CN200953088Y

CN200953088Y - DCS performance comprehensive tester

Info

Publication number: CN200953088Y
Application number: CN 200620055193
Authority: CN
Inventors: 周丹
Original assignee: Individual
Current assignee: Individual
Priority date: 2006-02-23
Filing date: 2006-02-23
Publication date: 2007-09-26
Anticipated expiration: 2016-02-23

Abstract

This utility model relates to one electronic instrument for performance test of DCS (distributed control system) and PLC (programmable logic control). Specifically, it is one DCS and PLC performance tester that includes eight analog input channels with a sampling speed of 100,000bit/sec and 16bit A/D resolution; eight highly accurate pulse signal generating channels with a temporal resolution of 0.1ms; eight passive 4 to 20mA current signal generating channels that can also work as function generators. The instrument is connected to the computer via USB and IPT interface. It is convenient for carriage as no external mains power is needed. It is used to test the main performance indexes and appraise the working conditions and properties of DCS and PLC equipment.

Description

The DCS comprehensive test instrument for performance

Affiliated technical field:

The utility model relates to a kind of electronic equipment that carries out performance test at DCS (scattered control system) and PLC (programmable logic controller (PLC)) system, is a kind of DCS comprehensive test instrument for performance specifically.

Background technology:

Current, DCS and PLC system have obtained using widely at industrial circle, and become the monitoring maincenter of industrial processes.The reliability of its performance has constituted crucial influence to production run safe, stable.At present, the instrument and equipment that does not also not carry out integration test at DCS and PLC system multinomial performance index.This product can be finished this function, for industrial process safety, stable operation provide technical guarantee.

Summary of the invention:

The present invention is directed to the test of the performance index of DCS system, effective signal source and means of testing are provided, measure the performance index parameter of DCS system.

For achieving the above object, the utility model DCS comprehensive test instrument for performance is by high-speed data acquisition, the generation of analog quantity test signal, high precision pulse signal generation function.And data transmission is shown in computing machine by USB interface.The change of hardware capability and parameter is sent instruction control by USB interface to instrument by computing machine.

Be convenient on-the-spot the use, instrument adopts low power dissipation design, by the USB interface power supply, need not to provide external power supply.

The utility model high-speed data acquisition function has 8 passages, up to 100,000 times/second data acquisition rate, and 16 data resolution.Can be used for output accuracy test, the test in central processing unit for processing cycle, power supply, controller or the communication module redundancy handoff functionality and test switching time etc. of the analog output channel of DCS system.

Analog signals generator function has 8 passages, exports passive 4～20mA current signal, has the function generator function, and parameter is set by the user.The testing performance index such as analog input channel precision, series mode rejection ratio, antijamming capability and the passage verification that are applicable to the DCS system are used.

High precision pulse signal generator function has 8 passages, each passage is exportable can to reach the pulse signal of 0.1ms based on the resolution of same time reference, be applicable to the DCS system the SOE functional test, stand between clock synchronization property testing and the anti-shake functional test of DI passage.

These functions of the equipments have contained the main performance index of DCS, have filled up the blank of DCS and PLC ability meter instruments and meters, for the DCS performance test provides technological means easily, provide technique guarantee for guaranteeing industrial safety, stable operation.

Description of drawings:

Fig. 1 is a system construction drawing of the present utility model

Fig. 2 is a High Speed Data Acquisition Circuit block scheme of the present utility model

Fig. 3 is an analog quantity measuring signal generator circuit block diagram of the present utility model

Fig. 4 is a high-speed pulse signal generator circuit block scheme of the present utility model

Specific embodiment:

The utility model is described in further detail below in conjunction with accompanying drawing:

Below in conjunction with accompanying drawing in detail CONSTRUCTED SPECIFICATION of the present utility model is described in detail:

The circuit of equipment set comprises 3 most functions as shown in Figure 1, High Speed Data Acquisition Circuit, analog quantity test signal generation circuit and high-speed pulse signal generating circuit.

High Speed Data Acquisition Circuit is as shown in Figure 2: system is made up of 7 integrated circuit, on-the-spot 8 tunnel analog quantity input signals insert the S1～S8 pin of ADG506 multi-analog input switch integrated circuit, the A0 of ADG506 integrated circuit～A3 pin is connected with P0.0～P0.3 of single-chip microcomputer integrated circuit P89C51, accept the corresponding passage of input channel selection instruction connection that single-chip microcomputer sends, and corresponding simulating amount signal is exported by D and EN pin.AD7610 is the high-speed a/d converter ic, the D of signal input part IN and INGND pin and ADG506 is connected with the EN pin, sheet selects the P2.1 pin of CS pin and P89C51 to be connected, after ADG506 connects the passage of needs, single-chip microcomputer sends the CS signal, AD7610 carries out the A/D conversion to signal, and the numerical value after will changing sends to single-chip microcomputer P1.0 pin by the RD pin simultaneously and converts signal by D0～D15 output.The high least-significant byte of the signal after the conversion is divided into 2 groups of A1～A8 pins that enter 23 attitude gating circuit SN54HCT245, the P0.4 of single-chip microcomputer P89C51 is connected with the OE pin of 2 SN54HCT245 respectively with the P0.5 pin, send into D0～D7 pin of IDT7207 successively according to the order of most-significant byte behind the first least-significant byte data after with the AD conversion, the state of fifo fifo buffer circuit IDT7207 is connected with P1.2 with the P1.1 of single-chip microcomputer P89C51 with EF by pin FF, send in the single-chip microcomputer, the P0.6 pin of single-chip microcomputer and the W pin of IDT7207 are connected, and control writes data among the IDT7207 successively.Data output Q0～Q7 pin of IDT7207 and DATA0～DATA7 pin of usb circuit PDIUSBD12 are connected, PDIUSBD12 reads data among the IDT7207 by dma mode, data read is connected with the P2.0 pin with the P1.3 of confirmation signal by DMREQ and DMACK_N pin and single-chip microcomputer, P0.7 pin by single-chip microcomputer sends the R pin of reading data signal to IDT7207, data is sent into DATA0～DATA7 port of PDIUSBD12.Carry out exchanges data by D+ and D-data line and USB interface of computer.

Entire circuit is worked under the control of single-chip microcomputer P89C51.What the device of a whole set of circuit was selected for use is low energy-consumption electronic device, reduces the power consumption of equipment, has adopted the FIFO mode that data are cushioned, and guarantees that data can not cause loss of data because of the intersystem communications reason.Adopt high speed device, guarantee that the speed of data acquisition is not less than 100,000 times/second, satisfy the needs of DCS performance test.

The analog quantity test signal produces circuit as shown in Figure 3: have 8 groups of identical circuit of structure and constitute.

Usb circuit PDIUSBD12 is from the computing machine accepted data file, send the data sending request signal by the DMREQ pin to single-chip microcomputer P89C51 P3.0 pin, single-chip microcomputer sends the address data memory instruction by P0.0～P0.7 pin and P1.0～P1.5 pin to address strobe pin A0～14 of data-carrier store circuit HM62256 after receiving signal, and send confirmation signal to the DMACK_N of PDIUSBD12 pin by the P2.0 pin, WE by P2.1～P2.3 pin control HM62256, OE, thereby the Wave data file that CS three-prong control HM62256 storage is transmitted from USB interface, the PDIUSB12 chip is by the IO0～IO7 pin transmission data of DATA0～DATA7 pin to HM62256, after data transmission is finished, DB0～DB7 pin of D/A conversion chip AD7357 is sent into by IO0～IO7 the data of storing among the HM62256 in single-chip microcomputer P89C51 control successively with data, single-chip microcomputer P89C51 is by the CS of pin P2.4～P2.6 control AD7357, WR, the UPD pin, digital signal is converted to analog signals, by IoutA and AGND pin output analog signals.The XTR101 chip by+IN and-the IN pin accepts this analog signals, connect by the circuit on Fig. 3 voltage signal is converted to the passive electric current output of 4～20mA.Each output loop all adopts independent circuits, and element adopts low power dissipation design, can produce the required signal of DCS analog input channel test.

High-accuracy pulse is towards signal generator circuit as shown in Figure 4: the current computer technical development is swift and violent, the CPU frequency signal has reached the GHZ order of magnitude, frequency stability and accuracy are very high, and the signal source that is used as ms level pulse signal can be accomplished the 0ms error basically, are desirable time reference signals.This instrument adopts this principle, extract the CPU frequency signal, through frequency dividing circuit, produce specific pulse sequence signal, by the output of computing machine LPT mouth, the P2 of LPT interface～P9 pin connects the pin one of 8 photoelectric coupled device MOC3020 respectively, and the pin two of MOC3020 all is connected with the P25 pin of LPT interface, thereby control the on off operating mode of each MOC3020 by P2～P9 of LPT, thereby control the on off operating mode of output channel.As signal source the switching value input channel of DCS is carried out performance test.

Claims

1, a kind of DCS ability meter, it is characterized in that: comprise that 8 have the per second data acquisition rate 100,000 times, 16 A/D resolution analog input channels, 8 temporal resolutions can reach the high precision pulse signal generation passage of 0.1ms, passive 4～20mA current signal generation passage of 8 road tool function generator functions, instrument is connected with computing machine by USB interface.

2, DCS ability meter according to claim 1, it is characterized in that: analog quantity input Acquisition Circuit is made up of 7 integrated circuit, system is made up of 7 integrated circuit, on-the-spot 8 tunnel analog quantity input signals insert the S1～S8 pin of ADG506 circuit, P0.0～P0.3 of the A0 of ADG506 integrated circuit～A3 pin and P89C51 is connected, the IN of the D of ADG506 and EN pin and AD7610 is connected with the INGND pin, the CS pin of AD7610 and the P2.1 pin of P89C51 are connected, the RD pin of AD7610 and the P1.0 pin of P89C51 are connected, the D0 of AD7610～D15 pin is divided into high least-significant byte and is divided into the 2 groups of A1 that enters 2 SN54HCT245～A8 pins, the P0.4 of P89C51 is connected with the OE pin of 2 SN54HCT245 respectively with the P0.5 pin, the D0 of the B1～B8 of SN54HCT245 and IDT7207～D7 pin is connected, the pin FF of IDT7207, the P1.1 of EF and W and P89C51, P1.2 is connected with P0.6, the DATA0 of the Q0 of IDT7207～Q7 pin and PDIUSBD12～DATA7 pin is connected, the P1.3 of the DMREQ of PDIUSBD12 and DMACK_N pin and P89C51 is connected with the P2.0 pin, the P0.7 pin of P89C51 and the R pin of IDT7207 are connected the D+ of PDIUSBD12, D-pin and USB interface of computer are carried out exchanges data.

3, DCS ability meter according to claim 1, it is characterized in that: the analog quantity test signal produces circuit has 8 groups of identical circuit of structure to constitute, the D+ of PDIUSBD12 is connected with USB interface of computer with the D-pin, the DMREQ of PDIUSBD12, DMACK_N pin and single-chip microcomputer P89C51 P3.0, the P2.0 pin connects, the P0.0 of P89C51～P0.7 pin is connected with pin A0～A14 of P1.0～P1.5 pin and HM62256, the WE of the P2.1 of P89C51～P2.3 pin and HM62256, OE, the CS pin connects, the IO0 of the DATA0 of PDIUSB12～DATA7 pin and HM62256～IO7 pin is connected, the DB0 of the IO0 of HM62256～IO7 pin and AD7357～DB7 pin is connected, pin P2.4～the P2.6 of P89C51 and the CS of AD7357, WR, the UPD pin connects, the IoutA of AD7357 and AGND pin and XTR101 chip+IN is connected with-IN pin.

4, DCS ability meter according to claim 1, it is characterized in that: high-accuracy pulse constitutes towards signal generator circuit, the P2 of computing machine LPT interface～P9 pin is connected with the pin one of 8 photoelectric coupled device MOC3020 respectively, the pin two of MOC3020 all is connected with the P25 pin of LPT interface, and 4,6 pins of MOC3020 produce the pulsed quantity test signal as output.