CN201442215U - Mechanical pre-thinning device used for transmission electron microscopy sample preparation process - Google Patents
Mechanical pre-thinning device used for transmission electron microscopy sample preparation process Download PDFInfo
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- CN201442215U CN201442215U CN2009200127454U CN200920012745U CN201442215U CN 201442215 U CN201442215 U CN 201442215U CN 2009200127454 U CN2009200127454 U CN 2009200127454U CN 200920012745 U CN200920012745 U CN 200920012745U CN 201442215 U CN201442215 U CN 201442215U
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- objective table
- transmission electron
- retainer ring
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Abstract
The utility model relates to a mechanical pre-thinning device used for transmission electron microscopy sample preparation process, which is applied to the grinding of transmission electron microscopy film samples and comprises a stage, a fixed ring, a bearing and a balance weight. The sample is pasted on the bottom of the stage through modified paraffin; the stage can move up and down in the fixed ring; and when grinding, the outside sleeve of the bearing is hand-held, as friction force exists between the fixed ring and the grinding platform of a grinding-polishing machine, the fixed ring is driven by the grinding platform to conduct passive rotation so as to drive the stage and the sample to rotate, thus ensuring that the ground sample with higher parallelism and planeness can be obtained. Meanwhile, the periphery of the bottom of the fixed ring is provided with a liquid guiding groove, on one hand, the grinding material can pass through smoothly to reach the ground sample, on the other hand, the grinding material can be stirred and recovered through the passive rotation, thus reducing the wastage of the grinding material caused by centrifugal action and realizing the grinding with high efficiency and high quality. The device can be also used for the grinding of ordinary metallography samples, and has the characteristics of simple operation, high efficiency, practicability, low cost and the like.
Description
Technical field
The utility model relates to a kind of pre-attenuate device of machinery that is used for the transmission electron microscope sample making course, is specially adapted to the pre-attenuate stage of machinery in the transmission electron microscope sample making course.This device and Ginding process are applicable to the grinding and the polishing of common metallographic specimen too.
Background technology
It is big and evenly and unmanned thin (electron beam is transparent) district for defective that desirable transmission electron microscope film sample requires to have area, preparing such sample will be through the attenuate of multiprogramming, the general first step is the pre-attenuate (grinding) of machinery, just can carry out next step attenuate after requiring to be ground to about 30 μ m at least, so mechanical lapping is one of committed step of transmission electron microscope film sample preparation.
Easy way the thick thin slice of well cutting～0.5mm with on the gluing carrier (such as rubber, metal derby etc.) that is affixed on big plane of rapid hardening; on sand paper or grinding and polishing machine, grind by hand; because all even direction of manual firmly very difficult control is stable; usually (promptly ground do not had partially by one side for mill; and another side is also thicker) or the mill injustice; particularly for the sample that has the specific region to need protection, as hold and badly probably the part that will protect is ground off, success rate reduces greatly.After sample mill was inclined to one side, though very thin by the inclined to one side side of mill, this thin district was got by mechanical lapping, probably has mechanical damage and artificial defect, is not necessarily suited for transmission electron microscope observing.
The unit that has uses simple and easy lapping device sample preparation as shown in Figure 3, sample is pasted on the objective table below, last lower nut can be locked the height with the location sample mutually, on sand paper or grinding and polishing machine, grind then, its grinding effect with stick on metal derby or rubber on the same, also mill is inclined to one side easily, and the depth of parallelism of gained sample and flatness all are difficult to guarantee.In addition, the lower nut bottom periphery is not slotted, and when grinding on the grinding and polishing machine and polishing, abrasive material can than difficult arrival sample, reduce grinding efficiency in the periphery by the lower nut retaining.
Therefore, for a lot of Electronic Speculum workers, not only cheap but also efficient, practical abrasive disk is in demand.
Summary of the invention
The purpose of this utility model is that mill is inclined to one side easily at hand-ground in above-mentioned Electronic Speculum and the metallographic sample preparation process, and the depth of parallelism and flatness all are difficult to guarantee, design the hand-ground dish of a kind of cheapness and highly effective.This abrasive disk both can grind electron microscopic sample also can grind common metallographic samples, both can grind on sand paper by hand, also can be placed on the grinding and polishing machine and grind and polish, and the depth of parallelism of gained sample and flatness are all higher.
A kind of pre-attenuate device of machinery that is used for the transmission electron microscope sample making course described in the utility model, comprise that objective table and objective table are fixed, hand-held device, described objective table periphery disposes retainer ring, bearing and counterweight, counterweight loads on the objective table top by support bar, support bar is connected with the horizontal plane central point of objective table, the bearing encapsulation is in retainer ring top, objective table is nested in retainer ring inside and can moves up and down in the hole of retainer ring, and retainer ring, objective table and bearing inner sleeve can rotate freely together.Its assemble sequence as shown in Figure 1.During use, be pasted on the objective table below by ground sample.
Around below the retainer ring of the described pre-attenuate device of machinery that is used for the transmission electron microscope sample making course, have intake chute.Its effect is to guarantee that abrasive material by playing ablation to arrive sample, plays stirring and recovery effect to abrasive material in addition in rotary course, reduces the centrifugal loss of abrasive material.
The horizontal plane central point of above-mentioned support bar and objective table is for being threaded, but is not limited thereto connected mode, can use the alternate manner that can reach result of use to connect equally.
This using method that is used for the pre-attenuate device of machinery of transmission electron microscope sample making course is:
1) sample is pasted sample to be ground is pasted on the objective table bottom.
2) by said sequence assemble desire ground sample after, place on the grinding plate of grinding and polishing machine and grind, utilize the counterweight pressurization to guarantee that pressurization steadily, utilize the guide effect of retainer ring to guarantee that compression aspect is all the time perpendicular to grinding plate, hand-held bearing outside can rotate to guarantee retainer ring and sample, guarantees the flatness and the depth of parallelism of institute's grind away product by turning effort; Utilize intake chute to guarantee abrasive material, and in its rotary course, abrasive material stirred and promote abrasive material to be evenly distributed and taking back the platform middle part because centrifugal action is thrown to the abrasive material at grinding plate edge smoothly by arriving sample.
The sticking obedient process of described sample is that the modified paraffin that utilizes fusing point to be lower than 100 ℃ is pasted on the objective table bottom to sample to be ground.Utilize the low melting point and the low-intensity of paraffin, can limit in the process of lapping intense mechanical effect, lower process of lapping and introduce the new damage or the degree of defective sample.
Description of drawings
The utility model has accompanying drawing 8 width of cloth,
Fig. 1 is used for the pre-attenuate device installation diagram of machinery of transmission electron microscope sample making course;
Fig. 2 assemble sequence and assembling design sketch;
The simple and easy lapping device of Fig. 3;
Fig. 4 retainer ring;
Fig. 5 objective table;
Fig. 6 support bar;
Fig. 7 counterweight;
Fig. 8 does not have bearing assembling.
Sample in the drawings, 1, objective table, 2, retainer ring, 3, bearing, 4, counterweight, 5, support bar, 6, bearing inner sleeve, 7, intake chute, 8, top nut, 9, lower nut, 10.
The specific embodiment
The pre-attenuate device of the machinery that is used for the transmission electron microscope sample making course to the application is elaborated below with reference to accompanying drawings.But, the material of the component parts of being recorded and narrated in the following embodiment, size, shape etc., if the description that is not particularly limited does not then constitute the restriction to the utility model protection domain, and nothing but simple illustrated example.
A kind of pre-attenuate device of machinery that is used for the transmission electron microscope sample making course, comprise that objective table 1 and objective table are fixed, hand-held device, described objective table periphery disposes retainer ring 2, bearing 3 and counterweight 4, counterweight 4 loads on the objective table top by support bar 5, support bar is connected with objective table 1, bearing 3 encapsulations are in retainer ring 2 tops, be pasted on the objective table below by ground sample, objective table 1 is nested in retainer ring 2 inside and can moves up and down in the hole of retainer ring 2, and retainer ring 2, objective table 1 and bearing inner sleeve 6 can rotate freely together.Have intake chute 7 around the below of retainer ring 2.Described support bar 5 and objective table 1 are for being threaded.
Embodiment 2
For guaranteeing wearability and corrosion resistance, retainer ring is selected martensitic stain less steel 4Cr13 for use, presses Fig. 4 machined earlier, 1020 ℃ of vacuum hardenings then, and 350 ℃ of tempering get final product then.
Objective table and counterweight and counterweight support bar do not have the wearability requirement, select 304 austenitic stainless steels for use, press Fig. 5～Fig. 7 processing and get final product.
According to the size of retainer ring, select common 6008-2RS deep groove ball bearing for use, this bearing bilateral band sealing shroud can prevent that abrasive material and liquid from entering bearing and causing wearing and tearing and corrosion.If consider the rust-preventing characteristic of bearing, can select stainless steel bearing for use, but cost can increase slightly.
After above-mentioned parts is ready to, be a kind of pre-attenuate device of machinery that is used for the transmission electron microscope sample making course described in the utility model by assembling shown in Figure 2.The cost of this abrasive disk single-piece production (comprising fee of material and processing charges) is 350～400 yuans.As producing in batches, cost can further reduce.
Example 1
Utilize abrasive disk described in the utility model to carry out the mechanical lapping of electron microscopic sample, behind mechanical lapping to the 30 μ m, carried out pit again and ground and ion milling, the thin district on the gained sample is big and even.
Example 2
Utilize abrasive disk described in the utility model to prepare metallographic sample, the surface planarity of gained sample is higher.
Need to prove: abrasive disk described in the utility model is when pressing assembled in sequence shown in Figure 1, and when grinding on the grinding and polishing machine, sample rotates in process of lapping.If do not wish the sample rotation, perhaps on sand paper, grind by hand, then running in bearings does not get final product (installation diagram is seen Fig. 8).Also can manual mode pressurize, need take away counterweight and support bar this moment, pushes down the objective table top with finger during grinding and get final product.
Claims (3)
1. pre-attenuate device of machinery that is used for the transmission electron microscope sample making course, comprise that objective table (1) and objective table fix, hand-held device, it is characterized in that: described objective table periphery disposes retainer ring (2), bearing (3) and counterweight (4), counterweight (4) loads on the objective table top by support bar (5), support bar is connected with objective table (1), bearing (3) encapsulation is in retainer ring (2) top, be pasted on the objective table below by ground sample, objective table (1) is nested in retainer ring (2) inside and can moves up and down retainer ring (2) in the hole of retainer ring (2), objective table (1) and bearing inner sleeve (6) can rotate freely together.
2. according to a kind of pre-attenuate device of machinery that is used for the transmission electron microscope sample making course described in the claim 1, it is characterized in that: around the below of retainer ring (2), have intake chute (7).
3. be used for the pre-attenuate device of machinery of transmission electron microscope sample making course according to a kind of described in the claim 1, it is characterized in that: described support bar (5) and objective table (1) are for being threaded.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009200127454U CN201442215U (en) | 2009-04-03 | 2009-04-03 | Mechanical pre-thinning device used for transmission electron microscopy sample preparation process |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009200127454U CN201442215U (en) | 2009-04-03 | 2009-04-03 | Mechanical pre-thinning device used for transmission electron microscopy sample preparation process |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN201442215U true CN201442215U (en) | 2010-04-28 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2009200127454U Expired - Fee Related CN201442215U (en) | 2009-04-03 | 2009-04-03 | Mechanical pre-thinning device used for transmission electron microscopy sample preparation process |
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| CN (1) | CN201442215U (en) |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102519778A (en) * | 2011-12-26 | 2012-06-27 | 北京工业大学 | Device convenient for grinding and polishing transmission electron microscope sample |
| CN103293047A (en) * | 2013-06-28 | 2013-09-11 | 重庆大学 | High-precision method for preparing scanning electron microscope sample |
| CN107121446A (en) * | 2017-04-25 | 2017-09-01 | 大连交通大学 | A kind of Cross-section transmission tem sample mechanical pre-thinning method |
| CN108036984A (en) * | 2017-12-25 | 2018-05-15 | 开封龙宇化工有限公司 | Petrographic microscope thermoplastic resin membrane's sample preparation apparatus and its application method |
| CN108051461A (en) * | 2017-12-07 | 2018-05-18 | 齐鲁工业大学 | A kind of Micro-CT scanning efficiently scans sample stage |
| CN109015157A (en) * | 2018-05-30 | 2018-12-18 | 扬州大学 | For the pre- thinning device of metal sample and the pre- thining method of metal sample |
| CN111257092A (en) * | 2020-04-10 | 2020-06-09 | 昆明理工大学 | Fixing method for polished metal and mineral sheet samples |
| CN113933126A (en) * | 2021-10-15 | 2022-01-14 | 南京理工大学 | Mechanical grinding device for high-precision preparation of metallographic and transmission electron microscope film samples |
-
2009
- 2009-04-03 CN CN2009200127454U patent/CN201442215U/en not_active Expired - Fee Related
Cited By (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102519778A (en) * | 2011-12-26 | 2012-06-27 | 北京工业大学 | Device convenient for grinding and polishing transmission electron microscope sample |
| CN103293047A (en) * | 2013-06-28 | 2013-09-11 | 重庆大学 | High-precision method for preparing scanning electron microscope sample |
| CN103293047B (en) * | 2013-06-28 | 2015-07-01 | 重庆大学 | High-precision method for preparing scanning electron microscope sample |
| CN107121446A (en) * | 2017-04-25 | 2017-09-01 | 大连交通大学 | A kind of Cross-section transmission tem sample mechanical pre-thinning method |
| CN107121446B (en) * | 2017-04-25 | 2019-10-22 | 大连交通大学 | A kind of Cross-section transmission tem sample mechanical pre-thinning method |
| CN108051461A (en) * | 2017-12-07 | 2018-05-18 | 齐鲁工业大学 | A kind of Micro-CT scanning efficiently scans sample stage |
| CN108036984B (en) * | 2017-12-25 | 2023-12-05 | 开封龙宇化工有限公司 | Thermoplastic resin film sample preparation device for polarizing microscope and use method thereof |
| CN108036984A (en) * | 2017-12-25 | 2018-05-15 | 开封龙宇化工有限公司 | Petrographic microscope thermoplastic resin membrane's sample preparation apparatus and its application method |
| CN109015157A (en) * | 2018-05-30 | 2018-12-18 | 扬州大学 | For the pre- thinning device of metal sample and the pre- thining method of metal sample |
| CN109015157B (en) * | 2018-05-30 | 2020-04-10 | 扬州大学 | Pre-thinning device for metal sample and pre-thinning method for metal sample |
| CN111257092A (en) * | 2020-04-10 | 2020-06-09 | 昆明理工大学 | Fixing method for polished metal and mineral sheet samples |
| CN113933126A (en) * | 2021-10-15 | 2022-01-14 | 南京理工大学 | Mechanical grinding device for high-precision preparation of metallographic and transmission electron microscope film samples |
| CN113933126B (en) * | 2021-10-15 | 2024-04-16 | 南京理工大学 | Mechanical grinding device for high-precision preparation of metallographic and transmission electron microscope film samples |
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Legal Events
| Date | Code | Title | Description |
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| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C17 | Cessation of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20100428 Termination date: 20110403 |