CN201392374Y - Chip resistance temperature characteristic test device - Google Patents
Chip resistance temperature characteristic test device Download PDFInfo
- Publication number
- CN201392374Y CN201392374Y CN200920125370U CN200920125370U CN201392374Y CN 201392374 Y CN201392374 Y CN 201392374Y CN 200920125370 U CN200920125370 U CN 200920125370U CN 200920125370 U CN200920125370 U CN 200920125370U CN 201392374 Y CN201392374 Y CN 201392374Y
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- CN
- China
- Prior art keywords
- base
- temperature characteristic
- pressing plate
- test device
- resistance temperature
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
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Abstract
The utility model relates to a chip resistance temperature characteristic test device, belongs to electronic element performance test devices, and aims to provide a resistance temperature characteristic test device which has high detection efficiency and convenient operation. The chip resistance temperature characteristic test device comprises a base, a pressing plate and probes, wherein a limit plate (4) whose center is provided with a limit frame (11) is fixed on the base (5), an operation panel (6) whose surface is provided with a locating slot (9) is located in the limit frame (11), at least two sets of spring support mechanisms are arranged on the base (5), each spring support mechanism consists of a push rod (16) arranged in the base (5) and a spring (17) sleeved on the push rod, the pressing plate (2) is arranged on the base (5) through two locating pins (3) and a double-screw bolt (1), and a plurality of groups of conductive probes (13) are fixed on the pressing plate (2). The chip resistance temperature characteristic test device has simple structure and accurate testing data, and is an ideal device for detecting the temperature characteristics of chip resistances through the four-wire measurement.
Description
Technical field:
The utility model relates to a kind of electronic component performance proving installation, relates in particular to a kind of device of test resistance temperature characterisitic.
Background technology:
The resistance-temperature characteristic test is necessary important performance test before resistive element dispatches from the factory, because SMD resistance volume is little and do not have lead-in wire, traditional resistance-temperature characteristic proving installation can not satisfy the needs of large-scale production, therefore is badly in need of a kind of new equipment of suitable test patch formula resistance-temperature characteristic.
Summary of the invention:
In order to overcome the deficiencies in the prior art, the utility model aims to provide a kind of detection efficiency height, easy to operate SMD resistance-temperature characteristic proving installation.
To achieve these goals, the utility model by the following technical solutions: it comprises base, pressing plate and probe; The limiting plate that central authorities are provided with limitting casing is fixed on the base, and the operation panel that the surface is provided with locating slot is arranged in limitting casing; On base, be provided with two sleeve spring supporting mechanisms at least, this spring supporting mechanism by be arranged on the push rod in the base, the spring that is enclosed within on this push rod constitutes; Pressing plate is arranged on the base by two register pins and double-screw bolt, and some groups of conducting probes are fixed on the pressing plate.
Be provided with the groove that is communicated with limitting casing in the side of limiting plate, the adjustment sheet that is fixed on the operation panel stretches out from this groove; Position corresponding to adjustment sheet on base is provided with lock-screw; The edge of locating slot is provided with breach.
Compared with the prior art, the utility model is owing to adopted technique scheme, therefore can guarantee that ceramic substrate is positioned in the locating slot on the operation panel exactly, and be arranged on the ceramic substrate each resistance can be arranged on each group conducting probe of forming by four rubber-like conducting probes on the pressing plate and keep excellent contact, thereby have advantages such as measurement data is accurate, detection efficiency is high, easy to operate.
Description of drawings:
Fig. 1 is a structural representation of the present utility model;
Fig. 2 is the A-A cut-open view among Fig. 1;
Fig. 3 is that B among Fig. 1 is to view;
Fig. 4 is the left view among Fig. 1.
Among the figure: double-screw bolt 1 pressing plate 2 register pins 3 limiting plates 4 bases 5 operation panels 6 lock-screws 7 grooves 8 locating slots 9 adjustment sheets 10 limitting casings 11 insulcretes 12 conducting probes 13 breach 14 windows 15 push rods 16 springs 17
Embodiment:
The utility model is described in further detail below in conjunction with accompanying drawing and specific embodiment:
In Fig. 1～4, on base 5, the operation panel 6 that the surface is provided with square locating slot 9 is arranged in limitting casing 11 to the limiting plate 4 that central authorities are provided with square limitting casing 11 by screw retention.Pressing plate 2 is arranged on the base 5 by two register pins 3 and two double-screw bolts 1, and some groups have certain flexible conducting probe 13 and are fixed on the back side of pressing plate 2 by insulcrete 12, and every group of conducting probe 13 constitutes by four; The central authorities of pressing plate 2 are provided with window 15, can observe the situation that contacts of conducting probe 13 and resistance by this window.At the quadruplet spring supporting mechanism that is arranged on below the pressing plate 2 on the base 5, this spring supporting mechanism by be arranged on the push rod 16 in the base 5, the spring 17 that is enclosed within on this push rod constitutes.For easy to operate, on operation panel 6, be provided with adjustment sheet 10, be provided with the groove 8 that is communicated with limitting casing 11 in the side of limiting plate 4, adjustment sheet 10 stretches out from this groove; About adjusted sheet 10 can make operation panel 6 in limitting casing 11, move forward and backward.For fear of displacement, the position corresponding to adjustment sheet 10 on base 5 is provided with lock-screw 7.Convenient in order to pick and place ceramic substrate, also be provided with breach 14 at the edge of locating slot 9.
Claims (3)
1. a SMD resistance-temperature characteristic proving installation comprises base, pressing plate and probe; It is characterized in that: the limiting plate (4) that central authorities are provided with limitting casing (11) is fixed on the base (5), and the operation panel (6) that the surface is provided with locating slot (9) is arranged in limitting casing (11); At least be provided with two sleeve spring supporting mechanisms on base (5), this spring supporting mechanism is made of the spring (17) that is arranged on push rod (16) in the base (5), be enclosed within on this push rod; Pressing plate (2) is arranged on the base (5) by two register pins (3) and double-screw bolt (1), and some groups of conducting probes (13) are fixed on the pressing plate (2).
2. SMD resistance-temperature characteristic proving installation according to claim 1 is characterized in that: be provided with the groove (8) that is communicated with limitting casing (11) in the side of limiting plate (4), the adjustment sheet (10) that is fixed on the operation panel (6) stretches out from this groove; The position of going up corresponding to adjustment sheet (10) at base (5) is provided with lock-screw (7).
3. SMD resistance-temperature characteristic proving installation according to claim 1 and 2 is characterized in that: the edge of locating slot (9) is provided with breach (14).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN200920125370U CN201392374Y (en) | 2009-04-30 | 2009-04-30 | Chip resistance temperature characteristic test device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN200920125370U CN201392374Y (en) | 2009-04-30 | 2009-04-30 | Chip resistance temperature characteristic test device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN201392374Y true CN201392374Y (en) | 2010-01-27 |
Family
ID=41599195
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN200920125370U Expired - Lifetime CN201392374Y (en) | 2009-04-30 | 2009-04-30 | Chip resistance temperature characteristic test device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN201392374Y (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102721872A (en) * | 2012-03-13 | 2012-10-10 | 北京元六鸿远电子技术有限公司 | 8-position semi-automatic insulating resistance measuring device |
| CN104730295A (en) * | 2015-04-02 | 2015-06-24 | 中国电子科技集团公司第十三研究所 | Clamp for thermal resistance test of SMD packaged semiconductor device |
| CN105665535A (en) * | 2016-03-04 | 2016-06-15 | 安徽飞翔电器有限公司 | Motor stamping piece die |
| CN105750394A (en) * | 2016-03-22 | 2016-07-13 | 安徽飞翔电器有限公司 | Motor stamped sheet molding system |
-
2009
- 2009-04-30 CN CN200920125370U patent/CN201392374Y/en not_active Expired - Lifetime
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102721872A (en) * | 2012-03-13 | 2012-10-10 | 北京元六鸿远电子技术有限公司 | 8-position semi-automatic insulating resistance measuring device |
| CN104730295A (en) * | 2015-04-02 | 2015-06-24 | 中国电子科技集团公司第十三研究所 | Clamp for thermal resistance test of SMD packaged semiconductor device |
| CN105665535A (en) * | 2016-03-04 | 2016-06-15 | 安徽飞翔电器有限公司 | Motor stamping piece die |
| CN105750394A (en) * | 2016-03-22 | 2016-07-13 | 安徽飞翔电器有限公司 | Motor stamped sheet molding system |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CX01 | Expiry of patent term |
Granted publication date: 20100127 |
|
| CX01 | Expiry of patent term |