CN108572143B - Full polarization measuring microscope - Google Patents
Full polarization measuring microscope Download PDFInfo
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- CN108572143B CN108572143B CN201710147924.8A CN201710147924A CN108572143B CN 108572143 B CN108572143 B CN 108572143B CN 201710147924 A CN201710147924 A CN 201710147924A CN 108572143 B CN108572143 B CN 108572143B
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- uniaxial crystal
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/21—Polarisation-affecting properties
Abstract
The invention discloses a full-polarization measuring microscope which is characterized by comprising a collimating lens, a filter, an objective lens, a polarization modulation combination, an imaging lens and a CCD camera which are sequentially arranged along the direction of incident light, wherein a sample to be measured is arranged between the filter and the objective lens, and the objective lens and the imaging lens have magnification; the polarization modulation combination comprises a first improved Sawaar polarizer, a half wave plate, a second improved Sawaar polarizer and a polarizing plate which are sequentially arranged along the incident light direction. The invention adopts static polarization modulation combination to replace a photoelectric modulation system or a rotating system, and can obtain all polarization information of the target by only one-time measurement.
Description
Technical Field
The present invention relates to the field of optical image processing. More particularly, the present invention relates to a full polarization measurement microscope.
Background
The polarizing optical microscope for measuring the polarization of a sample has important application value for improving the research level of biotechnology and medical clinical detection, but at present, a rotating device or an electric control modulation device is generally adopted to be combined with the microscope, and the structure has the following defects:
1. multiple measurements are needed to obtain all polarization images of the target;
2. measurement errors are easy to generate in multiple measurements;
3. the measuring system comprises precise electric control equipment, and the system is relatively complex and expensive;
4. real-time detection of living objects or moving scenes is not possible.
Disclosure of Invention
An object of the present invention is to solve at least the above problems and to provide at least the advantages described later.
It is yet another object of the present invention to provide a full-polarization measurement microscope that can acquire all polarization information of a target with only one measurement.
To achieve these objects and other advantages in accordance with the present invention, there is provided a full polarization measurement microscope including a collimating lens, a filter, an objective lens, a polarization modulation combination, an imaging lens, and a CCD camera sequentially arranged in an incident light direction, a sample to be measured being arranged between the filter and the objective lens, the objective lens and the imaging lens having a magnification;
the polarization modulation combination comprises a first improved Sawaar polarizer, a half wave plate, a second improved Sawaar polarizer and a polarizing plate which are sequentially arranged along the direction of incident light;
light emitted by a light source is changed into parallel light with an incident direction being a Z axis after passing through a collimating lens, the parallel light is changed into narrow-band parallel light after passing through a filter and then irradiates on a sample to be measured, an objective lens collects transmitted light passing through the sample to be measured, the transmitted light is decomposed into two linearly polarized light beams with incident directions being X axis and Y axis respectively and vibrating with equal intensity and being vertical to each other after passing through a first improved Sawa polarizer, the two linearly polarized light beams rotate along a clockwise direction after passing through a half-wave plate with a fast axis direction of 22.5 degrees in a polarization direction, the four linearly polarized light beams are decomposed into four linearly polarized light beams with equal intensity and vibrating along the X axis and the Y axis respectively after passing through a second improved Sawa polarizer, the four linearly polarized light beams have the same polarization direction after passing through a polarizing plate with the polarization direction being 22.5 degrees in the positive direction of the X axis, and pass through an imaging lens, i.e. an interference image is formed on the CCD camera.
Preferably, the first and second improved savart polarizers each comprise a first uniaxial crystal plate, a second uniaxial crystal plate, and a half-wave plate disposed between the first uniaxial crystal plate and the second uniaxial crystal plate, the optical axes of the first uniaxial crystal plate and the second uniaxial crystal plate are in an XZ plane and form an angle of 45 ° with the Z axis, and the optical axes of the first uniaxial crystal plate are respectively oriented at an angle of 45 ° with the X, Z axis forward direction; the optical axis of the second uniaxial crystal plate is oriented at an angle of 45 degrees with the positive direction of the X axis and the negative direction of the Z axis respectively, the optical axes of the first uniaxial crystal plate and the second uniaxial crystal plate are perpendicular to each other, and the optical axis of the half-wave plate is at an angle of 45 degrees with the positive direction of the X, Y axis.
Preferably, the intensity of the interference image is represented by formula 1:
wherein, the S0, the S1, the S2 and the S3 are Stokes components of four beams of linearly polarized light respectively, omega is the carrier frequency of the polarization modulation combination, lambda is the wavelength of incident light, f is the focal length of the imaging mirror, and x isiIs the abscissa and y of the image planeiIs the ordinate at the image plane.
Preferably, the objective lens is one of objective lenses with magnification of 10X, 20X, 40X.
Preferably, the microscope further comprises a photographic output port for optical output during microscope image acquisition.
The invention at least comprises the following beneficial effects: the invention adopts the static polarization modulation combination to replace a photoelectric modulation system or a rotating system, can obtain all polarization information of the target by only one-time measurement, and solves the problem that the polarization information of the moving target and the dynamic scene can not be obtained in real time.
Additional advantages, objects, and features of the invention will be set forth in part in the description which follows and in part will become apparent to those having ordinary skill in the art upon examination of the following or may be learned from practice of the invention.
Drawings
FIG. 1 is a diagram of an optical path structure of a polarization spectrum measuring microscope according to the present invention;
FIG. 2 is a block diagram of the optical path of the polarization modulating assembly of the present invention;
FIG. 3 is a view showing another optical path configuration of the polarization spectrum measuring microscope of the present invention.
Detailed Description
The present invention is further described in detail below with reference to the attached drawings so that those skilled in the art can implement the invention by referring to the description text.
It is to be noted that the experimental methods described in the following embodiments are all conventional methods unless otherwise specified, and the reagents and materials, if not otherwise specified, are commercially available; in the description of the present invention, the terms "lateral", "longitudinal", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", etc., indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, are only for convenience in describing the present invention and simplifying the description, and do not indicate or imply that the device or element being referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus, should not be construed as limiting the present invention.
As shown in fig. 1-2, the present invention provides a full-polarization measurement microscope, which comprises a collimating lens, a filter, an objective lens, a polarization modulation combination, an imaging lens and a CCD camera, which are sequentially arranged along an incident light direction, wherein a sample to be measured is arranged between the filter and the objective lens, and the objective lens and the imaging lens have a magnification factor;
wherein the polarization modulation combination comprises a first modified savart polarizer (MSPl), a Half Wave Plate (HWP), a second modified savart polarizer (MSP2) and a polarizing plate (A) which are arranged in sequence along the direction of incident light;
light emitted by a light source is changed into parallel light with an incident direction being a Z axis after passing through a collimating lens, the parallel light is changed into narrow-band parallel light after passing through a filter and then irradiates on a sample to be measured, an objective lens collects transmitted light passing through the sample to be measured, the transmitted light is decomposed into two linearly polarized light beams with incident directions being X axis and Y axis respectively and vibrating with equal intensity and being vertical to each other after passing through a first improved Sawa polarizer, the two linearly polarized light beams rotate along a clockwise direction after passing through a half-wave plate with a fast axis direction of 22.5 degrees in a polarization direction, the four linearly polarized light beams are decomposed into four linearly polarized light beams with equal intensity and vibrating along the X axis and the Y axis respectively after passing through a second improved Sawa polarizer, the four linearly polarized light beams have the same polarization direction after passing through a polarizing plate with the polarization direction being 22.5 degrees in the positive direction of the X axis, and pass through an imaging lens, that is, when an interference image is formed on the CCD camera and the direction of the fast axis of the half-wave plate is 22.5 °, the two light beams emitted from the half-wave plate can be split into four light beams (eoeo, oeeo, eooe, oeoe) of equal intensity by the second improved savart polarizer.
The first improved Sawav polarizer and the second improved Sawav polarizer respectively comprise a first uniaxial crystal plate, a second uniaxial crystal plate and a half-wave plate, wherein the first uniaxial crystal plate and the second uniaxial crystal plate are equal in thickness, the half-wave plate is arranged between the first uniaxial crystal plate and the second uniaxial crystal plate, the optical axes of the first uniaxial crystal plate and the second uniaxial crystal plate are in an XZ plane and form an angle of 45 degrees with the Z axis, and the optical axes of the first uniaxial crystal plate are respectively oriented to form an angle of 45 degrees with the positive direction of the X, Z axis; the optical axis of the second uniaxial crystal plate is oriented at an angle of 45 degrees with the positive direction of the X axis and the negative direction of the Z axis respectively, the optical axes of the first uniaxial crystal plate and the second uniaxial crystal plate are perpendicular to each other, and the optical axis of the half-wave plate is at an angle of 45 degrees with the positive direction of the X, Y axis. The half-wave plate has the double functions of phase delay and field of view expansion; the ordinary ray (o light) in the left plate becomes extraordinary ray (e light) after passing through the half-wave plate, and vice versa. The structure can enlarge the visual field to about +/-10 degrees, thereby ensuring that interference fringes in a far field are still equally-spaced straight fringes. Further, the distance between the two outgoing light rays eo and oe is a lateral shear amount, which is 2 Δ (Δ is a veneer shear amount).
The intensity of the interference image is represented by equation 1:
wherein, the S0, the S1, the S2 and the S3 are Stokes components of four linearly polarized light beams respectively, omega is the carrier frequency of any one improved savart polarizer, and because the two improved savart polarizers have the same structure, the carrier frequency is the same, lambda is the incident light wavelength, f is the focal length of the imaging lens, x is the focal length of the imaging lensiIs the abscissa and y of the image planejIs the ordinate at the image plane.
The polarizer must be tilted by 45 ° so that the contrast of the interference pattern obtained is the highest, and the intensity of the interference pattern is represented by equation 2. At four Stokes parameters S0～3In (1), S is generally regarded as0Is the intensity component, S1～3Is inclined toVibration component S is shown in the formula (2)2～3Is only S1Will result in an inverted S at the same noise level2～3Has a signal-to-noise ratio significantly lower than S1It is not favorable for the detection of the whole polarization information.
The objective lens is one of objective lenses with the magnification of 10X, 20X and 40X.
The microscope also comprises a photographic output port for optical output during microscope image acquisition.
As shown in fig. 3, in an embodiment, a certain included angle exists between the incident light emitted from the light source LED and the reflected light reflected from the surface of the sample, and since the polarization characteristics are different by a certain amount when the included angle is changed, when the polarization measurement is actually performed, a more comprehensive polarization characteristic is obtained by adjusting the incident angle of the incident light multiple times.
While embodiments of the invention have been described above, it is not limited to the applications set forth in the description and the embodiments, which are fully applicable in various fields of endeavor to which the invention pertains, and further modifications may readily be made by those skilled in the art, it being understood that the invention is not limited to the details shown and described herein without departing from the general concept defined by the appended claims and their equivalents.
Claims (3)
1. A full polarization measurement microscope is characterized by comprising a collimating lens, a filter, an objective lens, a polarization modulation combination, an imaging lens and a CCD camera which are sequentially arranged along the direction of incident light, wherein a sample to be measured is arranged between the filter and the objective lens, and the objective lens and the imaging lens have magnification;
the polarization modulation combination comprises a first improved Sawaar polarizer, a half wave plate, a second improved Sawaar polarizer and a polarizing plate which are sequentially arranged along the direction of incident light;
light emitted by a light source is changed into parallel light with an incident direction being a Z axis after passing through a collimating lens, the parallel light is changed into narrow-band parallel light after passing through a filter and then irradiates on a sample to be measured, an objective lens collects transmitted light passing through the sample to be measured, the transmitted light passes through a first improved Sawa polarizer and then is decomposed into two linearly polarized light beams with vibration directions being X axis and Y axis respectively and equal in vibration and being vertical to each other, the two linearly polarized light beams pass through a half-wave plate with a fast axis direction of 22.5 degrees and then rotate in a clockwise direction by 45 degrees, the linearly polarized light beams pass through a second improved Sawa polarizer and then are decomposed into four linearly polarized light beams with vibration directions being equal in vibration along the X axis and the Y axis respectively, the four linearly polarized light beams pass through an imaging lens, the polarization directions of the four linearly polarized light beams are identical in orientation after passing through a polarizing plate with a positive direction of 22.5 degrees with the X axis, and, namely, forming an interference image on a CCD camera;
the first improved Sawav polarizer and the second improved Sawav polarizer respectively comprise a first uniaxial crystal plate, a second uniaxial crystal plate and a half-wave plate, wherein the first uniaxial crystal plate and the second uniaxial crystal plate are equal in thickness, the half-wave plate is arranged between the first uniaxial crystal plate and the second uniaxial crystal plate, the optical axes of the first uniaxial crystal plate and the second uniaxial crystal plate are in an XZ plane and form an angle of 45 degrees with the Z axis, and the optical axes of the first uniaxial crystal plate are respectively oriented to form an angle of 45 degrees with the positive direction of the X, Z axis; the optical axis of a second uniaxial crystal plate is oriented at an angle of 45 degrees with the positive direction of an X axis and the negative direction of a Z axis respectively, the optical axes of the first uniaxial crystal plate and the second uniaxial crystal plate are perpendicular to each other, and the optical axis of the half-wave plate is at an angle of 45 degrees with the positive direction of an X, Y axis;
the intensity of the interference image is represented by equation 1:
wherein, the S0, the S1, the S2 and the S3 are Stokes components of four linearly polarized light beams respectively, omega is the carrier frequency of the polarization modulation combination, and xiIs the abscissa and y of the image planeiIs the ordinate at the image plane.
2. The full polarization measurement microscope of claim 1, wherein the objective lens is one of 10X, 20X, 40X magnification objective lenses.
3. The full polarization measurement microscope of claim 1, further comprising a photographic output port for optical output at microscope image acquisition.
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| CN110133880B (en) * | 2019-04-30 | 2022-03-18 | 东莞市溢彩科技有限公司 | Crystal ball axial measuring method |
| CN111537070B (en) * | 2020-03-26 | 2021-09-24 | 华南师范大学 | Differential interference imaging system capable of quickly changing shearing direction and size |
| CN113218635B (en) * | 2021-04-30 | 2023-02-28 | 重庆大学 | Non-contact vector polarization light field test system |
| CN113884471B (en) * | 2021-09-24 | 2023-10-03 | 中国科学院光电技术研究所 | Crystal orientation testing device and method for two-dimensional material |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN105547480A (en) * | 2015-12-24 | 2016-05-04 | 南京理工大学 | High-throughput birefringence interference imaging spectrum device |
| CN106197670A (en) * | 2015-05-28 | 2016-12-07 | 广西师范学院 | A kind of double mode full polarization imaging surveys folk prescription method |
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| CN106197670A (en) * | 2015-05-28 | 2016-12-07 | 广西师范学院 | A kind of double mode full polarization imaging surveys folk prescription method |
| CN105547480A (en) * | 2015-12-24 | 2016-05-04 | 南京理工大学 | High-throughput birefringence interference imaging spectrum device |
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| 空间调制稳态微型快拍成像测偏技术研究;曹奇志 等;《物理学报》;20160315;第65卷(第5期);第050702-2至050702-4、050702-7至050702-9页 * |
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Inventor after: Cao Qizhi Inventor after: Zhang Jing Inventor after: Zhao Yinjun Inventor after: Li Jianying Inventor after: Deng Ting Inventor after: Fan Dongxin Inventor after: Wang Huahua Inventor before: Zhang Jing Inventor before: Cao Qizhi Inventor before: Zhao Yinjun Inventor before: Li Jianying Inventor before: Deng Ting Inventor before: Fan Dongxin Inventor before: Wang Huahua |
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