CN1821790A - Universal probe device for electronic module detecting system - Google Patents

Universal probe device for electronic module detecting system Download PDF

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Publication number
CN1821790A
CN1821790A CN 200610004414 CN200610004414A CN1821790A CN 1821790 A CN1821790 A CN 1821790A CN 200610004414 CN200610004414 CN 200610004414 CN 200610004414 A CN200610004414 A CN 200610004414A CN 1821790 A CN1821790 A CN 1821790A
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China
Prior art keywords
probe
those
signal source
connector
probe unit
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Granted
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CN 200610004414
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Chinese (zh)
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CN100422748C (en
Inventor
张钦亮
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AU Optronics Corp
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AU Optronics Corp
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Priority to CNB2006100044147A priority Critical patent/CN100422748C/en
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Abstract

This invention relates to a universal probe device used in an electronic component test system including a probe unit and a circuit switch device, in which, the probe unit includes a bracket base and multiple probes set on the base to test the electronic component system, the circuit switch device is used in electrically connecting probes corresponding to different panels with the test signal source.

Description

The universal probe device of electronic assembly test system
Technical field
The invention relates to a kind of probe unit of electronic package system testing, and the probe unit of particularly testing relevant for a kind of panel array.
Background technology
The application of flat-panel screens extends in word processor, desktop PC, hand held television indicator and similarly uses and Rapid Expansion.Particularly LCD (Liquid CrystalDisplay:LCD) panel is because of the maturation of its manufacture craft technology, so extensively apply in the various application.Along with improvement of Manufacturing Technology, the display pannel size also develops and plurality of specifications to meet different user demands, because panel of LCD is made up of many liquid crystal bags and other assembly, in addition, bigger panel of LCD has more assembly.Even have only a component faults in the panel of LCD, whole panel of LCD failure.So before the packaged liquid crystal display panel, be the important step that guarantees manufacturing LCD quality in order to the testing procedure of testing liquid crystal display panel.
Traditionally, the contact type probe detection module is used in the test display panel, during test, uses the probe on the probe module that the contact mat on the panel of LCD (pad) is carried out engaged test.But the contact mat number on the various different size panels also has nothing in common with each other, thus must design and produce the relevant probe test module of corresponding various different sizes, to test various panel of LCD.
Yet in the manufacturing works of LCD, a kind of panel of LCD of specification can only be tested in a testing station, and the probe test module in order to test is designed at the LCD of this size on the testing station, if production line changes the LCD of producing other size, just employed probe test module more must be changed, with the panel of LCD of the new size that cooperates manufacturing.
For example, most traditional probe test modules are normally produced the prober frame of different size, are used in the test of different product line.On each specific frame number of probes just corresponding the contact mat number that panel had of a specific dimensions specification, prober frame is exactly the unit that a plurality of detecting probes is incorporated into one, is beneficial to batch testing.
But at the different size panel that develops, if carry out test in this way, because the panel of different size specification has the contact mat of different number, therefore be developed when a new product specification, just must make a prober frame that meets the new size specification again.Because a kind of framework of specific standard normally can't be applicable to other products, so will cause extra prober frame to make and design cost, and the making of prober frame and even hand over time phase very long.In addition, when the replacing product line was done test, the step of changing prober frame was also quite consuming time, and various reasons causes the waste of production capacity and manpower.
Summary of the invention
Therefore a purpose of the present invention just provides a kind of probe unit of electronic package system testing, in order to the panel or the electronic package layout of convenient test different size specification.
Another object of the present invention provides a kind of probe unit of electronic package system testing, so that the solution of test different size specification panel or electronic package layout to be provided.
Another purpose of the present invention provides a kind of probe unit of electronic package system testing, saves cost, time and manpower cost.
According to above-mentioned purpose of the present invention, a kind of probe unit of electronic package system testing is proposed.The probe unit of electronic package system testing comprises a probe unit and a circuit switching device shifter, and probe unit comprises the probe of a supporting seat and one first number, and probe all is arranged on the supporting seat, in order to a panel array is tested.The circuit switching device shifter is used so that be electric connection between the test signal source of the probe of one second number and one the 3rd number.Wherein second number is less than first number, and second number is not less than the 3rd number, and one of them is electrically connected at least one probe to test the signal source.
According to one embodiment of the present invention, proving installation is used for the test of panel array, and the circuit switching device shifter is a winding displacement, comprises a probe connector, signal source connector and a transmission line.The probe connector comprises the sound end pin of first number, in order to be electrically connected on probe.Signal source connector comprises the signal source termination pin of the 3rd number, in order to be electrically connected on test signal source.Transmission line makes sound end pin and signal source termination pin be electric connection according to a line configuring.Each signal source end jack is electrically connected at least one sound end jack.
The panel array proving installation also comprises a signal source apparatus, has a signal source connector.The signal source connector has the signal source connector pin of the 4th number, and each number source connector pin is as a kind of test signal source, in order to plant accordingly and to be electrically connected at the signal source termination pin of circuit switching device shifter, with supply test signal in probe unit.Wherein the 4th number is more than or equal to the 3rd number.
The circuit switching device shifter also can be a plug type flexible circuit board, and an end is electrically connected on probe, and the other end is electrically connected on test signal source.
When testing the panel of a specific dimensions specification, can utilize earlier and design and corresponding circuit switching device shifter is planted with probe unit and signal source respectively and is connected, again probe alignment on the probe unit is tested the panel placement platform of usefulness, the contact mat of panel is contacted with the probe of a part, other probe does not then contact with any contact mat, as same empty pin position.By the line configuring of circuit switching device shifter, make the signal source be sent on the probe of ad-hoc location to carry out test.
When changing different specification panels, the circuit switching device shifter need only be pulled out, change the circuit switching device shifter that another has different line configuring designs, can test.
Owing to design most probes on probe module in advance, make probe unit contain the panel test scope of an above dimensions, only must change the test that the circuit switching device shifter is changeable different product line, and the circuit switching device shifter is quite fast simple on manufacturing and designing compared to probe unit integral body, it is also low to expend cost, and on the replacing step, also faster, sizable benefiting also arranged for the utilization of producing the line production time.
Description of drawings
For above and other objects of the present invention, feature, advantage and embodiment can be become apparent, being described in detail as follows of accompanying drawing:
Fig. 1 a is the synoptic diagram according to probe unit one preferred embodiment of electronic package system testing of the present invention.
Fig. 1 b is the synoptic diagram that contacts with contact mat according to one embodiment of the present invention middle probe.
Fig. 2 is the arrangement plan according to one embodiment of the present invention middle probe.
Fig. 3 switches the inner line configuring synoptic diagram of dress according to circuit in one embodiment of the present invention.
The primary clustering symbol description
100: signal source apparatus 102: the signal source connector
102a: signal source connector pin 104: test signal source
110: probe unit 112: framework
114: probe 116: flexible circuit board
118: probe connector 118a: probe connector pin
120: circuit switching device shifter 122: transmission line
124: probe connector 124a: sound end pin
126: signal source connector 126a: signal source termination pin
160: measured panel 162: contact mat
202: probe location 312: probe connector pin
310: probe connector 322a~322e: signal source connector pin
320: the signal source connector
330: line configuring
Embodiment
The present invention discloses a kind of probe unit of electronic package system testing, provide a probe unit of sharing to carry out testing procedure to the display panel of different size specification, change when product line is done to test and only must change the circuit switching device shifter, exempt inconvenient and a large amount of cost consumption that tradition must design, makes and change prober frame in addition.In order to make narration of the present invention more detailed and complete, can be with reference to the icon of following description and cooperation Fig. 1 a and Fig. 1 b.
With reference to Fig. 1 a, it illustrates the synoptic diagram according to probe unit one preferred embodiment of electronic package system testing of the present invention.The probe unit of electronic package system testing of the present invention comprises a probe unit 110 (being illustrated in Fig. 1 b) and a circuit switching device shifter 120.Probe unit 110 comprises a supporting seat, and as framework 112, and the probe 114 of first number (being illustrated in Fig. 1 b), all probes are 114 careful, be arranged on the supporting seat to little spacing, in order to electronic package system such as panel array are tested.
Circuit switching device shifter 120 usefulness are so that a part of probe 114 is electric connection between the test signal source 104 (being illustrated in Fig. 1 b) of the i.e. probe 114 of second number, and the 3rd number.The second above-mentioned number is less than first number, and second number is not less than the 3rd number.Actual when using probe unit to test, one of them is electrically connected at least one probe 114 test signal source 104.Second number for example is an integer multiple of the 3rd number.
Particularly, circuit switching device shifter 120 has the sound end pin 124a of second number and the signal source termination pin 126a of the 3rd number, the probe 114 of sound end pin 124a in order to be electrically connected at probe unit 110, signal source termination pin 126a is in order to be electrically connected at test signal source 104.And the electric connection between above-mentioned pin and probe and test signal source is that pullable separates.
In a preferred embodiment, the probe unit of electronic package system testing comprises a signal source apparatus 100, a circuit switching device shifter 120 and a probe unit 110.Signal source apparatus 100 comprises a signal source connector 102 in order to supply test signal.The signal source connector pin 102a that signal source connector 102 has the 4th number thereon, each signal source connector pin 102a represents a kind of test signal source, one specific test signal is provided, but might not transmit the signal of all the 4th numbers during actual the use, visual testing requirement and only utilize a part of test signal.So the 4th number is more than or equal to the 3rd number.Signal source apparatus 100 platform structure more in this example, the platform of placing as measured panel 160.
Probe unit 110 comprises the probe 114 of a framework 112, a probe connector 118 and one first number, and all probes 114 are arranged on the framework 112, test in order to counter plate 160 arrays.This routine middle frame 112 is a quadrilateral frame, a square frame for example, and probe 114 is arranged on the edge of framework 112.In the probe unit of the present invention, supporting seat is not limited to the framework shown in the foregoing description, for example also can be a bar structure.
Probe connector 118 has corresponding with probe 114 and the probe connector pin 118a of similar number, i.e. first number pin 118a, and each pin 118a is electrically connected at other probe 114 respectively accordingly.In this example, all probes 114 are to electrically connect accordingly by a flexible circuit board 116 with probe connector pin 118a, and 118 of probe connectors are installed on the framework 112.
Circuit switching device shifter 120 is a winding displacement, comprises a probe connector 124, a signal source connector 126 and a transmission line 122.Circuit switching device shifter 120 1 ends are probe connector 124, have the sound end pin 124a of second number, are connected in the probe connector 118 of probe unit 110 in order to plant.By contacting between probe connector pin 118a and the sound end pin 124a, make between circuit switching device shifter 120 and the probe 114 to be electric connection.
Circuit switching device shifter 120 other ends are signal source connector 126, have the signal source termination pin 126a of the 3rd number, are connected in the signal source connector 102 of signal source apparatus 120 in order to plant.By contacting between signal source connector pin 102a and the signal source termination pin 126a, make between circuit switching device shifter 120 and the test signal source 104 to be electric connection.
The signal source termination pin 126a of the 3rd number sees through transmission line 122, is electric connection with the sound end pin 124a of second number, and the signal that will test signal source 104 sends is sent to the sound end pin 124a of second number from signal source termination pin 126a.Because transmission line 122 is a specific line configuring, therefore also circuit switching device shifter 120 becomes the pathway in probe 114 and 104 in test signal source, and the pathway that is provided is that panel product at different specification size has the design of different circuit distributions.
The kenel of above-mentioned center line circuit switching device is not limited to comprise a winding displacement of connector, it can also for example be the design of a pluggable circuit board or flexible circuit board, it has in order to be electrically connected on the sound end pin and the signal source termination pin in probe and test signal source, also can bring into play identical function in the present invention.In addition, embodiment center line circuit switching device is the connector with jack, an i.e. female, but page or leaf can be a public plug, the simple exchange design of this kind public plug and female be belong to that the insider can think easily and conversion, as long as the circuit switching device shifter is for can all being included in spirit of the present invention and the scope from probe unit and the signal source apparatus plug person of substituting.
Below the operation of the probe unit of electronic package system testing of the present invention will be described with an example.Shown in Fig. 1 b, when measured panel 160 has been positioned over the location, on the platform as signal source apparatus 100, framework 112 is aimed at correct orientation put down, probe 114 is contacted with contact mat 162 on the measured panel 160.When beginning to test, activate signal source apparatus 100 and make test signal source 104 send the test signal, the connection line of process circuit switching device shifter 120 correctly reaches probe 114 with signal and then reaches on the contact mat 162.Changing product line carries out when testing, the circuit switching device shifter 120 that last time used need only be pulled out, change the circuit switching device shifter of another kind of specification, just finish the step of changing test specification, must be compared to tradition with the mode of framework 112 integral replacings, probe unit general form design of the present invention replaces with quite easy replacing step.
With reference to figure 3, it illustrates the line configuring of circuit switching device shifter inside simultaneously.As shown in FIG., the signal source connector pin 322a~322e number on the signal source connector 320 is five, and expression has five kinds of test signals to be provided out the usefulness of conduct test.Signal is from signal source connector pin 322a~322e place, is sent to the probe connector pin 312 on the probe connector 310 through the line configuring 330 of circuit switching device shifter.Can find out obviously in the legend that probe connector pin 312 splits two row up and down, each signal is sent to four probe connector pins 312 via line configuring 330, that is has four probes uses with a kind of test signal.
All the other probe connector pins are not then because the relation of line configuring 330 electrically connects the empty pin position when becoming the use test device with signal source connector pin 322a~322e on the probe connector 310.Though that is to say probe socket receptacle pin 312 all is plugged in the sound end jack of probe connector accordingly, but therefore and all do not electrically connect with test signal source, also must sight path configuration 330 and deciding, have different conducting states at the different panels size design.
When test during one specific standard panel, the representative of place, empty pin position does not have electric signal and is supplied to probe to locating, because according to the contact mat design result of panel, this place probe does not have the contact mat of corresponding contact, so need not test signal.Generally speaking, the configuration of empty pin position is the designing institute decision by the circuit switching device shifter.
With reference to figure 2, it illustrates the arrangement plan according to one embodiment of the present invention middle probe.If at existing 14 inches, 15 inches, 17 inches, 19 inches panel, the contact mat number of each dimensions is all inequality.Contact mat configuration on the panel is to design according to all probe locations 202 on the probe unit, no matter just any specification panel, its all contact mats all design wherein a part of position on the position 202 of most probes in probe unit, position, so that a correct corresponding contact of probe to be provided.
Therefore, the design consideration of number of probes makes it contain the panel cun pairing contact mat number of specification that may develop in the future for choosing a proper number.Number of probes designs many more closely more, and the different product number that then can contain is also more relatively.The number of this routine middle probe is designed on the quadrilateral frame, and a side has 100 probes, and probe spacing then is 10mm.Yet probe keeps equally spaced is designed to probe with panel designs is considered easily, is not must meet equidistantly, and non-equidistance design also belongs in the spiritual scope of the present invention, this be the insider can think easily and variation.
Probe unit can cooperate a plurality of substrates to use, and as display panel substrate, has a plurality of contact mats on each substrate, and each contact mat all can correspond to a probe location.
With reference to figure 1a and Fig. 2, be the example explanation simultaneously with a female glass sheet with the long 1000mm of side.If the designing probe spacing is 10mm, and first with the most last probe location each with the edge of female glass sheet at a distance of one apart from as 5mm.Side design in framework 112 has 100 probe 114 mean allocation in last, and corresponding probe connector pin 118a also has 100.
If this female glass sheet is for manufacturing 2 * 4 panels 160, as shown in FIG., about two sides split four panels 160.And design two groups of probe connector pins in the both sides of framework 112, and the probe connector pin in left side is positioned at four panels in graphic left side in order to control, and the probe connector pin 118a on right side then is positioned at four panels in addition on graphic right side in order to control.
If every panel 160 need receive five kinds of test signals separately, the signal source termination pin 126a quantity of the circuit switching device shifter 120 on left side and right side is the 3rd number, is all five in this example, receives five kinds of test signals from signal source apparatus 100 respectively.
Therefore, the sound end pin in left side be 5 * 4 with the pin that is electric connection with number probe 114.In like manner, the signal source termination pin of the circuit switching device shifter 120 on right side quantity too is five, receives five kinds of test signals from signal source apparatus 100, and is sent to separately on 4 panels 160 on right side.
And the sound end pin 124a on right side also is similarly 5 * 4, is the pin of electric connection with 5 * 4 probes.If female glass sheet is to manufacture for example 2 * 6 panels, and every panel 160 will receive seven kinds of test signals, so, the signal source termination pin 126a quantity of each side is seven, and the sound end pin 124a of each side be 7 * 6 with the pin that is electric connection with number probe 114.
What must pay special attention to is, might not transmit the test signal of the 4th number when having actual use of signal source connector pin 102a of the 4th number, decides on user demand, and the test signal less than the 4th number also can be provided.Therefore the 4th number is more than or equal to the 3rd number.In the above embodiments, be to equal the 3rd number with the 4th number to come exemplary illustration.
Look actual user demand, signal source number for example is five, seven or other number.So, as long as change the circuit switching device shifter that is applicable to different size or panel assembly layout, promptly applicable to same probe unit.When the assembly layout on the every panel changes, can be without the otherwise designed probe unit, as long as want the contact mat of acceptance test signal to have corresponding position on every panel, promptly applicable to various panel size and assembly layout with the probe of probe unit.
In the foregoing description, be to control the panel that is positioned at both sides separately with the probe connector pin of supporting seat both sides, and on practice, also can be designed as and only dispose single probe connector in a side, control the test of whole panels, the probe Integration Design that also is about to two sides is for being electrically connected at single probe connector pin, and this moment, the number of probe connector pin was the sum total of all probes.
By the invention described above preferred embodiment as can be known, use the present invention and have following advantage.By careful probe design, and cooperate pluggable circuit switching device shifter, make the same probe unit can be in order to the panel of different size specification is tested.Change the products of different specifications line and carry out when testing, need only simply the circuit switching device shifter be pulled out replacing,, save considerable replacing time and manual resource compared to the mode of traditional whole framework of replacing.
And, at the product specification that goes out different or newly developed, the present invention need only or revise the circuit switching device shifter with corresponding line configuring by design and get final product, in design and Design of device, Production Time and convenience, even expending aspect the cost, all than the prober frame of making a new spec more obvious benefit is arranged, the present invention provides a very important commercial value really.
Though the present invention with preferred embodiment openly as above; right its is not in order to qualification the present invention, any insider, without departing from the spirit and scope of the present invention; when can being used for a variety of modifications and variations, so protection scope of the present invention is as the criterion when looking claims person of defining.

Claims (14)

1. the probe unit of an electronic package system testing is applicable to the test of an electronic package system, comprises at least:
One probe unit comprises the probe of a supporting seat and one first number, and those probes are arranged on this supporting seat, in order to this electronic package system is tested; And
One circuit switching device shifter, with so that be electric connection between the test signal source of those probes of one second number and one the 3rd number,
Wherein this second number is less than this first number, and this second number is not less than the 3rd number.
2. probe unit according to claim 1, wherein this second number is an integer multiple of the 3rd number.
3. probe unit according to claim 1, wherein this circuit switching device shifter is a winding displacement, comprising:
One probe connector comprises the sound end pin of this second number, in order to be electrically connected on those probes;
One signal source connector comprises the signal source termination pin of the 3rd number, in order to be electrically connected on those test signal sources; And
One transmission line makes those sound end pins and those signal source termination pin be electric connection according to a line configuring,
Wherein each those signal source termination pin is electrically connected at least one those sound end pins.
4. probe unit according to claim 1, wherein this circuit switching device shifter is a flexible circuit board, and an end is electrically connected on those probes, and the other end is electrically connected on those test signal sources.
5. probe unit according to claim 1, wherein those probes are to be electrically connected with a flexible circuit board with those probe connector pins.
6. probe unit according to claim 1, wherein this probe unit can cooperate a plurality of substrates to use, and has a plurality of contact mats on each those substrate, each those contact mat all can correspond to those probes one of them.
7. the probe unit of an electronic package system testing is applicable to the test of an electronic package system, comprises at least:
One probe unit, the probe that comprises a supporting seat, a probe connector and one first number, those probes are arranged on this supporting seat, in order to this electronic package system is tested, this probe connector comprises the probe connector pin of this first number, and those probe connector pins are electrically connected at those probes accordingly; And
One circuit switching device shifter is used so that the test signal source of those probes and one the 3rd number electrically connects, and comprising:
One probe connector has the sound end pin of one second number, in order to be electrically connected on those probe connector pins accordingly; And
One signal source connector has the signal source termination pin of the 3rd number, and in order to being electrically connected on those test signal sources of the 3rd number, and those sound end pins of those signal source termination pin and this second number are electric connection,
Wherein this second number is less than this first number, and this second number is not less than the 3rd number.
8. probe unit according to claim 7, wherein this circuit switching device shifter is a winding displacement.
9. probe unit according to claim 7, wherein those probes are to be electrically connected with a flexible circuit board with those probe connector pins.
10. probe unit according to claim 7, wherein this probe unit can cooperate a plurality of substrates to use, and has a plurality of contact mats on each those substrate, each those contact mat all can correspond to those probes one of them.
11. the probe unit of an electronic package system testing is applicable to the test of an electronic package system, comprises at least:
One probe unit, the probe that comprises a supporting seat, a probe connector and one first number, those probes are arranged on this supporting seat, in order to this panel array is tested, this probe connector comprises the probe connector pin of this first number, and those probe connector pins are electrically connected at those probes accordingly;
One circuit switching device shifter comprises:
One probe connector has the sound end pin of this first number, in order to be inserted in those probe connector pins accordingly; And
One signal source connector has the signal source termination pin of one the 3rd number, and those sound end pins of those signal source termination pin and one second number are electric connection, and wherein this second number is less than this first number, and this second number is not less than the 3rd number; And
One signal source apparatus, comprise a signal source connector, this signal source connector comprises the signal source connector pin of the 4th number, in order to plant accordingly and to be electrically connected at those signal source termination pin, with supply test signal, wherein the 4th number is more than or equal to the 3rd number.
12. probe unit according to claim 11, wherein this circuit switching device shifter is a winding displacement.
13. probe unit according to claim 11, wherein this second number is an integer multiple of the 3rd number.
14. probe unit according to claim 11, wherein those probes are to be electrically connected with a flexible circuit board with those probe connector pins.
CNB2006100044147A 2006-02-10 2006-02-10 Universal probe device for electronic module detecting system Active CN100422748C (en)

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Application Number Priority Date Filing Date Title
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Application Number Priority Date Filing Date Title
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Cited By (8)

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CN102043074A (en) * 2009-10-14 2011-05-04 旺矽科技股份有限公司 High-frequency probe card
CN102591624A (en) * 2011-01-06 2012-07-18 上海华虹Nec电子有限公司 Method for surpassing arrangement mode of probe station
CN103345916A (en) * 2013-06-21 2013-10-09 深圳市华星光电技术有限公司 All-purpose circuit board of short-circuiting bar
CN103439538A (en) * 2013-08-30 2013-12-11 徐州华夏电子有限公司 Replaceable conduction test connecting instrument
CN106782234A (en) * 2015-11-24 2017-05-31 飞腾动力公司 System and method for promoting the inspection to the device to be tested including multiple panels
CN106840605A (en) * 2017-01-17 2017-06-13 武汉华星光电技术有限公司 Detection means and monitor station
CN109521607A (en) * 2018-12-21 2019-03-26 惠科股份有限公司 A kind of wiring construction and radiation slit vertical orientation electricity applying system
WO2021000515A1 (en) * 2019-06-29 2021-01-07 苏州精濑光电有限公司 Testing mechanism for display panel

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Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102043074A (en) * 2009-10-14 2011-05-04 旺矽科技股份有限公司 High-frequency probe card
CN102591624A (en) * 2011-01-06 2012-07-18 上海华虹Nec电子有限公司 Method for surpassing arrangement mode of probe station
CN102591624B (en) * 2011-01-06 2015-06-03 上海华虹宏力半导体制造有限公司 Method for surpassing arrangement mode of probe station
CN103345916A (en) * 2013-06-21 2013-10-09 深圳市华星光电技术有限公司 All-purpose circuit board of short-circuiting bar
CN103345916B (en) * 2013-06-21 2016-05-04 深圳市华星光电技术有限公司 A kind of omnipotent circuit board of short bar
CN103439538A (en) * 2013-08-30 2013-12-11 徐州华夏电子有限公司 Replaceable conduction test connecting instrument
CN106782234A (en) * 2015-11-24 2017-05-31 飞腾动力公司 System and method for promoting the inspection to the device to be tested including multiple panels
CN106782234B (en) * 2015-11-24 2022-05-13 奥宝科技有限公司 System and method for facilitating inspection of a device under test comprising a plurality of panels
CN106840605A (en) * 2017-01-17 2017-06-13 武汉华星光电技术有限公司 Detection means and monitor station
CN109521607A (en) * 2018-12-21 2019-03-26 惠科股份有限公司 A kind of wiring construction and radiation slit vertical orientation electricity applying system
CN109521607B (en) * 2018-12-21 2022-03-22 惠科股份有限公司 Wiring structure and radiation slit vertical alignment power-up system
WO2021000515A1 (en) * 2019-06-29 2021-01-07 苏州精濑光电有限公司 Testing mechanism for display panel

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