CN201409138Y - Test board - Google Patents
Test board Download PDFInfo
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- CN201409138Y CN201409138Y CN2009201081392U CN200920108139U CN201409138Y CN 201409138 Y CN201409138 Y CN 201409138Y CN 2009201081392 U CN2009201081392 U CN 2009201081392U CN 200920108139 U CN200920108139 U CN 200920108139U CN 201409138 Y CN201409138 Y CN 201409138Y
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Abstract
The embodiment of the utility model provides a test board which comprises a first electricity crossed unit of a channel to be tested, used for sending test signals to an automatic strobe multichanneloptical transceiver, and the first electricity crossed unit comprises a first input terminal used for receiving the test signals and a plurality of first output terminals used for being respectively communicated with a plurality of channels in the multichannel optical transceiver; and the test board also comprises a second electricity crossed unit which is used for automatically outputting the test signals output by the channel to be tested to a signal test unit, and comprises a plurality of second input terminals used for being respectively communicated with a plurality of channels in the multichannel optical transceiver and a second output terminal used for being connected with the signal test unit. Automatic switch of channels to be tested is realized by the test board, thereby improving the test efficiency and the data credibility, and also reducing the abrasion to the external interface of the test board and the complexity of the test board.
Description
Technical field
The utility model embodiment relates to measuring technology, particularly a kind of test board.
Background technology
For adapting to communication network to requirements for transmission, can adopt multiple channel optical transceiver spare, reach the purpose that increases the telecommunication transmission system total capacity by the integrated level that increases transmission channel.For example, wavelength division multiplexing (Wavelength Division Multiplexing in optical fiber communication, (Photonic Integrated Device is hereinafter to be referred as PID) the i.e. integrated transmission channel of multichannel different wavelengths of light in single-chip hereinafter to be referred as: the optical integrated device that WDM) uses in the technology.Prior art to multiple channel optical transceiver spare for example the test of PID device be by the PID device is connected on the test board, and build jointly by test instrumentation, test board and PID device that the test macro that forms optical transmission chain tests.
The test board that Fig. 1 provides for prior art is applied to the system architecture diagram of test macro, as shown in Figure 1, in the prior art at the performance test of multiple channel optical transceiver spare, with the PID device is example, be by with test instrumentation pulse signal generator (Pulse Pattern Generator, hereinafter to be referred as: PPG), Error detection unit (Error Detector, hereinafter to be referred as: ED) with test board (TESTBENCH), be connected PID device on this test board and connect into transmission link end to end, and the test signal of test event of the same race is imported one by one the performance test of finishing whole each transmission channel of PID device in each transmission channel of PID device for the test data transmission.PID device among Fig. 1 has N transmission line, comprise wave multiplexer (MUX), channel-splitting filter (DEMUX), laser (Laser), driver (Driver), photodiode (PIN) and data recovery parts functional parts such as (CDR), the transmitting-receiving electrical interface of this PID device is connected with the input/output interface on the test board, and communicates by the external interface of this input/output interface and test board.As shown in Figure 1, the test signal receiving terminal of this test board and transmitting terminal have N external interface respectively, this N external interface respectively with the PID device in N integrated test channel communicate.External meters PPG and ED are connected on the external interface of test board by cable connection.In test, the switching of interference signal between PID device transmission channel in the test signal or the test of crosstalking all is to realize by the manual cable connection that switches external testing instrument PPG, ED and test board external interface.
The designer finds that the performance test of multiple channel optical transceiver spares such as above-mentioned PID device remains in following technological deficiency in realizing process of the present utility model:
1, in the test process manually the switch test passage can make that testing efficiency is lower, prolonged the test period of multiple channel optical transceiver spare; And long-term test meeting causes considerable wearing and tearing to the external interface of test board, shortens the useful life of test board; In addition, the too much external force in the manual switchover gets involved, and can impact a whole set of test environment, reduces the confidence level of test data;
2, the integrated multipath transmission channel can make that the external interface of test board is also corresponding more in the multiple channel optical transceiver spare, and the placement-and-routing and the arranging of external interface of test board posed a big pressure.
The utility model content
The utility model embodiment provides a kind of test board, solve testing efficiency and all lower problem of test data confidence level that existing manual switchover test channel causes, realize the automatic switchover between test channel, improve the confidence level of testing efficiency and test data, and reduce wearing and tearing, reduced the complexity of test board the test board external interface.
The utility model embodiment provides a kind of test board, comprising:
Be used for test signal is sent to the first electric cross unit of passage to be measured of the multiple channel optical transceiver spare of automatic gating, the described first electric cross unit comprises a first input end that is used for the acceptance test signal and a plurality of first outputs that are used for being communicated with respectively a plurality of passages of multiple channel optical transceiver spare; And,
Be used for the test signal of described passage output to be measured is exported to automatically the second electric cross unit of detecting signal unit, the described second electric cross unit comprises a plurality of second inputs and one second output that is used for being connected with described detecting signal unit that are used for being communicated with respectively a plurality of passages of multiple channel optical transceiver spare.
The test board of the utility model embodiment is by being provided with electric cross unit, utilize this electricity cross unit that test signal is sent to passage to be measured in the multiple channel optical transceiver spare automatically, and automatic reception and test signal that will this passage to be measured output export detecting signal unit to, the efficient and all lower problem of test data confidence level of existing method of testing have been solved, realized interchannel automatic switchover to be measured, improved the confidence level of testing efficiency and test data, and can reduce the wearing and tearing of test board external interface, reduce the complexity of test board.
Description of drawings
The test board that Fig. 1 provides for prior art is applied to the system architecture diagram of test macro;
The structural representation of the test board that Fig. 2 provides for the utility model embodiment one;
The structural representation of the test board that Fig. 3 provides for the utility model embodiment two;
The test board that Fig. 4 provides for the utility model embodiment two is applied to the system architecture diagram of test macro.
Embodiment
Further specify the technical scheme of the utility model embodiment below in conjunction with the drawings and specific embodiments.
The structural representation of the test board that Fig. 2 provides for the utility model embodiment one, as shown in Figure 2, the test board of present embodiment comprises the first electric cross unit 11 and the second electric cross unit 12.Wherein, the first electric cross unit 11 is used for the acceptance test signal, and test signal is sent to the passage to be measured in the multiple channel optical transceiver spare of automatic gating; The second electric cross unit 12 is used to receive the test signal of passage output to be measured, and exports test signal to detecting signal unit automatically.Concrete, the first electric cross unit 11 comprises a first input end that is used for the acceptance test signal and a plurality of first outputs that are used for being communicated with respectively a plurality of passages of multiple channel optical transceiver spare; The second electric cross unit 12 comprises and is used for a plurality of second inputs that are communicated with respectively with a plurality of passages of multiple channel optical transceiver spare and one second output that is used for being connected with detecting signal unit.
In concrete the application, the test board of present embodiment is when being used for that multiple channel optical transceiver spare carried out transmission performance test, after the first input end of the first electric cross unit 11 in this test board receives the test signal of external testing instrument generation, can this test signal be sent in the selected passage to be measured of multiple channel optical transceiver spare automatically by first output with channel connection to be measured.This passage to be measured is sent to test signal this passage to be measured by the first electric cross unit 11 automatic gatings automatically by the first electric cross unit 11, rather than comes gating by the external interface cable connection of switch test plate manually.This test signal is through after the transmission of transmission link, export from the electric transmitting terminal corresponding of multiple channel optical transceiver spare again with passage to be measured, at this moment, test signal that can this passage output to be measured of automatic reception in the second electric cross unit 12 with second input of channel connection to be measured, and export this test signal to analysis and processing that detecting signal unit carries out test signal by second output, obtain the transmission performance indicators analysis result of passage to be measured.The output of this test signal also is sent to detecting signal unit with test signal by second output automatically by the second electric cross unit 12, rather than sets up the passage that test signal exports detecting signal unit to by the external interface cable connection of switch test plate manually.
In the test process of multiple channel optical transceiver spare, the first electric cross unit 11 can be imported test signal in each passage to be measured of multiple channel optical transceiver spare one by one, the second electric cross unit 12 can automatic reception multiple channel optical transceiver spare the test signal of each passage output to be measured of electricity transmitting terminal correspondence, and export it to ED one by one, thereby finish the test of whole multiple channel optical transceiver spare.
The present embodiment test board is by being provided with electric cross unit on test board, test signal is imported one by one in each passage to be measured of multiple channel optical transceiver spare by electric cross unit, and the test signal that each passage to be measured is exported receives and exports to detecting signal unit one by one, realized that test signal in interchannel automatic switchover to be measured, has improved testing efficiency; And automatically switch and can reduce the external interface setting of test board, reduce the complexity of test board, reduce the test board interface wearing and tearing that manual switch test plate interface cable connection causes.
The structural representation of the test board that Fig. 3 provides for the utility model embodiment two, as shown in Figure 3, the test board of present embodiment is on the basis of the test plate structure that embodiment one provides, the first electric cross unit 11 also comprises second input, this second input is used for being connected with the interference signal generator, receives interference signal; The present embodiment test board also comprises interference signal generation unit 13 and the control unit 14 that is arranged on the test board, and wherein, interference signal generation unit 13 is used to produce interference signal, and exports this interference signal to first electric cross unit 11; Control unit 14 is used for pre-determining the passage to be measured of the multiple channel optical transceiver spare that needs detect, and control the first electric cross unit 11 test signal is sent in the multiple channel optical transceiver spare selected passage to be measured, and, control the test signal that the second electric cross unit 12 receives passage output to be measured, and export test signal to detecting signal unit.Control unit 14 can also be used to control the form of the interference signal that interference signal generation unit 13 produces.
The test board of present embodiment is applied to test macro, and as shown in Figure 4, the test board that Fig. 4 provides for the utility model embodiment two is applied to the system architecture diagram of test macro.Specify the test process that the present embodiment test board is applied to multiple channel optical transceiver spare below in conjunction with Fig. 4.
As shown in Figure 4, before the test of carrying out multiple channel optical transceiver spare, at first need to build test environment by testing equipment.The multiple channel optical transceiver spare of present embodiment comprises the PID device, it perhaps is the combination of a plurality of discrete optical transceiving devices, these a plurality of discrete optical transceiving devices can be optical module (the 10-Gigabit small form-factor pluggable transceiver of ten thousand mbit ethernet interface Small Form-Factor Pluggables, hereinafter to be referred as: XFP), Small Form-Factor Pluggable optical module (Small Form-Factor Pluggable, hereinafter to be referred as: SFP) or photodiode (PIN photodiode, hereinafter to be referred as: the PIN pipe), avalanche photodide (avalanche photodiode, hereinafter to be referred as: the APD pipe) etc.Present embodiment is that example describes with the test of PID device.Testing equipment in the present embodiment can adopt PPG, ED and test board, and the PID device is connected on the test board.In concrete the enforcement, can comprise on this test board two electricity intersect (Cross point Switch, hereinafter to be referred as: CPS) unit is called a CPS unit 11 and the 2nd CPS unit 12.Wherein, the one CPS unit 11 can comprise a plurality of first outputs and first input end, PID-TX in the output interface of these a plurality of first outputs and the PID device receives electrical interface and is connected, when carrying out transmission performance test, this first input end is one, and its input interface is connected with measuring signal generator; When carrying out the crosstalk performance test, this first input end is two, and its input interface is connected with the interference signal generator with measuring signal generator respectively, and this measuring signal generator is used to produce test signal, and the interference signal generator is used to produce interference signal.The 2nd CPS unit 12 can comprise a plurality of second inputs and one second output, and the input interface of these a plurality of second inputs is connected with the PID-RX generating interface of PID device, and the output interface of second output is connected with ED by cable connection.Each integrated in the receipts of PID device/generating interface and PID device transmission channel communicates.PG, ED, test board and PID device are through after above-mentioned the connection, constituted test signal transmission link end to end, this transmission link is that the test signal of measuring signal generator output enters the passage to be measured of PID device via the CPS unit on the test board, exports ED through after the transmission of transmission link to by the 2nd CPS unit on the test board.
Test environment build finish after, in conjunction with test macro shown in Figure 4, the concrete application of specifically setting forth the present embodiment test board is as follows:
When carrying out the transmission performance test of passage to be measured, the application of the test board that its applicating adn implementing example one provides is identical, in concrete the enforcement, and the passage to be measured in the multiple channel optical transceiver spare that can utilize control unit 14 to pre-determine to need to detect.For example, control unit 14 pre-determines first passage to be measured that needs test PID device, can be referred to as first passage, then after the first input end of the first electric cross unit 11 receives test signal, control unit 14 can indicate the first electric cross unit 11 by first output that is communicated with first passage the test signal that receives to be sent in this first passage to the first electric cross unit 11 output control commands.Test signal is through after the transmission of transmission link, electric transmitting terminal at the PID device, control unit 14 also can be to the second electric cross unit 12 output control commands, indicate the test signal of this first passage output of the second input automatic reception that is communicated with first passage in the second electric cross unit 12, and the test signal that receives is sent in the detecting signal unit by second output.
When the crosstalk performance test of carrying out passage to be measured, the first electric cross unit 11 of present embodiment test board is outside the acceptance test signal, also receive interference signal by second input, and the interference signal fan-out promptly can be sent to simultaneously in PID device passage to be measured all the other all passages in addition, these all the other all passages can be called interfering channel.Wherein, interference signal can be produced by external meters PPG, also can produce by the interference signal generation unit 13 that is arranged on the test board, interference signal in the present embodiment is produced by interference signal generation unit 13, this interference signal generation unit 13 can be PPG CHIP unit, and this PPG CHIP unit is one and has the chip that signal produces function; It can produce interference signal, and this interference signal is inputed to the first electric cross unit 11 by second input.In concrete the enforcement, the form of the interference signal that can produce by control unit 14 control interference signal generation units 13, and control the first electric cross unit 11 interference signal that receives is fanned out in all interfering channels.The plate that is provided with on the use test plate carries PPG CHIP and produces interference signal, compares and uses external meters PPG to produce interference signal, can significantly reduce testing cost, and can reduce the complexity of test board so that the external interface of test board further reduces.
The present embodiment test board is when carrying out the PID device detection, the first electric cross unit 11 in the test board and the second electric cross unit 12 can automatically be imported test signal in each passage to be measured of PID device one by one, and the test signal of each passage output to be measured of automatic reception, export each test signal to ED one by one and carry out analyzing and processing, thereby finish the test of whole PID device.When the test board of present embodiment is applied to a plurality of discrete optical transceiving device, the combination of these a plurality of discrete optical transceiving devices promptly is equivalent to a PID device, the first electric cross unit 11 and the second electric cross unit 12 of test board can be imported test signal in the passage of each discrete optical transceiving device one by one, and the test signal of the passage of each discrete optical transceiving device of automatic reception output, export this test signal to ED one by one and carry out analyzing and processing, thereby realize that the automatic passage between these a plurality of discrete optical transceiving devices switches, finish the channel performance test of a plurality of discrete optical transceiving devices.
The present embodiment test board is realizing that passage to be measured automaticallyes switch, improve on the basis of testing efficiency, carry the interference signal generation unit, reduced dependence the external meters PPG that produces interference signal by plate is set, further reduce the complexity of test board, and significantly saved testing cost.
It should be noted that at last: above embodiment only in order to the explanation the technical solution of the utility model, is not intended to limit; Although the utility model is had been described in detail with reference to previous embodiment, those of ordinary skill in the art is to be understood that: it still can be made amendment to the technical scheme that aforementioned each embodiment put down in writing, and perhaps part technical characterictic wherein is equal to replacement; And these modifications or replacement do not make the essence of appropriate technical solution break away from the spirit and scope of each embodiment technical scheme of the utility model.
Claims (5)
1, a kind of test board is characterized in that, comprising:
Be used for test signal is sent to the first electric cross unit of passage to be measured of the multiple channel optical transceiver spare of automatic gating, the described first electric cross unit comprises a first input end that is used for the acceptance test signal and a plurality of first outputs that are used for being communicated with respectively a plurality of passages of multiple channel optical transceiver spare; And,
Be used for the test signal of described passage output to be measured is exported to automatically the second electric cross unit of detecting signal unit, the described second electric cross unit comprises a plurality of second inputs and one second output that is used for being connected with described detecting signal unit that are used for being communicated with respectively a plurality of passages of multiple channel optical transceiver spare.
2, test board according to claim 1 is characterized in that, the described first electric cross unit also comprises second input that is used to receive interference signal.
3, test board according to claim 2 is characterized in that, also comprises:
The interference signal generation unit is used to produce described interference signal, and exports described interference signal to described second input.
4, according to claim 1,2 or 3 described test boards, it is characterized in that, also comprise:
Be used to pre-determine described passage to be measured, and control the passage described to be measured that the described first electric cross unit is sent to test signal automatic gating, and, control the described second electric cross unit and export the test signal of described passage to be measured output the control unit of detecting signal unit to automatically, described control unit is connected with the second electric cross unit with the described first electric cross unit.
5, test board according to claim 1 is characterized in that, described multiple channel optical transceiver spare comprises optical integrated device or a plurality of discrete optical transceiving device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009201081392U CN201409138Y (en) | 2009-05-14 | 2009-05-14 | Test board |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009201081392U CN201409138Y (en) | 2009-05-14 | 2009-05-14 | Test board |
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| CN201409138Y true CN201409138Y (en) | 2010-02-17 |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101826918A (en) * | 2010-05-05 | 2010-09-08 | 中兴通讯股份有限公司 | Test method, unit, system, single plate and backing plate of optical transport network electric crossing unit |
| CN102098186A (en) * | 2010-12-17 | 2011-06-15 | 武汉电信器件有限公司 | QSFP (Quad Small Form-factor Pluggable) module detecting system and detecting method |
| CN102255773A (en) * | 2011-06-27 | 2011-11-23 | 中兴通讯股份有限公司 | Method for testing back board signal of communication equipment and testing board |
-
2009
- 2009-05-14 CN CN2009201081392U patent/CN201409138Y/en not_active Expired - Fee Related
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101826918A (en) * | 2010-05-05 | 2010-09-08 | 中兴通讯股份有限公司 | Test method, unit, system, single plate and backing plate of optical transport network electric crossing unit |
| CN101826918B (en) * | 2010-05-05 | 2015-01-28 | 中兴通讯股份有限公司 | Test method, unit, system, single plate and backing plate of optical transport network electric crossing unit |
| CN102098186A (en) * | 2010-12-17 | 2011-06-15 | 武汉电信器件有限公司 | QSFP (Quad Small Form-factor Pluggable) module detecting system and detecting method |
| CN102255773A (en) * | 2011-06-27 | 2011-11-23 | 中兴通讯股份有限公司 | Method for testing back board signal of communication equipment and testing board |
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| C14 | Grant of patent or utility model | ||
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| C17 | Cessation of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20100217 Termination date: 20130514 |