CN1979187A - 多驱动方式的lcd驱动电路的测试装置及其测试方法 - Google Patents
多驱动方式的lcd驱动电路的测试装置及其测试方法 Download PDFInfo
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- CN1979187A CN1979187A CN 200510102008 CN200510102008A CN1979187A CN 1979187 A CN1979187 A CN 1979187A CN 200510102008 CN200510102008 CN 200510102008 CN 200510102008 A CN200510102008 A CN 200510102008A CN 1979187 A CN1979187 A CN 1979187A
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- 238000012360 testing method Methods 0.000 title claims abstract description 26
- 238000000034 method Methods 0.000 claims abstract description 6
- 238000012545 processing Methods 0.000 claims description 34
- 239000004973 liquid crystal related substance Substances 0.000 claims description 25
- 230000007274 generation of a signal involved in cell-cell signaling Effects 0.000 claims description 16
- 238000006243 chemical reaction Methods 0.000 claims description 12
- 238000009434 installation Methods 0.000 claims description 10
- 238000005086 pumping Methods 0.000 claims description 3
- 238000010998 test method Methods 0.000 claims description 3
- 238000011946 reduction process Methods 0.000 claims description 2
- 238000013461 design Methods 0.000 abstract description 11
- 238000004904 shortening Methods 0.000 abstract 1
- 230000000694 effects Effects 0.000 description 7
- 238000010586 diagram Methods 0.000 description 6
- 238000004088 simulation Methods 0.000 description 3
- 238000011161 development Methods 0.000 description 2
- 239000011159 matrix material Substances 0.000 description 2
- 241001270131 Agaricus moelleri Species 0.000 description 1
- 230000003321 amplification Effects 0.000 description 1
- 238000003491 array Methods 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000005284 excitation Effects 0.000 description 1
- 239000012467 final product Substances 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- 230000004304 visual acuity Effects 0.000 description 1
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- Liquid Crystal Display Device Control (AREA)
- Control Of Indicators Other Than Cathode Ray Tubes (AREA)
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Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CNB200510102008XA CN100526891C (zh) | 2005-12-07 | 2005-12-07 | 多驱动方式的lcd驱动电路的测试装置及其测试方法 |
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CNB200510102008XA CN100526891C (zh) | 2005-12-07 | 2005-12-07 | 多驱动方式的lcd驱动电路的测试装置及其测试方法 |
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Publication Number | Publication Date |
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CN1979187A true CN1979187A (zh) | 2007-06-13 |
CN100526891C CN100526891C (zh) | 2009-08-12 |
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CNB200510102008XA Expired - Fee Related CN100526891C (zh) | 2005-12-07 | 2005-12-07 | 多驱动方式的lcd驱动电路的测试装置及其测试方法 |
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Cited By (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101995686A (zh) * | 2010-11-18 | 2011-03-30 | 福州瑞芯微电子有限公司 | 基于fpga的lcdc模块的ft测试方法 |
CN102005194A (zh) * | 2010-09-14 | 2011-04-06 | 吴坚鸿 | 单色液晶模块通用驱动器 |
CN102054412A (zh) * | 2009-11-09 | 2011-05-11 | 纬创资通股份有限公司 | 共用电源和显示器检测不同主机板电路的设备及转接装置 |
CN102096038A (zh) * | 2010-11-23 | 2011-06-15 | 福州瑞芯微电子有限公司 | 基于fpga的vip模块的ft测试方法 |
CN103869709A (zh) * | 2012-12-13 | 2014-06-18 | 英飞凌科技股份有限公司 | 仿真系统和方法 |
CN102103818B (zh) * | 2009-12-17 | 2014-07-30 | 北京中星微电子有限公司 | 一种lcd控制器的测试方法及系统 |
CN106971686A (zh) * | 2017-05-25 | 2017-07-21 | 上海中航光电子有限公司 | 显示装置及其驱动方法 |
CN107436574A (zh) * | 2017-07-27 | 2017-12-05 | 北京东方赛腾科技有限公司 | 一种多功能信号发生器及其信号产生方法 |
CN108279072A (zh) * | 2018-01-18 | 2018-07-13 | 南京大学 | 一种基于超导氮化铌复用热、微波及太赫兹的直接检测器 |
CN108510921A (zh) * | 2017-12-29 | 2018-09-07 | 学校法人金泉大学 | Lcd模块检测系统 |
CN109324560A (zh) * | 2018-12-06 | 2019-02-12 | 中国科学院国家天文台 | 一种液晶驱动器、扫描控制系统及该系统的控制方法 |
CN110554260A (zh) * | 2019-08-13 | 2019-12-10 | 威胜信息技术股份有限公司 | 一种双路电压切换线损测量系统与控制方法及装置 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002156417A (ja) * | 2000-11-17 | 2002-05-31 | Oht Inc | 回路基板の検査装置及び検査方法 |
AU2002255823A1 (en) * | 2001-03-19 | 2002-10-03 | Nptest, Inc. | Test system formatters |
KR100491560B1 (ko) * | 2003-05-06 | 2005-05-27 | 엘지.필립스 엘시디 주식회사 | 액정표시소자의 검사방법 및 장치 |
CN1553202A (zh) * | 2003-05-30 | 2004-12-08 | 上海华园微电子技术有限公司 | 液晶显示驱动器的测试电路及其测试方法 |
TW200539079A (en) * | 2004-05-28 | 2005-12-01 | Innolux Display Corp | Active matrix display device |
-
2005
- 2005-12-07 CN CNB200510102008XA patent/CN100526891C/zh not_active Expired - Fee Related
Cited By (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102054412A (zh) * | 2009-11-09 | 2011-05-11 | 纬创资通股份有限公司 | 共用电源和显示器检测不同主机板电路的设备及转接装置 |
CN102054412B (zh) * | 2009-11-09 | 2013-03-13 | 纬创资通股份有限公司 | 共用电源和显示器检测不同主机板电路的设备及转接装置 |
CN102103818B (zh) * | 2009-12-17 | 2014-07-30 | 北京中星微电子有限公司 | 一种lcd控制器的测试方法及系统 |
CN102005194A (zh) * | 2010-09-14 | 2011-04-06 | 吴坚鸿 | 单色液晶模块通用驱动器 |
CN102005194B (zh) * | 2010-09-14 | 2012-07-18 | 吴坚鸿 | 单色液晶模块通用驱动器 |
CN101995686B (zh) * | 2010-11-18 | 2012-06-06 | 福州瑞芯微电子有限公司 | 基于fpga的lcdc模块的ft测试方法 |
CN101995686A (zh) * | 2010-11-18 | 2011-03-30 | 福州瑞芯微电子有限公司 | 基于fpga的lcdc模块的ft测试方法 |
CN102096038A (zh) * | 2010-11-23 | 2011-06-15 | 福州瑞芯微电子有限公司 | 基于fpga的vip模块的ft测试方法 |
CN102096038B (zh) * | 2010-11-23 | 2013-01-16 | 福州瑞芯微电子有限公司 | 基于fpga的vip模块的ft测试方法 |
CN103869709A (zh) * | 2012-12-13 | 2014-06-18 | 英飞凌科技股份有限公司 | 仿真系统和方法 |
CN106971686A (zh) * | 2017-05-25 | 2017-07-21 | 上海中航光电子有限公司 | 显示装置及其驱动方法 |
CN107436574A (zh) * | 2017-07-27 | 2017-12-05 | 北京东方赛腾科技有限公司 | 一种多功能信号发生器及其信号产生方法 |
CN108510921A (zh) * | 2017-12-29 | 2018-09-07 | 学校法人金泉大学 | Lcd模块检测系统 |
CN108279072A (zh) * | 2018-01-18 | 2018-07-13 | 南京大学 | 一种基于超导氮化铌复用热、微波及太赫兹的直接检测器 |
CN109324560A (zh) * | 2018-12-06 | 2019-02-12 | 中国科学院国家天文台 | 一种液晶驱动器、扫描控制系统及该系统的控制方法 |
CN110554260A (zh) * | 2019-08-13 | 2019-12-10 | 威胜信息技术股份有限公司 | 一种双路电压切换线损测量系统与控制方法及装置 |
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Publication number | Publication date |
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CN100526891C (zh) | 2009-08-12 |
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Assignee: SHENZHEN BYD MICROELECTRONICS Co.,Ltd. Assignor: BYD Co.,Ltd. Contract fulfillment period: 2008.4.25 to 2015.8.16 Contract record no.: 2008440000068 Denomination of invention: Testing device of multi-drive-mode LCD drive circuit and testing method License type: General permission Record date: 20080504 |
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Free format text: COMMON LICENCE; TIME LIMIT OF IMPLEMENTING CONTACT: 2008.4.25 TO 2015.8.16 Name of requester: SHENZHEN BIYADI MICRO-ELECTRONIC CO., LTD. Effective date: 20080504 |
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Effective date of registration: 20191230 Address after: 518119 1 Yanan Road, Kwai Chung street, Dapeng New District, Shenzhen, Guangdong Patentee after: SHENZHEN BYD MICROELECTRONICS Co.,Ltd. Address before: 518119 BYD Industrial Park, Yanan Road, Kwai Chung Town, Longgang District, Guangdong, Shenzhen Patentee before: BYD Co.,Ltd. |
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Address after: 518119 No.1 Yan'an Road, Kuiyong street, Dapeng New District, Shenzhen City, Guangdong Province Patentee after: BYD Semiconductor Co.,Ltd. Address before: 518119 No.1 Yan'an Road, Kuiyong street, Dapeng New District, Shenzhen City, Guangdong Province Patentee before: BYD Semiconductor Co.,Ltd. Address after: 518119 No.1 Yan'an Road, Kuiyong street, Dapeng New District, Shenzhen City, Guangdong Province Patentee after: BYD Semiconductor Co.,Ltd. Address before: 518119 No.1 Yan'an Road, Kuiyong street, Dapeng New District, Shenzhen City, Guangdong Province Patentee before: SHENZHEN BYD MICROELECTRONICS Co.,Ltd. |
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Granted publication date: 20090812 |