CN201122570Y - Multi-example loading combination device of scanning electronic microscope - Google Patents
Multi-example loading combination device of scanning electronic microscope Download PDFInfo
- Publication number
- CN201122570Y CN201122570Y CNU200720131193XU CN200720131193U CN201122570Y CN 201122570 Y CN201122570 Y CN 201122570Y CN U200720131193X U CNU200720131193X U CN U200720131193XU CN 200720131193 U CN200720131193 U CN 200720131193U CN 201122570 Y CN201122570 Y CN 201122570Y
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- China
- Prior art keywords
- sample
- electronic microscope
- combination device
- scanning electronic
- loading combination
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Abstract
The utility model discloses a multi-sample loading combination device of a scanning electronic microscope, which comprises a supporting seat matched with the electronic microscope, a base seat provided with a plurality of grooves and arranged on the supporting seat and a sample seat respectively inserted in each groove on the base seat. The structure of the multi-sample loading combination device is reasonable, and the sample replacement is convenient and quick; the combination of the multiple-sample, multi-angle and different size sample seats can be performed; the infection and the pollution to the vacuum degree of the sample chamber is reduced; because the high conductivity metal precision finishing is adopted, the slot and the elastic steel ball can ensure the electrical conductivity of the connection among metal parts; the multi-sample loading combination device can be matched with the scanning electronic microscope of any model numbers and manufacturers for use.
Description
Technical field:
The utility model relates to a kind of scanning electron microscopy sample loading attachment.
Background technology:
At present, when the various product of application scanning electron microscope observation, carbonaceous conductive glue commonly used or conductive double-sided tape are bonded at the small sample platform on the big base to be observed both at home and abroad, and its electric conductivity and convenient degree of operation and the vacuum degree that adjusts the telescope to one's eyes are all influential.
Summary of the invention:
It is a kind of rational in infrastructure, easy to use that the purpose of this utility model is to provide, the various loading composite set of the scanning electron microscopy of favorable working performance.
Technical solution of the present utility model is:
The various product of a kind of scanning electron microscopy load composite set, comprise and the bearing of electron microscope coupling, it is characterized in that: be provided with the pedestal of a plurality of grooves on the bearing, specimen holder of plug-in mounting respectively in each groove on the pedestal.
The specimen holder of the different sizes of difference plug-in mounting, shape, angle in each groove on the pedestal.The specimen holder bottom is provided with the elastic steel ball device that contacts with base seat groove.
The utility model is rational in infrastructure, and sample is changed convenient, fast; Can carry out the combination of various product, multi-angle, different big or small specimen holders; Influence and pollution have been reduced to the sample vacuum chamber degree; Use the high-conductivity metal Precision Machining, slot and elastic steel ball are guaranteed the conductivity that connects between the metal parts; Can any model and the scanning electron microscopy coupling of producer use.
Description of drawings:
The utility model is described in further detail below in conjunction with drawings and Examples.
Fig. 1 is the configuration diagram of an embodiment of the utility model.
Fig. 2 is the configuration diagram of a specimen holder among Fig. 1.
Embodiment:
The various product of a kind of scanning electron microscopy load composite set, comprise the bearing 1 that mates with electron microscope, are provided with the pedestal 3 of a plurality of grooves 2 on the bearing 1, the specimen holder 4 of the different sizes of difference plug-in mounting, shape, angle in each groove on the pedestal.Specimen holder 4 bottoms are provided with the elastic steel ball device 5 that contacts with base seat groove.
Claims (3)
1, the various product of a kind of scanning electron microscopy load composite set, comprise and the bearing of electron microscope coupling, it is characterized in that: be provided with the pedestal of a plurality of grooves on the bearing, specimen holder of plug-in mounting respectively in each groove on the pedestal.
2, the various product of scanning electron microscopy according to claim 1 load composite set, it is characterized in that: the specimen holder of the different sizes of difference plug-in mounting, shape, angle in each groove on the pedestal.
3, the various product of scanning electron microscopy according to claim 1 and 2 load composite set, it is characterized in that: the specimen holder bottom is provided with the elastic steel ball device that contacts with base seat groove.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNU200720131193XU CN201122570Y (en) | 2007-12-04 | 2007-12-04 | Multi-example loading combination device of scanning electronic microscope |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNU200720131193XU CN201122570Y (en) | 2007-12-04 | 2007-12-04 | Multi-example loading combination device of scanning electronic microscope |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN201122570Y true CN201122570Y (en) | 2008-09-24 |
Family
ID=40009809
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNU200720131193XU Expired - Fee Related CN201122570Y (en) | 2007-12-04 | 2007-12-04 | Multi-example loading combination device of scanning electronic microscope |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN201122570Y (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102830056A (en) * | 2012-08-28 | 2012-12-19 | 杭州富如德科技有限公司 | Testing component of rotary liquid-solid two-phase flow erosive wear testing device |
| CN103730312A (en) * | 2014-01-09 | 2014-04-16 | 东北大学 | Sample platform for nanomechanic test system and using method thereof |
| CN103943445A (en) * | 2014-04-30 | 2014-07-23 | 湖州师范学院 | Sample placing auxiliary support |
| CN105651798A (en) * | 2015-12-30 | 2016-06-08 | 哈尔滨工业大学 | Sample clamp for t-EBSD (electron backscattered diffraction) test |
-
2007
- 2007-12-04 CN CNU200720131193XU patent/CN201122570Y/en not_active Expired - Fee Related
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102830056A (en) * | 2012-08-28 | 2012-12-19 | 杭州富如德科技有限公司 | Testing component of rotary liquid-solid two-phase flow erosive wear testing device |
| CN102830056B (en) * | 2012-08-28 | 2014-11-12 | 杭州富如德科技有限公司 | Testing component of rotary liquid-solid two-phase flow erosive wear testing device |
| CN103730312A (en) * | 2014-01-09 | 2014-04-16 | 东北大学 | Sample platform for nanomechanic test system and using method thereof |
| CN103730312B (en) * | 2014-01-09 | 2015-12-02 | 东北大学 | A kind of sample platform for nanomechanic test system and using method thereof |
| CN103943445A (en) * | 2014-04-30 | 2014-07-23 | 湖州师范学院 | Sample placing auxiliary support |
| CN105651798A (en) * | 2015-12-30 | 2016-06-08 | 哈尔滨工业大学 | Sample clamp for t-EBSD (electron backscattered diffraction) test |
| CN105651798B (en) * | 2015-12-30 | 2019-03-12 | 哈尔滨工业大学 | A kind of sample clamp for t-EBSD test |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C19 | Lapse of patent right due to non-payment of the annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |