a test result is obtained.
As shown in fig. 6, a programmable power supply simulation apparatus includes:
the analog signal acquisition module 101 is used for acquiring an analog signal when the power supply to be tested executes a certain power supply instruction;
an analog-to-digital conversion module 102, which converts the analog signal into a digital signal;
the voltage information and time information obtaining module 103 is configured to segment the analog signal into a plurality of segments to obtain voltage information of each segment of the analog signal, and find time information corresponding to the voltage information of each segment of the analog signal in the digital signal according to a corresponding relationship between the analog signal and the digital signal;
the array module 104 is provided with a plurality of arrays, and the number of the arrays is consistent with the number of segments of the segmentation of the analog signals;
an information input module 105, which is used for inputting the time information and the voltage information corresponding to each section of analog signal into a corresponding array;
the simulation module 106 is programmed according to the time information and the voltage information in each array and simulates a digital oscillogram when the power supply to be tested executes the power supply instruction
Referring to fig. 7, an embodiment of the present invention further provides a terminal. As shown, the terminal 300 includes a processor 301 and a memory 302. The processor 301 is electrically connected to the memory 302. The processor 301 is a control center of the terminal 300, connects various parts of the entire terminal using various interfaces and lines, and performs various functions of the terminal and processes data by running or calling a computer program stored in the memory 302 and calling data stored in the memory 302, thereby performing overall monitoring of the terminal 300.
In this embodiment, the processor 301 in the terminal 300 loads instructions corresponding to one or more processes of the computer program into the memory 302 according to the following steps, and the processor 301 runs the computer program stored in the memory 302, so as to implement various functions: acquiring an analog signal when a power supply to be tested executes a certain power supply instruction; converting the analog signal to a digital signal; the analog signal is divided into a plurality of sections to obtain the voltage information of each section of analog signal, and the time information corresponding to the voltage information of each section of analog signal is found in the digital signal according to the corresponding relation between the analog signal and the digital signal; setting a plurality of arrays, wherein the number of the arrays is consistent with the number of segments for segmenting the analog signal; putting the time information and the voltage information corresponding to each section of analog signal into a corresponding array; and programming according to the time information and the voltage information in each array, and simulating a digital waveform diagram when the power supply to be tested executes the power supply instruction.
Memory 302 may be used to store computer programs and data. The memory 302 stores computer programs containing instructions executable in the processor. The computer program may constitute various functional modules. The processor 301 executes various functional applications and data processing by calling a computer program stored in the memory 302.
An embodiment of the present application provides a storage medium, and when being executed by a processor, the computer program performs a method in any optional implementation manner of the foregoing embodiment to implement the following functions: acquiring an analog signal when a power supply to be tested executes a certain power supply instruction; converting the analog signal to a digital signal; the analog signal is divided into a plurality of sections to obtain the voltage information of each section of analog signal, and the time information corresponding to the voltage information of each section of analog signal is found in the digital signal according to the corresponding relation between the analog signal and the digital signal; setting a plurality of arrays, wherein the number of the arrays is consistent with the number of segments of the segmentation of the analog signals; putting the time information and the voltage information corresponding to each section of analog signal into a corresponding array; and programming according to the time information and the voltage information in each array, and simulating a digital oscillogram when the power supply to be tested executes the power supply instruction. The storage medium may be implemented by any type of volatile or nonvolatile storage device or combination thereof, such as a Static Random Access Memory (SRAM), an Electrically Erasable Programmable Read-Only Memory (EEPROM), an Erasable Programmable Read-Only Memory (EPROM), a Programmable Read-Only Memory (PROM), a Read-Only Memory (ROM), a magnetic Memory, a flash Memory, a magnetic disk, or an optical disk.
In the embodiments provided in the present application, it should be understood that the disclosed apparatus and method may be implemented in other ways. The above-described embodiments of the apparatus are merely illustrative, and for example, the division of the units is only one logical division, and there may be other divisions when actually implemented, and for example, a plurality of units or components may be combined or integrated into another system, or some features may be omitted, or not executed. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection of devices or units through some communication interfaces, and may be in an electrical, mechanical or other form.
In addition, units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of the embodiment.
Furthermore, the functional modules in the embodiments of the present application may be integrated together to form an independent part, or each module may exist separately, or two or more modules may be integrated to form an independent part.
In this document, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions.
The above description is only an example of the present application and is not intended to limit the scope of the present application, and various modifications and changes may be made by those skilled in the art. Any modification, equivalent replacement, improvement and the like made within the spirit and principle of the present application shall be included in the protection scope of the present application.
Claims (10)
1. A programmable power supply simulation method is characterized by comprising the following steps:
acquiring an analog signal when a power supply to be tested executes a certain power supply instruction;
converting the analog signal to a digital signal;
the analog signal is divided into a plurality of sections to obtain the voltage information of each section of analog signal, and the time information corresponding to the voltage information of each section of analog signal is found in the digital signal according to the corresponding relation between the analog signal and the digital signal;
setting a plurality of arrays, wherein the number of the arrays is consistent with the number of segments of the segmentation of the analog signals;
putting the time information and the voltage information corresponding to each section of analog signal into a corresponding array;
and programming according to the time information and the voltage information in each array, and simulating a digital waveform diagram when the power supply to be tested executes the power supply instruction.
2. The programmable power supply simulation method of claim 1, wherein the simulation signal of the power supply to be tested when executing a certain power supply instruction is obtained through an oscilloscope.
3. The programmable power supply emulation method of claim 1, wherein both the analog and digital signals are saved in a CSV file format.
4. The programmable power supply simulation method of claim 1, wherein the analog signal is divided into a plurality of segments to obtain voltage information of each segment of the analog signal, and time information corresponding to the voltage information of each segment of the analog signal is found in the digital signal according to a corresponding relationship between the analog signal and the digital signal, and the specific process is as follows: dividing the analog signal into a plurality of sections, wherein a rising step or a falling step of a voltage value exists between two adjacent sections of analog signals, the voltage information of the first section of analog signal is the voltage value of the power supply to be tested before executing the power supply instruction, and the voltage information of each section of analog signal is the voltage information of the previous section of analog signal plus the voltage value of the rising step or the falling step, so that the voltage information of the next section of analog signal is obtained; and after voltage information of all the sections of analog signals is obtained, time information corresponding to the voltage information of each section of analog signal is found in the digital signals according to the corresponding relation between the analog signals and the digital signals.
5. The programmable power supply simulation method of claim 4, wherein the rising or falling step voltage value is formulated as follows: VCC/N, VCC is the difference between the voltage value that needs to reach when the power supply to be measured carries out the present power supply instruction and the voltage value that needs to reach when the power supply to be measured carries out last power supply instruction, N is the number of segments of analog signal segmentation.
6. A programmable power supply test system, comprising:
the Programmable power module is used for programming simulation of the power supply to be tested to obtain the relationship between time information and voltage information when the power supply to be tested executes various instructions;
a test program module Plan, finding the relation between the time information and the voltage information when the power supply to be tested executes the test instruction according to the test instruction, and supplying power to a product to be powered on the basis of a digital oscillogram simulated by the programmable power supply simulation method according to any one of claims 1 to 5 according to the relation between the time information and the voltage information to obtain a test result;
the Pattern program module Pattern program outputs a test result;
and the Device definition file is used for defining the pin connection relationship between the product to be powered and the programmable power supply test system.
7. The programmable power supply test system of claim 6, implemented using an Integrated Circuit (IC) tester.
8. A programmable power supply simulation device is characterized by comprising the following steps:
the analog signal acquisition module is used for acquiring an analog signal when the power supply to be tested executes a certain power supply instruction;
the analog-to-digital conversion module is used for converting the analog signal into a digital signal;
the voltage information and time information acquisition module is used for segmenting the analog signal into a plurality of sections to obtain the voltage information of each section of analog signal, and finding the time information corresponding to the voltage information of each section of analog signal in the digital signal according to the corresponding relation between the analog signal and the digital signal;
the array module is provided with a plurality of arrays, and the number of the arrays is consistent with the number of segments of the segmentation of the analog signals;
the information input module is used for inputting the time information and the voltage information corresponding to each section of analog signal into a corresponding array;
and the analog module is programmed according to the time information and the voltage information in each array and simulates a digital oscillogram when the power supply to be tested executes the power supply instruction.
9. A storage medium having stored thereon a computer program which, when run on a computer, causes the computer to perform the method of any one of claims 1 to 5.
10. A terminal, characterized in that it comprises a processor and a memory, in which a computer program is stored, the processor being adapted to carry out the method of any one of claims 1 to 5 by calling the computer program stored in the memory.
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| JP3992845B2 (en) * | 1998-06-17 | 2007-10-17 | 新潟精密株式会社 | Digital-analog converter |
| CN101931407B (en) * | 2010-08-31 | 2012-11-28 | 西安交通大学 | Transposed analogue-to-digital and digital-to-analogue conversion method capable of accurately recovering signal |
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| CN204832473U (en) * | 2015-07-17 | 2015-12-02 | 江苏辰阳电子有限公司 | Power supply product integration testing system |
| CN106789423B (en) * | 2016-12-20 | 2021-02-26 | 深圳市菲菱科思通信技术股份有限公司 | Automatic testing device and method for switch |
| CN109143111A (en) * | 2017-06-28 | 2019-01-04 | 东软集团股份有限公司 | A kind of power supply changes test method, device and equipment |
| CN108051745A (en) * | 2017-10-19 | 2018-05-18 | 上海科梁信息工程股份有限公司 | Test system, method and the computer readable storage medium of BMS |
| CN109765500A (en) * | 2017-11-08 | 2019-05-17 | 中兴通讯股份有限公司 | A kind of power supply analog machine and power supply analogy method |
| CN108304659B (en) * | 2018-02-05 | 2019-05-24 | 哈尔滨工业大学 | A kind of Switching Power Supply testability analysis system and method based on LabVIEW platform |
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