CN100523824C - Detecting circuit arrangement and manufacturing method of liquid crystal display panel - Google Patents
Detecting circuit arrangement and manufacturing method of liquid crystal display panel Download PDFInfo
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- CN100523824C CN100523824C CNB2006100598538A CN200610059853A CN100523824C CN 100523824 C CN100523824 C CN 100523824C CN B2006100598538 A CNB2006100598538 A CN B2006100598538A CN 200610059853 A CN200610059853 A CN 200610059853A CN 100523824 C CN100523824 C CN 100523824C
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Abstract
The present invention provides a device of detecting the circuit layout and the method is suitable for detecting the panel unit in groups, wherein, each panel unit has a plurality of first signal lines and second signals lines. The device of detecting the circuit layout includes a multiplexer and a gasket of detecting. The multiplexer is connected electrically to at least one of the first signal lines and the second signal lines of the panel unit, and the gasket of detecting is connected electrically to the multiplexer that is suitable for communicating the gasket of detecting with the first signal lines or the second signal lines of a group of panel units.
Description
Technical field
The present invention relates to a kind of detection technique of panel, and be particularly related to a kind of detection line layout of panel and the manufacture method of display panels.
Background technology
The progressive rapidly tremendous progress that is indebted to semiconductor element or display device mostly of multimedia society.With regard to display, have that high image quality, space utilization efficient are good, (liquid crystal display LCD) becomes the main flow in market to the LCD of low consumpting power, advantageous characteristic such as radiationless gradually.
Fig. 1 is the perspective exploded view of known active array display panels (active matrix LCD panel, AM-LCD panel).Please refer to Fig. 1, active array display panels 100 comprises active component array base board 110, liquid crystal layer 120 and colored filter (color filter, CF) 130.Wherein, colored filter 130 is to be positioned at active component array base board 110 tops, and liquid crystal layer 120 then is to be arranged between active component array base board 110 and the colored filter 130.On the active component array base board 110 be provided with a plurality of arrayed active member 112 and with the pixel electrode (pixelelectrode) 114 of each active member 112 corresponding setting, these active members 112 are intended for the on-off element of pixel cell.And; in order to drive the active member 112 in the individual pixel cells; usually can choose specific pixel by sweep trace (scan line) 116 and data line (data line) 118, and provide this pixel suitable operating voltage, to show the picture of corresponding this pixel.
Fig. 2 is the detection line schematic layout pattern of known a kind of panel unit.Please refer to Fig. 2, the manufacturing process of the active array display panels 100 of Fig. 1 is to assemble with a sheet of active component array base board and a sheet of colored filter earlier, so that liquid crystal layer is sealed in therebetween, and then forms the panel unit 200 of a plurality of arrayed.Cut again afterwards and split (cutting) technology, to form a plurality of active array display panels 100 shown in Figure 1.
The electrical detection method of known panel unit 200 is elder generation's scan wiring and data wirings with each panel unit 200, be serially connected with the scan wiring and the data wiring of other panel unit 200 by short-circuit rods (shorting bar) 140 respectively, and short-circuit rods 140 is electrically connected to connection pad 210.Afterwards, probe (probe) (not shown) pressed touch on connection pad 210, with by the scan wiring of probe input signal, and open the active member 112 of Fig. 1 to each panel unit 200.Then, by probe detection signal is passed to data wiring in each panel unit 200 again, and makes each panel unit 200 come display frame according to this detection signal.At this moment, the related personnel can judge whether these panel units 200 are specification product according to panel unit 200 shown pictures.
With the manufacturing process of small size display panel, a glass substrate can be used for forming tens of or hundreds of panel unit.As shown in Figure 2, simultaneously the huge panel unit 200 of these quantity is carried out electrical detection as desiring, then these panel units 200 must be maintained under the state of charging, and transmit detection signal to each panel unit 200 by the probe (not shown) that pressure is touched on connection pad 300.That is to say that in testing process, the active member (not shown)s in these panel units 200 all are in opening, up to all panel units 200 all detects finish after, just close the interior active member of all panel units 200.
Though in above-mentioned detection method, only need make one group of probe, and its pressure is touched on connection pad 210, can finish the detection of all panel units 200.Yet, if active member is under the opening for a long time, will cause its element characteristic to change, thereby can't operate as normal.
For this reason, known technology proposes another kind of detection method, to address the above problem.Fig. 3 is the detection line schematic layout pattern of known another kind of panel unit.Please refer to Fig. 3, this kind detection method is that these panel units 200 are divided into many groups, and respectively to organize panel unit 200 be to be electrically connected to its pairing connection pad 300 respectively.Therefore, when carrying out the detection of panel unit 200, only need certain group panel unit 200 of desiring to detect is charged, and the probe (not shown) pressed to touch so far organize on the panel unit 200 pairing connection pads 300, the detection signal transmission so far can be organized in the panel unit 200.And, after these group panel unit 200 detections finish, can close the active member in this group panel unit 200.In other words, this kind detection method can shorten active member and is in time under the opening.
Yet, because this kind detection method once only can detect at one group of panel unit, therefore the intact one group of panel unit of every survey then need move to probe on the connection pad corresponding to another group panel unit, and whenever moving a probe needs contraposition more once to touch on connection pad so that probe can be pressed really.When the panel element number for a long time, promptly need the long detection that just can finish all panel units detection time.Though can increase the probe groups number, to carry out simultaneously, to organize the detections of panel units more, and then shorten detection time, relative detection cost also need improve.
Summary of the invention
The purpose of this invention is to provide a kind of detection line layout, it can shorten the required consumed time of the single or single group panel unit of indivedual detections.
Another object of the present invention provides a kind of manufacture method of display panels, and it can shorten with batch display panels and carry out the required consumed time of lighting test.
For reaching above-mentioned or other purpose, the present invention proposes a kind of detection line layout, and it is suitable for being used for detecting single or single group panel unit, and wherein each panel unit has many first signal wires and many secondary signal lines.This detection line layout comprise first multiplexer (Multiplexer, MUX) and first detect connection pad.Wherein, first multiplexer is first signal wire that is electrically connected on these panel units, and first to detect connection pad be to be electrically connected on first multiplexer, and first multiplexer is suitable for optionally the first signal wire conducting that detects connection pad and one group of panel unit with first.
In one embodiment of this invention, the first above-mentioned signal wire for example is sweep trace (scanline), and the secondary signal line for example is data line (data line).
In one embodiment of this invention, above-mentioned detection line layout also comprises many first short-circuit rods, it is to be electrically connected to the first above-mentioned multiplexer, and each bar first short-circuit rods all is connected in series some or all first signal wires of its pairing one group of panel unit.For instance, these first short-circuit rods comprise many first odd number short-circuit rods and many first even number short-circuit rods, and each first odd number short-circuit rods is odd number bar first signal wire of one group of panel unit of serial connection, and each first even number short-circuit rods then is even number bar first signal wire of one group of panel unit of serial connection.
In one embodiment of this invention, above-mentioned detection line layout also comprises a plurality of static discharges (electrostatic discharge, ESD) protective element, it is to be electrically connected on respectively between first signal wire of the first corresponding short-circuit rods and this group panel unit.
In one embodiment of this invention, the first above-mentioned multiplexer comprises a plurality of first oxide-semiconductor control transistors, the drain electrode of these first oxide-semiconductor control transistors is to be electrically connected on first respectively to detect connection pad, and the source electrode of each first oxide-semiconductor control transistors then is to be electrically connected with first signal wire of corresponding one group of panel unit respectively.
In one embodiment of this invention, above-mentioned detection line layout comprises that also first refreshes (refresh) signal provision unit, and it is to be electrically connected to above-mentioned first multiplexer.And, the first above-mentioned multiplexer also comprises a plurality of first refresh transistor, and the source electrode of each first refresh transistor is to be electrically connected between the source electrode and first signal wire of the first corresponding oxide-semiconductor control transistors, and the drain electrode of these first refresh transistor then is to be electrically connected on the first above-mentioned refresh signal feeding unit respectively.
In one embodiment of this invention, above-mentioned detection line layout comprises that also second multiplexer and second detects connection pad, be electrically connected on the secondary signal line of these panel units, and second to detect connection pad be to be electrically connected on second multiplexer, and second multiplexer is suitable for optionally the secondary signal line conducting that detects connection pad and one group of panel unit with second.
In one embodiment of this invention, above-mentioned detection line layout also comprises many second short-circuit rods, it is to be electrically connected to the second above-mentioned multiplexer, and each bar second short-circuit rods all is connected in series some or all secondary signal lines of its pairing one group of panel unit.For instance, these second short-circuit rods comprise many second odd number short-circuit rods and many second even number short-circuit rods, and each second odd number short-circuit rods is the odd number bar secondary signal line of one group of panel unit of serial connection, and each second even number short-circuit rods then is the even number bar secondary signal line of one group of panel unit of serial connection.
In one embodiment of this invention, above-mentioned detection line layout also comprises a plurality of static discharges (electrostatic discharge, ESD) protective element, it is to be electrically connected on respectively between the secondary signal line of the second corresponding short-circuit rods and this group panel unit.
In one embodiment of this invention, the second above-mentioned multiplexer comprises a plurality of second oxide-semiconductor control transistors, the drain electrode of these second oxide-semiconductor control transistors is to be electrically connected on second respectively to detect connection pad, and the source electrode of each second oxide-semiconductor control transistors then is to be electrically connected with the secondary signal line of corresponding one group of panel unit respectively.
In one embodiment of this invention, above-mentioned detection line layout comprises that also second refreshes (refresh) signal provision unit, and it is to be electrically connected to above-mentioned second multiplexer.And, the second above-mentioned multiplexer also comprises a plurality of second refresh transistor, and the source electrode of each second refresh transistor is to be electrically connected between the source electrode and secondary signal line of the second corresponding oxide-semiconductor control transistors, and the drain electrode of these second refresh transistor then is to be electrically connected on the second above-mentioned refresh signal feeding unit respectively.
The present invention also proposes a kind of manufacture method of display panels, it is to form liquid crystal layer earlier on first substrate, and one second substrate is provided again, then assembles first substrate and second substrate, so that liquid crystal layer is sealed between first substrate and second substrate, organize panel units and form more.Afterwards, form above-mentioned detection line layout, input point modulating signal detection line layout so far again is to carry out lighting test to these panel units.After test finished, first substrate and second substrate after the cutting assembling were to form a plurality of display panels.
In one embodiment of this invention, the method that forms above-mentioned liquid crystal layer comprise the formula of dripping inject (one drop fill, ODF).
In one embodiment of this invention, before forming above-mentioned liquid crystal layer, also be included in and form frame glue on first substrate, crossing a plurality of liquid crystal injection region on first substrate, and the liquid crystal layer of follow-up formation promptly is to be positioned at these liquid crystal injection regions.In addition, the method for assembling first substrate and second substrate for example is first pressing first substrate and second substrate, and then solidifies frame glue.Wherein, the method for curing frame glue for example is heat curing or ultraviolet light polymerization.
Detection line layout of the present invention be utilize multiplexer come optionally with the part panel unit with detect the connection pad conducting so that the detection of packets panel unit, therefore need not traveling probe in testing process, can finish the detection of all panel units.
For above and other objects of the present invention, feature and advantage can be become apparent, preferred embodiment cited below particularly, and conjunction with figs. are described in detail below.
Description of drawings
Fig. 1 is the schematic perspective view of known active array display panels.
Fig. 2 is the detection line schematic layout pattern of known a kind of panel unit.
Fig. 3 is the detection line schematic layout pattern of known another kind of panel unit.
Fig. 4 is the synoptic diagram of detection line layout in the first embodiment of the present invention.
Fig. 5 is the circuit diagram of the multiplexer 510 of Fig. 4.
Fig. 6 is the synoptic diagram of detection line layout in the second embodiment of the invention.
Fig. 7 is the synoptic diagram of detection line layout in the third embodiment of the invention.
Fig. 8 is the circuit diagram of the multiplexer 710 of Fig. 7.
Fig. 9 A to Fig. 9 C is the manufacturing process schematic top plan view of display panels in one embodiment of the invention.
The main element description of symbols
100: the active array display panels
110: active component array base board
112: active member
114: pixel electrode
116: sweep trace
118: data line
120,620: liquid crystal layer
130: colored filter
140,150,540,540o, 540e: short-circuit rods
200,502: panel unit
210,220,300: connection pad
500,700: the detection line layout
504a: first signal wire
504b: secondary signal line
512,712: oxide-semiconductor control transistors
514,714: transistor
520,720: detect connection pad
530,730: select signal bonding pad
550: protecting component for electrostatic discharge
560,760: the refresh signal feeding unit
610: the first substrates
614: frame glue
616: the liquid crystal injection region
630: the second substrates
A
1, A
2..., A
N-1, A
n: the group of panel unit
D1, D2, D1 ', D2 ': drain electrode
G1, G2, G1 ', D2 ': grid
IS, IS ': detection signal
RS: refresh signal
SS, SS ': select signal
S1, S2, S1 ', S2 ': source electrode
Embodiment
Fig. 4 is the synoptic diagram of detection line layout in the first embodiment of the present invention.Please refer to Fig. 4, detection line layout 500 of the present invention is in order to a plurality of panel units 502 are detected, wherein these panel units 502 are to have many first signal wire 504a and secondary signal line 504b respectively, and panel unit 502 promptly is by these first signal wire 504a and secondary signal line 504b, receives from the detection signal of detection line layout 500 inputs.In the present embodiment, the first signal wire 504a for example is a sweep trace, and secondary signal line 504b for example is a data line.
Please continue with reference to Fig. 4, detection line layout 500 comprises multiplexer 510 and detects connection pad 520.Wherein, detecting connection pad 520 is to be electrically connected on multiplexer 510, and is used for detecting the detection signal of panel unit 502 in order to reception.Multiplexer 510 is to be connected between the first signal wire 504a that detects connection pad 520 and panel unit 502, with the first signal wire 504a of conduction detection connection pad optionally 520, so that detection signal is so far organized in the panel unit 502 by first signal wire 504a transmission from detecting connection pad 520 with a certain group of panel unit of desiring to detect 502.In addition, the selection signal SS in order to control multiplexer 510 sees through the selection signal bonding pad 530 that is electrically connected with multiplexer 510 to transfer in the multiplexer 510.
What deserves to be mentioned is that each first signal wire 504a that organizes panel unit 502 is serially connected by short-circuit rods 540,510 of multiplexers are to be electrically connected with the first signal wire 504a of panel unit 502 by these short-circuit rods 540.Thus, the signal of being exported by multiplexer 510 can be passed in all panel units of same group 502 simultaneously by short-circuit rods 540.Wherein, these short-circuit rods 540 comprise odd number short-circuit rods 540o and even number short-circuit rods 540e, the odd number bar first signal wire 504a of each panel unit 502 is that short circuit is in each other by odd number short-circuit rods 540o, and the even number bar first signal wire 504a of each panel unit 502 then is in each other by even number short-circuit rods 540e short circuit.Certainly, the present invention do not limit the first signal wire 504a of the first signal wire 504a of even number bar and odd number bar must short circuit in each other, in other embodiments, also can make all first signal wire 504a short circuits each other, or make these first signal wires 504a grouping short circuit in other mode.
In addition, can also be provided with protecting component for electrostatic discharge 550 between the first signal wire 504a that each short-circuit rods 540o or short-circuit rods 540e are connected with it, it is in order to provide the dissipation path to the static charge in the panel unit 502, to avoid producing electrostatic breakdown in panel unit 502.
Below will illustrate the electronic component of multiplexer 510 inside, so that further describe the principle of work of multiplexer 510.
Fig. 5 is the circuit diagram of the multiplexer 510 of Fig. 4.Please refer to Fig. 5, multiplexer 510 for example is to comprise oxide-semiconductor control transistors 512.Wherein, the drain D 1 of these oxide-semiconductor control transistors 512 is to be electrically connected on respectively to detect connection pad 520, and its source S 1 then is to be electrically connected with the first signal wire 504a of corresponding one group of panel unit 502 respectively.
Please be simultaneously with reference to Fig. 4 and Fig. 5, in the present embodiment, the panel unit 502 of Fig. 4 for example is to be divided into A
1, A
2..., A
N-1, A
nEtc. group, and because the first signal wire 504a of present embodiment is a sweep trace, and multiplexer 510 is in order to the first signal wire 504a of conduction detection connection pad optionally 520 with each group panel unit 502, so the panel unit 502 with delegation is to be divided into same group among Fig. 4.
From the above, detect A as desire
1The panel unit 502 of group can be pressed one group of probe (not shown) to touch and detect connection pad 520 and selecting on the signal bonding pad 530, so that respectively detection signal IS is transferred in the detection line layout 500 by external circuit with selecting signal SS by probe.Multiplexer 510 is to apply voltages to and A according to selecting signal SS
1The grid G 1 of the oxide-semiconductor control transistors 512 that group panel unit 502 is electrically connected, and then open this oxide-semiconductor control transistors 512.Thus, detection signal IS can organize in the panel unit 502 and transfer to A1 to be detected from detecting connection pad 520 successively by drain D 1, source S 1 and the first signal wire 504a of oxide-semiconductor control transistors 512.At this,, therefore work as detection signal IS and transfer to A because the first signal wire 504a of present embodiment is a sweep trace
1After in the group panel unit 502, each pixel of this group panel unit 502 can be unlocked, and follow-up as long as input data signal is organized to A1 in the data line of all panel units 502, the related personnel can judge A according to the operative scenario of each panel unit 502
1Whether these panel units 502 in the group are specification product.
Specifically, the multiplexer 510 of present embodiment can also comprise a plurality of refresh transistor 514, wherein the source S 2 of each refresh transistor 514 is source S 1 and the first signal wire 504a that are electrically connected on corresponding oxide-semiconductor control transistors 512, and drain D 2 then is to be electrically connected on a refresh signal feeding unit 560.Detecting A
1Behind the panel unit 502 of group, as desire to carry out the detection of next group panel unit 502, then can will be connected to A
1The oxide-semiconductor control transistors 512 of group is closed, and opens refresh transistor 514, so that the refresh signal that refresh signal feeding unit 560 is exported (refresh signal) RS transfers to A by drain D 2, the source S 2 of refresh transistor 514 successively
1In the group panel unit 502, and then refresh (refresh) A
1Detection signal in the group panel unit 502.
Hold above-mentioned, with A
1Detection signals in the group panel unit 502 refresh finish after, can close A
1Organize pairing refresh transistor 514, then carry out the detection of other group panel unit 502 afterwards again with identical method.What is particularly worth mentioning is that, in the testing process of next group panel unit 502, needn't move and press the probe that touches in detecting on the connection pad 520, as long as select to desire control of turning transistor 512 by multiplexer 510.
Hence one can see that, detecting A
1In the process of group panel unit 502,, therefore needn't open the active member in other group panel unit 502, the A in the detection is only arranged because detection signal can't transfer in other group panel unit 502
1Active member in the group panel unit 502 need be in opening.In other words, detection line layout 500 of the present invention can be carried out detection of packets in counter plate unit 502, be in the time of opening with the active member that shortens in each panel unit 502, and then avoid the active member in the panel unit 502 to damage because of being in opening for a long time.
What needs one were carried is, though the multiplexer of the foregoing description is to be used for the optionally sweep trace of conduction detection connection pad and panel unit, but the person of ordinary skill in the field will be appreciated that, set multiplexer 510 also can be used to the data line (secondary signal line 504b just) of conduction detection connection pad optionally 520 and panel unit 502 in the detection line layout 500, as shown in Figure 6.And detection line layout of the present invention can also utilize two multiplexers to come respectively the optionally sweep trace and the data line of conduction detection connection pad and panel unit, with each panel unit of indivedual detections.Hereinafter will it be described for embodiment.
Fig. 7 is the synoptic diagram of detection line layout in the third embodiment of the invention.Please refer to Fig. 7, the element that constitutes detection line layout 700 also includes multiplexer 710 and detects connection pad 720 except the multiplexer 510 and detection connection pad 520 of previous embodiment.In the present embodiment, these panel units 502 are the matrixes that are arranged in the ranks formula.Wherein, multiplexer 510 is in order to the first signal wire 504a (sweep trace) of conduction detection connection pad optionally 520 with certain row (column) panel unit 502, and 710 of multiplexers are in order to the secondary signal line 504b (data line) with certain row (row) panel unit 502 of conduction detection connection pad 720 optionally.And as shown in Figure 8, the electronic component of the multiplexer 710 inside electronic component with multiplexer 510 inside haply is identical, the refresh transistor 714 that it also includes oxide-semiconductor control transistors 712 and is electrically connected with refresh signal feeding unit 760.
Please be simultaneously with reference to Fig. 5, Fig. 7 and Fig. 8, in the present embodiment, detection line layout 700 can be used for detecting single panel unit 502.For instance, detect the panel unit 502 that is positioned at first row, first row as desire, then earlier the probe (not shown) is pressed to touch and detecting connection pad 520, select signal bonding pad 530, detecting connection pad 720 and select on the signal bonding pad 730, so that respectively detection signal IS, IS ' are transferred in the detection line layout 700 by external circuit with selecting signal SS, SS ' by probe.
Hold above-mentionedly, multiplexer 510 is the grid G 1 that apply voltages to the oxide-semiconductor control transistors 512 that is electrically connected with the first row panel unit 502 according to selecting signal SS, and then opens this oxide-semiconductor control transistors 512.Thus, detection signal IS can be positioned at first panel unit 502 that is listed as and transfer to from detecting connection pad 520 successively by drain D 1, source S 1 and the first signal wire 504a of oxide-semiconductor control transistors 512.On the other hand, multiplexer 710 is the grid G 1 ' that apply voltages to the oxide-semiconductor control transistors 712 that is electrically connected with the first row panel unit 502 according to selecting signal SS ', and then opens oxide-semiconductor control transistors 712.Thus, detection signal IS ' can be positioned at first panel unit 502 of going and transfer to from detecting connection pad 720 successively by drain D 1 ', source S 1 ' and the secondary signal line 504b of oxide-semiconductor control transistors 712.
At this, because the first signal wire 504a of present embodiment is a sweep trace, so after in detection signal IS transfers to first panel unit 502 of going, each pixel in the panel unit 502 of this journey can be unlocked.But, therefore only there is the panel unit 502 that is positioned at first row, first row to come display frame according to detection signal IS ' because present embodiment is that detection signal IS ' is transferred in the panel unit 502 of first row.At this moment, the related personnel can judge whether it is specification product according to these panel unit 502 shown pictures.
From the above, detection line layout of the present invention is to utilize multiplexer to come panel unit that conducting desires to detect and detect connection pad, so that grouping or detect panel unit individually.Therefore, need not traveling probe in testing process, can finish the detection of all panel units.
In the manufacture process of display panels,, can significantly shorten the process time if use the formula of dripping of detection line layout collocation liquid crystal of the present invention to inject manufacturing process.The manufacturing process of this display panels hereinafter will be described.
Fig. 9 A to Fig. 9 C is the manufacturing process schematic top plan view of display panels in one embodiment of the invention.Please refer to Fig. 9 A, at first on first substrate 610, form liquid crystal layer 620.Wherein, for example be to be formed with a plurality of active member (not shown)s, pixel electrode (not shown) and the frame glue of arranging with array way 614 on first substrate 610, and frame glue 614 is to cross a plurality of liquid crystal injection region 616 on first substrate 610.Liquid crystal layer 620 promptly is the mode of injecting with the formula of dripping, and is formed in these liquid crystal injection regions 616.
Please refer to Fig. 9 B, second substrate 630 then is provided, and it is arranged at first substrate, 610 tops.Wherein, second substrate 630 for example is a colored filter.Afterwards, with second substrate 630 and 610 assemblings of first substrate,, organize panel units 502 and form so that liquid crystal layer 620 is sealed between first substrate 610, frame glue 614 and second substrate 630 more.And the method for assembling first substrate 610 and second substrate 630 for example is first application of force pressing first substrate 610 and second substrate 630, is then solidifying frame glue 614, so that first substrate 610 and second substrate 630 positively with each other bind.In the present embodiment, frame glue 614 can be heat-curable glue, also can be ultraviolet cured adhesive.In other words, present embodiment for example is to solidify frame glue 614 in the mode of heat curing or ultraviolet light polymerization.
After forming panel unit 502, then promptly be the detection line layout that forms Fig. 4, Fig. 6 or Fig. 7, and the input point modulating signal is to the detection line layout, so that lighting test is carried out in these panel unit 502 groupings.Wherein, in the lighting test process, each element of detection line layout and the operative scenario of panel unit 502 are described as preamble, repeat no more herein.
Please refer to Fig. 9 C, behind the lighting test of finishing all panel units 502, can cut and split (cutting) technology, so that first substrate 610 after the assembling of Fig. 9 B and second substrate 630 are cut into a plurality of display panels 600, and the follow-up manufacturing process of these display panels 600 is known by the person of ordinary skill in the field, repeats no more herein.
In sum, the present invention has following characteristics:
1. detection line layout of the present invention is to select the single or multiple panel unit desiring to detect with multiplexer, therefore using detection line layout of the present invention to detect in the process of panel unit, needn't move and press the probe that touches on the detection connection pad can finish the detection of all panel units.So, use detection line layout of the present invention can shorten required consumed time in the testing process effectively, and then reduce time cost.And, if use detection line layout of the present invention, then only need use one group of probe in the testing process, can finish the detection of all panel units.In other words, use detection line layout of the present invention can save the cost of making the required cost of probe.
2. using detection line layout of the present invention to detect in the process of panel unit, only having the active member in the panel unit in the detection to be under the opening, the active member in the remaining panel unit all can be in closed condition.That is to say, utilize the detection line layout of the present invention can a plurality of panel units of detection of packets, be in time under the opening to shorten active member in the panel unit, and then prolong the serviceable life of active member.
3. in the manufacturing process of display panels of the present invention, be earlier a plurality of panel units to be carried out lighting test before splitting not cutting, cut again afterwards and split manufacturing process and form a plurality of display panels.With earlier large substrates is cut in the known technology split for the practice of carrying out lighting test behind a plurality of display panels more by contrast, the present invention can carry out lighting test to a plurality of panel units simultaneously, and then significantly shortens with batch display panels and carry out the required consumed time of lighting test.
Though the present invention discloses as above with preferred embodiment; right its is not in order to limit the present invention; any person of ordinary skill in the field; without departing from the spirit and scope of the present invention; when can doing a little change and improvement, so protection scope of the present invention is as the criterion when looking the claim person of defining.
Claims (18)
1. detection line layout be suitable at least wherein one of a plurality of panel units is detected, and respectively this panel unit has many first signal wires and many secondary signal lines, it is characterized in that this detection line layout comprises:
First multiplexer is electrically connected on above-mentioned these first signal wires of above-mentioned these panel units;
First detects connection pad, is electrically connected on this first multiplexer, and wherein this first multiplexer is suitable for optionally these first above-mentioned these first signal wire conductings that detect connection pad and one group of panel unit; And
Many first short-circuit rods are electrically connected to this first multiplexer, and above-mentioned these first short-circuit rods are first signal wires that are connected in series its pairing one group of panel unit at least a portion respectively;
Wherein this first multiplexer comprises a plurality of first oxide-semiconductor control transistors, the drain electrode of above-mentioned these first oxide-semiconductor control transistors is to be electrically connected on this respectively first to detect connection pad, and respectively the source electrode of this first oxide-semiconductor control transistors is to be electrically connected with above-mentioned these first signal wires of corresponding one group of panel unit respectively.
2. detection line layout according to claim 1, it is characterized in that above-mentioned these first short-circuit rods comprise a plurality of first odd number short-circuit rods and a plurality of first even number short-circuit rods, and respectively this first odd number short-circuit rods is odd number bar first signal wire of its pairing one group of panel unit of serial connection, and respectively this first even number short-circuit rods is even number bar first signal wire of this group panel unit of serial connection.
3. detection line layout according to claim 1 is characterized in that also comprising a plurality of protecting component for electrostatic discharge, is electrically connected on respectively between part first signal wire of corresponding above-mentioned these first short-circuit rods and this group panel unit.
4. detection line layout according to claim 1 is characterized in that also comprising the first refresh signal feeding unit, is electrically connected to this first multiplexer.
5. detection line layout according to claim 4, it is characterized in that this first multiplexer also comprises a plurality of first refresh transistor, and respectively the source electrode of this first refresh transistor is to be electrically connected between the source electrode and above-mentioned these first signal wires of this corresponding first oxide-semiconductor control transistors, and the drain electrode of above-mentioned these first refresh transistor is to be electrically connected on this refresh signal feeding unit respectively.
6. detection line layout according to claim 1 is characterized in that also comprising:
Second multiplexer is electrically connected on above-mentioned these secondary signal lines of above-mentioned these panel units; And
Second detects connection pad, is electrically connected on this second multiplexer, and wherein this second multiplexer is suitable for optionally these second above-mentioned these secondary signal line conductings that detect connection pad and one group of panel unit.
7. detection line layout according to claim 6, it is characterized in that also comprising many second short-circuit rods, be electrically connected to this second multiplexer, and above-mentioned these second short-circuit rods are the secondary signal lines that are connected in series its pairing one group of panel unit at least a portion respectively.
8. detection line layout according to claim 7, it is characterized in that above-mentioned these second short-circuit rods comprise a plurality of second odd number short-circuit rods and a plurality of second even number short-circuit rods, and respectively this second odd number short-circuit rods is the odd number bar secondary signal line of its pairing one group of panel unit of serial connection, and respectively this second even number short-circuit rods is the even number bar secondary signal line of this group panel unit of serial connection.
9. detection line layout according to claim 7 is characterized in that also comprising a plurality of protecting component for electrostatic discharge, is electrically connected on respectively between the part secondary signal line of this corresponding second short-circuit rods and this group panel unit.
10. detection line layout according to claim 6, it is characterized in that this second multiplexer comprises a plurality of second oxide-semiconductor control transistors, the drain electrode of above-mentioned these second oxide-semiconductor control transistors is to be electrically connected on this respectively second to detect connection pad, and respectively the source electrode of this second oxide-semiconductor control transistors is to be electrically connected with above-mentioned these secondary signal lines of corresponding one group of panel unit respectively.
11. detection line layout according to claim 10 is characterized in that also comprising the second refresh signal feeding unit, is electrically connected to this second multiplexer.
12. detection line layout according to claim 11, it is characterized in that this second multiplexer also comprises a plurality of second refresh transistor, and respectively the source electrode of this second refresh transistor is to be electrically connected between the source electrode and above-mentioned these secondary signal lines of this corresponding second oxide-semiconductor control transistors, and the drain electrode of above-mentioned these second refresh transistor is to be electrically connected on this refresh signal feeding unit respectively.
13. detection line layout according to claim 1 it is characterized in that above-mentioned these first signal wires are sweep trace, and above-mentioned these secondary signal lines is data line.
14. the manufacture method of a display panels is characterized in that comprising:
On first substrate, form liquid crystal layer;
Second substrate is provided, is arranged at this first substrate top;
Assemble this first substrate and this second substrate,, and form many group panel units so that this liquid crystal layer is sealed between this first substrate and this second substrate;
Form the detection line layout of claim 1;
The input point modulating signal is to this detection line layout, respectively above-mentioned these panel units are carried out lighting test; And
This first substrate and this second substrate after the cutting assembling are to form a plurality of display panels.
15. the manufacture method of display panels according to claim 14 is characterized in that the method that forms this liquid crystal layer comprises the formula injection of dripping.
16. the manufacture method of display panels according to claim 14, it is characterized in that before forming this liquid crystal layer, also be included in and form frame glue on this first substrate, crossing a plurality of liquid crystal injection region on this first substrate, and this liquid crystal layer of follow-up formation is positioned at above-mentioned these liquid crystal injection regions.
17. the manufacture method of display panels according to claim 16 is characterized in that the method for assembling this first substrate and this second substrate comprises:
This first substrate of pressing and this second substrate; And
Solidify this frame glue.
18. the manufacture method of display panels according to claim 17 is characterized in that the method for solidifying this frame glue comprises heat curing or ultraviolet light polymerization.
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| Application Number | Priority Date | Filing Date | Title |
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| CNB2006100598538A CN100523824C (en) | 2006-03-15 | 2006-03-15 | Detecting circuit arrangement and manufacturing method of liquid crystal display panel |
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| CNB2006100598538A CN100523824C (en) | 2006-03-15 | 2006-03-15 | Detecting circuit arrangement and manufacturing method of liquid crystal display panel |
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| CN101038300A CN101038300A (en) | 2007-09-19 |
| CN100523824C true CN100523824C (en) | 2009-08-05 |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2014146367A1 (en) * | 2013-03-20 | 2014-09-25 | 深圳市华星光电技术有限公司 | Detection device of liquid crystal display panel |
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| CN101713813B (en) * | 2008-10-06 | 2012-06-06 | 中兴通讯股份有限公司 | SOC (system on chip) chip and method for testing same |
| CN102043292B (en) * | 2009-10-13 | 2013-03-27 | 胜华科技股份有限公司 | Active component array and detection method |
| CN102116945B (en) * | 2010-01-04 | 2012-11-07 | 京东方科技集团股份有限公司 | Device for distributing array substrate detection signals, and detection equipment |
| KR20140015887A (en) * | 2012-07-26 | 2014-02-07 | 삼성디스플레이 주식회사 | Safety driving system of display device and safety driving method of display device |
| CN102789076B (en) * | 2012-08-01 | 2016-02-03 | 深圳市华星光电技术有限公司 | The method for making of a kind of detection line and display panels |
| CN106814490A (en) * | 2017-03-20 | 2017-06-09 | 武汉华星光电技术有限公司 | The preparation method of narrow frame liquid crystal display panel |
| CN108873506B (en) | 2017-05-10 | 2021-01-22 | 京东方科技集团股份有限公司 | Motherboard and test method of motherboard |
| CN107068029B (en) * | 2017-06-20 | 2019-11-22 | 惠科股份有限公司 | A kind of the test circuit and test method of display panel |
| CN107544182A (en) * | 2017-10-24 | 2018-01-05 | 深圳市华星光电技术有限公司 | HVA orientations unit and the method for carrying out orientation to liquid crystal display panel using it |
| KR102489595B1 (en) * | 2017-12-15 | 2023-01-17 | 엘지디스플레이 주식회사 | Chip on film and display device incluidng the same |
| CN108648676B (en) * | 2018-05-14 | 2020-09-22 | 昆山国显光电有限公司 | Drive substrate and display panel |
| CN114333681B (en) * | 2018-09-27 | 2023-08-18 | 武汉天马微电子有限公司 | Display panel and display device |
| TWI683114B (en) * | 2018-11-28 | 2020-01-21 | 友達光電股份有限公司 | Display panel |
| CN114144826A (en) * | 2020-05-19 | 2022-03-04 | 京东方科技集团股份有限公司 | Display panel, display device, test method and crack detection method |
-
2006
- 2006-03-15 CN CNB2006100598538A patent/CN100523824C/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2014146367A1 (en) * | 2013-03-20 | 2014-09-25 | 深圳市华星光电技术有限公司 | Detection device of liquid crystal display panel |
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| CN101038300A (en) | 2007-09-19 |
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