CN205303412U - Scanning electron microscope specimen grip that can throw light on holds device - Google Patents
Scanning electron microscope specimen grip that can throw light on holds device Download PDFInfo
- Publication number
- CN205303412U CN205303412U CN201620012745.4U CN201620012745U CN205303412U CN 205303412 U CN205303412 U CN 205303412U CN 201620012745 U CN201620012745 U CN 201620012745U CN 205303412 U CN205303412 U CN 205303412U
- Authority
- CN
- China
- Prior art keywords
- workstation
- electron microscope
- scanning electron
- workbench
- boss
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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- Sampling And Sample Adjustment (AREA)
Abstract
The utility model provides a scanning electron microscope specimen grip that can throw light on holds device, includes the workstation, the one end of workstation is equipped with the fixture block no. One, the workstation upper surface transversely be equipped with the spout, it has the slider to inlay in the spout, the top of slider is equipped with the fixture block no. Two, the other end of workstation is equipped with the boss, the limit portion of boss passes through cylindrical spring and is connected with the slider, bottom in the spout is equipped with a plurality of blind holes, be equipped with the bracing piece in the blind hole, the top of bracing piece is equipped with the layer board, the limit portion of workstation is equipped with the recess, be equipped with the battery in the recess, limit portion on the workstation vertically is equipped with the telescopic link, the top of telescopic link is articulated through damping pivot and lamp pole, the end of lamp pole is equipped with the bulb. The utility model discloses the angle that can conveniently adjust bulb on the lamp pole through the design of damping pivot, convenient to the sample scanning see time measuring and throw light on.
Description
Technical field
This utility model relates to a kind of scanning electron microscope sample clamping device illuminated.
Background technology
When using scanning electron microscope, it is necessary to be put into by sample on sample clamping device, but bring inconvenience to when the light is dusky sometimes scanning observation.
Summary of the invention
The purpose of this utility model is for above-mentioned deficiency, it is provided that a kind of scanning electron microscope sample clamping device illuminated.
Described purpose is achieved by the following scheme: a kind of scanning electron microscope sample clamping device illuminated, including workbench, one end of described workbench is provided with a fixture block, described worktable upper surface be transversely provided with chute, it is inlaid with slide block in described chute, the top of described slide block is provided with No. two fixture blocks, the other end of described workbench is provided with boss, the edge of described boss is connected with slide block by cylindrical spring, bottom in described chute is provided with multiple blind hole, it is provided with support bar in described blind hole, the top of described support bar is provided with supporting plate, the edge of described workbench is provided with groove, it is provided with accumulator in described groove, edge on described workbench is longitudinally provided with expansion link, the top of described expansion link is hinged by Damping rotation shaft and lamp stand, the termination of described lamp stand is provided with bulb.
A described fixture block and the corresponding sidewall of No. two fixture blocks are provided with anti-slip veins.
This utility model has the advantage that this utility model can pass through the angle of bulb on the design convenient adjustment lamp stand of Damping rotation shaft, is illuminated when conveniently Sample Scan being observed.
Accompanying drawing explanation
Fig. 1 is structural representation of the present utility model.
Wherein, 1-workbench, number fixture block of 2-, 3-chute, 4-slide block, No. bis-fixture blocks of 5-, 6-boss, 7-cylindrical spring, 8-blind hole, 9-support bar, 10-supporting plate, 11-groove, 12-accumulator, 13-expansion link, 14-Damping rotation shaft, 15-lamp stand, 16-bulb.
Detailed description of the invention
This utility model is elaborated preferred embodiment below in conjunction with accompanying drawing.
A kind of scanning electron microscope sample clamping device illuminated, including workbench 1, one end of described workbench 1 is provided with a fixture block 2, described workbench 1 upper surface be transversely provided with chute 3, it is inlaid with slide block 4 in described chute 3, the top of described slide block 4 is provided with No. two fixture blocks 5, the other end of described workbench 1 is provided with boss 6, the edge of described boss 6 is connected with slide block 4 by cylindrical spring 7, bottom in described chute 3 is provided with multiple blind hole 8, it is provided with support bar 9 in described blind hole 8, the top of described support bar 9 is provided with supporting plate 10, the edge of described workbench 1 is provided with groove 11, it is provided with accumulator 12 in described groove 11, edge on described workbench 1 is longitudinally provided with expansion link 13, the top of described expansion link 13 is hinged by Damping rotation shaft 14 and lamp stand 15, the termination of described lamp stand 15 is provided with bulb 16. a described fixture block 2 sidewall corresponding with No. two fixture blocks 5 is provided with anti-slip veins.
Slide block 4 is promoted to slide in chute 3 by the elastic force of cylindrical spring 7, by the cooperation of a fixture block 2 and No. two fixture blocks 5, sample is clamped, the design of anti-slip veins is conducive to fixing sample, meet sample heavier time, volume per sample is held by the supporting plate 10 on support bar 9, and support bar 9 can volume size per sample be alternatively provided in suitable blind hole 8.
Bulb 16 is connected with lamp stand by lamp socket, and lamp socket is connected with accumulator 12 by connecting line, regulated the angle of lamp stand 15 by Damping rotation shaft 14 after, by bulb 16, sample is illuminated. With rear. By Damping rotation shaft 14, lamp stand 15 is merged with expansion link 13, save parking space. Expansion link 13 can highly stretch per sample, regulates the height of bulb 16 on lamp stand 15.
The exemplary illustrated of this patent is not simply limited its protection domain by present embodiment; it can also be carried out local and change by those skilled in the art; as long as no the spirit beyond this patent, all it is considered as the equivalent replacement to this patent, all at the protection domain of this patent.
Claims (2)
1. the scanning electron microscope sample clamping device that a kind can illuminate, including workbench (1), it is characterized in that: one end of described workbench (1) is provided with a fixture block (2), described workbench (1) upper surface be transversely provided with chute (3), slide block (4) it is inlaid with in described chute (3), the top of described slide block (4) is provided with No. two fixture blocks (5), the other end of described workbench (1) is provided with boss (6), the edge of described boss (6) is connected with slide block (4) by cylindrical spring (7), bottom in described chute (3) is provided with multiple blind hole (8), support bar (9) it is provided with in described blind hole (8), the top of described support bar (9) is provided with supporting plate (10), the edge of described workbench (1) is provided with groove (11), accumulator (12) it is provided with in described groove (11), edge on described workbench (1) is longitudinally provided with expansion link (13), the top of described expansion link (13) is hinged by Damping rotation shaft (14) and lamp stand (15), the termination of described lamp stand (15) is provided with bulb (16).
2. the scanning electron microscope sample clamping device illuminated according to claim 1, it is characterised in that: the sidewall that a described fixture block (2) is corresponding with No. two fixture blocks (5) is provided with anti-slip veins.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201620012745.4U CN205303412U (en) | 2016-01-08 | 2016-01-08 | Scanning electron microscope specimen grip that can throw light on holds device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201620012745.4U CN205303412U (en) | 2016-01-08 | 2016-01-08 | Scanning electron microscope specimen grip that can throw light on holds device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN205303412U true CN205303412U (en) | 2016-06-08 |
Family
ID=56485203
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201620012745.4U Expired - Fee Related CN205303412U (en) | 2016-01-08 | 2016-01-08 | Scanning electron microscope specimen grip that can throw light on holds device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN205303412U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106444036A (en) * | 2016-10-26 | 2017-02-22 | 北京云驾科技有限公司 | Splitting type HUD (Head Up Display) method and equipment based on cell phone |
| CN108200307A (en) * | 2018-03-14 | 2018-06-22 | 河北南昊高新技术开发有限公司 | Shaft relocation mechanism and scanner |
-
2016
- 2016-01-08 CN CN201620012745.4U patent/CN205303412U/en not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106444036A (en) * | 2016-10-26 | 2017-02-22 | 北京云驾科技有限公司 | Splitting type HUD (Head Up Display) method and equipment based on cell phone |
| CN108200307A (en) * | 2018-03-14 | 2018-06-22 | 河北南昊高新技术开发有限公司 | Shaft relocation mechanism and scanner |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20160608 Termination date: 20180108 |