CN201392427Y - High-contrast metallographic microscope - Google Patents
High-contrast metallographic microscope Download PDFInfo
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- CN201392427Y CN201392427Y CN200920005800U CN200920005800U CN201392427Y CN 201392427 Y CN201392427 Y CN 201392427Y CN 200920005800 U CN200920005800 U CN 200920005800U CN 200920005800 U CN200920005800 U CN 200920005800U CN 201392427 Y CN201392427 Y CN 201392427Y
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Abstract
The utility model relates to a high-contrast metallographic microscope, which comprises a condenser lens, a semi-permeable semi-reflection mirror, an eyepiece and an objective lens. A polarizer is respectively arranged between the condenser lens and the semi-permeable semi-reflection mirror and between the eyepiece and the semi-permeable semi-reflection mirror. The polarization directions of the two polarizers are orthogonal. The front end of the objective lens is provided with a depolarizing device made of a birefringent crystal. The utility model uses birefringent material to manufacture the depolarizing device of polarized light and depolarizes the linear polarized light of lighting source so that an apparatus can only restrain parasitic light which is generated at a surface inside a microscope optical system and influences imaging contrast and does not restrain specimen imaging beam. Therefore, the parasitic light which disturbs the imaging and is caused by reflection in the metallographic microscope internal optical system is restrained effectively and the contrast of the metallographic specimen imaging is improved greatly.
Description
Technical field
The utility model relates to a kind of high contrast metaloscope.
Background technology
Metaloscope is a kind of professional instrument that is used for observing metallographic structure, can differentiate and analyze various metals and alloy organizing structure, can be widely used in factory or laboratory and carry out the evaluation of casting quality, raw-material check or starting material are handled work such as researching and analysing of back metallographic structure.Can observe simultaneously the state of opaque materials surface.Have good stability, imaging is clear, resolution is high, the visual field is big and smooth characteristics.
Metallographic specimen is generally opaque material, so metaloscope adopts the mode that falls to penetrating formula illumination that sample is thrown light on, and microscopical object lens not only are the object lens used of imaging but also are illuminating condensers.Existing metaloscope optical system as shown in fig. 1, light source 1 and condenser 2 and semi-transparent semi-reflecting lens are on same linear light path, eyepiece, semi-transparent semi-reflecting lens 3, object lens 4, sample 6 are arranged on the same linear light path, above-mentioned two light paths are vertical mutually at semi-transparent semi-reflecting lens 3 places, and described semi-transparent semi-reflecting lens 3 is 45 with two light paths respectively and places.The illuminating ray that light source 1 sends is through condenser 2, semi-transparent semi-reflecting lens 3 and object lens 4 back lighting samples 6; The imaging beam of sample 6 sees through semi-transparent semi-reflecting lens 3 again and enters eyepiece 5 imagings after object lens 4 imagings, but the reflection ray on some other optical element surfaces in object lens 4 and the microscope optical system is often stronger, actual object lens 4 have a plurality of reflectings surface, the surface will be reflected a large amount of light and enter eyepiece, the imaging of meeting serious disturbance sample, the contrast of imaging is reduced, and when particularly the reflectivity of sample was low, row was observed in the time of can't be to the fine structure of sample when serious.
Abroad in the metaloscope product of well-known manufacturer production, great majority adopt the surface optical device at object lens 4 to plate broad-band transparence-increased film and solve this problem.The purpose of plating broad-band transparence-increased film is to reduce the intensity of reflected light on optical element surface, and the anti-reflection ability of broad-band transparence-increased film is limited, still there is certain reflection potential in the broad-band transparence-increased film surface that is coated with, the reflection ray of optical system inside can not be suppressed to very low.Because broad-band transparence-increased film often has 20-30 layer coating, on the optical element of little sphere, be coated with also relatively difficulty, cost also is higher.
The utility model content
Fundamental purpose of the present utility model is optionally to suppress the reflected light that microscope optical system and object lens optical surface produce and the imaging beam intensity that do not suppress metallographic specimen, make the imaging of sample possess higher contrast, a kind of high contrast metaloscope that can effectively avoid reflection ray the contrast of imaging to be caused interference is provided.
The technical scheme in the invention for solving the technical problem is: a kind of high contrast metaloscope, comprise condenser, semi-transparent semi-reflecting lens, eyepiece and object lens, between described condenser and the semi-transparent semi-reflecting lens, respectively be provided with a polaroid between eyepiece and the semi-transparent semi-reflecting lens, and two polaroid polarization direction quadratures, described object lens front end also is provided with the Xie Pianqi that makes with birefringece crystal.
The linear light path at described condenser and semi-transparent semi-reflecting lens place can be vertical mutually with the linear light path at eyepiece, semi-transparent semi-reflecting lens and object lens place.
The utility model adopts birefringent material to make the Xie Pianqi of polarized light, the linearly polarized photon of lighting source is separated partially, make instrument can only suppress that the inner surface of microscope optical system produces, influence into " veiling glare " of image contrast, the sample imaging beam is not played inhibiting effect, the parasitic light that therefore can suppress the interference imaging that metaloscope internal optics system causes because of reflection effectively, the contrast of metallographic sample imaging is greatly improved, particularly lower to reflecting rate micro-sample, effect is more outstanding.Cost of the present invention is extremely low, and the reflection ray on inner surface can be suppressed to the state near zero, and the raising of contrast clearly is beneficial to the observation to the sample details.
Description of drawings
Fig. 1 is the optical system synoptic diagram of existing metaloscope;
Fig. 2 is an optical system synoptic diagram of the present utility model.
Embodiment
At first, before introducing technical solutions of the utility model in detail, the technical term that relates to is briefly introduced:
The contrast of micro-image: the quality of microscope imaging is represented with " sharpness ".Sharpness is made up of " resolution " and " contrast " two parameters.Resolution is represented the resolution characteristic of fine structure in the microscope imaging, and contrast is represented the contrast ability of B﹠W in the micro-image.Microscopical imaging should possess enough resolving powers simultaneously and contrast just helps eye-observation or instrument record.
Polarized light: only a kind of electromagnetic radiation, explain that according to the undulatory theory of light it is a kind of shear wave.The light of continuous vibration is called natural light on the direction of vibration of the light wave all directions vertical with optical propagation direction, and the light that vibrates on only vertical with the optical propagation direction direction of the direction of vibration of light wave then is referred to as linearly polarized light.If the direction of vibration of light wave vibrates on certain only vertical with the direction of propagation in a flash direction, but along with forward propagation, its direction of vibration produces and changes, and forms a kind of screw type propagation, and this light is referred to as elliptically polarized light.The elliptically polarized light that the amplitude of all directions equates is referred to as circularly polarized light.
Polaroid, cross-polarized light: polaroid only allows the light of a direction vibration to pass through, and then becomes linearly polarized light after natural light is by polaroid.When natural light becomes linearly polarized light by a polaroid, and then play folk prescription to last the orthogonal polaroid of polaroid the time by one, light then can't pass through.This state is referred to as quadrature.
Birefringece crystal: refracting crystal has anisotropic characteristics, when linearly polarized photon becomes certain included angle incident birefringece crystal with its optical axis (non-vanishing degree is not 90 degree yet), can produce the orthogonal polarized light in two bundle polarization directions, two ray refraction rate differences, and have certain optical path difference.
Below, in conjunction with Fig. 2 and specific embodiment, the utility model is described in detail:
The layout and the prior art of light source 1, condenser 2, semi-transparent semi-reflecting lens 3, object lens 4, eyepiece 5, sample 6 are basic identical, difference be in: behind described condenser 3, installed a polaroid 7 additional, as the polarizer, make the natural light of light source become the polarization direction becomes vertical direction with drawing linearly polarized light r1; Secondly, between semi-transparent semi-reflecting lens 3 and eyepiece 5, installed another polaroid 8 additional, as analyzer, this polaroid 8 and last polaroid 7 state that is orthogonal.At this moment, because microscope is in quadrature, the reflection ray of optical system inside has all been suppressed (imaging beam and the reflection ray that causes interference that comprise sample), present full dark state in eyepiece 5 visual fields (if sample is certainly as anisotropy, have birefringent phenomenon, then can see to have birefringent part.If sample is isotropic material then cannot see whatever).Therefore also to before object lens 4, settle an inclined to one side device 9 of separating with the birefringece crystal making, make by described and separate that inclined to one side device 9 shines the light of sample 6 and the light by sample 6 reflection is circularly polarized light r2, described light reflected once more through described separate inclined to one side device 9 after, form with the polarizer and play folk prescription in angle of 45 degrees polarized light r3, at last, form the polarization direction polarized light r4 parallel through analyzer 8, make polarization direction and second polaroid 8 of the light beam of sample imaging not be in quadrature with paper.Like this,, also can only see the imaging of sample in eyepiece 5 visual fields, and the reflected light that all surface produces has been suppressed effectively all although sample 6 is isotropic materials.
The utility model adopts birefringent material to make the Xie Pianqi of polarized light, the linearly polarized photon of lighting source is separated partially, make instrument can only suppress that the inner surface of microscope optical system produces, influence into " veiling glare " of image contrast, the sample imaging beam is not played inhibiting effect, the parasitic light that therefore can suppress the interference imaging that metaloscope internal optics system causes because of reflection effectively, the contrast of metallographic sample imaging is greatly improved, particularly lower to reflecting rate micro-sample, effect is more outstanding.
In addition, the linear light path at described condenser and semi-transparent semi-reflecting lens place, vertical mutually with the linear light path at eyepiece, semi-transparent semi-reflecting lens and object lens place, that promptly adopts falls to penetrating lighting system, also very effective to the observation of the pit bottom on sample surface.
More than high contrast metaloscope provided by the utility model is described in detail, used specific case herein principle of the present utility model and embodiment are set forth, the explanation of above embodiment just is used for helping to understand method of the present utility model and core concept thereof; Simultaneously, for one of ordinary skill in the art, according to thought of the present utility model, the part that all can change in specific embodiments and applications, in sum, this description should not be construed as restriction of the present utility model.
Claims (2)
1. one kind high contrast metaloscope, comprise condenser, semi-transparent semi-reflecting lens, eyepiece and object lens, it is characterized in that: between described condenser and the semi-transparent semi-reflecting lens, respectively be provided with a polaroid between eyepiece and the semi-transparent semi-reflecting lens, and two polaroid polarization direction quadratures, described object lens front end also is provided with the Xie Pianqi that makes with birefringece crystal.
2. high contrast metaloscope according to claim 1 is characterized in that: the linear light path at described condenser and semi-transparent semi-reflecting lens place is vertical mutually with the linear light path at eyepiece, semi-transparent semi-reflecting lens and object lens place.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN200920005800U CN201392427Y (en) | 2009-03-16 | 2009-03-16 | High-contrast metallographic microscope |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN200920005800U CN201392427Y (en) | 2009-03-16 | 2009-03-16 | High-contrast metallographic microscope |
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| Publication Number | Publication Date |
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| CN201392427Y true CN201392427Y (en) | 2010-01-27 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN200920005800U Expired - Lifetime CN201392427Y (en) | 2009-03-16 | 2009-03-16 | High-contrast metallographic microscope |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102539400A (en) * | 2011-12-31 | 2012-07-04 | 广东工业大学 | High-accuracy fluorescence anisotropy microscopic imaging device and method |
| CN104793326A (en) * | 2015-04-30 | 2015-07-22 | 麦克奥迪实业集团有限公司 | Stereo microscope with coaxial lighting effect |
| CN106580268A (en) * | 2017-01-24 | 2017-04-26 | 青岛大学附属医院 | Device for detecting human body microvascular ultramicrostructure by utilizing orthogonal polarization spectral imaging |
| CN113108697A (en) * | 2021-04-06 | 2021-07-13 | 合肥埃科光电科技有限公司 | Differential spectrum confocal sensor |
-
2009
- 2009-03-16 CN CN200920005800U patent/CN201392427Y/en not_active Expired - Lifetime
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102539400A (en) * | 2011-12-31 | 2012-07-04 | 广东工业大学 | High-accuracy fluorescence anisotropy microscopic imaging device and method |
| CN102539400B (en) * | 2011-12-31 | 2013-10-09 | 广东工业大学 | High-accuracy fluorescence anisotropy microscopic imaging device and method |
| CN104793326A (en) * | 2015-04-30 | 2015-07-22 | 麦克奥迪实业集团有限公司 | Stereo microscope with coaxial lighting effect |
| CN106580268A (en) * | 2017-01-24 | 2017-04-26 | 青岛大学附属医院 | Device for detecting human body microvascular ultramicrostructure by utilizing orthogonal polarization spectral imaging |
| CN106580268B (en) * | 2017-01-24 | 2023-10-24 | 青岛大学附属医院 | Device for detecting human body microvascular ultrastructure by using orthogonal polarization spectrum imaging |
| CN113108697A (en) * | 2021-04-06 | 2021-07-13 | 合肥埃科光电科技有限公司 | Differential spectrum confocal sensor |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| ASS | Succession or assignment of patent right |
Owner name: CHONGQING CHONGGUANG INDUSTRIAL CO., LTD. Free format text: FORMER OWNER: CHONGQING OPTICAL + ELECTRICAL INSTRUMENT CO., LTD. Effective date: 20140715 |
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| C41 | Transfer of patent application or patent right or utility model | ||
| COR | Change of bibliographic data |
Free format text: CORRECT: ADDRESS; FROM: 400712 BEIPEI, CHONGQING TO: 400711 BEIPEI, CHONGQING |
|
| TR01 | Transfer of patent right |
Effective date of registration: 20140715 Address after: 400711 Chongqing city Beibei District Jin Shan Road No. 70 of No. 5 Patentee after: Chongqing Light Industrial Co. Ltd. Address before: 400712 Chongqing optical instrument factory, Chongqing Town, Beibei Patentee before: Chongqing Optical & Electrical Instrument Co., Ltd. |
|
| CX01 | Expiry of patent term | ||
| CX01 | Expiry of patent term |
Granted publication date: 20100127 |