CN1987404B - Electronic universal tester - Google Patents

Electronic universal tester Download PDF

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Publication number
CN1987404B
CN1987404B CN2005101116805A CN200510111680A CN1987404B CN 1987404 B CN1987404 B CN 1987404B CN 2005101116805 A CN2005101116805 A CN 2005101116805A CN 200510111680 A CN200510111680 A CN 200510111680A CN 1987404 B CN1987404 B CN 1987404B
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China
Prior art keywords
load sensor
electronic universal
testing machine
universal tester
shifting beam
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CN2005101116805A
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Chinese (zh)
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CN1987404A (en
Inventor
卢长城
李明义
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Hualong Detector Co., Ltd., Shanghai
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HUALONG DETECTOR CO Ltd SHANGHAI
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Priority to CN2005101116805A priority Critical patent/CN1987404B/en
Publication of CN1987404A publication Critical patent/CN1987404A/en
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Abstract

The testing machine includes a shifting beam, and a drive unit connected to the shifting beam. The drive unit drives the shifting beam to implement loading. The machine also includes small load sensor connected to the shifting beam, and a small load tension clamp connected to the small load sensor. Through expansion of the shifting beam, framework structure of small load sensor is built out. Using drive system of experimental space of large load sensor, through ball screw brought along by a transmission system, the framework structure of small load sensor drives the shifting beam to implement loading so as to carry out mechanical test under different load measuring range. The invention solves general issue that current electronic universal testing machine cannot accomplish testing task since 'exceeding low limit of effective measuring range of sensor'. The machine provides handy operation.

Description

Electronic universal tester
Technical field
The present invention relates to a kind of electronic universal tester, specifically, relate to measurement range electronic universal tester wide, easy and simple to handle.
Background technology
The electronic universal tester main frame of traditional a kind of single space structure as shown in Figure 1, its principle of work is, drive system 16 drives ball-screw 13 by kinematic train 15, thereby driving moving beam 11 realizes loading, test specimen is clipped on the anchor clamps 14, and the load of test specimen is measured by sensor 12.The shortcoming of this structure is as follows: the test that exceeds sensor effective range lower limit can't be finished; Such as the 300kN electronic universal tester, its effective range is 0.6~300kN, can't realize the pilot project of load less than 0.6kN; Electronic universal tester will be done the test of disparity items such as stretching, compression, bending, and the test fixture difference of every kind of project is finished different pilot projects in a space, change the anchor clamps of respective item, complex operation.
Fig. 2 has shown that poor lotus double space (is big load operation space between the anchor clamps 24, be little load operation space between the anchor clamps 28) the electronic universal tester main frame of structure, the principle of work in its big load operation space is with Fig. 1 structure, the driving in little load operation space, transmission are until same Fig. 1 of action of moving beam 21, test specimen is clipped on the anchor clamps 28, and the load of test specimen is measured by little load sensor 27.Though this structure has solved first problem of Fig. 1 structure, carry out little load test in its upper side and need step on the halfpace operation, operation inconvenience.
Fig. 3 (is the stretching work space for waiting lotus double space between the anchor clamps 34, be compression, crooked work space between the anchor clamps 37) the electronic universal tester main frame of structure, its principle of work is used for doing tension test with Fig. 1 structure between the anchor clamps 34, be used for doing compression, bending test between the anchor clamps 37.The shared load sensor 32 in space is measured up and down.Though this structure has solved second problem of Fig. 1 structure, the test that exceeds sensor effective range lower limit can't be finished; Such as the 300kN electronic universal tester, its effective range is 0.6~300kN, can't realize the pilot project of load less than 0.6kN; The described inconvenience of stepping on halfpace at its upper side action need of Fig. 2 structure simultaneously, but this structure can change anchor clamps 34 and anchor clamps 37 up and down places the bottom can alleviate complex operation the anchor clamps of frequently use.
Summary of the invention
The objective of the invention is to, a kind of electronic universal tester is provided, test that existing electronic universal tester exceeds sensor effective range lower limit can't be finished and the technical matters of complex operation to overcome.
In order to achieve the above object, technical scheme of the present invention is as follows:
A kind of electronic universal tester comprises moving beam, and the drive unit that links to each other with moving beam, this drive unit drive moving beam and realize loading; This testing machine comprises: little load sensor links to each other with described moving beam; Little load stretching clamp links to each other with described little load sensor.
Outer attached primary school load sensor main machine structure is by the extension to moving beam, utilize the drive system of big load sensor test space, drive ball-screw by kinematic train, realize loading, carry out the mechanical property test of different load measurement range thereby drive moving beam.Solved the common problem of existing electronic universal tester structure " test that exceeds sensor effective range lower limit can't be finished ", and easy and simple to handle.
This testing machine comprises big load sensor, is connected on the described moving beam.
This testing machine comprises bending fixture, links to each other with described big load sensor.
Described drive unit comprises drive system, kinematic train and the ball-screw that links to each other successively.
Described big load stretching clamp is installed in the following space of this testing machine.
Described bending fixture is installed in the following space of this testing machine.
Description of drawings
Fig. 1 is a kind of electronic universal tester host structure chart of existing single space structure;
Fig. 2 is the electronic universal tester host structure chart of another kind of existing poor lotus double space;
Fig. 3 is the another kind of existing electronic universal tester host structure chart that waits the lotus double space;
Fig. 4 is an electronic universal tester host structure chart of the present invention;
Embodiment
According to Fig. 4, provide better embodiment of the present invention, and described in detail below, enable to understand better function of the present invention, characteristics.
Fig. 4 is (to load greatly and be big load stretching work space between the stretching clamp 44 in outer attached sensor three spaces, between the bending fixture 47 big load compression, crooked work space, be little load stretching work space between the anchor clamps 44) structure, this electronic universal tester, comprise moving beam 41, the ball-screw 43 that links to each other with moving beam 41, kinematic train 45 and drive system 46; This testing machine comprises: little load sensor 48 links to each other with described moving beam 41; Little load stretching clamp 49 links to each other with described little load sensor 48.Outer attached primary school load sensor 48 main machine structures are by the extension to moving beam 41, utilize the drive system 46 of big load sensor 42 test spaces, drive ball-screw 43 by kinematic train 45, realize loading thereby drive moving beam 41, carry out the mechanical property test of different load measurement range.
Such as the 300kN electronic universal tester, its effective range is 600~300000N, for the pilot project less than 600N, (its effective range is 2~1000N), and effective range has expanded to 2~300000N externally to increase the 1000N load sensor.So just can solve the common problem of existing electronic universal tester structure " test that exceeds sensor effective range lower limit can't be finished " easily.
The height of 300kN electronic universal tester is substantially between 2.3~2.5 meters, if little load test expands to space (as Fig. 2), people's height station at all and can't operate, must could realize operation by supplementary means, and the operation of outer attached sensor construction height is between 0.65~1 meter, the operator sits down and can finish test operation, and is not only comfortable but also convenient.
In addition,, select anchor clamps 44 or anchor clamps 47 are contained in down the space, avoided the problem of Fig. 1 structure operation inconvenience according to the frequent degree of using.
Above-described; it only is preferred embodiment of the present invention; be not in order to limiting scope of the present invention, promptly every simple, equivalence of doing according to the claims and the description of the present patent application changes and modifies, and all falls into the claim protection domain of patent of the present invention.

Claims (4)

1. an electronic universal tester comprises moving beam, and the drive unit that links to each other with moving beam, this drive unit drive moving beam and realize loading; It is characterized in that this testing machine comprises:
Little load sensor links to each other with described moving beam;
Little load stretching clamp links to each other with described little load sensor;
This testing machine also comprises big load sensor, is connected on the described moving beam;
This testing machine also comprises bending fixture, links to each other with described big load sensor.
2. electronic universal tester as claimed in claim 1 is characterized in that, described drive unit comprises drive system, kinematic train and the ball-screw that links to each other successively.
3. electronic universal tester as claimed in claim 1 is characterized in that, described big load stretching clamp is installed in the following space of this testing machine.
4. as claim 1 or 3 described electronic universal testers, it is characterized in that described bending fixture is installed in the following space of this testing machine.
CN2005101116805A 2005-12-20 2005-12-20 Electronic universal tester Active CN1987404B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN2005101116805A CN1987404B (en) 2005-12-20 2005-12-20 Electronic universal tester

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN2005101116805A CN1987404B (en) 2005-12-20 2005-12-20 Electronic universal tester

Publications (2)

Publication Number Publication Date
CN1987404A CN1987404A (en) 2007-06-27
CN1987404B true CN1987404B (en) 2010-10-06

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102507327A (en) * 2011-10-11 2012-06-20 浙江健力机动车部件有限公司 Instrument for detecting strength of welding points of check rings of synchronous belt wheel
CN108120631A (en) * 2016-11-30 2018-06-05 镇江石鼓文智能化系统开发有限公司 A kind of safe digital display gate-type electronic universal tester

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102721603A (en) * 2012-06-20 2012-10-10 新疆维吾尔自治区计量测试研究院 Electronic universal tester
CN103278377A (en) * 2013-06-05 2013-09-04 南通市华海铸造有限公司 New-type electronic universal material testing machine
CN108195678A (en) * 2018-02-08 2018-06-22 丹阳市鼎新机械设备有限公司 A kind of device for testing tensile strength of metal wire
CN110057654A (en) * 2019-05-16 2019-07-26 苏州汇才土水工程科技有限公司 A kind of New universal material test machine

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5948994A (en) * 1998-04-02 1999-09-07 Jen; Ming-Hwa R. Multi-functional test machine
CN1462871A (en) * 2003-06-26 2003-12-24 上海申联试验机厂 Three degree of freedom microcomputer controlled universal tester
US6679124B2 (en) * 2000-06-06 2004-01-20 Mts Systems Corporation Statistically rigid and dynamically compliant material testing system
CN2612942Y (en) * 2003-05-12 2004-04-21 深圳市新三思计量技术有限公司 Double space tester
CN2674430Y (en) * 2003-03-25 2005-01-26 上海华龙测试仪器有限公司 Microcomputer controlled electronic universal tester

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5948994A (en) * 1998-04-02 1999-09-07 Jen; Ming-Hwa R. Multi-functional test machine
US6679124B2 (en) * 2000-06-06 2004-01-20 Mts Systems Corporation Statistically rigid and dynamically compliant material testing system
CN2674430Y (en) * 2003-03-25 2005-01-26 上海华龙测试仪器有限公司 Microcomputer controlled electronic universal tester
CN2612942Y (en) * 2003-05-12 2004-04-21 深圳市新三思计量技术有限公司 Double space tester
CN1462871A (en) * 2003-06-26 2003-12-24 上海申联试验机厂 Three degree of freedom microcomputer controlled universal tester

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
JP平2-203240A 1990.08.13
JP平7-72058A 1995.03.17

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102507327A (en) * 2011-10-11 2012-06-20 浙江健力机动车部件有限公司 Instrument for detecting strength of welding points of check rings of synchronous belt wheel
CN108120631A (en) * 2016-11-30 2018-06-05 镇江石鼓文智能化系统开发有限公司 A kind of safe digital display gate-type electronic universal tester

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Owner name: SHANGHAI HUALONG TEST INSTRUMENTS CORPORATION

Free format text: FORMER NAME: HUALONG DETECTOR CO., LTD., SHANGHAI

CP01 Change in the name or title of a patent holder

Address after: 201202 Shanghai City, Pudong Chuansha Economic Zone, Sichuan Road No. 389

Patentee after: Shanghai Hualong Test Instruments Co., Ltd.

Address before: 201202 Shanghai City, Pudong Chuansha Economic Zone, Sichuan Road No. 389

Patentee before: Hualong Detector Co., Ltd., Shanghai

CP03 Change of name, title or address
CP03 Change of name, title or address

Address after: 201201 No. 389 Chuanhong Road, Chuansha Town, Pudong New Area, Shanghai

Patentee after: Hualong Detector Co., Ltd., Shanghai

Address before: No. 389 Chuanhong Road, Chuansha Economic Park, Pudong, Shanghai

Patentee before: Shanghai Hualong Test Instruments Co., Ltd.