CN201072437Y - DC/DC module aging test circuit - Google Patents
DC/DC module aging test circuit Download PDFInfo
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- CN201072437Y CN201072437Y CN 200720121343 CN200720121343U CN201072437Y CN 201072437 Y CN201072437 Y CN 201072437Y CN 200720121343 CN200720121343 CN 200720121343 CN 200720121343 U CN200720121343 U CN 200720121343U CN 201072437 Y CN201072437 Y CN 201072437Y
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Abstract
The utility model relates to a DC/DC module aging test circuit. An output end of the tested DC/DC module is connected with an input end through a feedback circuit. By adopting the DC/DC module aging test circuit of the utility model, the utilization ratio of electric energy can be improved, the equipment cost is reduced and the feedback efficiency is high.
Description
Technical field
The utility model relates to burn in test circuit, more particularly, relates to a kind of DC/DC module burn in test circuit.
Background technology
The burn-in test of power supply product generally wears out as the load of power supply product with resistance or feedback module at present, but it is aging cost height that resistance is done the shortcoming of load, electric energy loses fully, and the shortcoming that the feedback module is done load is the equipment cost height, and feedback efficient is low.
The utility model content
The technical problems to be solved in the utility model is, at the above-mentioned defective of prior art, provides a kind of DC/DC module burn in test circuit.
The technical scheme that its technical matters that solves the utility model adopts is: construct a kind of DC/DC module burn in test circuit, the output terminal of tested DC/DC module is connected to input end by feedback circuit.
In DC/DC module burn in test circuit described in the utility model, described feedback circuit is an adjustable resistance, and described adjustable resistance is connected between the positive output end of described DC/DC module and the positive input terminal or is connected between the negative output terminal and negative input end of described DC/DC module.Described adjustable resistance comprises: metal-oxide-semiconductor and control circuit; The source electrode of described metal-oxide-semiconductor positive input terminal, the grid that is connected to described DC/DC module that link to each other with the positive output end of described DC/DC module, drain is connected to described control circuit; Or the source electrode of described metal-oxide-semiconductor negative input end, the grid that is connected to the DC/DC module that link to each other, drain with the negative output terminal of DC/DC module is connected to described control circuit.
In DC/DC module burn in test circuit described in the utility model, described feedback circuit is an adjustable resistance, the first input end of described adjustable resistance is connected with the positive output end of described DC/DC module, first output terminal is connected with the positive input terminal of described DC/DC module, and second input end is connected with the negative output terminal of described DC/DC module, second output terminal is connected with the negative input end of described DC/DC module.Described adjustable resistance comprises: first and second metal-oxide-semiconductor and control circuit; The source electrode of described first metal-oxide-semiconductor positive input terminal, the grid that is connected to described DC/DC module that link to each other with the positive output end of described DC/DC module, drain is connected to described control circuit; The source electrode of described second metal-oxide-semiconductor negative input end, the grid that is connected to described DC/DC module that link to each other with the negative output terminal of described DC/DC module, drain is connected to described control circuit.
In DC/DC module burn in test circuit described in the utility model, described feedback circuit is a fixed resistance, described fixed resistance is connected between the positive output end and positive input terminal of described DC/DC module, is connected with adjustable resistance between the positive input terminal of the positive input terminal of power supply and described DC/DC module; Or described fixed resistance is connected between the negative output terminal and negative input end of described DC/DC module, is connected with described adjustable resistance between the negative input end of the negative input end of power supply and described DC/DC module.Described adjustable resistance comprises metal-oxide-semiconductor and control circuit, and the source electrode of described metal-oxide-semiconductor is connected with the power supply positive input terminal, drain electrode is connected with the positive input terminal of described DC/DC module, grid is connected to described control circuit; Or the source electrode of described metal-oxide-semiconductor is connected with the power-input end, drain electrode is connected with the negative input end of described DC/DC module, grid is connected to described control circuit.
In DC/DC module burn in test circuit described in the utility model, described feedback circuit comprises first and second fixed resistance; Described first fixed resistance is connected between the positive input terminal of the positive output end of described DC/DC module and described DC/DC module, and described second fixed resistance is connected between the negative input end of the negative output terminal of described DC/DC module and described DC/DC module; Between the input end of the input end of power supply and described DC/DC module, be connected with adjustable resistance.Described adjustable resistance comprises first and second metal-oxide-semiconductor and control circuit; The source electrode of described first metal-oxide-semiconductor is connected with the power supply positive input terminal, drain electrode is connected with the positive input terminal of described DC/DC module, grid is connected to described control circuit; The source electrode of described second metal-oxide-semiconductor is connected with the power-input end, drain electrode is connected with the negative input end of described DC/DC module, grid is connected to described control circuit.
In DC/DC module burn in test circuit described in the utility model, described DC/DC module comprises a DC/DC transducer or at least two DC/DC transducers that are connected in series.
Implement DC/DC module burn in test circuit of the present utility model, have following beneficial effect: the utilization rate of electrical height, equipment cost is low, and feedback efficient height.
Description of drawings
The utility model is described in further detail below in conjunction with drawings and Examples, in the accompanying drawing:
Fig. 1 is the logic diagram of the utility model DC/DC module burn in test circuit first embodiment;
Fig. 2 is the logic diagram of the utility model DC/DC module burn in test circuit second embodiment;
Fig. 3 is the logic diagram of the utility model DC/DC module burn in test circuit the 3rd embodiment;
Fig. 4 is the logic diagram of the utility model DC/DC module burn in test circuit the 4th embodiment;
Fig. 5 is the logic diagram of the utility model DC/DC module burn in test circuit the 5th embodiment;
Fig. 6 is the logic diagram of the utility model DC/DC module burn in test circuit the 6th embodiment;
Embodiment
Shown in Fig. 1,2,3,4,5,6, in DC/DC module burn in test circuit of the present utility model, the output terminal of tested DC/DC module 1 is connected to input end by feedback circuit 2.
In the embodiment as shown in Figure 1, described feedback circuit 2 is adjustable resistances, and described adjustable resistance is connected between the positive output end and positive input terminal of described DC/DC module 1.Described adjustable resistance comprises: metal-oxide-semiconductor and control circuit; The source electrode of described metal-oxide-semiconductor positive input terminal, the grid that is connected to described DC/DC module 1 that link to each other with the positive output end of described DC/DC module 1, drain is connected to described control circuit.
In the embodiment as shown in Figure 2, described feedback circuit 2 is adjustable resistances, and described adjustable resistance is connected between the negative output terminal and negative input end of described DC/DC module 1.Described adjustable resistance comprises: metal-oxide-semiconductor and control circuit; The source electrode of described metal-oxide-semiconductor negative input end, the grid that is connected to DC/DC module 1 that link to each other with the negative output terminal of DC/DC module 1, drain is connected to described control circuit.
In the embodiment as shown in Figure 3, further, described feedback circuit 2 is adjustable resistances, the first input end of described adjustable resistance is connected with the positive output end of described DC/DC module 1, first output terminal is connected with the positive input terminal of described DC/DC module 1, and second input end is connected with the negative output terminal of described DC/DC module 1, second output terminal is connected with the negative input end of described DC/DC module 1.Described adjustable resistance comprises: first and second metal-oxide-semiconductor and control circuit; The source electrode of described first metal-oxide-semiconductor positive input terminal, the grid that is connected to described DC/DC module 1 that link to each other with the positive output end of described DC/DC module 1, drain is connected to described control circuit; The source electrode of described second metal-oxide-semiconductor negative input end, the grid that is connected to described DC/DC module 1 that link to each other with the negative output terminal of described DC/DC module 1, drain is connected to described control circuit.
In the embodiment as shown in Figure 4, described feedback circuit 2 is fixed resistances, described fixed resistance is connected between the positive output end and positive input terminal of described DC/DC module 1, is connected with adjustable resistance between the positive input terminal of the positive input terminal of power supply and described DC/DC module 1; Described adjustable resistance comprises metal-oxide-semiconductor and control circuit, and the source electrode of described metal-oxide-semiconductor is connected with the power supply positive input terminal, drain electrode is connected with the positive input terminal of described DC/DC module 1, grid is connected to described control circuit.
In the embodiment as shown in Figure 5, described fixed resistance is connected between the negative output terminal and negative input end of described DC/DC module 1, is connected with described adjustable resistance between the negative input end of the negative input end of power supply and described DC/DC module 1.Described adjustable resistance comprises metal-oxide-semiconductor and control circuit, and the source electrode of described metal-oxide-semiconductor is connected with the power-input end, drain electrode is connected with the negative input end of described DC/DC module 1, grid is connected to described control circuit.
In the embodiment as shown in Figure 6, further, described feedback circuit 2 comprises first and second fixed resistance; Described first fixed resistance is connected between the positive input terminal of the positive output end of described DC/DC module 1 and described DC/DC module 1, and described second fixed resistance is connected between the negative input end of the negative output terminal of described DC/DC module 1 and described DC/DC module 1; Between the input end of the input end of power supply and described DC/DC module 1, be connected with adjustable resistance.Described adjustable resistance comprises first and second metal-oxide-semiconductor and control circuit; The source electrode of described first metal-oxide-semiconductor is connected with the power supply positive input terminal, drain electrode is connected with the positive input terminal of described DC/DC module 1, grid is connected to described control circuit; The source electrode of described second metal-oxide-semiconductor is connected with the power-input end, drain electrode is connected with the negative input end of described DC/DC module 1, grid is connected to described control circuit.
In DC/DC module burn in test circuit described in the utility model, described DC/DC module 1 comprises a DC/DC transducer or at least two DC/DC transducers that are connected in series.
As the DC/DC transducer is 700W, efficient is 86%, input voltage is under the situation of 54V so, input current is 15A, two module input currents are 30A, and resistance is (56-54)/24=0.083 ohm if we are provided with adjusting, and the feedback electric current is 24A so, under the situation of same aging power, input current only needs 6A.The DC/DC transducer of aging 700W needed power input 54*15=810W originally, only needed 54*3=162W now, energy-conservation 80%.
In fact the output of primary power source is adjustable, we consider that the output error of two secondary modules is 0.1V, the error of two series connection is 0.2V so, and the output error of primary power supply system is 0.1V, considers contact resistance pressure reduction again, loss on the line, the series electrical pressure reduction of primary power source output and two DC/DC transducers is 1V so, and the 1400W output power of two DC/DC transducers so is except the 25A*1V=25W loss, all feedbacks of remaining 1375W, efficient 98.2%.
Further, in DC/DC module burn in test circuit of the present utility model with an intelligent device (single-chip microcomputer or DSP) power controlling device at linear condition, and the output current of sampling DC/DC module, output voltage and other ageing information, the information that collects is reported the daemon software that runs on PC, can accomplish the flexibility (but aging load dynamic hop) of aging monitoring and aging mode.
Claims (10)
1. a DC/DC module burn in test circuit is characterized in that, the output terminal of tested DC/DC module (1) is connected to input end by feedback circuit (2).
2. DC/DC module burn in test circuit according to claim 1, it is characterized in that, described feedback circuit (2) is an adjustable resistance, and described adjustable resistance is connected between the positive output end of described DC/DC module (1) and the positive input terminal or is connected between the negative output terminal and negative input end of described DC/DC module (1).
3. DC/DC module burn in test circuit according to claim 2 is characterized in that described adjustable resistance comprises: metal-oxide-semiconductor and control circuit; The source electrode of described metal-oxide-semiconductor positive input terminal, the grid that is connected to described DC/DC module (1) that link to each other, drain with the positive output end of described DC/DC module (1) is connected to described control circuit; Or the source electrode of described metal-oxide-semiconductor and the negative output terminal of DC/DC module (1) negative input end, the grid that is connected to DC/DC module (1) that link to each other, drain is connected to described control circuit.
4. DC/DC module burn in test circuit according to claim 1, it is characterized in that, described feedback circuit (2) is an adjustable resistance, the first input end of described adjustable resistance is connected with the positive output end of described DC/DC module (1), first output terminal is connected with the positive input terminal of described DC/DC module (1), and second input end is connected with the negative output terminal of described DC/DC module (1), second output terminal is connected with the negative input end of described DC/DC module (1).
5. DC/DC module burn in test circuit according to claim 4 is characterized in that described adjustable resistance comprises: first and second metal-oxide-semiconductor and control circuit; The source electrode of described first metal-oxide-semiconductor positive input terminal, the grid that is connected to described DC/DC module (1) that link to each other, drain with the positive output end of described DC/DC module (1) is connected to described control circuit; The source electrode of described second metal-oxide-semiconductor negative input end, the grid that is connected to described DC/DC module (1) that link to each other, drain with the negative output terminal of described DC/DC module (1) is connected to described control circuit.
6. DC/DC module burn in test circuit according to claim 1, it is characterized in that, described feedback circuit (2) is a fixed resistance, described fixed resistance is connected between the positive output end and positive input terminal of described DC/DC module (1), is connected with adjustable resistance between the positive input terminal of the positive input terminal of power supply and described DC/DC module (1); Or described fixed resistance is connected between the negative output terminal and negative input end of described DC/DC module (1), is connected with described adjustable resistance between the negative input end of the negative input end of power supply and described DC/DC module (1).
7. DC/DC module burn in test circuit according to claim 6, it is characterized in that, described adjustable resistance comprises metal-oxide-semiconductor and control circuit, and the source electrode of described metal-oxide-semiconductor is connected with the power supply positive input terminal, drain electrode is connected with the positive input terminal of described DC/DC module (1), grid is connected to described control circuit; Or the source electrode of described metal-oxide-semiconductor is connected with the power-input end, drain electrode is connected with the negative input end of described DC/DC module (1), grid is connected to described control circuit.
8. DC/DC module burn in test circuit according to claim 1 is characterized in that described feedback circuit (2) comprises first and second fixed resistance; Described first fixed resistance is connected between the positive input terminal of the positive output end of described DC/DC module (1) and described DC/DC module (1), and described second fixed resistance is connected between the negative input end of the negative output terminal of described DC/DC module (1) and described DC/DC module (1); Between the input end of the input end of power supply and described DC/DC module (1), be connected with adjustable resistance.
9. DC/DC module burn in test circuit according to claim 8 is characterized in that described adjustable resistance comprises first and second metal-oxide-semiconductor and control circuit; The source electrode of described first metal-oxide-semiconductor is connected with the power supply positive input terminal, drain electrode is connected with the positive input terminal of described DC/DC module (1), grid is connected to described control circuit; The source electrode of described second metal-oxide-semiconductor is connected with the power-input end, drain electrode is connected with the negative input end of described DC/DC module (1), grid is connected to described control circuit.
10. according to any described DC/DC module burn in test circuit of claim 1～9, it is characterized in that described DC/DC module (1) comprises a DC/DC transducer or at least two DC/DC transducers that are connected in series.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200720121343 CN201072437Y (en) | 2007-07-09 | 2007-07-09 | DC/DC module aging test circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200720121343 CN201072437Y (en) | 2007-07-09 | 2007-07-09 | DC/DC module aging test circuit |
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| CN201072437Y true CN201072437Y (en) | 2008-06-11 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN 200720121343 Expired - Lifetime CN201072437Y (en) | 2007-07-09 | 2007-07-09 | DC/DC module aging test circuit |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2011044827A1 (en) * | 2009-10-16 | 2011-04-21 | 华为终端有限公司 | Self-diagnosis method and system for wireless data service device |
| CN104375039A (en) * | 2014-11-21 | 2015-02-25 | 华北电力大学（保定） | Testing system for isolation type direct-current transformer |
| CN104569680A (en) * | 2015-01-06 | 2015-04-29 | 工业和信息化部电子第五研究所 | Testing device and method for DC/DC converter |
| CN106451524A (en) * | 2015-08-07 | 2017-02-22 | 艾默生网络能源有限公司 | Power supply system and aging method of power supply module of power supply system |
| CN106645916A (en) * | 2015-10-29 | 2017-05-10 | 国网智能电网研究院 | Power test system of high-voltage DC-DC converter |
-
2007
- 2007-07-09 CN CN 200720121343 patent/CN201072437Y/en not_active Expired - Lifetime
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2011044827A1 (en) * | 2009-10-16 | 2011-04-21 | 华为终端有限公司 | Self-diagnosis method and system for wireless data service device |
| CN104375039A (en) * | 2014-11-21 | 2015-02-25 | 华北电力大学（保定） | Testing system for isolation type direct-current transformer |
| CN104569680A (en) * | 2015-01-06 | 2015-04-29 | 工业和信息化部电子第五研究所 | Testing device and method for DC/DC converter |
| CN106451524A (en) * | 2015-08-07 | 2017-02-22 | 艾默生网络能源有限公司 | Power supply system and aging method of power supply module of power supply system |
| CN106451524B (en) * | 2015-08-07 | 2019-03-05 | 维谛技术有限公司 | The aging method of power-supply system and its power module |
| CN106645916A (en) * | 2015-10-29 | 2017-05-10 | 国网智能电网研究院 | Power test system of high-voltage DC-DC converter |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| ASS | Succession or assignment of patent right |
Owner name: YADA POWER SUPPLY PRODUCTS (SHENZHEN) CO., LTD. Free format text: FORMER OWNER: AIMOSHENG NETWORK ENERGY SOURCE CO LTD Effective date: 20140904 |
|
| C41 | Transfer of patent application or patent right or utility model | ||
| COR | Change of bibliographic data |
Free format text: CORRECT: ADDRESS; FROM: 518057 SHENZHEN, GUANGDONG PROVINCE TO: 518101 SHENZHEN, GUANGDONG PROVINCE |
|
| TR01 | Transfer of patent right |
Effective date of registration: 20140904 Address after: 518101 Guangdong city of Shenzhen province Baoan District Xin'an road two North 68 Street office Honglang District Industrial Park plant Patentee after: Astec power supply (Shenzhen) Co., Ltd. Address before: 518057 Nanshan District science and Technology Industrial Park, Guangdong, Shenzhen Branch Road, No. Patentee before: Aimosheng Network Energy Source Co., Ltd. |
|
| CX01 | Expiry of patent term | ||
| CX01 | Expiry of patent term |
Granted publication date: 20080611 |